AU2001280558A1 - Absorbing compounds for spin-on glass anti-reflective coatings for photolithography - Google Patents

Absorbing compounds for spin-on glass anti-reflective coatings for photolithography

Info

Publication number
AU2001280558A1
AU2001280558A1 AU2001280558A AU8055801A AU2001280558A1 AU 2001280558 A1 AU2001280558 A1 AU 2001280558A1 AU 2001280558 A AU2001280558 A AU 2001280558A AU 8055801 A AU8055801 A AU 8055801A AU 2001280558 A1 AU2001280558 A1 AU 2001280558A1
Authority
AU
Australia
Prior art keywords
photolithography
spin
reflective coatings
absorbing compounds
glass anti
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001280558A
Inventor
Teresa Baldwin
James Drage
Mary Richey
Richard Spear
Hui-Jung Wu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell International Inc
Original Assignee
Honeywell International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell International Inc filed Critical Honeywell International Inc
Publication of AU2001280558A1 publication Critical patent/AU2001280558A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G77/00Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
    • C08G77/42Block-or graft-polymers containing polysiloxane sequences
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D4/00Coating compositions, e.g. paints, varnishes or lacquers, based on organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond ; Coating compositions, based on monomers of macromolecular compounds of groups C09D183/00 - C09D183/16
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/28Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material
    • C03C17/30Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material with silicon-containing compounds
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F7/00Compounds containing elements of Groups 4 or 14 of the Periodic System
    • C07F7/02Silicon compounds
    • C07F7/08Compounds having one or more C—Si linkages
    • C07F7/18Compounds having one or more C—Si linkages as well as one or more C—O—Si linkages
    • C07F7/1804Compounds having Si-O-C linkages
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D183/00Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
    • C09D183/04Polysiloxanes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/31504Composite [nonstructural laminate]
    • Y10T428/31652Of asbestos
    • Y10T428/31663As siloxane, silicone or silane
AU2001280558A 2000-07-17 2001-07-12 Absorbing compounds for spin-on glass anti-reflective coatings for photolithography Abandoned AU2001280558A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09617365 2000-07-17
US09/617,365 US6368400B1 (en) 2000-07-17 2000-07-17 Absorbing compounds for spin-on-glass anti-reflective coatings for photolithography
PCT/US2001/022232 WO2002006402A1 (en) 2000-07-17 2001-07-12 Absorbing compounds for spin-on glass anti-reflective coatings for photolithography

Publications (1)

Publication Number Publication Date
AU2001280558A1 true AU2001280558A1 (en) 2002-01-30

Family

ID=24473372

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001280558A Abandoned AU2001280558A1 (en) 2000-07-17 2001-07-12 Absorbing compounds for spin-on glass anti-reflective coatings for photolithography

Country Status (9)

Country Link
US (3) US6368400B1 (en)
EP (1) EP1301569A4 (en)
JP (1) JP2004504328A (en)
KR (1) KR100804870B1 (en)
CN (1) CN1296435C (en)
AU (1) AU2001280558A1 (en)
CA (1) CA2413726C (en)
TW (2) TWI238174B (en)
WO (1) WO2002006402A1 (en)

Families Citing this family (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100804873B1 (en) 1999-06-10 2008-02-20 얼라이드시그날 인코퍼레이티드 Spin-on-glass anti-reflective coatings for photolithography
US6268457B1 (en) * 1999-06-10 2001-07-31 Allied Signal, Inc. Spin-on glass anti-reflective coatings for photolithography
US6824879B2 (en) * 1999-06-10 2004-11-30 Honeywell International Inc. Spin-on-glass anti-reflective coatings for photolithography
US6890448B2 (en) * 1999-06-11 2005-05-10 Shipley Company, L.L.C. Antireflective hard mask compositions
CN1271691C (en) * 2000-04-03 2006-08-23 爱发科股份有限公司 Method for preparing porous SOG film
TW576949B (en) 2000-08-17 2004-02-21 Shipley Co Llc Antireflective coatings with increased etch rates
EP1197998A3 (en) * 2000-10-10 2005-12-21 Shipley Company LLC Antireflective porogens
JP3602071B2 (en) * 2001-06-05 2004-12-15 株式会社日立製作所 Purification and separation method of nucleic acid
JP4144204B2 (en) * 2001-09-20 2008-09-03 日産自動車株式会社 Light absorbing film and manufacturing method thereof
KR20040066124A (en) * 2001-11-15 2004-07-23 허니웰 인터내셔널 인코포레이티드 Spin-On Anti-Reflective Coatings For Photolithography
EP1478682A4 (en) * 2001-11-15 2005-06-15 Honeywell Int Inc Anti-reflective coatings for photolithography and methods of preparation thereof
AU2003295517A1 (en) * 2002-11-12 2004-06-03 Honeywell International Inc Anti-reflective coatings for photolithography and methods of preparation thereof
US7368173B2 (en) * 2003-05-23 2008-05-06 Dow Corning Corporation Siloxane resin-based anti-reflective coating composition having high wet etch rate
US7303785B2 (en) * 2003-06-03 2007-12-04 Shin-Etsu Chemical Co., Ltd. Antireflective film material, and antireflective film and pattern formation method using the same
KR100857967B1 (en) * 2003-06-03 2008-09-10 신에쓰 가가꾸 고교 가부시끼가이샤 Antireflective Film Material, and Antireflective Film and Pattern Formation Method Using the Same
US7867331B2 (en) * 2003-08-04 2011-01-11 Honeywell International Inc. Coating composition optimization for via fill and photolithography applications and methods of preparation thereof
US7223517B2 (en) * 2003-08-05 2007-05-29 International Business Machines Corporation Lithographic antireflective hardmask compositions and uses thereof
US8053159B2 (en) * 2003-11-18 2011-11-08 Honeywell International Inc. Antireflective coatings for via fill and photolithography applications and methods of preparation thereof
US7153783B2 (en) * 2004-07-07 2006-12-26 Honeywell International Inc. Materials with enhanced properties for shallow trench isolation/premetal dielectric applications
US8901268B2 (en) * 2004-08-03 2014-12-02 Ahila Krishnamoorthy Compositions, layers and films for optoelectronic devices, methods of production and uses thereof
US20080157065A1 (en) * 2004-08-03 2008-07-03 Ahila Krishnamoorthy Compositions, layers and films for optoelectronic devices, methods of production and uses thereof
US20060051929A1 (en) * 2004-09-03 2006-03-09 Honeywell International Inc. Electrical properties of shallow trench isolation materials via high temperature annealing in the presence of reactive gases
CN101072813B (en) * 2004-12-17 2011-06-08 陶氏康宁公司 Siloxane resin coating
ATE400672T1 (en) 2004-12-17 2008-07-15 Dow Corning METHOD FOR FORMING AN ANTIREFLECTION COATING
US20060154485A1 (en) * 2005-01-12 2006-07-13 Bo Li Sacrificial layers comprising water-soluble compounds, uses and methods of production thereof
US7867779B2 (en) 2005-02-03 2011-01-11 Air Products And Chemicals, Inc. System and method comprising same for measurement and/or analysis of particles in gas stream
US20060183055A1 (en) * 2005-02-15 2006-08-17 O'neill Mark L Method for defining a feature on a substrate
EP1762895B1 (en) * 2005-08-29 2016-02-24 Rohm and Haas Electronic Materials, L.L.C. Antireflective Hard Mask Compositions
EP1989593A2 (en) 2006-02-13 2008-11-12 Dow Corning Corporation Antireflective coating material
US20070212886A1 (en) * 2006-03-13 2007-09-13 Dong Seon Uh Organosilane polymers, hardmask compositions including the same and methods of producing semiconductor devices using organosilane hardmask compositions
WO2007144453A1 (en) * 2006-06-13 2007-12-21 Braggone Oy Carbosilane polymer compositions for anti-reflective coatings
WO2007144452A1 (en) * 2006-06-13 2007-12-21 Braggone Oy Hybrid inorganic-organic polymer compositions for anti-reflective coatings
US7704670B2 (en) * 2006-06-22 2010-04-27 Az Electronic Materials Usa Corp. High silicon-content thin film thermosets
US8026040B2 (en) 2007-02-20 2011-09-27 Az Electronic Materials Usa Corp. Silicone coating composition
JP2010519362A (en) * 2007-02-26 2010-06-03 エイゼット・エレクトロニック・マテリアルズ・ユーエスエイ・コーポレイション Method for producing siloxane polymer
US8642246B2 (en) 2007-02-26 2014-02-04 Honeywell International Inc. Compositions, coatings and films for tri-layer patterning applications and methods of preparation thereof
TWI439494B (en) * 2007-02-27 2014-06-01 Braggone Oy Process for producing an organosiloxane polymer
WO2008104881A1 (en) 2007-02-27 2008-09-04 Az Electronic Materials Usa Corp. Silicon-based antifrelective coating compositions
JP5587791B2 (en) 2008-01-08 2014-09-10 東レ・ダウコーニング株式会社 Silsesquioxane resin
JP2011510133A (en) * 2008-01-15 2011-03-31 ダウ・コーニング・コーポレイション Silsesquioxane resin
WO2009111122A2 (en) * 2008-03-04 2009-09-11 Dow Corning Corporation Silsesquioxane resins
JP5581224B2 (en) * 2008-03-05 2014-08-27 ダウ・コーニング・コーポレイション Silsesquioxane resin
JP5359014B2 (en) * 2008-04-28 2013-12-04 三菱瓦斯化学株式会社 Polycarbonate resin with ultraviolet absorbing ability
CN102245723B (en) * 2008-12-10 2014-12-17 陶氏康宁公司 Wet-etchable antireflective coatings
US8809482B2 (en) 2008-12-10 2014-08-19 Dow Corning Corporation Silsesquioxane resins
US8084186B2 (en) * 2009-02-10 2011-12-27 Az Electronic Materials Usa Corp. Hardmask process for forming a reverse tone image using polysilazane
US8557877B2 (en) 2009-06-10 2013-10-15 Honeywell International Inc. Anti-reflective coatings for optically transparent substrates
CN101979352B (en) * 2010-10-28 2012-11-28 常熟耀皮特种玻璃有限公司 Organic coating material capable of reducing light reflectivity of glass surface and glass
CN102485807A (en) * 2010-12-01 2012-06-06 常熟卓辉光电科技有限公司 Coating material capable of reducing light reflection of glass surface
US8864898B2 (en) 2011-05-31 2014-10-21 Honeywell International Inc. Coating formulations for optical elements
JP6196194B2 (en) * 2014-08-19 2017-09-13 信越化学工業株式会社 Ultraviolet absorber, resist underlayer film forming composition, and pattern forming method
WO2016167892A1 (en) 2015-04-13 2016-10-20 Honeywell International Inc. Polysiloxane formulations and coatings for optoelectronic applications
CN109722033B (en) * 2018-12-10 2021-08-06 沈阳化工大学 Preparation method of dianthranyl diphenyl ether vinyl silicone rubber

Family Cites Families (88)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3615272A (en) 1968-11-04 1971-10-26 Dow Corning Condensed soluble hydrogensilsesquioxane resin
US3884702A (en) 1972-12-14 1975-05-20 Unitika Ltd Photosensitive polyamide composition
US3873361A (en) 1973-11-29 1975-03-25 Ibm Method of depositing thin film utilizing a lift-off mask
US4053313A (en) 1975-06-03 1977-10-11 E. I. Du Pont De Nemours And Company Process for image reproduction using multilayer photosensitive solvent processable elements
JPS55165922A (en) * 1979-06-14 1980-12-24 Daicel Chem Ind Ltd Production of thermosetting organopolysiloxane
US4349609A (en) 1979-06-21 1982-09-14 Fujitsu Limited Electronic device having multilayer wiring structure
JPS5850417B2 (en) 1979-07-31 1983-11-10 富士通株式会社 Manufacturing method of semiconductor device
US4257826A (en) 1979-10-11 1981-03-24 Texas Instruments Incorporated Photoresist masking in manufacture of semiconductor device
US4290896A (en) 1980-05-27 1981-09-22 Dow Corning Corporation Dewatering fine coal slurries using organopolysiloxanes
US4483107A (en) 1980-06-17 1984-11-20 Konishiroku Photo Industry Co., Ltd. Polishing method for electrophotographic photoconductive member
EP0046695B1 (en) 1980-08-26 1986-01-08 Japan Synthetic Rubber Co., Ltd. Ladder-like lower alkylpolysilsesquioxanes and process for their preparation
JPS5760330A (en) 1980-09-27 1982-04-12 Fujitsu Ltd Resin composition
US4515828A (en) 1981-01-02 1985-05-07 International Business Machines Corporation Planarization method
US4423135A (en) 1981-01-28 1983-12-27 E. I. Du Pont De Nemours & Co. Preparation of photosensitive block copolymer elements
US4413052A (en) 1981-02-04 1983-11-01 Ciba-Geigy Corporation Photopolymerization process employing compounds containing acryloyl group and anthryl group
US4419437A (en) 1981-02-11 1983-12-06 Eastman Kodak Company Image-forming compositions and elements containing ionic polyester dispersing agents
US4312970A (en) 1981-02-20 1982-01-26 Dow Corning Corporation Silazane polymers from {R'3 Si}2 NH and organochlorosilanes
EP0076656B1 (en) 1981-10-03 1988-06-01 Japan Synthetic Rubber Co., Ltd. Solvent-soluble organopolysilsesquioxanes, processes for producing the same, and compositions and semiconductor devices using the same
JPS58171416A (en) 1982-04-02 1983-10-08 Hitachi Ltd Heat-resistant polymer
US4910122A (en) 1982-09-30 1990-03-20 Brewer Science, Inc. Anti-reflective coating
US4434127A (en) 1982-12-09 1984-02-28 Dow Corning Corporation Heat curable polydiorganosiloxane compositions having enhanced release upon cure
JPS59109565A (en) 1982-12-16 1984-06-25 Fujitsu Ltd Coating resin solution and production thereof
KR890003903B1 (en) 1983-06-29 1989-10-10 가부시끼가이샤 히다찌세이사꾸쇼 Pattern forming method
US4617252A (en) 1983-07-01 1986-10-14 Philip A. Hunt Chemical Corporation Antireflective coatings for use in the manufacture of semi-conductor devices, methods and solutions for making such coatings, and the method for using such coatings to absorb light in ultraviolet photolithography processes
GB8333901D0 (en) 1983-12-20 1984-02-01 Minnesota Mining & Mfg Radiationsensitive compositions
GB8401016D0 (en) 1984-01-14 1984-02-15 Hagen Perennatorwerk Organopolysiloxane compositions
JPS60177029A (en) 1984-02-21 1985-09-11 Toray Silicone Co Ltd Method for curing organopolysiloxane composition
US4702990A (en) 1984-05-14 1987-10-27 Nippon Telegraph And Telephone Corporation Photosensitive resin composition and process for forming photo-resist pattern using the same
EP0163538B1 (en) 1984-05-30 1989-11-23 Fujitsu Limited Pattern-forming material and its production and use
US4657965A (en) 1984-10-22 1987-04-14 Toshiba Silicone Co., Ltd. Silicone elastomer composition
US4670299A (en) 1984-11-01 1987-06-02 Fujitsu Limited Preparation of lower alkyl polysilsesquioxane and formation of insulating layer of silylated polymer on electronic circuit board
US4620986A (en) 1984-11-09 1986-11-04 Intel Corporation MOS rear end processing
US4587138A (en) 1984-11-09 1986-05-06 Intel Corporation MOS rear end processing
CA1245394A (en) 1985-02-15 1988-11-22 Dale R. Flackett Organopolysiloxane composition curable to an elastomer and use thereof
FR2579552B1 (en) 1985-03-27 1990-06-08 Honda Motor Co Ltd FRONT AND REAR WHEEL STEERING DEVICE FOR VEHICLE
EP0204963B1 (en) 1985-05-10 1993-01-13 Hitachi, Ltd. Use of Alkali-Soluble Polyorganosilsesquioxane Polymers in a resist for preparing electronics parts.
US4745169A (en) 1985-05-10 1988-05-17 Hitachi, Ltd. Alkali-soluble siloxane polymer, silmethylene polymer, and polyorganosilsesquioxane polymer
US4663414A (en) 1985-05-14 1987-05-05 Stauffer Chemical Company Phospho-boro-silanol interlayer dielectric films and preparation
US4816049A (en) * 1985-07-12 1989-03-28 Hoya Corporation Process of surface treating laser glass
US4786569A (en) 1985-09-04 1988-11-22 Ciba-Geigy Corporation Adhesively bonded photostructurable polyimide film
US4723978A (en) 1985-10-31 1988-02-09 International Business Machines Corporation Method for a plasma-treated polysiloxane coating
US4676867A (en) 1986-06-06 1987-06-30 Rockwell International Corporation Planarization process for double metal MOS using spin-on glass as a sacrificial layer
EP0255303B1 (en) 1986-07-25 1989-10-11 Oki Electric Industry Company, Limited Negative resist material, method for its manufacture and method for using it
US4806504A (en) 1986-09-11 1989-02-21 Fairchild Semiconductor Corporation Planarization method
US4756977A (en) 1986-12-03 1988-07-12 Dow Corning Corporation Multilayer ceramics from hydrogen silsesquioxane
US4822697A (en) 1986-12-03 1989-04-18 Dow Corning Corporation Platinum and rhodium catalysis of low temperature formation multilayer ceramics
US4898907A (en) 1986-12-03 1990-02-06 Dow Corning Corporation Compositions of platinum and rhodium catalyst in combination with hydrogen silsesquioxane resin
US5008320A (en) 1986-12-04 1991-04-16 Dow Corning Corporation Platinum or rhodium catalyzed multilayer ceramic coatings from hydrogen silsesquioxane resin and metal oxides
US4753855A (en) 1986-12-04 1988-06-28 Dow Corning Corporation Multilayer ceramic coatings from metal oxides for protection of electronic devices
US4911992A (en) 1986-12-04 1990-03-27 Dow Corning Corporation Platinum or rhodium catalyzed multilayer ceramic coatings from hydrogen silsesquioxane resin and metal oxides
US4808653A (en) 1986-12-04 1989-02-28 Dow Corning Corporation Coating composition containing hydrogen silsesquioxane resin and other metal oxide precursors
JPH0819381B2 (en) 1987-01-06 1996-02-28 日本合成ゴム株式会社 Coating composition
DE3810247A1 (en) 1987-03-26 1988-10-06 Toshiba Kawasaki Kk LIGHT SENSITIVE COATING
US4855199A (en) 1987-04-03 1989-08-08 General Electric Company Photopatterned product of silicone polyamic acid on a transparent substrate
JPS63312643A (en) 1987-06-16 1988-12-21 Mitsubishi Electric Corp Manufacture of semiconductor device
US4849296A (en) 1987-12-28 1989-07-18 Dow Corning Corporation Multilayer ceramic coatings from metal oxides and hydrogen silsesquioxane resin ceramified in ammonia
US4847162A (en) 1987-12-28 1989-07-11 Dow Corning Corporation Multilayer ceramics coatings from the ceramification of hydrogen silsequioxane resin in the presence of ammonia
JPH01185367A (en) 1988-01-18 1989-07-24 Toshiba Silicone Co Ltd Surface-treated polymethylsilsesquioxane powder
US4921778A (en) 1988-07-29 1990-05-01 Shipley Company Inc. Photoresist pattern fabrication employing chemically amplified metalized material
US4981530A (en) 1988-11-28 1991-01-01 International Business Machines Corporation Planarizing ladder-type silsesquioxane polymer insulation layer
US4885262A (en) 1989-03-08 1989-12-05 Intel Corporation Chemical modification of spin-on glass for improved performance in IC fabrication
US4999397A (en) 1989-07-28 1991-03-12 Dow Corning Corporation Metastable silane hydrolyzates and process for their preparation
US5045592A (en) 1989-07-28 1991-09-03 Dow Corning Corporation Metastable silane hydrolyzates
CA2027031A1 (en) 1989-10-18 1991-04-19 Loren A. Haluska Hermetic substrate coatings in an inert gas atmosphere
US4973526A (en) 1990-02-15 1990-11-27 Dow Corning Corporation Method of forming ceramic coatings and resulting articles
US5043789A (en) 1990-03-15 1991-08-27 International Business Machines Corporation Planarizing silsesquioxane copolymer coating
JPH03272131A (en) 1990-03-22 1991-12-03 Oki Electric Ind Co Ltd Manufacture of semiconductor element
US5059448A (en) 1990-06-18 1991-10-22 Dow Corning Corporation Rapid thermal process for obtaining silica coatings
US5472488A (en) 1990-09-14 1995-12-05 Hyundai Electronics America Coating solution for forming glassy layers
US5100503A (en) 1990-09-14 1992-03-31 Ncr Corporation Silica-based anti-reflective planarizing layer
US5527872A (en) 1990-09-14 1996-06-18 At&T Global Information Solutions Company Electronic device with a spin-on glass dielectric layer
US5063267A (en) 1990-11-28 1991-11-05 Dow Corning Corporation Hydrogen silsesquioxane resin fractions and their use as coating materials
DE4132697A1 (en) * 1991-10-01 1993-04-08 Wacker Chemie Gmbh METHOD FOR PRODUCING ORGANOPOLYSILOXANE RESIN
US6165697A (en) 1991-11-15 2000-12-26 Shipley Company, L.L.C. Antihalation compositions
JPH0656560A (en) 1992-08-10 1994-03-01 Sony Corp Sog composition and production of semiconductor device by using this composition
JPH06333803A (en) 1992-09-18 1994-12-02 Sharp Corp Filter for projection type exposure device
US5328975A (en) * 1993-04-02 1994-07-12 Ppg Industries, Inc. Ultraviolet radiation absorbing coating
DE4338360A1 (en) * 1993-11-10 1995-05-11 Inst Neue Mat Gemein Gmbh Process for the production of functional glass-like layers
JP3272131B2 (en) 1993-12-27 2002-04-08 マツダ株式会社 Gear transmission meshing device
JP3301215B2 (en) 1994-05-31 2002-07-15 ソニー株式会社 Halftone phase shift mask, translucent portion forming material used for producing halftone phase shift mask, and method for producing halftone phase shift mask
US5729563A (en) 1994-07-07 1998-03-17 Hewlett-Packard Company Method and apparatus for optically and thermally isolating surface emitting laser diodes
TW404974B (en) * 1995-07-19 2000-09-11 Kansai Paint Co Ltd Solidifiable coating composite
US5693691A (en) 1995-08-21 1997-12-02 Brewer Science, Inc. Thermosetting anti-reflective coatings compositions
US5583195A (en) * 1995-09-29 1996-12-10 General Electric Company Photocurable epoxy silicones functionalized with fluorescent or photosensitizing marker dyes
JP3473887B2 (en) 1997-07-16 2003-12-08 東京応化工業株式会社 Composition for forming antireflection film and method for forming resist pattern using the same
US5962067A (en) * 1997-09-09 1999-10-05 Lucent Technologies Inc. Method for coating an article with a ladder siloxane polymer and coated article
US6268457B1 (en) * 1999-06-10 2001-07-31 Allied Signal, Inc. Spin-on glass anti-reflective coatings for photolithography
JP4248098B2 (en) * 1999-09-20 2009-04-02 東京応化工業株式会社 Antireflection film forming composition and resist pattern forming method

Also Published As

Publication number Publication date
TW200512257A (en) 2005-04-01
TWI238174B (en) 2005-08-21
WO2002006402A1 (en) 2002-01-24
CA2413726C (en) 2005-11-29
CN1443218A (en) 2003-09-17
US20030199659A1 (en) 2003-10-23
CN1296435C (en) 2007-01-24
KR100804870B1 (en) 2008-02-20
US6605362B2 (en) 2003-08-12
KR20030031120A (en) 2003-04-18
US20020068181A1 (en) 2002-06-06
US6914114B2 (en) 2005-07-05
CA2413726A1 (en) 2002-01-24
EP1301569A1 (en) 2003-04-16
JP2004504328A (en) 2004-02-12
EP1301569A4 (en) 2007-08-29
US6368400B1 (en) 2002-04-09

Similar Documents

Publication Publication Date Title
AU2001280558A1 (en) Absorbing compounds for spin-on glass anti-reflective coatings for photolithography
AU2002227106A1 (en) Spin-on anti-reflective coatings for photolithography
AU5600200A (en) Spin-on-glass anti-reflective coatings for photolithography
AU2002336709A1 (en) Spin-on-glass anti-reflective coatings for photolithography
AU3278899A (en) Filter for extreme ultraviolet lithography
AU2001277097A1 (en) Ultraviolet filter coating
AU5546000A (en) Compounds
AU2002225730A1 (en) Compounds
EP1478681A4 (en) Spin-on-glass anti-reflective coatings for photolithography
AU6599300A (en) Photoresist remover composition
AU5561800A (en) Sorbent composition
AU3840000A (en) Tricyclic compounds
AU2002218410A1 (en) Retractable towers
EP1316360B8 (en) Fabrication methods for thin-well microplate
AU2001253362A1 (en) Novel compounds
AU1746401A (en) Compounds
AUPQ949600A0 (en) Anti-reflection coated lens
AU2001256964A1 (en) Novel compounds
AU2002225724A1 (en) Motilide compounds
AU2002217285A1 (en) Compounds
AU2001230689A1 (en) Novel compounds
AU2002216060A1 (en) Novel compounds
AU5883800A (en) Collapsible mist eliminator
AU3199201A (en) Optical components
AU2001276890A1 (en) Novel compounds