1258590 九、發明說明： 【發明所屬之技術領域】 本發明係有關於-種發光二極體測試裝置，尤指一種 能夠大量生產、提高生產效率之發光二極體測試裝置。 【先前技術】 ▲自從196G年代發光二極體開始商品化以來，由於具有1258590 IX. Description of the Invention: [Technical Field] The present invention relates to a light-emitting diode testing device, and more particularly to a light-emitting diode testing device capable of mass production and improved production efficiency. [Prior Art] ▲ Since the commercialization of the luminescent diode in the 196G era,
=震性、壽命長，同時耗電量少、發熱度小，所以其應 用。耗圍遍及日常生活中的各項用品，如家電製品及各式儀 ^之指讀或光源等。近年來，因多色彩及高亮度化之發 應用範圍更朝向戶外顯示器發展，如大型戶外顯示看 扳及交通號誌燈等。 徊姐^光二極體係利^ P型與N型半導體之間互相形成一 著界面，g其此f結構在未施加任何 ，導體的費米階(如_^^ ^成—電場（即存在—電位能）。進而加人適當的順向福 】，電子、電洞分別注入P型與N型半導體兩端後，便, 处=/N界面區域結合而發光，即電子由高能量狀況掉回作 月匕，狀怨與電洞結合，將能量以光的形式釋放出來；藉佳 地由N侧注入電子、p侧注入電洞，使得「電子、, :二合而發光」的動作持續進行，即能使發光二極體持每 a光’ Pi^著材料與設計的不同，其發光特性也隨之不同。 、通常發光二極體產品於製作完成後會進行其電性特相 ^則"式’如順向電壓（Forward Bias Voltage，VF)，逆洽 朋/貝電壓（VZ)，逆向漏電流（Reverse current，Ir)，办 1258590 熱前後的 VF 差值（Data Forward Voltage，DVF)，VF 的 暫悲峰值（VFD)、以及光學特性如：光強度（Luminous= Shock, long life, low power consumption, low heat generation, so its application. It is used for all kinds of daily necessities, such as home appliances and various types of instruments. In recent years, the application range of multi-color and high-brightness has been directed toward outdoor displays, such as large outdoor display panels and traffic lights.徊 ^ ^ 光 二 光 ^ ^ ^ ^ P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P P Potential energy). In addition, the appropriate forward direction is added. After the electrons and holes are injected into the two ends of the P-type and N-type semiconductors respectively, the =/N interface region combines to emit light, that is, the electrons fall back from the high energy state. As a new moon, the grievances are combined with the holes to release the energy in the form of light. The electrons are injected from the N side and the p side is injected into the hole, so that the action of "electron, : two-in-one and illuminate" continues. That is, the light-emitting diode can be made different from the material and design of each light, and the light-emitting characteristics are also different. Usually, the light-emitting diode product will be subjected to electrical characteristics after the completion of the production. "Forms such as Forward Bias Voltage (VF), reverse contact / Bay voltage (VZ), reverse current (Ir), do 1258590 VF difference before and after heat (Data Forward Voltage, DVF ), the transient peak of the VF (VFD), and optical characteristics such as: light intensity (Luminous)
Intensity，Iv) ’ 蜂值波長（Peak Length，λ p)，波寬 (HW)，色度座標（Chromaticity Coordinates，CIE)，主 要波長（Dominated Length，λά)，顏色純度（Purity)， 色溫（Color Temperature)尊，以進行進一步的分類、包 裝及出貨等流程。然，每一流程環節若是稍有延遲，即大 大衫％後績產品父期與公司商譽，已知習知發光二極體的 測試分類，係以逐一測試電性特性再逐一確認光學特性的 方式分類，實不符合逐漸受到廣泛應用的發光二極體之量 產需求，亦大幅降低生產效率、增加公司成本。 請參閱第一圖所示之習知發光二極體測試裝置，其包 括由電腦及其週邊設備所組成之控制單元1〇a、電性連接 至該處理單元l〇a之光學量測儀器2〇a、以及設置於該光 子i測儀裔20a正下方之發光二極體3〇a ;其中，該光學 測1儀器20a之光輸入口 21a必須準確對應於該發光二極 體30a之上，否則該發光二極體3〇&釋放之光線容易散逸， 影響測量準確度；此外該光學測量儀器2〇a具有光輸出2匕 與，性輸出23a，並分別連接到該控制單元1〇a;是以，不 論是單獨移動該光學測量儀器2〇a或該發光二極體3〇&以 進灯對應，均需達成準確對應之目的，再利用該發光二極 體30=連接一電流源於導通後發光，透過該光學測量儀器 20a =測其光學特性，於此步驟之前或之後，可移動該光 學測1儀器20a或該發光二極體3〇a以接觸對方進行電性 特性之量測，再根據所得之光學與電性特性對該發光二極 體30a進行分類。然此等逐一測試的方法加上測試項目的 1258590 雜數里龐大的發光二極體要經由测試篩選 工’明顯地成為製程中的瓶頸站別。 。耗日守廢 緣是，本發明人有感於上述之缺失，士既 配合學理之運用、及便於攜帶特性 乃4寸潛心研究並 設計合理且有效改善上述缺失之本發明里’終於提出—種 【發明内容】 ====== 數發光—極體的光學測試。 積刀表叹置硬數採針’以一次進行涵蓋 二極體的電性測試。 ，、卜之夕㈣尤 提供—種1產式發光二極體測試裝置，可利用 2 S複數發光二極體，且按實際需求設計該測試板 ^佈局，俾使該發光二極體可依該需求進行或光學測 呑式0 人批ίΐΓ係提供—種量產式發光二極體測試裝置，係包 έ二果、、且至J 一積分球测試模組、以及至少一測試板。 其中該控組包括具有可程式邏魅制之中央處理單 兀、、巧與該中央處理單元聯繫之通訊介面單元 ;該積分 球測搞_聯繫至雜健組之軌介面單元，且每一 1258590 積分球測試模組係具有電性輸出、光輸出、以及_光輪入 口 ’該測試板對應於該積分球測試模組設置，且每一測試 板係於其上置放有複數個發光二極體、每一測試板並佈局 有複數個對應於該發光二極體之電性接點，以供應該發光 二極體所需電流之輸出與輸入；其中，該積分球測試^組 之該光輪入口係開設有一預定面積，可一次涵蓋預定數量 之該發光二極體於其下，該積分球測試模組係包括有對應 於預定數量之該發光二極體之複數探針，並且可同時以一 對接觸式探測預定數量之該發光二極體之電性特性。 為使貝審查委貝得能更進一步瞭解本發明之特徵與 技術内容，請參閱以下有關本發明之詳細說明與所附圖 式；然而所附圖式僅提供參考與說明用，並非用以限制本 發明。 【實施方式】 ^積分球是一個中空的球腔，球腔上可依需求開設數量 不等的輸入孔和輸出孔，内腔壁一般爲具有漫反射性質的 塗層，當積分球於實際應用時，被測光束從輸入孔射入， 經過腔壁複雜的漫反射後，按該塗層之材質決定被腔壁吸 收白y光月b里，其餘從輸入孔和輸出孔射出。通過收集漫反 射光來進行定性或定量分析，積分球的作用就是收集此等 由四面八方反射的光以被檢測器檢測的光，通過特殊的設 計’可取樣出孔處的光功率、波形和能量，換算後即可得 到原入射光束的相應參數。 本發明即應用積分球進行光線蒐集，不用準確設置積 分球於發光二極體之正上方，即可蒐集足夠光線以供檢 8 1258590 測，藉以得知該發光二極體之光學特性。 請芩閱第二圖所示之量產式發光二極 包含控制模組10 (可包括全光域光 、=係 至少-積分球測試模組20、至少一測試板 該控制核組Μ之馬達單元6G。其巾雜㈣組括且 ，可程式邏輯控制之中央處理單元n、與該中理^ Π聯繫之通訊介面單元12、 命 、 早兀 擊之软體模組η .兮 乂及舁該中央處理單元11聯 繫权體核、、-13’該積分球測試模組 模組ίο之通訊介面單亓u η — 啊繁至a控制 〇〇 丨，且母一積/刀球測試模組20係 ，、有電f輸出22、光輸出23、以及光輸人口 21 :該Intensity, Iv) 'Peak Length (λ p), Wave Width (HW), Chromaticity Coordinates (CIE), Dominated Length (λά), Color Purity, Color Temperature (Color) Temperature) for further classification, packaging and shipping processes. However, if there is a slight delay in each process, that is, the value of the product is the parent product and the company's goodwill. The test classification of the known light-emitting diodes is to test the optical characteristics one by one and confirm the optical characteristics one by one. The classification of methods does not meet the mass production requirements of LEDs that are gradually being widely used, and also greatly reduces production efficiency and increases company costs. Please refer to the conventional light-emitting diode testing device shown in the first figure, which comprises a control unit 1A composed of a computer and its peripheral devices, and an optical measuring instrument 2 electrically connected to the processing unit 10a. 〇a, and a light-emitting diode 3〇a disposed directly below the photon meter 20a; wherein the optical input port 21a of the optical measuring instrument 20a must correspond exactly to the light-emitting diode 30a, Otherwise, the light emitted by the light-emitting diode 3〇& is easily dissipated, affecting the measurement accuracy; further, the optical measuring instrument 2〇a has a light output 2匕, a sexual output 23a, and is respectively connected to the control unit 1〇a Therefore, whether the optical measuring instrument 2〇a or the light-emitting diode 3〇& is required to achieve an accurate correspondence, the light-emitting diode 30=connects a current. After being turned on, the light is transmitted through the optical measuring instrument 20a. The optical characteristic is measured. Before or after this step, the optical measuring instrument 20a or the light emitting diode 3a can be moved to contact the other party for electrical characteristics. Measurement, and then according to the optical and Characteristics of the light emitting diodes are classified 30a. However, the method of testing one by one plus the large number of light-emitting diodes in the 1258590 heterogeneous test items is obviously a bottleneck in the process. . The inventor is convinced that the above-mentioned deficiency, the combination of the use of academics, and the convenience of carrying characteristics are 4 inches of painstaking research and design reasonable and effective to improve the above-mentioned defects in the invention. SUMMARY OF THE INVENTION ====== Number of luminescence - optical test of the polar body. The electric knife is used to cover the electrical test of the diode. , Bu Zhi Xi (4) especially provides a kind of 1 type light-emitting diode test device, which can utilize 2 S complex light-emitting diodes, and design the test board according to actual needs, so that the light-emitting diode can be The demand or optical measurement type is provided by a batch-type light-emitting diode test device, which comprises a package of two fruits, a J-integral ball test module, and at least one test board. The control group includes a central processing unit having a programmable logic system, and a communication interface unit that is in contact with the central processing unit; the integrating sphere is _contacted to the rail interface unit of the hybrid group, and each 1258590 The integrating sphere test module has electrical output, light output, and _light wheel inlet. The test board corresponds to the integrating sphere test module, and each test board is provided with a plurality of light emitting diodes thereon. Each test board is arranged with a plurality of electrical contacts corresponding to the light-emitting diodes to supply an output and input of current required by the light-emitting diodes; wherein the light-ball inlet of the integrating sphere test group The system has a predetermined area, and the predetermined number of the LEDs can be covered at a time. The integrating sphere test module includes a plurality of probes corresponding to a predetermined number of the LEDs, and can simultaneously The electrical characteristics of the predetermined number of the light-emitting diodes are detected by contact. In order to provide a further understanding of the features and technical aspects of the present invention, reference should be made to the detailed description of the invention and the accompanying drawings. this invention. [Embodiment] The integrating sphere is a hollow spherical cavity. The spherical cavity can be provided with a plurality of input holes and output holes according to requirements. The inner cavity wall is generally a coating with diffuse reflection properties. When the integrating sphere is used in practical applications. When the measured beam is incident from the input hole, after the complex diffuse reflection of the cavity wall, the material of the coating is determined to be absorbed by the cavity wall by white y light b, and the rest is emitted from the input hole and the output hole. By collecting diffusely reflected light for qualitative or quantitative analysis, the function of the integrating sphere is to collect the light reflected by the detector in all directions to be detected by the detector. Through special design, the optical power, waveform and energy at the hole can be sampled. After conversion, the corresponding parameters of the original incident beam can be obtained. In the present invention, the integrating sphere is used for light collection. Instead of accurately setting the integrating sphere directly above the light-emitting diode, sufficient light can be collected for inspection to determine the optical characteristics of the light-emitting diode. Please refer to the mass-produced two-pole control module 10 shown in the second figure (which may include all-optical light, = at least - integrating sphere test module 20, at least one test board, the control core set of motors) Unit 6G. The central processing unit n of the programmable logic control unit, the communication interface unit 12 connected with the middle management unit, and the software module η.兮乂 and 兀The central processing unit 11 contacts the right core, and the communication interface of the integrating sphere test module ίο 亓 啊 a a a 且 且 且 且 且 且 且 且 且 且 且 且 且 且 且 且 且 且System, with electric f output 22, light output 23, and light transmission population 21:
應置=積分勒馳組2G設置，且每—測試板 係於其上置放有魏個發光二極體4Q 佈應於該發光二_ 4〇之電性= 反= 供應該發光二極體4Q所需電流之輸出與輸入；其 =’該積刀球測試模組2()之該光輸人口 21係開設有一預 疋=積H涵蓋預定數量（複數）之該發光二極體仙 t 過移賴積分球職模組2G即可達成預定 極體4〇之光學特性測試，該積分球測試模 、’且糸〇有對應於預定數量之該發光二極 探_示)，並且可同時以-對-接觸式探測預定= 之該叙光一極體40之電性特性’如順向電壓(F〇rwardBias 〇 age，VF)，逆向崩潰電壓（VZ )，逆向漏電流（Reverse Current’⑻，加熱前後的VF差值（此仏F〇rward v〇 =二的暫態峰值⑽）等等；藉此，可縮短逐一測 #母毛光一極體4〇電性特性所需之時間。 其中’該通訊介面單元12係包括RS 485通訊介面， 1258590 =刀，測試模組20係通過該RS 485 if 至該控制模組1G ;該測試板㈣連接至少 別，以分別提供該發光二極體4〇固定電流（如牙第疋二電^原 該測式板30係連接預定數量（數量相#於該發光二θ極 4(0^穩定電流源（未圖示），以分別對應於預定數量之該 發光一極體4〇並提供固定電流。 人 該測試板30係電性聯繫於該控制模組1〇，通 體模組13可分別控制該測試板3Q上每—發光二極叙~〇 ^導通狀態；其中，當測試每—發光二極體4G之光學特性 時，如：光強度（Lumi nous I ntens i ty，丨v)，峰值波長（ Length，λΡ)，波寬（HW)，色度座標（Chr〇maticity Coordinates，CIE)’ 主要波長（D〇minatedLength M)， f 色純度（Purity)，色溫（Color Temperature)等，涵 盍於預定數量之該發光二極體4〇被控制、且依序導通呈發 光狀恶，或該控制模組1 〇可通過至少一操作單元（未圖 不），如鍵盤、滑鼠等等，藉以提供人為設定測試與分類條 件。 、 其中，該馬達單元60係用來驅動並控制該積分球測試 模組20平移與起降，以移動該積分球測試模組2〇設置於 預定數量之該發光二極體40之上方，該馬達單元可為伺服 馬達或步進馬達。 由前述可知，本發明之量產式發光二極體測試裝置係 具有以下之優點·· 1·可一次涵蓋較多的發光二極體，透過設置於測試 板上的發光二極體以串聯方式驅動後，藉由設置於該發光 二極體之複數探針同時測得每一發光二極體之電性特性。 1258590 積分球測試模組，透體，無須經過移動該 放光線以測試每-發光二極體之該發光二極體釋 3 ·可同時設置互相對靡 、—、 與測試板，料—步達成量積分球測試模組 准以上所述僅為本發明之佳每 拘限本發明之專利範圍，故舉 例，非因此即 内容所為^效結觀化，本f職日轉及圖式 内，合予陳明。 9里问包含於本發明之範圍 【圖式簡單說明】 ;Γ=Γ，係為習知發光二極體職裝置之示意圖； 弟—圖所示，係為本發明之 示意圖；以及 錢發先二極體測試裝置之 第三圖所示，係為本發明之 有互相m t、產式鲞光二極體測試裝置含 =互相對應之魏積分球職裝置與賴板之示意 【主要元件符號說明】 光學量測儀器 光輸出 發光二極體 11測試裝置 中央處理單元 20a 22a 30a 習知發光二極體測試裝置 控制單元 i〇a 光輸入口 21a 電性輪出 23a 本發明之量產式發光二極 控制模組 10 11 1258590 通訊介面單元 12 軟體模組 積分球測試模組20 光輸入口 電性輸出口 22 光輸出口 測試板 30 發光二極體 穩定電流源 50 馬達單元 1321 23 40 60Should be set = integral Lechi group 2G settings, and each test board is placed on it with a light emitting diode 4Q cloth should be in the light of the second _ 4 〇 electrical = anti = supply the light emitting diode The output and input of the required current of 4Q; which = 'the light beam population of the integrated knife test module 2 () has a pre-turn = product H covers a predetermined number (plural) of the light-emitting diodes The optical characteristic test of the predetermined polar body can be achieved by moving the 2G of the integrating sphere module, the integrating sphere testing mode, 'and corresponding to the predetermined number of the LEDs, and simultaneously The electrical characteristics of the light-emitting diode 40 are determined by --to-contact detection = such as forward voltage (F〇rwardBias 〇age, VF), reverse collapse voltage (VZ), reverse current leakage (Reverse Current'(8) , the VF difference before and after heating (this 仏F〇rward v〇=two transient peak (10)), etc.; thereby, the time required to measure the electrical characteristics of the female hair one pole one by one can be shortened. 'The communication interface unit 12 includes an RS 485 communication interface, 1258590 = a knife, and the test module 20 passes the RS 485 if to the Module 1G; the test board (4) is connected at least to provide a fixed current of the light-emitting diode 4 (for example, the second type of the test board 30 is connected to the predetermined number (the quantity phase # is the light) Two θ poles 4 (0^stabilize current sources (not shown) to respectively correspond to a predetermined number of the light-emitting poles 4 〇 and provide a fixed current. The test board 30 is electrically connected to the control module 1 In other words, the whole body module 13 can respectively control the conduction state of each of the light-emitting diodes on the test board 3Q; wherein, when testing the optical characteristics of each of the light-emitting diodes 4G, such as: light intensity (Lumi nous I) Ntens i ty, 丨v), peak wavelength (Length, λΡ), wave width (HW), Chromaticity Coordinates (CIE)' D波长minatedLength M, f color purity (Purity), Color temperature, etc., the predetermined number of the LEDs 4 are controlled, and sequentially turned on to emit light, or the control module 1 can pass at least one operation unit (not shown) , such as keyboards, mice, etc., to provide artificial settings test and classification The motor unit 60 is configured to drive and control the translation and landing of the integrating sphere testing module 20 to move the integrating sphere testing module 2 to be disposed above a predetermined number of the LEDs 40. The motor unit can be a servo motor or a stepping motor. As can be seen from the foregoing, the mass-produced light-emitting diode testing device of the present invention has the following advantages: 1. A plurality of light-emitting diodes can be covered at a time. After the LEDs disposed on the test board are driven in series, the electrical characteristics of each of the LEDs are simultaneously measured by a plurality of probes disposed on the LED. 1258590 Integral ball test module, transmissive, without the need to move the light to test the light-emitting diode of each-light-emitting diode release 3 · Simultaneously set the mutual confrontation, -, and test board, material - step to achieve The above-mentioned measurement of the integral sphere test module is only for the purpose of the present invention, and the scope of the patent of the present invention is limited. Therefore, for example, the content is not effective, and the present is the day-to-day transfer and the schema. To Chen Ming. 9 is included in the scope of the present invention [simple description of the schema]; Γ = Γ, is a schematic diagram of a conventional light-emitting diode device; the brother-picture is a schematic diagram of the invention; and Qian Faxian The third diagram of the diode testing device is shown as a schematic diagram of the main component symbol of the Wei-integrated ball device and the board corresponding to each other in the mt, production-type dimmer test device. Optical measuring instrument light output light emitting diode 11 test device central processing unit 20a 22a 30a conventional light emitting diode testing device control unit i〇a optical input port 21a electrical wheeling 23a mass production type light emitting diode of the present invention Control module 10 11 1258590 Communication interface unit 12 Software module integrating sphere test module 20 Optical input port Electrical output port 22 Optical output port test board 30 Light-emitting diode stable current source 50 Motor unit 1321 23 40 60
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