201126151 - 六、發明說明： 【發明所屬之技術領域】 本發明係有關一種光學檢測技術，尤其是指可以避免 發光二極體漏光而影響到檢測結果之一種發光二極體之檢 - 測方法與系統。 【先前技術】 φ 發光二極體（Light Emitting Diode，LED )是由半導體 材料所製成之發光元件。由於製程的進步，使得發光二極 體的應用日益廣泛，不論小至手電筒，大至戶外的大型看 板’甚至取代成為下一代的照明系統。而發光二極體所產 生之光.線的品質’直接會影響到產品之呈現品質，由此可 見發光一極體品管的重要性。因此，發光二極體之光度量 測技術是製造發光二極體的過程中重要的一環。 通常發光二極體產品於製作完成後會進行其電性特性 • 之測試以及光學特性的檢測。其中在電性檢測的部分通常 會需要將電極與發光二極體的電性端點相耦接，以測試其 通電狀態；而在光學特性的檢測，則包括有光強度 (Luminous Intensity，Iv)，峰值波長(peakLengttap)分佈， 色溫(Color Temperature)分佈等檢測。檢測完畢之後，再對 發光二極體進行等級分類。 請參閱圖一所示，該圖係為中華民國公告專利第 1258590所揭露之量產式發光二極體測試裝置示意圖。該裝 置包含控制模組10、至少一積分球測試模組u、至少一測 201126151 t ,以及咖該控制模組Η)之馬達單元13 分球測試模組11翻繫1() = 13 °該積 測試模U係具有電性輪出14、光母—積分球 口 16;該m驗12對應於該積分球 、以及光輸入 ，一測試板12係於其上置放有複數個發光1=二7置，且 = 佈)局有複數個對應於該發光二極之； 接J (未圖不）’ Μ供應該發光二極體 電 出與輸入；其中，該積分球測簡組η之該光;^之輸 係開設有-預定面積’可一次涵蓋預定數 ；口 16 發光二極體40於其下，無須經過移動該積 )=亥 u即可達成預定數量之該發光二極體17之光學特=、，且 试，_分球測試模組11係包括有對應於預定數 光二極體17之複數探針（未圖示），並且可同時以_ 探測預定數.量之該發光二極體17之電性特性，如: 向電壓（Forward Bias Voltage，VF)，逆向崩潰電壓（νζ)，、,、 向漏電流(Reverse Current，IR)，加熱前後的νρ差值(D t Forward Voltage,DVF),VF 的暫態峰值(VFD)等等.奸咖 可縮短逐一測試每一發光二極體17電性特性所需::間。 圖一之技術雖可以檢測發光二極體之電性务 性，然而仍然具有一些有待克服之問題。第一個問= 圖-知技術中於發光二極體之發光部雖 = 2〇，然而發光二極體並非容置於該積分球*石谓刀琢 光二極體所產生之光並沒有辦法完全的校射至：二=發 部’而被積分球感測。尤其對於大視角的 、 光—極體而， 圖一知技術所檢測到的光學特性並無法準確的表八發一5 201126151 極妝的真正光學特性，因而有檢測光特性效率不佳的 題i第二個問題是在圖—之技術中，由於發光部朝上1 :丄有=檢測困難的問題。這是因為發光二極體發光部 朝上’則發光二極體的電性接點則在發光部之另一側 :在發光二極體的底面。因此，為了檢測發光二極體之電 :.須要利用特殊的電性連接方式來檢測，增加 構與檢測的困難度。 ，合上述’因此亟f—種發光二極體之檢測方法 統來解決習用技術所產生之問題。 〃系 【發明内容】 恭土本《月提（、g發光二極體檢測方法與系統，其係使 ^ 一極體之發料容置於制體内，使得發光二極體所 題完全被檢測體所檢測，而不會有料漏之問 而必鄕人測體也不會受到外部環境所產生之光場的干擾 =檢顧果。因此’本發明之方法與线可以提昇發 先一極體光特性之檢測效率。 本發明提供—種發光二極體檢測方法與系統，其係使 二二一極體之發光部容置於檢測體内時，發光二極體之電 欢測面朝上’使得電性檢測元件可以輕易 ::檢:面上的電性端子電性連接，進而可以檢二 尤一極體之電性。 法，中’本發明提供一種發光二極體檢測方 其係包括有下列步驟··提供一檢測體，其内具有一檢 201126151 測空間’在該檢測體之一側具有一開口與該檢測空間相連 接，以一拾取機構拾取一發光二極體，將該發光二極體置 於違開口上’使該發光二極體之發光部容置於該檢測空間 内；使該發光二極體於該檢測空間内產生—光場；以及以 該檢測體檢測該光場。 在另貝轭例中，本發明提供一種發光二極體檢測夺 統’其係包括有：一檢測體，其内具有一檢測空間，在； 檢測體之-侧具有—開口與該檢測空間相連接；以及一拾 取機構《係设置於該檢測體之一側，該拾取機構拾取一 發光二極體，將該發光二極體置入於該開口上。 另只轭例中，該開口係開設於該檢測體之頂部， ::亥發光二極體容置於該開口上時，該發光二極體之發 、f5月下而合置於該檢測空間内，而發光二極體之底面朝 ^使得-電性提供部可與該發光二_之底面上之對電 ^點電性連接，進而檢測該發光二極體之電性。 【實施方式】 為使貴審查判能對本發明之特徵、目的及功能 2二_知與瞭解，下文特將本發明之裝置的相關 以及°又计的理念原由進行說明，以使得審查委員 了解本發明之特點，詳細說明陳述如下： 清^圖二所示，該圖係為本發明之發光二極體檢 /不意圖。該檢測方法2首先以步驟2 Q提供一檢測^ =有一檢測空間，在該檢測體之-側具有-開口與 w工間相連接。該檢龍，在本實施例中，其係為一 201126151 - 分球體（integrating sphere)。該積分球體可以收集投射入積 分球的光，並在積分球殼内部形成擴散效果，達到均勻光 的效應。再經過在積分球球殼上的光偵測器以偵測光之特 性。積分球體之特徵係屬於習用之技術，在此不做贅述。 隨後，進行步驟21，以一拾取機構拾取一發光二極體，將 該發光二極體置於該開口上，使該發光二極體之發光部容 置於該檢測空間内。該發光二極體係可以為利用有機發光 材料所形成之有機發光·一極體(organic light emitting diode, Φ 〇led)或者是一般的半導體所構成之發光材料的發光二極 體(light emitting diode, LED)。 該拾取機構，則可μ藉由線性位移運動與轉動運動將 該發光二極體之發光部置入於該開口内，使得該發光二極 體之發光部可以完全容置於該檢測體之檢測空間内。步驟 21之後’接著進行步驟22，使該發光二極體於該檢測空間 内產生一光場。在本步驟中，係對發光二極體進行通電， • 使得該發光二極體產生光場。最後，再進行步驟23，以該 _ 檢測體檢測該光場。由於該發光二極體之發光部完全容置 於該檢測空間内，因此發光二極體所產生之光場可以完全 在檢測體内擴散，因此檢測體可以百分之百的感測到光 場，進而可以完整地分析該光場之特性。檢測完畢之發光 二極體’再以步驟24 ’藉由拾取機構將s玄發光二極體取出， 再根據結果將該發光二極體放置對應該檢測結果之收集區 内。藉由前述之流程，由於發光二極體之發光部完全容置 於檢測體内，因此不會有光線洩漏的問題。再力Π上，由於 發光二極體放置於該開口上，因此檢測體也不會受到外部 201126151 環境所產生之光場的干擾。綜合前述之兩個特點，檢測體 可以完整地檢測發光二極體所產生之光場，進而準確地得 到關於該發光二極體之光學特性，而根據檢測結果與以分 類。 請參閱圖三所示，該圖係為本發明之發光二極體之檢 測系統第一實施例示意圖。為了實現圖二之檢測流程，圖 三之檢測系統3包括有一檢測體30以及一拾取機構31。 該檢測體3 0 »在本實施例中係為一積分球體。該檢測體3 0 内具有一檢測空間300，在該檢測體30之一側具有一開口 301與該檢測空間300相連接。在該開口 301之周圍更具 有一承載座302以提供承載該發光二極體91。該拾取機構 31，其係設置於該檢測體30之一側，該拾取機構31拾取 置放於承載盤90内之發光二極體91，將該發光二極體91 置入於該開口 301上。在本實施例中，該拾取機構31更包 括有一第一拾取臂310以及一第二拾取臂311。該第一拾 取臂310，其係由承載盤90上拾取發光二極體91。該第二 拾取臂311，其係設置於該第一拾取臂310之一側，該第 二拾取臂3Π係由該第一拾取臂310所拾取之該發光二極 體91之底面912拾取該發光二極體91，並藉由一旋轉運 動92將該發光二極體置91入於該開口 30]上，使該發光 二極體91之底面912朝上。 請蒼閱圖四A至圖四D所不，該圖係為本發明圖三之 實施例動作示意圖。首先，如圖四A所示，利用該第一拾 取臂310藉由二維線性位移運動93與94移動至承載複數 個發光二極體91之發光二極體承載盤90上。提供二維線 201126151 =t運動=機制可以利用線性滑轨或者是線性馬達等元 後二3屬於習用技術之元件，在此不作贅述。然 承i二二拾取臂31G上的真空吸嘴遍吸取放置於該 一批Γ辟之發光二極體91。接著如圖四B所示，該第 =I 3H)移動至該對應該第二拾取f 311之真空吸嘴 料:位置上’使該第二拾取臂311之真空吸嘴3則吸取 拾取臂==1之4面912。接著如圖四C所示，該第二 :極邮盘旋轉運動92，旋轉18G度，使得該發光 二二3〇1相對應，進而釋放該發光二極體 光二極、—極體91抵靠於承載座302上，而使得發 300—I之發光部910容置於該檢測體30之檢測空間 轉運動92則可以利用馬達提供轉動力，帶動第 體tr之轉動。接著如圖四d所示，由於該發光二極 朝上而Λ 0朝下，因此該發光二極體91的底面912 部32盘路淨:對電性端,點911。因此可以藉由一電能提供 電性、卓Γ由 體91之底面912上之該對電性端點911 笋而差該發光二極體91之發光部910因為電的激 。要說明的是，藉由本發明之容置方式，使 端點接觸。使得可以直接與電性201126151 - VI. Description of the invention: [Technical field of the invention] The present invention relates to an optical detection technique, and more particularly to a detection and measurement method for a light-emitting diode which can avoid light leakage of a light-emitting diode and affect the detection result. system. [Prior Art] A φ Light Emitting Diode (LED) is a light-emitting element made of a semiconductor material. Due to advances in the process, the use of light-emitting diodes has become increasingly widespread, and large-scale billboards, ranging from small flashlights to large outdoor ones, have even replaced the next generation of lighting systems. The quality of the light produced by the light-emitting diodes directly affects the quality of the product, which makes it possible to see the importance of the light-emitting diode. Therefore, the light measurement technique of the light-emitting diode is an important part in the process of manufacturing the light-emitting diode. Usually, the LED products are tested for their electrical properties and their optical properties after fabrication. The part of the electrical detection usually needs to couple the electrode to the electrical end of the light-emitting diode to test its energization state; and the detection of the optical characteristic includes the Luminous Intensity (Iv). , peak wavelength (peakLengttap) distribution, color temperature (Color Temperature) distribution and other detection. After the detection is completed, the light-emitting diodes are classified. Please refer to FIG. 1 , which is a schematic diagram of the mass-produced light-emitting diode testing device disclosed in the Republic of China Patent No. 1258590. The device comprises a control module 10, at least one integrating sphere test module u, at least one test 201126151 t, and a motor unit 13 of the control module Η). The ball test module 11 is turned over 1 () = 13 ° The product test module U has an electrical wheeling 14, a light-integrating ball-integrating ball port 16; the m-test 12 corresponds to the integrating sphere and the light input, and a test board 12 is provided with a plurality of light-emitting lights thereon. Two 7 sets, and = cloth) a plurality of points corresponding to the light emitting diode; J (not shown) ' Μ supply the light emitting diode output and input; wherein, the integrating sphere test group η The light is provided with a predetermined area that can cover a predetermined number at a time; the light-emitting diode 40 is below the mouth, and the predetermined number of the light-emitting diodes can be achieved without moving the product. The optical test of the 17th, and the test, the _ ball test module 11 includes a plurality of probes (not shown) corresponding to the predetermined number of photodiodes 17, and can simultaneously detect the predetermined number by _. The electrical characteristics of the light-emitting diode 17, such as: Forward Bias Voltage (VF), reverse collapse voltage (νζ), ,,, direction Reverse Current (IR), D t Forward Voltage (DVF) before and after heating, Transient Peak (VFD) of VF, etc. Tracing can shorten the electrical characteristics of each LED 26 one by one. Required:: between. Although the technique of Fig. 1 can detect the electrical properties of the light-emitting diode, it still has some problems to be overcome. The first question = Fig. - Known technology in the light-emitting diode of the light-emitting diode = 2 〇, however, the light-emitting diode is not accommodated in the integrating sphere * stone is called the light produced by the light-emitting diode and there is no way The complete calibration is: 2 = hair section 'and is sensed by the integrating sphere. Especially for large viewing angles, light-polar bodies, the optical characteristics detected by the technique can not be accurately determined. The true optical characteristics of the 201128151 polar makeup are therefore inefficient. The second problem is that in the technique of the figure, since the light-emitting portion faces up 1: there is a problem that the detection is difficult. This is because the light-emitting diode is turned upwards and the electrical contact of the light-emitting diode is on the other side of the light-emitting portion: on the bottom surface of the light-emitting diode. Therefore, in order to detect the electricity of the light-emitting diode: it is necessary to use a special electrical connection to detect, increasing the difficulty of construction and detection. In combination with the above-mentioned method, the detection method of the light-emitting diodes is used to solve the problems caused by the conventional technology. 〃系[Inventive content] Gong Tuben "Moon Lift (G-light diode detection method and system, which makes the body of the body of the body of the body of the body, so that the problem of the light-emitting diode is completely The detection of the object, without the problem of material leakage, must be subject to the interference of the light field generated by the external environment = check the results. Therefore, the method and line of the present invention can improve the first pole The detection efficiency of the body light characteristic is provided. The invention provides a method and a system for detecting a light-emitting diode, which is to make the light-emitting part of the 221-pole body be placed in the detection body, and the light-emitting diode is turned on. The upper part makes the electrical detecting component easy:: the electrical connection of the electrical terminal on the surface can be electrically connected, and the electrical property of the second pole can be checked. The method of the invention provides a light-emitting diode detection method. The method includes the following steps: providing a detecting body having a detecting 201126151 measuring space, having an opening on one side of the detecting body connected to the detecting space, and picking up a light emitting diode by a picking mechanism, The light-emitting diode is placed against the opening The light emitting portion of the light emitting diode is housed in the detecting space; the light emitting diode generates a light field in the detecting space; and the light field is detected by the detecting body. In another example, the present invention Provided is a light-emitting diode detecting system comprising: a detecting body having a detecting space therein; wherein the detecting body has an opening connected to the detecting space; and a picking mechanism On one side of the detecting body, the pick-up mechanism picks up a light-emitting diode and places the light-emitting diode on the opening. In another yoke example, the opening is formed on the top of the detecting body, :: When the LED light-emitting diode is placed on the opening, the light-emitting diode is placed in the detection space under the f5 month, and the bottom surface of the light-emitting diode is made to be electrically-powered. The electrical connection of the light-emitting diode on the bottom surface of the light-emitting diode is further detected, and the electrical properties of the light-emitting diode are detected. [Embodiment] In order to enable the review, the features, objects and functions of the present invention are known. It is understood that the following relates to the device of the present invention and The concept of the meter is explained in order to make the reviewer understand the characteristics of the present invention, and the detailed description is as follows: As shown in Fig. 2, the figure is the light-emitting diode inspection/notification of the present invention. The detection method 2 firstly Step 2 Q provides a detection ^ = there is a detection space, and there is an opening on the side of the detector - the opening is connected to the w. The inspection dragon, in this embodiment, is a 201126151 - integral sphere The integrating sphere collects the light projected into the integrating sphere and forms a diffusion effect inside the integrating sphere shell to achieve a uniform light effect. The photodetector on the integrating sphere shell is then used to detect the characteristics of the light. The feature of the integrating sphere is a conventional technique and will not be described here. Subsequently, in step 21, a light-emitting diode is picked up by a pick-up mechanism, and the light-emitting diode is placed on the opening to make the light-emitting diode The light emitting portion of the body is accommodated in the detection space. The light emitting diode system may be a light emitting diode (light emitting diode) of an organic light emitting diode (Φ 〇led) formed by an organic light emitting material or a general semiconductor. LED). The pick-up mechanism can insert the light-emitting portion of the light-emitting diode into the opening by linear displacement motion and rotational motion, so that the light-emitting portion of the light-emitting diode can be completely accommodated in the detection of the detector Within the space. After step 21, step 22 is followed to cause the light-emitting diode to generate a light field in the detection space. In this step, the light-emitting diode is energized, so that the light-emitting diode generates a light field. Finally, step 23 is performed to detect the light field with the detector. Since the light emitting portion of the light emitting diode is completely accommodated in the detecting space, the light field generated by the light emitting diode can be completely diffused in the detecting body, so that the detecting body can sense the light field 100%, and thus The characteristics of the light field are completely analyzed. The detected light-emitting diodes are further removed by the pick-up mechanism in step 24, and the light-emitting diodes are placed in the collection area corresponding to the detection results according to the results. According to the foregoing flow, since the light-emitting portion of the light-emitting diode is completely housed in the detecting body, there is no problem of light leakage. Further, since the light-emitting diode is placed on the opening, the sample is not disturbed by the light field generated by the external environment of 201126151. Combining the above two characteristics, the detecting body can completely detect the light field generated by the light-emitting diode, thereby accurately obtaining the optical characteristics of the light-emitting diode, and classifying according to the detection result. Referring to FIG. 3, the figure is a schematic diagram of a first embodiment of a detection system for a light-emitting diode of the present invention. In order to realize the detection flow of FIG. 2, the detection system 3 of FIG. 3 includes a detecting body 30 and a picking mechanism 31. The sample 3 0 » is an integrating sphere in this embodiment. The detecting body 30 has a detecting space 300, and an opening 301 is connected to the detecting space 300 on one side of the detecting body 30. A carrier 302 is further disposed around the opening 301 to provide the light-emitting diode 91. The pick-up mechanism 31 is disposed on one side of the detecting body 30. The pick-up mechanism 31 picks up the light-emitting diode 91 placed in the carrier 90, and places the light-emitting diode 91 on the opening 301. . In the embodiment, the picking mechanism 31 further includes a first picking arm 310 and a second picking arm 311. The first pick-up arm 310 picks up the light-emitting diode 91 from the carrier disk 90. The second pick-up arm 311 is disposed on one side of the first pick-up arm 310, and the second pick-up arm 3 is picked up by the bottom surface 912 of the light-emitting diode 91 picked up by the first pick-up arm 310. The diode 91 is placed on the opening 30 by a rotary motion 92 such that the bottom surface 912 of the LED 91 faces upward. Please refer to FIG. 4A to FIG. 4D, which is a schematic diagram of the operation of the embodiment of FIG. 3 of the present invention. First, as shown in Fig. 4A, the first pick-up arm 310 is moved by the two-dimensional linear displacement motions 93 and 94 to the light-emitting diode carrier disk 90 carrying the plurality of light-emitting diodes 91. Provide two-dimensional line 201126151 = t motion = mechanism can use linear slide rail or linear motor and other elements. The second and third are components of the conventional technology, and will not be described here. However, the vacuum nozzle on the pickup arm 31G absorbs the light-emitting diodes 91 placed in the batch. Next, as shown in FIG. 4B, the first = I 3H) is moved to the vacuum nozzle corresponding to the second pickup f 311: the position is such that the vacuum nozzle 3 of the second pickup arm 311 sucks the pickup arm = =1 of 4 faces 912. Next, as shown in FIG. 4C, the second: polar mail rotary motion 92 is rotated by 18G degrees, so that the light-emitting diodes 2 〇1 correspond to each other, thereby releasing the light-emitting diode light poles and the pole body 91 abutting. On the carrier 302, the light-emitting portion 910 of the hair 300-I is placed in the detection space rotating motion 92 of the detecting body 30, and the motor can be used to provide a rotational force to drive the rotation of the first body tr. Next, as shown in Fig. 4d, since the light-emitting diodes face upward and Λ0 faces downward, the bottom surface 912 portion 32 of the light-emitting diode 91 is clean: the electrical end, point 911. Therefore, the light-emitting portion 910 of the light-emitting diode 91 can be made worse by the electrical energy supply, the pair of electrical terminals 911 on the bottom surface 912 of the body 91. It is to be noted that the end points are brought into contact by the accommodating manner of the present invention. Make it possible to communicate directly with electricity
Sfi不具有側面電性接點）進行檢測，以增加可檢測 土忐一極體之種類。 發光二極體91產生光場之後，檢顯如即可偵 娜该發光二極體91之光場，推而栌媸， 4 根據5亥發光二極體91的 果對该發先二極體91進行分類。檢測完畢之後，再 201126151 利用第二拾取臂311取出請發一— 度的轉動。接著再利用該第二極體91’然後再進行180 取臂311上的發光二極駿91洛取臂31〇吸取在該第二捡 入於對應分類的承载盤内。進而將該發光二極體91置 請參閱圖五所示，該圖係為本 測系統第二實施例示意圖。本二二發明之發光二極體之檢 類似，差異的是本實施例之柊例之結構基本上與圖三 31不同。本實施例之拾取機°機構33與圖三支拾取機構 以及一第二拾取臂331所構33係為一第一拾取臂33〇 可拾取承載盤90上的發光战二其中該第-拾取臂刻 .係藉由^旋轉運動％將‘^91，該第一拾取臂330 拾取臂330更可以具有二維^/體翻轉。此外’ ^ 一 .真空吸嘴3300的位置。該第線,f位移運動93與94來改變 .移運動93與94來調整备.取臂°取臂331則可以用線性位 侧可以吸取發光二極體之^31之位置’ H空2 <底面912，再藉由線性位移運 動93與94將該發光二極體移動至該檢測體3〇之開口 3〇1 上0 惟以上所述者，僅為本發明之實施例，當不能以之限 制本發明範圍。即大凡依本發明申請專利範圍所做之均等 變化及修飾，仍將不失本發明之要義所在，亦不脫離本發 明之精神和範圍，故都應視為本發明的進一步實施狀況。 例如：本發明之拾取機構可以根據實際之需要而有不同的 組合，這是熟悉此項技術之人可以根據本發明之檢測精神 而予以變化。 201126151 【圖式簡單說明】 圖一係為中華民國公告專利第ί25859〇所揭露之量產式發 光二極體測試裝置示意圖。 Λ 圖二係為本發明之發光二極體檢測方法示意圖。 =三係為本發明之發光二極體之檢㈣統第—實施例 圖。 、Sfi does not have a side electrical contact) to detect the type of detectable bandit. After the light-emitting diode 91 generates a light field, the light field of the light-emitting diode 91 can be detected, and the light-emitting diode is turned on, and the light-emitting diode is turned on. 91 for classification. After the detection is completed, the second pick arm 311 is used to take out the one-degree rotation. Then, the second pole body 91' is used again, and then the light-emitting diode 61 on the arm 311 is sucked into the carrier tray of the corresponding classification. Further, the light-emitting diode 91 is shown in FIG. 5, which is a schematic diagram of the second embodiment of the measurement system. The detection of the light-emitting diode of the invention of the second embodiment is similar, and the difference is that the structure of the example of the embodiment is basically different from that of FIG. The pick-up mechanism 33 of the present embodiment and the third pick-up mechanism and the second pick-up arm 331 are a first pick-up arm 33. The illuminating warfare on the pick-up tray 90 can be picked up, wherein the first pick-up arm The first pick arm 330 picking arm 330 can have a two-dimensional body/body flip by the rotary motion %. In addition ' ^ a . vacuum nozzle 3300 position. The first line, the f-displacement motions 93 and 94 are used to change the movements 93 and 94 to adjust the preparation. The arm-shaped arm 331 can be used to draw the position of the light-emitting diode ^31 from the linear position side. The bottom surface 912 is further moved to the opening 3〇1 of the detecting body 3 by the linear displacement motions 93 and 94. However, the above is only an embodiment of the present invention. This limits the scope of the invention. It is to be understood that the scope of the present invention is not limited to the spirit and scope of the present invention, and should be considered as further implementation of the present invention. For example, the picking mechanism of the present invention can be variously combined according to actual needs, which can be changed by those skilled in the art in accordance with the spirit of detection of the present invention. 201126151 [Simple description of the diagram] Figure 1 is a schematic diagram of the mass-produced light-emitting diode test device disclosed in the Republic of China Announcement Patent No. ί25859. Λ Figure 2 is a schematic diagram of the detection method of the light-emitting diode of the present invention. = Three is the inspection of the light-emitting diode of the present invention (four) system - embodiment. ,
【主要元件符號說明】 I 〇-控制模組 II -積分.球測試模組 12 -測試板 13- 馬達單元 14- 電性輸出 15- 光輸出 16- 光輸入口 17- 發光二極體 2- 發光二極體之檢測方法 20〜24-步驟 3- 檢測系統 30-檢測體 3 00-檢測空間 201126151 301- 開口 302- 承載座 31- 拾取機構 310- 第一拾取臂 3100-吸嘴 311- 第二拾取臂 3110-吸嘴 32- 電能提供部 33- 拾取機構 330-第一拾取臂 3300-吸嘴 33卜第二拾取臂 3310-吸嘴 90- 承載盤 91- 發光二極體 910- 發光部 911- 電性端點 912- 底面 92- 旋轉運動 93、94-二維線性位移運動 12[Main component symbol description] I 〇-control module II - integral. Ball test module 12 - test board 13 - motor unit 14 - electrical output 15 - light output 16 - optical input port 17 - light emitting diode 2 Detection method of light-emitting diode 20~24-Step 3 - Detection system 30 - Detection body 3 00 - Detection space 201126151 301 - Opening 302 - Carrier 31 - Pickup mechanism 310 - First pickup arm 3100 - Nozzle 311 - Two pickup arms 3110 - suction nozzle 32 - electric power supply portion 33 - pickup mechanism 330 - first pickup arm 3300 - suction nozzle 33 second pickup arm 3310 - suction nozzle 90 - carrier disk 91 - light emitting diode 910 - light emitting portion 911- Electrical Endpoint 912- Bottom 92- Rotating Motion 93, 94 - Two-Dimensional Linear Displacement Motion 12