TW521392B - Fuse circuit - Google Patents

Fuse circuit Download PDF

Info

Publication number
TW521392B
TW521392B TW090132334A TW90132334A TW521392B TW 521392 B TW521392 B TW 521392B TW 090132334 A TW090132334 A TW 090132334A TW 90132334 A TW90132334 A TW 90132334A TW 521392 B TW521392 B TW 521392B
Authority
TW
Taiwan
Prior art keywords
circuit
fuse element
voltage
state
potential
Prior art date
Application number
TW090132334A
Other languages
English (en)
Chinese (zh)
Inventor
Tohru Kimura
Masaru Koyanagi
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of TW521392B publication Critical patent/TW521392B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18—Auxiliary circuits, e.g. for writing into memory
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Read Only Memory (AREA)
  • Fuses (AREA)
TW090132334A 2000-12-27 2001-12-26 Fuse circuit TW521392B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000399222A JP2002203901A (ja) 2000-12-27 2000-12-27 フューズ回路

Publications (1)

Publication Number Publication Date
TW521392B true TW521392B (en) 2003-02-21

Family

ID=18864036

Family Applications (1)

Application Number Title Priority Date Filing Date
TW090132334A TW521392B (en) 2000-12-27 2001-12-26 Fuse circuit

Country Status (7)

Country Link
US (1) US6657531B2 (enExample)
EP (1) EP1221699B1 (enExample)
JP (1) JP2002203901A (enExample)
KR (1) KR100458884B1 (enExample)
CN (1) CN1362741A (enExample)
DE (1) DE60129292T2 (enExample)
TW (1) TW521392B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI803411B (zh) * 2022-07-04 2023-05-21 南亞科技股份有限公司 記憶體元件及其形成方法

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6774457B2 (en) * 2001-09-13 2004-08-10 Texas Instruments Incorporated Rectangular contact used as a low voltage fuse element
KR100448703B1 (ko) * 2001-10-24 2004-09-16 삼성전자주식회사 메이크 링크 퓨즈를 구비한 회로 및 이를 이용한 반도체장치
JP4179834B2 (ja) * 2002-09-19 2008-11-12 株式会社リコー 半導体装置の製造装置及び製造方法
JP4456816B2 (ja) * 2003-01-29 2010-04-28 川崎マイクロエレクトロニクス株式会社 半導体装置およびその製造方法
JP3878586B2 (ja) 2003-07-17 2007-02-07 株式会社東芝 リード／プログラム電位発生回路
KR100528480B1 (ko) 2003-12-09 2005-11-15 삼성전자주식회사 반도체장치의 전기적 퓨즈 회로
KR100791071B1 (ko) * 2006-07-04 2008-01-02 삼성전자주식회사 일회 프로그래머블 소자, 이를 구비하는 전자시스템 및 그동작 방법
JP5119626B2 (ja) * 2006-08-18 2013-01-16 富士通セミコンダクター株式会社 電気ヒューズ回路
US8350264B2 (en) 2010-07-14 2013-01-08 International Businesss Machines Corporation Secure anti-fuse with low voltage programming through localized diffusion heating
KR101240256B1 (ko) * 2011-03-28 2013-03-11 에스케이하이닉스 주식회사 반도체 집적회로
CN103871475B (zh) * 2014-02-21 2016-09-14 中国电子科技集团公司第二十四研究所 上电自复位的熔丝读取电路
KR20150144147A (ko) * 2014-06-16 2015-12-24 에스케이하이닉스 주식회사 반도체 장치 및 그의 동작방법
CN117133342A (zh) * 2022-05-19 2023-11-28 长鑫存储技术有限公司 反熔丝电路及反熔丝单元烧写状态验证方法
CN117133341A (zh) * 2022-05-19 2023-11-28 长鑫存储技术有限公司 反熔丝电路及反熔丝单元烧写状态实时验证方法

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Publication number Priority date Publication date Assignee Title
JPS60182219A (ja) * 1984-02-29 1985-09-17 Fujitsu Ltd 半導体装置
JPS60201598A (ja) * 1984-03-23 1985-10-12 Fujitsu Ltd 半導体集積回路
US5243226A (en) * 1991-07-31 1993-09-07 Quicklogic Corporation Programming of antifuses
US5241496A (en) * 1991-08-19 1993-08-31 Micron Technology, Inc. Array of read-only memory cells, eacch of which has a one-time, voltage-programmable antifuse element constructed within a trench shared by a pair of cells
US5418487A (en) * 1992-09-04 1995-05-23 Benchmarg Microelectronics, Inc. Fuse state sense circuit
FR2697673B1 (fr) * 1992-10-29 1994-12-16 Gemplus Card Int Circuit à fusible, pour circuit intégré.
US5444650A (en) * 1994-01-25 1995-08-22 Nippondenso Co., Ltd. Semiconductor programmable read only memory device
US5635854A (en) * 1994-05-24 1997-06-03 Philips Electronics North America Corporation Programmable logic integrated circuit including verify circuitry for classifying fuse link states as validly closed, validly open or invalid
KR970017759A (ko) * 1995-09-14 1997-04-30 김광호 반도체 장치의 퓨즈용단 선택회로
US5731733A (en) * 1995-09-29 1998-03-24 Intel Corporation Static, low current sensing circuit for sensing the state of a fuse device
KR100228522B1 (ko) * 1996-08-06 1999-11-01 윤종용 부분칩을 통한 전류 절감특성을 갖는 반도체메모리장치
JP3361018B2 (ja) * 1996-11-11 2003-01-07 株式会社東芝 半導体記憶装置
KR100250755B1 (ko) * 1996-12-28 2000-05-01 김영환 플래쉬 메모리 장치
JP3401522B2 (ja) * 1998-07-06 2003-04-28 日本電気株式会社 ヒューズ回路及び冗長デコーダ回路
US6172929B1 (en) * 1999-06-25 2001-01-09 Micron Technology, Inc. Integrated circuit having aligned fuses and methods for forming and programming the fuses
JP3848022B2 (ja) 1999-08-27 2006-11-22 株式会社東芝 電気フューズ素子を備えた半導体集積回路装置
US6346846B1 (en) * 1999-12-17 2002-02-12 International Business Machines Corporation Methods and apparatus for blowing and sensing antifuses
KR100363327B1 (ko) * 2000-03-23 2002-11-30 삼성전자 주식회사 퓨즈 회로 및 그것의 프로그램 상태 검출 방법
JP3526446B2 (ja) * 2000-06-09 2004-05-17 株式会社東芝 フューズプログラム回路
JP2002133895A (ja) * 2000-08-17 2002-05-10 Toshiba Corp アンチフューズを用いたリダンダンシ回路及び半導体メモリにおける不良アドレス検索方法
US6426911B1 (en) * 2000-10-19 2002-07-30 Infineon Technologies Ag Area efficient method for programming electrical fuses
JP2002134620A (ja) * 2000-10-27 2002-05-10 Mitsubishi Electric Corp 半導体装置
JP2002217295A (ja) * 2001-01-12 2002-08-02 Toshiba Corp 半導体装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI803411B (zh) * 2022-07-04 2023-05-21 南亞科技股份有限公司 記憶體元件及其形成方法

Also Published As

Publication number Publication date
EP1221699A3 (en) 2004-11-17
EP1221699A2 (en) 2002-07-10
US6657531B2 (en) 2003-12-02
KR20020053769A (ko) 2002-07-05
US20020080004A1 (en) 2002-06-27
DE60129292T2 (de) 2008-03-20
JP2002203901A (ja) 2002-07-19
DE60129292D1 (de) 2007-08-23
CN1362741A (zh) 2002-08-07
KR100458884B1 (ko) 2004-12-03
EP1221699B1 (en) 2007-07-11

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