TWI238174B - Absorbing compounds for spin-on-glass anti-reflective coatings for photolithography - Google Patents
Absorbing compounds for spin-on-glass anti-reflective coatings for photolithography Download PDFInfo
- Publication number
- TWI238174B TWI238174B TW090117454A TW90117454A TWI238174B TW I238174 B TWI238174 B TW I238174B TW 090117454 A TW090117454 A TW 090117454A TW 90117454 A TW90117454 A TW 90117454A TW I238174 B TWI238174 B TW I238174B
- Authority
- TW
- Taiwan
- Prior art keywords
- compound
- group
- patent application
- item
- absorbing
- Prior art date
Links
- 150000001875 compounds Chemical class 0.000 title claims abstract description 50
- 239000011521 glass Substances 0.000 title claims abstract description 34
- 239000006117 anti-reflective coating Substances 0.000 title abstract description 5
- 238000000206 photolithography Methods 0.000 title abstract description 4
- -1 acetoxysilicon compound Chemical class 0.000 claims abstract description 36
- 238000000034 method Methods 0.000 claims abstract description 31
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims abstract description 24
- 239000001301 oxygen Substances 0.000 claims abstract description 8
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 8
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 6
- 239000000203 mixture Substances 0.000 claims description 22
- 229920000642 polymer Polymers 0.000 claims description 21
- 238000004528 spin coating Methods 0.000 claims description 20
- 238000010521 absorption reaction Methods 0.000 claims description 17
- 238000000576 coating method Methods 0.000 claims description 15
- 239000011248 coating agent Substances 0.000 claims description 14
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 13
- 239000002904 solvent Substances 0.000 claims description 12
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 claims description 11
- 229910052710 silicon Inorganic materials 0.000 claims description 11
- CPUDPFPXCZDNGI-UHFFFAOYSA-N triethoxy(methyl)silane Chemical compound CCO[Si](C)(OCC)OCC CPUDPFPXCZDNGI-UHFFFAOYSA-N 0.000 claims description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 10
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 claims description 10
- 239000000376 reactant Substances 0.000 claims description 10
- 239000010703 silicon Substances 0.000 claims description 10
- 239000008199 coating composition Substances 0.000 claims description 9
- 150000004678 hydrides Chemical class 0.000 claims description 9
- 239000002253 acid Substances 0.000 claims description 8
- 239000011541 reaction mixture Substances 0.000 claims description 8
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 claims description 6
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 claims description 6
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 claims description 5
- 229910017604 nitric acid Inorganic materials 0.000 claims description 5
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 5
- 239000006227 byproduct Substances 0.000 claims description 4
- JJQZDUKDJDQPMQ-UHFFFAOYSA-N dimethoxy(dimethyl)silane Chemical compound CO[Si](C)(C)OC JJQZDUKDJDQPMQ-UHFFFAOYSA-N 0.000 claims description 4
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 4
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 claims description 4
- LFQCEHFDDXELDD-UHFFFAOYSA-N tetramethyl orthosilicate Chemical compound CO[Si](OC)(OC)OC LFQCEHFDDXELDD-UHFFFAOYSA-N 0.000 claims description 4
- 125000000217 alkyl group Chemical group 0.000 claims description 3
- 125000003118 aryl group Chemical group 0.000 claims description 3
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 claims description 3
- 238000010304 firing Methods 0.000 claims description 3
- 239000001257 hydrogen Substances 0.000 claims description 3
- 229910052739 hydrogen Inorganic materials 0.000 claims description 3
- 239000005055 methyl trichlorosilane Substances 0.000 claims description 3
- JLUFWMXJHAVVNN-UHFFFAOYSA-N methyltrichlorosilane Chemical compound C[Si](Cl)(Cl)Cl JLUFWMXJHAVVNN-UHFFFAOYSA-N 0.000 claims description 3
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 claims description 3
- 150000003377 silicon compounds Chemical class 0.000 claims description 3
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 claims description 3
- ZNOCGWVLWPVKAO-UHFFFAOYSA-N trimethoxy(phenyl)silane Chemical compound CO[Si](OC)(OC)C1=CC=CC=C1 ZNOCGWVLWPVKAO-UHFFFAOYSA-N 0.000 claims description 3
- 239000005046 Chlorosilane Substances 0.000 claims description 2
- 150000001335 aliphatic alkanes Chemical class 0.000 claims description 2
- 125000001309 chloro group Chemical group Cl* 0.000 claims description 2
- JEZFASCUIZYYEV-UHFFFAOYSA-N chloro(triethoxy)silane Chemical compound CCO[Si](Cl)(OCC)OCC JEZFASCUIZYYEV-UHFFFAOYSA-N 0.000 claims description 2
- NPVQBEIMNWDKEU-UHFFFAOYSA-N chloromethoxy-dimethoxy-phenylsilane Chemical compound ClCO[Si](OC)(OC)C1=CC=CC=C1 NPVQBEIMNWDKEU-UHFFFAOYSA-N 0.000 claims description 2
- KOPOQZFJUQMUML-UHFFFAOYSA-N chlorosilane Chemical class Cl[SiH3] KOPOQZFJUQMUML-UHFFFAOYSA-N 0.000 claims description 2
- KTQYJQFGNYHXMB-UHFFFAOYSA-N dichloro(methyl)silicon Chemical compound C[Si](Cl)Cl KTQYJQFGNYHXMB-UHFFFAOYSA-N 0.000 claims description 2
- ZZNQQQWFKKTOSD-UHFFFAOYSA-N diethoxy(diphenyl)silane Chemical compound C=1C=CC=CC=1[Si](OCC)(OCC)C1=CC=CC=C1 ZZNQQQWFKKTOSD-UHFFFAOYSA-N 0.000 claims description 2
- IJKVHSBPTUYDLN-UHFFFAOYSA-N dihydroxy(oxo)silane Chemical compound O[Si](O)=O IJKVHSBPTUYDLN-UHFFFAOYSA-N 0.000 claims description 2
- AHUXYBVKTIBBJW-UHFFFAOYSA-N dimethoxy(diphenyl)silane Chemical compound C=1C=CC=CC=1[Si](OC)(OC)C1=CC=CC=C1 AHUXYBVKTIBBJW-UHFFFAOYSA-N 0.000 claims description 2
- LIKFHECYJZWXFJ-UHFFFAOYSA-N dimethyldichlorosilane Chemical compound C[Si](C)(Cl)Cl LIKFHECYJZWXFJ-UHFFFAOYSA-N 0.000 claims description 2
- YYLGKUPAFFKGRQ-UHFFFAOYSA-N dimethyldiethoxysilane Chemical compound CCO[Si](C)(C)OCC YYLGKUPAFFKGRQ-UHFFFAOYSA-N 0.000 claims description 2
- NOKUWSXLHXMAOM-UHFFFAOYSA-N hydroxy(phenyl)silicon Chemical class O[Si]C1=CC=CC=C1 NOKUWSXLHXMAOM-UHFFFAOYSA-N 0.000 claims description 2
- 239000005048 methyldichlorosilane Substances 0.000 claims description 2
- KBXJHRABGYYAFC-UHFFFAOYSA-N octaphenylsilsesquioxane Chemical compound O1[Si](O2)(C=3C=CC=CC=3)O[Si](O3)(C=4C=CC=CC=4)O[Si](O4)(C=5C=CC=CC=5)O[Si]1(C=1C=CC=CC=1)O[Si](O1)(C=5C=CC=CC=5)O[Si]2(C=2C=CC=CC=2)O[Si]3(C=2C=CC=CC=2)O[Si]41C1=CC=CC=C1 KBXJHRABGYYAFC-UHFFFAOYSA-N 0.000 claims description 2
- 150000004756 silanes Chemical class 0.000 claims description 2
- 239000011877 solvent mixture Substances 0.000 claims description 2
- 238000003756 stirring Methods 0.000 claims description 2
- ZDHXKXAHOVTTAH-UHFFFAOYSA-N trichlorosilane Chemical compound Cl[SiH](Cl)Cl ZDHXKXAHOVTTAH-UHFFFAOYSA-N 0.000 claims description 2
- 239000005052 trichlorosilane Substances 0.000 claims description 2
- QQQSFSZALRVCSZ-UHFFFAOYSA-N triethoxysilane Chemical compound CCO[SiH](OCC)OCC QQQSFSZALRVCSZ-UHFFFAOYSA-N 0.000 claims description 2
- YUYCVXFAYWRXLS-UHFFFAOYSA-N trimethoxysilane Chemical compound CO[SiH](OC)OC YUYCVXFAYWRXLS-UHFFFAOYSA-N 0.000 claims description 2
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 claims 3
- WIHMGGWNMISDNJ-UHFFFAOYSA-N 1,1-dichloropropane Chemical compound CCC(Cl)Cl WIHMGGWNMISDNJ-UHFFFAOYSA-N 0.000 claims 1
- CASYTJWXPQRCFF-UHFFFAOYSA-N 2-chloroethyl(trimethoxy)silane Chemical compound CO[Si](OC)(OC)CCCl CASYTJWXPQRCFF-UHFFFAOYSA-N 0.000 claims 1
- PKNXECFWMCLFIG-UHFFFAOYSA-N C1=CC=C(C=C1)C2=CC3=CC=CC4=C3C5=C(C=C4)C(=C(C(=C25)Cl)Cl)Cl Chemical compound C1=CC=C(C=C1)C2=CC3=CC=CC4=C3C5=C(C=C4)C(=C(C(=C25)Cl)Cl)Cl PKNXECFWMCLFIG-UHFFFAOYSA-N 0.000 claims 1
- DHXVGJBLRPWPCS-UHFFFAOYSA-N Tetrahydropyran Chemical compound C1CCOCC1 DHXVGJBLRPWPCS-UHFFFAOYSA-N 0.000 claims 1
- JCJNNHDZTLRSGN-UHFFFAOYSA-N anthracen-9-ylmethanol Chemical compound C1=CC=C2C(CO)=C(C=CC=C3)C3=CC2=C1 JCJNNHDZTLRSGN-UHFFFAOYSA-N 0.000 claims 1
- 229950005499 carbon tetrachloride Drugs 0.000 claims 1
- FPOSCXQHGOVVPD-UHFFFAOYSA-N chloromethyl(trimethoxy)silane Chemical compound CO[Si](CCl)(OC)OC FPOSCXQHGOVVPD-UHFFFAOYSA-N 0.000 claims 1
- 229920001577 copolymer Polymers 0.000 claims 1
- MTKPOFJUULWZNU-UHFFFAOYSA-N ethoxysilicon Chemical compound CCO[Si] MTKPOFJUULWZNU-UHFFFAOYSA-N 0.000 claims 1
- 150000002431 hydrogen Chemical group 0.000 claims 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims 1
- 239000004575 stone Substances 0.000 claims 1
- JCVQKRGIASEUKR-UHFFFAOYSA-N triethoxy(phenyl)silane Chemical compound CCO[Si](OCC)(OCC)C1=CC=CC=C1 JCVQKRGIASEUKR-UHFFFAOYSA-N 0.000 claims 1
- 239000000463 material Substances 0.000 abstract description 23
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 abstract description 10
- 238000004519 manufacturing process Methods 0.000 abstract description 7
- 238000006243 chemical reaction Methods 0.000 abstract description 5
- 150000002170 ethers Chemical class 0.000 abstract description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 abstract 2
- 230000002194 synthesizing effect Effects 0.000 abstract 1
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 18
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 17
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 15
- 238000002360 preparation method Methods 0.000 description 9
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 8
- 239000010408 film Substances 0.000 description 8
- 229920002120 photoresistant polymer Polymers 0.000 description 8
- 239000000975 dye Substances 0.000 description 7
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 6
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 6
- 229910000077 silane Inorganic materials 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 5
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- OFBQJSOFQDEBGM-UHFFFAOYSA-N Pentane Chemical compound CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- 150000001298 alcohols Chemical class 0.000 description 3
- 230000002051 biphasic effect Effects 0.000 description 3
- 239000008367 deionised water Substances 0.000 description 3
- 229910021641 deionized water Inorganic materials 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- FENFUOGYJVOCRY-UHFFFAOYSA-N 1-propoxypropan-2-ol Chemical compound CCCOCC(C)O FENFUOGYJVOCRY-UHFFFAOYSA-N 0.000 description 2
- 206010001513 AIDS related complex Diseases 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 2
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 2
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 2
- AMQJEAYHLZJPGS-UHFFFAOYSA-N N-Pentanol Chemical compound CCCCCO AMQJEAYHLZJPGS-UHFFFAOYSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 239000002318 adhesion promoter Substances 0.000 description 2
- 210000002945 adventitial reticular cell Anatomy 0.000 description 2
- RDOXTESZEPMUJZ-UHFFFAOYSA-N anisole Chemical compound COC1=CC=CC=C1 RDOXTESZEPMUJZ-UHFFFAOYSA-N 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- ZDOBWJOCPDIBRZ-UHFFFAOYSA-N chloromethyl(triethoxy)silane Chemical compound CCO[Si](CCl)(OCC)OCC ZDOBWJOCPDIBRZ-UHFFFAOYSA-N 0.000 description 2
- 239000003085 diluting agent Substances 0.000 description 2
- CWAFVXWRGIEBPL-UHFFFAOYSA-N ethoxysilane Chemical compound CCO[SiH3] CWAFVXWRGIEBPL-UHFFFAOYSA-N 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 description 2
- 230000031700 light absorption Effects 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- BBEAQIROQSPTKN-UHFFFAOYSA-N pyrene Chemical compound C1=CC=C2C=CC3=CC=CC4=CC=C1C2=C43 BBEAQIROQSPTKN-UHFFFAOYSA-N 0.000 description 2
- 238000010992 reflux Methods 0.000 description 2
- NHGXDBSUJJNIRV-UHFFFAOYSA-M tetrabutylammonium chloride Chemical compound [Cl-].CCCC[N+](CCCC)(CCCC)CCCC NHGXDBSUJJNIRV-UHFFFAOYSA-M 0.000 description 2
- AFILDYMJSTXBAR-UHFFFAOYSA-N (4-chlorophenyl)-triethoxysilane Chemical compound CCO[Si](OCC)(OCC)C1=CC=C(Cl)C=C1 AFILDYMJSTXBAR-UHFFFAOYSA-N 0.000 description 1
- DURPTKYDGMDSBL-UHFFFAOYSA-N 1-butoxybutane Chemical compound CCCCOCCCC DURPTKYDGMDSBL-UHFFFAOYSA-N 0.000 description 1
- IKBFHCBHLOZDKH-UHFFFAOYSA-N 2-chloroethyl(triethoxy)silane Chemical compound CCO[Si](CCCl)(OCC)OCC IKBFHCBHLOZDKH-UHFFFAOYSA-N 0.000 description 1
- LDMRLRNXHLPZJN-UHFFFAOYSA-N 3-propoxypropan-1-ol Chemical compound CCCOCCCO LDMRLRNXHLPZJN-UHFFFAOYSA-N 0.000 description 1
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 1
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 1
- FNIZXUBJAVDTEM-UHFFFAOYSA-N C(C)O[SiH3].C1(=CC=CC=C1)[SiH2][SiH2][SiH3] Chemical compound C(C)O[SiH3].C1(=CC=CC=C1)[SiH2][SiH2][SiH3] FNIZXUBJAVDTEM-UHFFFAOYSA-N 0.000 description 1
- KUGJPIQTQADFFK-UHFFFAOYSA-N C(C)O[SiH3].C[SiH](O[SiH3])C Chemical compound C(C)O[SiH3].C[SiH](O[SiH3])C KUGJPIQTQADFFK-UHFFFAOYSA-N 0.000 description 1
- QEPMVDDGACXEKY-UHFFFAOYSA-N C(C)O[Si].[Si] Chemical compound C(C)O[Si].[Si] QEPMVDDGACXEKY-UHFFFAOYSA-N 0.000 description 1
- WAJPELQLZAXDJW-UHFFFAOYSA-N C(C)[Si](OC)(OC)OC.[Cl] Chemical compound C(C)[Si](OC)(OC)OC.[Cl] WAJPELQLZAXDJW-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- XTHFKEDIFFGKHM-UHFFFAOYSA-N Dimethoxyethane Chemical compound COCCOC XTHFKEDIFFGKHM-UHFFFAOYSA-N 0.000 description 1
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 235000010254 Jasminum officinale Nutrition 0.000 description 1
- 240000005385 Jasminum sambac Species 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 239000004721 Polyphenylene oxide Substances 0.000 description 1
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 1
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 1
- 240000008866 Ziziphus nummularia Species 0.000 description 1
- TVJPBVNWVPUZBM-UHFFFAOYSA-N [diacetyloxy(methyl)silyl] acetate Chemical compound CC(=O)O[Si](C)(OC(C)=O)OC(C)=O TVJPBVNWVPUZBM-UHFFFAOYSA-N 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 230000002745 absorbent Effects 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- KXKVLQRXCPHEJC-UHFFFAOYSA-N acetic acid trimethyl ester Natural products COC(C)=O KXKVLQRXCPHEJC-UHFFFAOYSA-N 0.000 description 1
- OSWRVYBYIGOAEZ-UHFFFAOYSA-N acetic acid;2-hydroxypropanoic acid Chemical compound CC(O)=O.CC(O)C(O)=O OSWRVYBYIGOAEZ-UHFFFAOYSA-N 0.000 description 1
- KLUDQUOLAFVLOL-UHFFFAOYSA-N acetyl propanoate Chemical compound CCC(=O)OC(C)=O KLUDQUOLAFVLOL-UHFFFAOYSA-N 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 125000003545 alkoxy group Chemical group 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 125000003277 amino group Chemical group 0.000 description 1
- 150000008064 anhydrides Chemical class 0.000 description 1
- XCCCHWWMLSAIOH-UHFFFAOYSA-N anthracen-1-ylmethanol Chemical compound C1=CC=C2C=C3C(CO)=CC=CC3=CC2=C1 XCCCHWWMLSAIOH-UHFFFAOYSA-N 0.000 description 1
- 150000001454 anthracenes Chemical class 0.000 description 1
- 230000003064 anti-oxidating effect Effects 0.000 description 1
- 230000003667 anti-reflective effect Effects 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 150000001721 carbon Chemical group 0.000 description 1
- 125000002843 carboxylic acid group Chemical group 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 235000013339 cereals Nutrition 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- CBVJWBYNOWIOFJ-UHFFFAOYSA-N chloro(trimethoxy)silane Chemical compound CO[Si](Cl)(OC)OC CBVJWBYNOWIOFJ-UHFFFAOYSA-N 0.000 description 1
- 238000000276 deep-ultraviolet lithography Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- MROCJMGDEKINLD-UHFFFAOYSA-N dichlorosilane Chemical compound Cl[SiH2]Cl MROCJMGDEKINLD-UHFFFAOYSA-N 0.000 description 1
- ZMAPKOCENOWQRE-UHFFFAOYSA-N diethoxy(diethyl)silane Chemical compound CCO[Si](CC)(CC)OCC ZMAPKOCENOWQRE-UHFFFAOYSA-N 0.000 description 1
- GAURFLBIDLSLQU-UHFFFAOYSA-N diethoxy(methyl)silicon Chemical compound CCO[Si](C)OCC GAURFLBIDLSLQU-UHFFFAOYSA-N 0.000 description 1
- POLCUAVZOMRGSN-UHFFFAOYSA-N dipropyl ether Chemical compound CCCOCCC POLCUAVZOMRGSN-UHFFFAOYSA-N 0.000 description 1
- PZPGRFITIJYNEJ-UHFFFAOYSA-N disilane Chemical compound [SiH3][SiH3] PZPGRFITIJYNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229940116333 ethyl lactate Drugs 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- GVEPBJHOBDJJJI-UHFFFAOYSA-N fluoranthrene Natural products C1=CC(C2=CC=CC=C22)=C3C2=CC=CC3=C1 GVEPBJHOBDJJJI-UHFFFAOYSA-N 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 238000007429 general method Methods 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 210000004185 liver Anatomy 0.000 description 1
- 239000006166 lysate Substances 0.000 description 1
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 1
- UZKWTJUDCOPSNM-UHFFFAOYSA-N methoxybenzene Substances CCCCOC=C UZKWTJUDCOPSNM-UHFFFAOYSA-N 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- YKYONYBAUNKHLG-UHFFFAOYSA-N n-Propyl acetate Natural products CCCOC(C)=O YKYONYBAUNKHLG-UHFFFAOYSA-N 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000012454 non-polar solvent Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000005054 phenyltrichlorosilane Substances 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 239000002798 polar solvent Substances 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 239000003755 preservative agent Substances 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- 229940090181 propyl acetate Drugs 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- FDNAPBUWERUEDA-UHFFFAOYSA-N silicon tetrachloride Chemical compound Cl[Si](Cl)(Cl)Cl FDNAPBUWERUEDA-UHFFFAOYSA-N 0.000 description 1
- 125000003808 silyl group Chemical group [H][Si]([H])([H])[*] 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000001117 sulphuric acid Substances 0.000 description 1
- 235000011149 sulphuric acid Nutrition 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- ZOYFEXPFPVDYIS-UHFFFAOYSA-N trichloro(ethyl)silane Chemical compound CC[Si](Cl)(Cl)Cl ZOYFEXPFPVDYIS-UHFFFAOYSA-N 0.000 description 1
- ORVMIVQULIKXCP-UHFFFAOYSA-N trichloro(phenyl)silane Chemical compound Cl[Si](Cl)(Cl)C1=CC=CC=C1 ORVMIVQULIKXCP-UHFFFAOYSA-N 0.000 description 1
- PPDADIYYMSXQJK-UHFFFAOYSA-N trichlorosilicon Chemical group Cl[Si](Cl)Cl PPDADIYYMSXQJK-UHFFFAOYSA-N 0.000 description 1
- 238000000233 ultraviolet lithography Methods 0.000 description 1
- NQPDZGIKBAWPEJ-UHFFFAOYSA-N valeric acid Chemical compound CCCCC(O)=O NQPDZGIKBAWPEJ-UHFFFAOYSA-N 0.000 description 1
- 235000021419 vinegar Nutrition 0.000 description 1
- 239000000080 wetting agent Substances 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/42—Block-or graft-polymers containing polysiloxane sequences
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D4/00—Coating compositions, e.g. paints, varnishes or lacquers, based on organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond ; Coating compositions, based on monomers of macromolecular compounds of groups C09D183/00 - C09D183/16
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/28—Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material
- C03C17/30—Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material with silicon-containing compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/02—Silicon compounds
- C07F7/08—Compounds having one or more C—Si linkages
- C07F7/18—Compounds having one or more C—Si linkages as well as one or more C—O—Si linkages
- C07F7/1804—Compounds having Si-O-C linkages
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31652—Of asbestos
- Y10T428/31663—As siloxane, silicone or silane
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Wood Science & Technology (AREA)
- Geochemistry & Mineralogy (AREA)
- General Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Silicon Polymers (AREA)
- Paints Or Removers (AREA)
- Surface Treatment Of Glass (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Description
1238174 A7 — --- B7 五、發明説明(1 ~'—"—-~~—~— 技術領域 本發明-般係關於破璃上之吸光旋塗材料,尤其是關於可 〇到玻璃上旋塗材料巾,用作光微影巾之抗反射層之吸光 化合物,及吸光化合物之製造方法。 背景 / 為付合更快速效能之需求,需持績的降低積體電路裝置之 零件之特定尺寸。較小零件尺寸裝置之製造對許多一般用 於半導體製造之製程產生新的挑戰。此等製造製程之最重 要之一為光微影。 長久以來均了解光微影產生之直線寬度變化可由自半導體 晶圓上之底層光反射出產生之光干涉造成。由於下層型態 所導致光阻厚度之改變亦導致直線寬度之改變。在光阻層 之下塗佈抗反射塗層(ARC)曾用於防止輻射束反射之干擾。 另外,抗氧化塗層使晶圓型態部分平坦化,因為光阻厚度 更均句,因此可協助改善步驟中線寬度之變化。 有機聚合物膜,尤其是在i-線(365奈米)及g-線(436奈米) 波長處吸光者經常用於曝曬光阻劑,且最近已使用248奈米 波長處吸光者當作抗反射塗層。然而,具有許多與有機光 阻劑相同化學性質之有機ARC會限制可用之製程順序。再者 ,有機ARC可能與光阻層混合。避免混合之一方法為導入熱 固性結合劑當作有機ARC之額外成分,例如Flaim等人之美 國專利第5,693,691號中之敘述。有機ARC中亦可添加染料, 以及選用之其他添加劑,如潤濕劑、黏著促進劑、防腐劑 、及可塑劑,如Arnold等人之美國專利第4,91〇,122號中所述 -4- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐)
裝
1238174 A7 B7 五、發明説明(2 氧基氮化矽為曾用作抗反射塗層之另一種材料。然而,氧 基氮化矽以解構干涉製程用作ARC更甚於吸收,亦即需極嚴 格的控制氧基氮化物之厚度,且該材料在高度變化之型態 上無法完全用作ARC。再者,氧基氮化矽一般係以化學蒸氣 沉積沉積,但光阻層一般係使用旋塗塗佈器塗佈。其他化 學蒸氣沉積法會增加製程之複雜度。 又另一類可用作抗反射層之物質為含染料之在玻璃上旋塗 (SOG)組合物。Yau等人之美國專利第4,587,138號中揭示一 種與量約1重量%之玻璃上旋塗混合之基本黃# 1 1染料。 Allman等人之美國專利第5,100,503號揭示一種含無機染料, 如Ti02、Cr2〇7、Μο04、Μη04、或Sc04及黏著促進劑之交聯 聚有機硬氧燒。Allman另外教示亦當作偏極化層之玻璃上旋 塗組合物。然而,迄今為止揭示之玻璃上旋塗、染料結合 物無法適當的曝曬於可用於製造小尺寸裝置之深紫外線, 尤其是248及193奈米之光源中。另外,並非所有染料均可加 到任意之玻璃上旋塗組合物中。 因此仍需要在深紫外線光譜區中可強力吸收,且可加到玻 璃上旋塗組合物中,得到抗反射塗層之化合物,及製備該 吸收化合物之方法。 發明概要 深紫外線光微影用之抗反射塗層材料包含一種或多種加到 玻璃上旋塗(SOG)材料中之有機吸收化合物。依據本發明之 較佳具體例,係使用經由氧键聯與莕或蒽發色團相連之包 -5- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) ^238174 A7 B7 五、發明説明(4 ) 一一"一一~ 物中 < 玻璃上旋塗材料之塗料溶液係用於在積體電路裝置 之各層中形成抗反射薄膜。 依據本發明之另一目的,亦提供一種製備包含吸光醚化合 物之吸收玻璃上旋塗組合物之方法。 附圖之簡要敘述 圖1敛述依據本發明之聚體例,使用甲基三乙醯氧基矽烷 製備9 -恩甲氧基_甲基二乙氧基矽烷之方法。 發明之詳細敘述 冰紫外線光微影用之抗反射塗層材料包含一種或多種加到 玻璃上旋塗(SOG)材料中之有機吸收化合物。該吸光之玻璃 上旋塗組合物溶於適當溶劑中,形成塗料溶液,且塗佈於 製造半導體裝置之各材料層上。吸光玻璃上旋塗之抗反射 圖W經設計成可輕易的整合到現有之半導體製造製程中。 得到整合之性質包含顯像劑抗性、標準光阻製程過程中之 熱安定性、及對下層之選擇性移除。 彳夕以奈及恩為主之化合物在2 4 8奈米及更低下均明顯的 吸光。以苯為主(在本文中相當於以苯基為主)之化合物在波 長低於200奈米下明顯的吸光。雖然此等以僚、蒽及苯為主 (化合物通稱之為染料,但在此處使用吸收化合物之詞, 因為此等化合物之吸光並不限於波長在光譜之可見光區中 。然而’並非所有此種吸收化合物均可加到用作ARC材料之 玻璃上旋塗中。本發明中適用之吸收化合物,其吸收峰之 寬度在可用作微影之波長範圍,如248奈米、193奈米或其他 紫外線波長如365奈米,至少為10奈米。在此等波長下僅具 本紙張尺度適财_家標準(CNS) M規格(2iQx297公菱) 1238174 A7 B7 五、發明説明(5 ) 有狹窄之吸收峰,例如少於2奈米寬,之吸收化合物並非如 所需。 適當吸收化合物之發色團一般具有一個、二個或三個可能 會或可能不會稠合之苯環。可添加之吸收化合物具有與發 色團相連之可用反應基,該反應基包含羥基、胺基、羧酸 基、及具有與一、二或三個 ''離去基〃(如烷氧基或函素原 子)鍵結之經取代甲矽烷基。乙氧基或甲氧基或氯原子為經 常使用之離去基。因此,適用之反應基包含矽乙氧基、矽 二乙氧基、矽三乙氧基、矽甲氧基、矽二甲氧基、矽三甲 氧基、氯甲矽烷基、二氯甲矽烷基、及三氯甲矽烷基。玻 璃上旋塗組合物用之可添加吸收化合物之特定實例敘述於 美國專利申請案系列編號第09/491,166號中,其係與本申請 案一起讓度,且在此提出供參考。具有一個或多個與碎键 結之乙氧基之反應基經發現較佳,尤其是對於提昇吸收SOG 薄膜之熱安定性。 依據本發明之目的,可添加之吸收化合物包含以氧键結, 與莕或蒽發色團相連之當作反應性基之矽乙氧基、矽二乙 氧基或矽三乙氧基類。因此,本發明之吸收化合物為似醚 狀(若吸收化合物中之矽原子以碳原子取代,則化合物之分 類為醚)。化合物之一般結構為
-8- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 1238174 A7 B7 五、發明説明(6 其中n=l-3,111 = 0- 2 ’且R為氳化燒基如甲基、乙基、或 丙基。結構.1及2說明之化合物其中之反應基矽在特殊之位 置與發色團相連。其中之反應基再另一位置相連之類似化 合物均以一般式 C14H9(CH2)nOSiRm(OC2H5)3.m 或 C10H8(CH2)nOSiRm(OC2H5)3-m敘述,且均包含在本發明中。 製備結構式1及2之吸光似醚化合物之方法係以在醇存在 下,使醇取代之稠合環發色團與乙醯氧基矽化合物之反應 為主。乙醯氧基矽反應物之一般式為RmSi(OCOCH3)4_m,其 中R之定義如上。所用乙醯氧基矽之特殊實例包含甲基三乙 醯氧基矽烷(MTAS)、四乙醯氧基矽烷(TAS)、二甲基二乙 醯氧基矽烷及二乙基二乙醯氧基矽烷。所用之醇包含甲醇 、乙醇及丙醇。 例如製備下式之9 -蒽甲氧基-甲基二乙氧基矽烷3
裝.
係使用莫爾比為i : 1 : 2之9-蒽曱醇、MTAS及乙醇當作 反應物。由圖1中之反應機構可了解到,MTAS中之乙酿氧 基與9-E甲醇中之-CH2〇H反應,形成與含矽之反應基及乙 酸間之_鍵聯,同時MTAS中之二乙醯氧基與乙醇反應,形 本紙張尺度1Α4_(21() χ 29ϋ 1238174 A7 --— __ B7 五、發明説明(7 ) *—"" 成乙氧基及乙酸。依該製備方法,反應物係與丙酮或其他 同類,如甲基異丁基酮(MIBK)或甲乙酮合併,形成反應混 合物’其再授拌至足以形成產物3之時間(一般為數天),接 著藉由充惰性氣體或真空萃取移除乙酸副產物。由該反應 機構可了解一般而言,醇取代之熔化環化合物與乙醯氧基 碎化合物(RmSi(〇COCH3)4_m)及醇之比為i : i : 3_m。 吸光之似醚化合物可添加於包含甲基矽氧烷、甲基矽倍半 氧烷、苯基矽氧烷、苯基矽倍半氧烷、甲基苯基矽氧烷、 甲基苯基矽倍半氧烷及矽酸酯聚合物之玻璃上旋塗材料 中。至於此處所用之玻璃上旋塗材料亦包含一般式(H〇_ i.〇Si〇i.5-2.G)x之氫矽氧烷聚合物及式(HSiC)i 5)χ之氫矽倍半氧 烷永合物(其中之X大於約8 )。亦包含者為烷基氫化物基矽 氧烷或羥基氫化物基矽氧烷。玻璃上旋塗之材料另包含一 般式(Ho-uSiO^2 G)n(R’G1 GSi〇i 5 2止之有機氫化物基矽氧 烷聚合物,及一般式為(Hsi〇i5)n(R,si〇i5)n^有機氫化物基 矽倍半氧烷聚合物(·其大於〇,且m&n之總合約大於8, 且R,為烷基或芳基)。部分使用之有機氫化物基矽烷聚合物 足η與m總合約為8至約5〇〇〇,且R,為Ci_c2❹烷基或C6_Ci2芳 基。有機氫化物基矽氧烷及有機氫化物基矽倍半氧烷 物可交互代表聚合物上之旋塗。特^之實例包含甲基氣㈣ 基矽氧烷、乙基氫化物基矽氧烷、丙基氫化物基矽氧燒、第 三-丁基氫化物基矽氧烷、苯基氫化物基矽氧烷、〒基氫化 物基矽倍半氧烷、乙基氫化物基矽倍半氧烷、丙基氫化物基 矽倍半氧烷、第三-丁基氫化物基矽倍半氧烷、苯基氫化物 -10-
1238174 A7 B7 五、發明説明(8 ) 基矽倍半氧烷及其合併物。 吸光玻璃上旋塗組合物中,吸收化合物可間斷的加到玻璃 上旋塗基質中。另外,吸收化合物係與玻璃上旋塗聚合物 化學鍵結。在不受任何理論限制下,本發明者建議可添加 吸收化合物經由可用之反應基與玻璃上旋塗聚合物主鏈键 結可得到有利之結果。 玻璃上旋塗材料一般係由各種梦燒反應物製備,包含例如 三乙氧基矽烷(HTEOS)、四乙氧基矽烷(TEOS)、甲基三乙 氧基矽烷(MTEOS)、二甲基二乙氧基矽烷、二甲基二甲氧 基矽烷、四甲氧基矽烷(TMOS)、甲基三甲氧基矽烷 (MTMOS)、三甲氧基矽烷、二甲基二甲氧基矽烷、苯基三 乙氧基矽烷(PTEOS)、苯基三甲氧基矽烷(PTMOS)、二苯基 二乙氧基矽烷、及二苯基二甲氧基矽烷。齒矽烷尤其是氯 矽烷,如三氯矽烷、甲基三氯矽烷、乙基三氯矽烷、苯基 三氯矽烷、四氯矽烷;二氯矽烷、甲基二氯矽烷、二甲基 二氯矽烷、氯三乙氧基矽烷、氯三甲氧基矽烷、氯甲基三 乙氧基矽烷、氯乙基三乙氧基矽烷、氯苯基三乙氧基矽烷 、氯甲基三甲氧基矽烷、氯乙基三甲氧基矽烷、及氯苯基 三甲氧基矽烷亦可用作矽烷反應物。為製造玻璃上旋塗組 合物,吸收醚化合物,如結構式(1)或(2)或結構式(1)及/ 或(2 )之結合物及其他吸收化合物係在SOG材料製備過程中 與矽烷反應物合併。 製備吸光玻璃上旋塗組合物之一般方法中,反應槽中會形 成包含矽烷反應物,例如HTEOS、或TEOS及MTEOS、或 -11 - 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐)
裝.
1238174 五、發明説明(9
TMOS及MTMOS ;另外四备^ 力外四鼠矽烷及甲基三氯矽烷、一 多種吸收化合物;溶崎丨劣^ ^ 、 次/谷劑之結合物,及酸/水混合物之 反應混合物。適用之溶劑包 丙酮、2_丙醇、及其他轉輩 之醇類、賴、及醋類如h丙醇、mIBK、丙氧基丙醇、及 乙酸丙酉日㊃/ 混合物為例如硝酸及水。其他質子酸或酸 酐,如乙酸、甲酸、磷酸、鹽酸、或乙酸肝均可交互用於 酸混合物中。所得混合物維持在3〇至8〇。。間約424小時 ,至得吸光SOG聚合物溶液。 吸光SOG可以以適當之溶劑稀釋,得到產生各種厚度之膜 <塗料溶液。適當之稀釋劑溶亦包含丙酮、2_丙醇、乙醇 、丁醇、乙酸丙酉旨、乳酸乙酉旨、丙二醇、甲基酸乙 酸酯、及丙二醇丙基醚,市售稱之為Pr〇pas〇1_p。具有高沸 點之稀釋劑落劑經發現更有利,如乳酸乙酯及丙二醇丙基 醚。相#咼沸點落劑可降低形成氣泡膜缺陷之可能性。相 反的’較低、滞點之溶劑會包在薄膜之交連上層之下,接著 在烘烤製程步驟中.驅除時會產生孔隙。本發明中所用之其 他溶劑包含以二醇二甲基醚(另稱之為直鏈聚醚)、苯甲醚、 二丁基醚、二丙基醚、及戊醇。塗料溶液中亦可視情況添 加界面活性劑,如3M(Minneapolis,MN)提供之產物FC340 ’或DIC(日本)提供之產物Megaface R08。塗料溶液一般含 0.5至20重量%之聚合物。使用前,以標準過濾技術過濾塗 料溶液。 形成吸光有機氫化物基矽氧烷材料之方法包含形成包含非 及相溶劑及及性溶劑之雙相溶劑混合物及相轉移處媒之混 12- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 1238174 A7
奋物’添加一種或多種有機二 ’緣一 _矽烷、氫化物基三_矽烷 及一種或多種吸收化合物,搵 件到雙相反應混合物;且使雙 相反應混合物反應1至2 4小换 μ , 广、 、’件到吸光之有機氫化物基碎 氧I $元聚合物。包含相韓移觸拔 . 邳得秒觸媒,但並不限於氯化四丁基銨 及氯化Τ基三甲基铵。列裹令非4τ 11 , 幻举< 非極性溶劑包含(但不限)戊烷 、己烷、庚烷、環己燒、茉、 _ ^〜 ^ 甲枣、二甲苯,齒化之溶劑 如四氯化碳及其混合戊。所用之極性溶劑包含水、醇及醇 與水之混合物。吸光之聚合物溶液如上述般稀釋及過滤, 形成塗料溶液。 吸光之SOG塗料溶液係依據特定之製程,塗怖於用於半導 體製程之各層上’且一般係以傳統之旋塗沉積技術。此等 技術包含分佈旋塗、厚度旋塗及熱烘步驟,得到吸光s〇g抗 反射薄膜。一般之製程包含在1〇〇〇至4〇〇〇 rpm下厚度旋塗約 20秒鐘’且在8(TC至·。C間之溫度下進行三次烘烤步驟各 約一分鐘。如下列實例2所述,具有(3)之吸光醚之吸光 SOG抗反射薄膜呈現之消散係數大於〇18。 製備9 -蒽甲氧基-甲基二乙氧基矽烷3、9_蒽甲氧基-三乙 氧基矽烷及包含此等吸收化合物之吸光s〇G材料之方法救述 於下列實例中。 實例1 9-蒽甲氧基-甲基二乙氧基矽烷之製備 將92.37克(0.419莫爾)甲基三乙醯氧基矽烷(Μτα§)、 87.36克(0.419莫爾)9·蒽甲醇、38.56克(0.839莫爾)乙醇、 595.51克(10.20莫爾)丙酮合併於三升之瓶中。使溶液在氣氣 -13- 本紙張尺度適用中國國家標準(CNS) Α4規格(210X297公釐) 1238174 A7 ______________ B7 _____ 五、發¥説明 Γ""^ ~~~~~~~~~ ~~ ~ 中攪拌7天。溶液經除氣移除乙酸副產物。 實例2 含9 -蒽甲氧基·甲基二乙氧基矽烷之吸光s〇G之製備 將297克(4.798莫爾)2-丙醇、148克(2.558莫爾)丙酮、123 克(0.593 莫爾)TEOS、77 克(0.432莫爾)MTEOS、200克實例 1中製備之9-蒽甲氧基-甲基二乙氧基矽烷、261克(0.009莫 爾)玫紅酸、1 0克(0.024莫爾)2-羥基-4-(3-三乙氧基甲矽烷 基丙氧基)二苯基酮、〇·〇9克(0.0004莫爾)蒽黃酸、0.6克1.0 Μ硝酸及72克(3.716莫爾)去離子水合併於1升瓶中。使該瓶 回流4小時。溶液中添加43克(0.590莫爾)之丁醇。過濾溶 液。溶液經分配,接著以3000 rpm厚度旋塗20秒,且各在 8 0°C 及 180°C 下烘烤一分鐘。以 n&K Technology Model 1200 分析儀測量光學性質。薄膜厚度為2801埃。248奈米下之反 射係數(η)為1.470,且消散係數(k)為〇·185。 實例3 9 ·蒽甲氧基-三乙氧·基矽烷之製備 將110.73克(0.419莫爾)四乙醯氧基矽烷(TAS)、87.36克 (0.419莫爾)9_蒽曱醇、57.98克( 1.2585莫爾)乙醇、595.51克 (10.20莫爾)丙酮合併於3升瓶中。使溶液在氮氣中揽拌7天 。所得溶液除氣移除乙酸副產物。 實例4 含9-蒽甲氧基-三乙氧基矽烷之吸光s〇G溶液之製備 將297克(4.798莫爾)2_丙醇、148克(2.558莫爾)丙酮' 123 克(〇·593 莫爾)TEOS、77 克(0.432莫爾)MTEOS、200克實例 -14 - 本紙張尺度適用中國國家標準(CNS) Α4規格(210 X 297公釐) 1238174 A7 -~ B7 五、{ 12 ) — _ --— 3中製備之9·®甲氧基三乙氧基㈣、G.6jU()M硝酸及72 克(3.716莫爾)去離子水合併於!升瓶中。使帛瓶回流*小時 。溶液中添加43克(0.590莫爾)之丁醇。過濾溶液。 S 9 -蒽甲氧基-甲基二乙氧基石夕燒之吸光s〇G之製備 將297克(4.798莫爾)2_丙醇、148克(2.558莫爾)丙酮、123 克(0.593 莫爾)TEOS、77 克(0.432莫爾)MTEOS、200克實例 1中製備之9-¾甲氧基_甲基二乙氧基碎燒、〇6克1〇 %硝酸 及7 2克(3.716莫爾)去離子水合併於i升瓶中。使該瓶回流4 小時。溶液中添加43克(0.590莫爾)之丁醇。過濾溶液。 雖然本發明已參考特定之實例敘述,但此等實例僅為本發 明應用之實例,不應視同本發明之限制。揭示實例特性之 各種分離及合併均在下列申請專利範圍所定義之本發明申 請專利範圍中。 -15-本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公羡)
Claims (1)
- A8 B8 C8 ..JDB. 123 8 VMl 17454號專利申請案 中文申請專利範圍替換本(93年10月) 申請專利範圍 1 · 一種製備吸光似醚化合物之方法,該方法包括: 結合醇取代之稠合苯環化合物(該稠合之環化合物包 括二或三個環)、乙醯氧基矽化合物、醇、及溶劑,製 成反應混合物,其中乙醯氧基矽化合物之一般式為 RmSl(〇C〇CH3)4-m,其中R係為氫或一烷基,且m=〇-2 ’且其中之稠合環化合物、乙醯氧基矽化合物及醇係以 化學計量比1 : 1 : 3-m結合; 攪拌反應混合物至足以形成吸光醚化合物之時間;及 移除酸副產物。 2 ·如申請專利範圍第1項之方法,其中乙醯氧基矽化合物 之一般式為RmSi(OCOCH3)4_m,其中之R係選自由氳' 甲基、乙基、及丙基所組成之群,且^==0-2,且其中 之稠合環化合物、乙醯氧基矽化合物及醇係以化學計量 比1 · 1 · 3 - in結合。 3 ·如申請專利範圍第2項之方法,其中之乙醯氧基矽化合 物為甲基三乙醯氧基矽烷。 4 ·如申請專利範圍第2項之方法,其中之稠合環化合物為 9 -蒽甲醇。 5 _如申請專利範圍第2項之方法,其中之醇為乙醇。 6·如申請專利範圍第3項之方法,其中之高吸光醚化合物 為9 -蒽甲氧基-甲基二乙氧基矽烷。 7 * 一種吸光玻璃上旋塗之組合物,該組合物包括碎燒聚合 物及包括二或三個稠合苯環及與選自由矽乙氧基、石夕二 乙氧基、及矽三乙氧基所組成之群之含矽類鍵聯之氧之 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐)吸光似醚化合物。 8 •如申請專利範圍第7項之組合物,其中之吸光醚化合物之 般式為 C14H9(CH2)n〇SiRm(〇C2H5)3_m4c10H8(CH2)n〇SiRm(〇c2H5)3· m,其中n=i-3,m = 〇_2,且尺係選自由氫、甲基、乙 基及丙基所組成之群。 如申w專利範圍第8項之組合物,其中之吸光醚類化合 物為9-E甲氧基_甲基二乙氧基矽烷。 口 11 如申μ專利範圍第7項之組合物,其中之石夕氧燒聚合物 係選自由甲基矽氧烷、甲基矽倍半氧烷、苯基矽氧烷、 苯基矽倍半氧烷、甲基苯基矽氧烷、甲基苯基矽倍半氧 烷、及矽酸酯聚合物所組成之群之聚合物。 如申印專利範圍第7項之組合物,其中之矽氧烷聚合物 為選自由氫矽氧烷、氫矽倍半矽氧烷、有機氫化物基矽 氧烷、及有機氫化物基矽倍半氧烷聚合物,及氫矽倍半 氧烷及烷氧基氫化物基矽氧烷或羥基氫化物基矽氧烷所 組成之群之共聚物。 12·如申請專利範圍第u項之組合物,其中之矽氧烷聚合 物為具備選自由下列所組成之群之一般式之聚合物·· (Hw.〇Si〇m‘,其中之 X 大於 8,及(H〇 i 〇Si〇i 5_ ,其中m大於〇,且之她人 至5000,且R,為Cl-C2Q烷基或C6-Ci2芳基。 〜口 13. -種塗料溶液,纟包括如申請專利範圍第7項之組合物 及溶劑或溶劑混合物。 14·如申請專利範圍第13項之塗料溶液,其中溶液中之吸 2- 1238174 A8 B8 C8 ______ D8 六、申請專利範圍 光玻璃上旋塗組合物在〇·5%至2〇%(重量)之間。 1 5. —種製備吸光玻璃上旋塗組合物之方法,包括: 結合一種或多種選自由烷氧基矽烷及鹵矽烷所組成之 群之碎坑反應物,一種或多種可添加之有機吸收化合物 (且其中至少一種有機吸收化合物為包括二或三個稠合 苯環及與選自由矽乙氧基、矽二乙氧基、矽三乙氧基所 組成之群之含矽類鍵聯之氧之吸光醚化合物)、酸/水混 合物及一種或多種溶劑,形成反應混合物,及 使反應混合物維持在3 0至8 0 t:之溫度下,至足以形 成吸光玻璃上旋塗組合物之時間。 1 6 ·如申請專利範圍第1 5項之方法,其中之一種或多種矽 燒反應物係選自由三乙氧基石夕燒、四乙氧基石夕垸、甲基 三乙氧基矽烷、二甲基二乙氧基矽烷、二甲基二甲氧基 石夕燒、四甲氧基矽烷、甲基三甲氧基矽烷、三甲氧基矽 烷、二甲基二甲氧基矽烷、苯基三乙氧基矽烷、苯基三 甲氧基矽烷、二苯基二乙氧基矽烷、及二苯基二甲氧基 石夕燒。IS矽烷尤其是氯矽烷,如三氯矽烷、甲基三氯矽 k*、乙基二氯梦燒、苯基三氯碎燒、四氯石夕燒;二氯石夕 烷、甲基二氯矽烷、二甲基二氯矽烷、氯三乙氧基矽烷 、氯二甲氧基石夕燒、氯甲基三乙氧基石夕燒、氯乙基三乙 氧基石夕虎、氯苯基三乙氧基矽烷、氯甲基三甲氧基矽烷 、氯乙基三甲氧基矽烷、及氯苯基三甲氧基矽烷所組成 之群。 1 7 ·如申請專利範圍第1 6項之方法,其中之一種或多種硬 I_ '3· 本紙張尺度it财目S家標準(CNS) A4規格(210X297公羡) · --- 74 ΊΧ 8 3 2 8 8 8 8 A B c D 六、申請專利範圍 烷反應物為四乙氧基矽烷及甲基三乙氧基矽烷。 1 8 .如申請專利範圍第1 5項之方法,其中之酸/水混合物為 硝酸/水混合物。 -4- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/617,365 US6368400B1 (en) | 2000-07-17 | 2000-07-17 | Absorbing compounds for spin-on-glass anti-reflective coatings for photolithography |
Publications (1)
Publication Number | Publication Date |
---|---|
TWI238174B true TWI238174B (en) | 2005-08-21 |
Family
ID=24473372
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW090117454A TWI238174B (en) | 2000-07-17 | 2001-07-17 | Absorbing compounds for spin-on-glass anti-reflective coatings for photolithography |
TW093130882A TW200512257A (en) | 2000-07-17 | 2001-08-07 | Absorbing compounds for spin-on-glass anti-reflective coatings for photolithography |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093130882A TW200512257A (en) | 2000-07-17 | 2001-08-07 | Absorbing compounds for spin-on-glass anti-reflective coatings for photolithography |
Country Status (9)
Country | Link |
---|---|
US (3) | US6368400B1 (zh) |
EP (1) | EP1301569A4 (zh) |
JP (1) | JP2004504328A (zh) |
KR (1) | KR100804870B1 (zh) |
CN (1) | CN1296435C (zh) |
AU (1) | AU2001280558A1 (zh) |
CA (1) | CA2413726C (zh) |
TW (2) | TWI238174B (zh) |
WO (1) | WO2002006402A1 (zh) |
Families Citing this family (53)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003044078A1 (en) * | 2001-11-15 | 2003-05-30 | Honeywell International Inc. | Anti-reflective coatings for photolithography and methods of preparation thereof |
KR100804873B1 (ko) * | 1999-06-10 | 2008-02-20 | 얼라이드시그날 인코퍼레이티드 | 포토리소그래피용 sog 반사방지 코팅 |
US6824879B2 (en) * | 1999-06-10 | 2004-11-30 | Honeywell International Inc. | Spin-on-glass anti-reflective coatings for photolithography |
US6268457B1 (en) * | 1999-06-10 | 2001-07-31 | Allied Signal, Inc. | Spin-on glass anti-reflective coatings for photolithography |
US6890448B2 (en) * | 1999-06-11 | 2005-05-10 | Shipley Company, L.L.C. | Antireflective hard mask compositions |
KR100816698B1 (ko) * | 2000-04-03 | 2008-03-27 | 가부시키가이샤 알박 | 다공성 sog 필름의 제조방법 |
AU8500701A (en) | 2000-08-17 | 2002-02-25 | Shipley Co Llc | Etch resistant antireflective coating compositions |
TW588072B (en) * | 2000-10-10 | 2004-05-21 | Shipley Co Llc | Antireflective porogens |
JP3602071B2 (ja) * | 2001-06-05 | 2004-12-15 | 株式会社日立製作所 | 核酸の精製分離方法 |
JP4144204B2 (ja) * | 2001-09-20 | 2008-09-03 | 日産自動車株式会社 | 光吸収膜およびその製造方法 |
CN1606713B (zh) * | 2001-11-15 | 2011-07-06 | 霍尼韦尔国际公司 | 用于照相平版印刷术的旋涂抗反射涂料 |
WO2004044025A2 (en) * | 2002-11-12 | 2004-05-27 | Honeywell International Inc | Anti-reflective coatings for photolithography and methods of preparation thereof |
KR101156200B1 (ko) * | 2003-05-23 | 2012-06-18 | 다우 코닝 코포레이션 | 습식 에치율이 높은 실록산 수지계 반사 방지 피막 조성물 |
KR100857967B1 (ko) * | 2003-06-03 | 2008-09-10 | 신에쓰 가가꾸 고교 가부시끼가이샤 | 반사 방지막 재료, 이것을 이용한 반사 방지막 및 패턴형성 방법 |
US7303785B2 (en) * | 2003-06-03 | 2007-12-04 | Shin-Etsu Chemical Co., Ltd. | Antireflective film material, and antireflective film and pattern formation method using the same |
TW200523298A (en) * | 2003-08-04 | 2005-07-16 | Honeywell Int Inc | Coating composition optimization for via fill and photolithography applications and methods of preparation thereof |
US7223517B2 (en) * | 2003-08-05 | 2007-05-29 | International Business Machines Corporation | Lithographic antireflective hardmask compositions and uses thereof |
US8053159B2 (en) * | 2003-11-18 | 2011-11-08 | Honeywell International Inc. | Antireflective coatings for via fill and photolithography applications and methods of preparation thereof |
US7153783B2 (en) * | 2004-07-07 | 2006-12-26 | Honeywell International Inc. | Materials with enhanced properties for shallow trench isolation/premetal dielectric applications |
US20080157065A1 (en) * | 2004-08-03 | 2008-07-03 | Ahila Krishnamoorthy | Compositions, layers and films for optoelectronic devices, methods of production and uses thereof |
US8901268B2 (en) * | 2004-08-03 | 2014-12-02 | Ahila Krishnamoorthy | Compositions, layers and films for optoelectronic devices, methods of production and uses thereof |
US20060051929A1 (en) * | 2004-09-03 | 2006-03-09 | Honeywell International Inc. | Electrical properties of shallow trench isolation materials via high temperature annealing in the presence of reactive gases |
US7833696B2 (en) | 2004-12-17 | 2010-11-16 | Dow Corning Corporation | Method for forming anti-reflective coating |
WO2006065310A2 (en) * | 2004-12-17 | 2006-06-22 | Dow Corning Corporation | Siloxane resin coating |
US20060154485A1 (en) * | 2005-01-12 | 2006-07-13 | Bo Li | Sacrificial layers comprising water-soluble compounds, uses and methods of production thereof |
US7867779B2 (en) | 2005-02-03 | 2011-01-11 | Air Products And Chemicals, Inc. | System and method comprising same for measurement and/or analysis of particles in gas stream |
US20060183055A1 (en) * | 2005-02-15 | 2006-08-17 | O'neill Mark L | Method for defining a feature on a substrate |
EP1762895B1 (en) * | 2005-08-29 | 2016-02-24 | Rohm and Haas Electronic Materials, L.L.C. | Antireflective Hard Mask Compositions |
KR101324052B1 (ko) | 2006-02-13 | 2013-11-01 | 다우 코닝 코포레이션 | 반사방지 코팅 재료 |
US20070212886A1 (en) * | 2006-03-13 | 2007-09-13 | Dong Seon Uh | Organosilane polymers, hardmask compositions including the same and methods of producing semiconductor devices using organosilane hardmask compositions |
US9051491B2 (en) * | 2006-06-13 | 2015-06-09 | Braggone Oy | Carbosilane polymer compositions for anti-reflective coatings |
JP2009540084A (ja) * | 2006-06-13 | 2009-11-19 | ブラゴーン オサケ ユキチュア | 反射防止被膜用の無機−有機混成重合体組成物 |
US7704670B2 (en) * | 2006-06-22 | 2010-04-27 | Az Electronic Materials Usa Corp. | High silicon-content thin film thermosets |
US8026040B2 (en) | 2007-02-20 | 2011-09-27 | Az Electronic Materials Usa Corp. | Silicone coating composition |
WO2008104874A1 (en) * | 2007-02-26 | 2008-09-04 | Az Electronic Materials Usa Corp. | Process for making siloxane polymers |
US8642246B2 (en) | 2007-02-26 | 2014-02-04 | Honeywell International Inc. | Compositions, coatings and films for tri-layer patterning applications and methods of preparation thereof |
KR101523393B1 (ko) | 2007-02-27 | 2015-05-27 | 이엠디 퍼포먼스 머티리얼스 코프. | 규소를 주성분으로 하는 반사 방지 코팅 조성물 |
TWI439494B (zh) * | 2007-02-27 | 2014-06-01 | Braggone Oy | 產生有機矽氧烷聚合物的方法 |
KR20100126295A (ko) | 2008-01-08 | 2010-12-01 | 다우 코닝 도레이 캄파니 리미티드 | 실세스퀴옥산 수지 |
CN101910253B (zh) * | 2008-01-15 | 2013-04-10 | 陶氏康宁公司 | 倍半硅氧烷树脂 |
CN101990551B (zh) * | 2008-03-04 | 2012-10-03 | 陶氏康宁公司 | 倍半硅氧烷树脂 |
KR101541939B1 (ko) * | 2008-03-05 | 2015-08-04 | 다우 코닝 코포레이션 | 실세스퀴옥산 수지 |
JP5359014B2 (ja) * | 2008-04-28 | 2013-12-04 | 三菱瓦斯化学株式会社 | 紫外線吸収能を有するポリカーボネート樹脂 |
US8809482B2 (en) | 2008-12-10 | 2014-08-19 | Dow Corning Corporation | Silsesquioxane resins |
JP5632387B2 (ja) * | 2008-12-10 | 2014-11-26 | ダウ コーニング コーポレーションDow Corning Corporation | 湿式エッチング可能な反射防止膜 |
US8084186B2 (en) * | 2009-02-10 | 2011-12-27 | Az Electronic Materials Usa Corp. | Hardmask process for forming a reverse tone image using polysilazane |
US8557877B2 (en) | 2009-06-10 | 2013-10-15 | Honeywell International Inc. | Anti-reflective coatings for optically transparent substrates |
CN101979352B (zh) * | 2010-10-28 | 2012-11-28 | 常熟耀皮特种玻璃有限公司 | 可降低玻璃表面光反射的有机涂覆材料及玻璃 |
CN102485807A (zh) * | 2010-12-01 | 2012-06-06 | 常熟卓辉光电科技有限公司 | 一种降低玻璃表面光反射的涂覆材料 |
US8864898B2 (en) | 2011-05-31 | 2014-10-21 | Honeywell International Inc. | Coating formulations for optical elements |
JP6196194B2 (ja) * | 2014-08-19 | 2017-09-13 | 信越化学工業株式会社 | 紫外線吸収剤、レジスト下層膜形成用組成物、及びパターン形成方法 |
JP6803842B2 (ja) | 2015-04-13 | 2020-12-23 | ハネウェル・インターナショナル・インコーポレーテッドHoneywell International Inc. | オプトエレクトロニクス用途のためのポリシロキサン製剤及びコーティング |
CN109722033B (zh) * | 2018-12-10 | 2021-08-06 | 沈阳化工大学 | 一种二蒽基二苯醚乙烯基硅橡胶制备方法 |
Family Cites Families (88)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3615272A (en) | 1968-11-04 | 1971-10-26 | Dow Corning | Condensed soluble hydrogensilsesquioxane resin |
US3884702A (en) | 1972-12-14 | 1975-05-20 | Unitika Ltd | Photosensitive polyamide composition |
US3873361A (en) | 1973-11-29 | 1975-03-25 | Ibm | Method of depositing thin film utilizing a lift-off mask |
US4053313A (en) | 1975-06-03 | 1977-10-11 | E. I. Du Pont De Nemours And Company | Process for image reproduction using multilayer photosensitive solvent processable elements |
JPS55165922A (en) * | 1979-06-14 | 1980-12-24 | Daicel Chem Ind Ltd | Production of thermosetting organopolysiloxane |
US4349609A (en) | 1979-06-21 | 1982-09-14 | Fujitsu Limited | Electronic device having multilayer wiring structure |
JPS5850417B2 (ja) | 1979-07-31 | 1983-11-10 | 富士通株式会社 | 半導体装置の製造方法 |
US4257826A (en) | 1979-10-11 | 1981-03-24 | Texas Instruments Incorporated | Photoresist masking in manufacture of semiconductor device |
US4290896A (en) | 1980-05-27 | 1981-09-22 | Dow Corning Corporation | Dewatering fine coal slurries using organopolysiloxanes |
US4483107A (en) | 1980-06-17 | 1984-11-20 | Konishiroku Photo Industry Co., Ltd. | Polishing method for electrophotographic photoconductive member |
EP0046695B1 (en) | 1980-08-26 | 1986-01-08 | Japan Synthetic Rubber Co., Ltd. | Ladder-like lower alkylpolysilsesquioxanes and process for their preparation |
JPS5760330A (en) | 1980-09-27 | 1982-04-12 | Fujitsu Ltd | Resin composition |
US4515828A (en) | 1981-01-02 | 1985-05-07 | International Business Machines Corporation | Planarization method |
US4423135A (en) | 1981-01-28 | 1983-12-27 | E. I. Du Pont De Nemours & Co. | Preparation of photosensitive block copolymer elements |
US4413052A (en) | 1981-02-04 | 1983-11-01 | Ciba-Geigy Corporation | Photopolymerization process employing compounds containing acryloyl group and anthryl group |
US4419437A (en) | 1981-02-11 | 1983-12-06 | Eastman Kodak Company | Image-forming compositions and elements containing ionic polyester dispersing agents |
US4312970A (en) | 1981-02-20 | 1982-01-26 | Dow Corning Corporation | Silazane polymers from {R'3 Si}2 NH and organochlorosilanes |
DE3278567D1 (en) | 1981-10-03 | 1988-07-07 | Japan Synthetic Rubber Co Ltd | Solvent-soluble organopolysilsesquioxanes, processes for producing the same, and compositions and semiconductor devices using the same |
JPS58171416A (ja) | 1982-04-02 | 1983-10-08 | Hitachi Ltd | 耐熱性重合体 |
US4910122A (en) | 1982-09-30 | 1990-03-20 | Brewer Science, Inc. | Anti-reflective coating |
US4434127A (en) | 1982-12-09 | 1984-02-28 | Dow Corning Corporation | Heat curable polydiorganosiloxane compositions having enhanced release upon cure |
JPS59109565A (ja) | 1982-12-16 | 1984-06-25 | Fujitsu Ltd | コ−テイング樹脂溶液およびその製造方法 |
KR890003903B1 (ko) | 1983-06-29 | 1989-10-10 | 가부시끼가이샤 히다찌세이사꾸쇼 | 패턴 형성 방법 |
US4617252A (en) | 1983-07-01 | 1986-10-14 | Philip A. Hunt Chemical Corporation | Antireflective coatings for use in the manufacture of semi-conductor devices, methods and solutions for making such coatings, and the method for using such coatings to absorb light in ultraviolet photolithography processes |
GB8333901D0 (en) | 1983-12-20 | 1984-02-01 | Minnesota Mining & Mfg | Radiationsensitive compositions |
GB8401016D0 (en) | 1984-01-14 | 1984-02-15 | Hagen Perennatorwerk | Organopolysiloxane compositions |
JPS60177029A (ja) | 1984-02-21 | 1985-09-11 | Toray Silicone Co Ltd | オルガノポリシロキサン組成物の硬化方法 |
US4702990A (en) | 1984-05-14 | 1987-10-27 | Nippon Telegraph And Telephone Corporation | Photosensitive resin composition and process for forming photo-resist pattern using the same |
KR900002364B1 (ko) | 1984-05-30 | 1990-04-12 | 후지쓰가부시끼가이샤 | 패턴 형성재의 제조방법 |
US4657965A (en) | 1984-10-22 | 1987-04-14 | Toshiba Silicone Co., Ltd. | Silicone elastomer composition |
US4670299A (en) | 1984-11-01 | 1987-06-02 | Fujitsu Limited | Preparation of lower alkyl polysilsesquioxane and formation of insulating layer of silylated polymer on electronic circuit board |
US4587138A (en) | 1984-11-09 | 1986-05-06 | Intel Corporation | MOS rear end processing |
US4620986A (en) | 1984-11-09 | 1986-11-04 | Intel Corporation | MOS rear end processing |
CA1245394A (en) | 1985-02-15 | 1988-11-22 | Dale R. Flackett | Organopolysiloxane composition curable to an elastomer and use thereof |
FR2579552B1 (fr) | 1985-03-27 | 1990-06-08 | Honda Motor Co Ltd | Dispositif de direction des roues avant et arriere pour vehicule |
EP0204963B1 (en) | 1985-05-10 | 1993-01-13 | Hitachi, Ltd. | Use of Alkali-Soluble Polyorganosilsesquioxane Polymers in a resist for preparing electronics parts. |
US4745169A (en) | 1985-05-10 | 1988-05-17 | Hitachi, Ltd. | Alkali-soluble siloxane polymer, silmethylene polymer, and polyorganosilsesquioxane polymer |
US4663414A (en) | 1985-05-14 | 1987-05-05 | Stauffer Chemical Company | Phospho-boro-silanol interlayer dielectric films and preparation |
US4816049A (en) * | 1985-07-12 | 1989-03-28 | Hoya Corporation | Process of surface treating laser glass |
US4786569A (en) | 1985-09-04 | 1988-11-22 | Ciba-Geigy Corporation | Adhesively bonded photostructurable polyimide film |
US4723978A (en) | 1985-10-31 | 1988-02-09 | International Business Machines Corporation | Method for a plasma-treated polysiloxane coating |
US4676867A (en) | 1986-06-06 | 1987-06-30 | Rockwell International Corporation | Planarization process for double metal MOS using spin-on glass as a sacrificial layer |
DE3760773D1 (en) | 1986-07-25 | 1989-11-16 | Oki Electric Ind Co Ltd | Negative resist material, method for its manufacture and method for using it |
US4806504A (en) | 1986-09-11 | 1989-02-21 | Fairchild Semiconductor Corporation | Planarization method |
US4898907A (en) | 1986-12-03 | 1990-02-06 | Dow Corning Corporation | Compositions of platinum and rhodium catalyst in combination with hydrogen silsesquioxane resin |
US4822697A (en) | 1986-12-03 | 1989-04-18 | Dow Corning Corporation | Platinum and rhodium catalysis of low temperature formation multilayer ceramics |
US4756977A (en) | 1986-12-03 | 1988-07-12 | Dow Corning Corporation | Multilayer ceramics from hydrogen silsesquioxane |
US4808653A (en) | 1986-12-04 | 1989-02-28 | Dow Corning Corporation | Coating composition containing hydrogen silsesquioxane resin and other metal oxide precursors |
US5008320A (en) | 1986-12-04 | 1991-04-16 | Dow Corning Corporation | Platinum or rhodium catalyzed multilayer ceramic coatings from hydrogen silsesquioxane resin and metal oxides |
US4753855A (en) | 1986-12-04 | 1988-06-28 | Dow Corning Corporation | Multilayer ceramic coatings from metal oxides for protection of electronic devices |
US4911992A (en) | 1986-12-04 | 1990-03-27 | Dow Corning Corporation | Platinum or rhodium catalyzed multilayer ceramic coatings from hydrogen silsesquioxane resin and metal oxides |
JPH0819381B2 (ja) | 1987-01-06 | 1996-02-28 | 日本合成ゴム株式会社 | コーティング用組成物 |
DE3810247A1 (de) * | 1987-03-26 | 1988-10-06 | Toshiba Kawasaki Kk | Lichtempfindliche beschichtungsmasse |
US4855199A (en) | 1987-04-03 | 1989-08-08 | General Electric Company | Photopatterned product of silicone polyamic acid on a transparent substrate |
JPS63312643A (ja) | 1987-06-16 | 1988-12-21 | Mitsubishi Electric Corp | 半導体装置の製造方法 |
US4849296A (en) | 1987-12-28 | 1989-07-18 | Dow Corning Corporation | Multilayer ceramic coatings from metal oxides and hydrogen silsesquioxane resin ceramified in ammonia |
US4847162A (en) | 1987-12-28 | 1989-07-11 | Dow Corning Corporation | Multilayer ceramics coatings from the ceramification of hydrogen silsequioxane resin in the presence of ammonia |
JPH01185367A (ja) | 1988-01-18 | 1989-07-24 | Toshiba Silicone Co Ltd | 表面処理されたポリメチルシルセスキオキサン粉末の製造方法 |
US4921778A (en) | 1988-07-29 | 1990-05-01 | Shipley Company Inc. | Photoresist pattern fabrication employing chemically amplified metalized material |
US4981530A (en) | 1988-11-28 | 1991-01-01 | International Business Machines Corporation | Planarizing ladder-type silsesquioxane polymer insulation layer |
US4885262A (en) | 1989-03-08 | 1989-12-05 | Intel Corporation | Chemical modification of spin-on glass for improved performance in IC fabrication |
US4999397A (en) | 1989-07-28 | 1991-03-12 | Dow Corning Corporation | Metastable silane hydrolyzates and process for their preparation |
US5045592A (en) | 1989-07-28 | 1991-09-03 | Dow Corning Corporation | Metastable silane hydrolyzates |
CA2027031A1 (en) | 1989-10-18 | 1991-04-19 | Loren A. Haluska | Hermetic substrate coatings in an inert gas atmosphere |
US4973526A (en) | 1990-02-15 | 1990-11-27 | Dow Corning Corporation | Method of forming ceramic coatings and resulting articles |
US5043789A (en) | 1990-03-15 | 1991-08-27 | International Business Machines Corporation | Planarizing silsesquioxane copolymer coating |
JPH03272131A (ja) | 1990-03-22 | 1991-12-03 | Oki Electric Ind Co Ltd | 半導体素子の製造方法 |
US5059448A (en) | 1990-06-18 | 1991-10-22 | Dow Corning Corporation | Rapid thermal process for obtaining silica coatings |
US5100503A (en) | 1990-09-14 | 1992-03-31 | Ncr Corporation | Silica-based anti-reflective planarizing layer |
US5527872A (en) | 1990-09-14 | 1996-06-18 | At&T Global Information Solutions Company | Electronic device with a spin-on glass dielectric layer |
US5472488A (en) | 1990-09-14 | 1995-12-05 | Hyundai Electronics America | Coating solution for forming glassy layers |
US5063267A (en) | 1990-11-28 | 1991-11-05 | Dow Corning Corporation | Hydrogen silsesquioxane resin fractions and their use as coating materials |
DE4132697A1 (de) * | 1991-10-01 | 1993-04-08 | Wacker Chemie Gmbh | Verfahren zur herstellung von organopolysiloxanharz |
US6165697A (en) | 1991-11-15 | 2000-12-26 | Shipley Company, L.L.C. | Antihalation compositions |
JPH0656560A (ja) | 1992-08-10 | 1994-03-01 | Sony Corp | Sog組成物及びそれを用いた半導体装置の製造方法 |
JPH06333803A (ja) | 1992-09-18 | 1994-12-02 | Sharp Corp | 投影型露光装置用フィルター |
US5328975A (en) * | 1993-04-02 | 1994-07-12 | Ppg Industries, Inc. | Ultraviolet radiation absorbing coating |
DE4338360A1 (de) * | 1993-11-10 | 1995-05-11 | Inst Neue Mat Gemein Gmbh | Verfahren zur Herstellung von funktionellen glasartigen Schichten |
JP3272131B2 (ja) | 1993-12-27 | 2002-04-08 | マツダ株式会社 | 歯車変速機の噛合装置 |
JP3301215B2 (ja) | 1994-05-31 | 2002-07-15 | ソニー株式会社 | ハーフトーン型位相シフトマスク、ハーフトーン型位相シフトマスクの作製に用いる半透明部形成材料、及びハーフトーン型位相シフトマスクの作製方法 |
US5729563A (en) | 1994-07-07 | 1998-03-17 | Hewlett-Packard Company | Method and apparatus for optically and thermally isolating surface emitting laser diodes |
TW404974B (en) * | 1995-07-19 | 2000-09-11 | Kansai Paint Co Ltd | Solidifiable coating composite |
US5693691A (en) | 1995-08-21 | 1997-12-02 | Brewer Science, Inc. | Thermosetting anti-reflective coatings compositions |
US5583195A (en) * | 1995-09-29 | 1996-12-10 | General Electric Company | Photocurable epoxy silicones functionalized with fluorescent or photosensitizing marker dyes |
JP3473887B2 (ja) | 1997-07-16 | 2003-12-08 | 東京応化工業株式会社 | 反射防止膜形成用組成物及びそれを用いたレジストパターンの形成方法 |
US5962067A (en) * | 1997-09-09 | 1999-10-05 | Lucent Technologies Inc. | Method for coating an article with a ladder siloxane polymer and coated article |
US6268457B1 (en) * | 1999-06-10 | 2001-07-31 | Allied Signal, Inc. | Spin-on glass anti-reflective coatings for photolithography |
JP4248098B2 (ja) * | 1999-09-20 | 2009-04-02 | 東京応化工業株式会社 | 反射防止膜形成用組成物及びレジストパターンの形成方法 |
-
2000
- 2000-07-17 US US09/617,365 patent/US6368400B1/en not_active Expired - Fee Related
-
2001
- 2001-07-12 AU AU2001280558A patent/AU2001280558A1/en not_active Abandoned
- 2001-07-12 JP JP2002512299A patent/JP2004504328A/ja not_active Withdrawn
- 2001-07-12 CA CA002413726A patent/CA2413726C/en not_active Expired - Fee Related
- 2001-07-12 WO PCT/US2001/022232 patent/WO2002006402A1/en active Application Filing
- 2001-07-12 EP EP01958953A patent/EP1301569A4/en not_active Withdrawn
- 2001-07-12 CN CNB018130097A patent/CN1296435C/zh not_active Expired - Fee Related
- 2001-07-12 KR KR1020037000660A patent/KR100804870B1/ko not_active IP Right Cessation
- 2001-07-17 TW TW090117454A patent/TWI238174B/zh not_active IP Right Cessation
- 2001-08-07 TW TW093130882A patent/TW200512257A/zh unknown
- 2001-11-05 US US10/012,651 patent/US6605362B2/en not_active Expired - Fee Related
-
2003
- 2003-04-30 US US10/428,807 patent/US6914114B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1301569A1 (en) | 2003-04-16 |
US6914114B2 (en) | 2005-07-05 |
AU2001280558A1 (en) | 2002-01-30 |
CA2413726C (en) | 2005-11-29 |
KR100804870B1 (ko) | 2008-02-20 |
WO2002006402A1 (en) | 2002-01-24 |
EP1301569A4 (en) | 2007-08-29 |
CN1296435C (zh) | 2007-01-24 |
KR20030031120A (ko) | 2003-04-18 |
JP2004504328A (ja) | 2004-02-12 |
US20030199659A1 (en) | 2003-10-23 |
CA2413726A1 (en) | 2002-01-24 |
US6368400B1 (en) | 2002-04-09 |
TW200512257A (en) | 2005-04-01 |
CN1443218A (zh) | 2003-09-17 |
US6605362B2 (en) | 2003-08-12 |
US20020068181A1 (en) | 2002-06-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI238174B (en) | Absorbing compounds for spin-on-glass anti-reflective coatings for photolithography | |
JP4703745B2 (ja) | フォトリソグラフィ用のスピンオングラス反射防止コーティング | |
EP1190277B1 (en) | Semiconductor having spin-on-glass anti-reflective coatings for photolithography | |
US6506497B1 (en) | Spin-on-glass anti-reflective coatings for photolithography | |
WO2003044600A1 (en) | Spin-on anti-reflective coatings for photolithography | |
JP2005509710A (ja) | フォトリソグラフィ用のスピンオングラス反射防止性コーティング | |
JP2011221549A (ja) | フォトリソグラフィー用スピンオン反射防止膜 | |
KR100917241B1 (ko) | 포토리소그래피용 스핀-온 무반사 코팅 | |
JP2009280822A (ja) | フォトリソグラフィ用のスピンオングラス反射防止性コーティング | |
JP2009175747A (ja) | フォトリソグラフィー用スピンオン反射防止膜 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |