DE60129292D1 - Schmelzsicherungsschaltung mit Kondensatoren als Sicherungselemente - Google Patents
Schmelzsicherungsschaltung mit Kondensatoren als SicherungselementeInfo
- Publication number
- DE60129292D1 DE60129292D1 DE60129292T DE60129292T DE60129292D1 DE 60129292 D1 DE60129292 D1 DE 60129292D1 DE 60129292 T DE60129292 T DE 60129292T DE 60129292 T DE60129292 T DE 60129292T DE 60129292 D1 DE60129292 D1 DE 60129292D1
- Authority
- DE
- Germany
- Prior art keywords
- fuse
- capacitors
- elements
- circuit
- fuse circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/18—Auxiliary circuits, e.g. for writing into memory
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000399222 | 2000-12-27 | ||
JP2000399222A JP2002203901A (ja) | 2000-12-27 | 2000-12-27 | フューズ回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60129292D1 true DE60129292D1 (de) | 2007-08-23 |
DE60129292T2 DE60129292T2 (de) | 2008-03-20 |
Family
ID=18864036
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60129292T Expired - Lifetime DE60129292T2 (de) | 2000-12-27 | 2001-12-21 | Schmelzsicherungsschaltung mit Kondensatoren als Sicherungselemente |
Country Status (7)
Country | Link |
---|---|
US (1) | US6657531B2 (de) |
EP (1) | EP1221699B1 (de) |
JP (1) | JP2002203901A (de) |
KR (1) | KR100458884B1 (de) |
CN (1) | CN1362741A (de) |
DE (1) | DE60129292T2 (de) |
TW (1) | TW521392B (de) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6774457B2 (en) * | 2001-09-13 | 2004-08-10 | Texas Instruments Incorporated | Rectangular contact used as a low voltage fuse element |
KR100448703B1 (ko) * | 2001-10-24 | 2004-09-16 | 삼성전자주식회사 | 메이크 링크 퓨즈를 구비한 회로 및 이를 이용한 반도체장치 |
JP4179834B2 (ja) * | 2002-09-19 | 2008-11-12 | 株式会社リコー | 半導体装置の製造装置及び製造方法 |
JP4456816B2 (ja) * | 2003-01-29 | 2010-04-28 | 川崎マイクロエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
JP3878586B2 (ja) | 2003-07-17 | 2007-02-07 | 株式会社東芝 | リード/プログラム電位発生回路 |
KR100528480B1 (ko) | 2003-12-09 | 2005-11-15 | 삼성전자주식회사 | 반도체장치의 전기적 퓨즈 회로 |
KR100791071B1 (ko) * | 2006-07-04 | 2008-01-02 | 삼성전자주식회사 | 일회 프로그래머블 소자, 이를 구비하는 전자시스템 및 그동작 방법 |
JP5119626B2 (ja) * | 2006-08-18 | 2013-01-16 | 富士通セミコンダクター株式会社 | 電気ヒューズ回路 |
US8350264B2 (en) | 2010-07-14 | 2013-01-08 | International Businesss Machines Corporation | Secure anti-fuse with low voltage programming through localized diffusion heating |
KR101240256B1 (ko) * | 2011-03-28 | 2013-03-11 | 에스케이하이닉스 주식회사 | 반도체 집적회로 |
CN103871475B (zh) * | 2014-02-21 | 2016-09-14 | 中国电子科技集团公司第二十四研究所 | 上电自复位的熔丝读取电路 |
KR20150144147A (ko) * | 2014-06-16 | 2015-12-24 | 에스케이하이닉스 주식회사 | 반도체 장치 및 그의 동작방법 |
CN117133341A (zh) * | 2022-05-19 | 2023-11-28 | 长鑫存储技术有限公司 | 反熔丝电路及反熔丝单元烧写状态实时验证方法 |
CN117133342A (zh) * | 2022-05-19 | 2023-11-28 | 长鑫存储技术有限公司 | 反熔丝电路及反熔丝单元烧写状态验证方法 |
US20240008269A1 (en) * | 2022-07-04 | 2024-01-04 | Nanya Technology Corporation | Memory device and method of forming the same |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60182219A (ja) * | 1984-02-29 | 1985-09-17 | Fujitsu Ltd | 半導体装置 |
JPS60201598A (ja) * | 1984-03-23 | 1985-10-12 | Fujitsu Ltd | 半導体集積回路 |
US5243226A (en) * | 1991-07-31 | 1993-09-07 | Quicklogic Corporation | Programming of antifuses |
US5241496A (en) * | 1991-08-19 | 1993-08-31 | Micron Technology, Inc. | Array of read-only memory cells, eacch of which has a one-time, voltage-programmable antifuse element constructed within a trench shared by a pair of cells |
US5418487A (en) * | 1992-09-04 | 1995-05-23 | Benchmarg Microelectronics, Inc. | Fuse state sense circuit |
FR2697673B1 (fr) * | 1992-10-29 | 1994-12-16 | Gemplus Card Int | Circuit à fusible, pour circuit intégré. |
US5444650A (en) * | 1994-01-25 | 1995-08-22 | Nippondenso Co., Ltd. | Semiconductor programmable read only memory device |
US5635854A (en) * | 1994-05-24 | 1997-06-03 | Philips Electronics North America Corporation | Programmable logic integrated circuit including verify circuitry for classifying fuse link states as validly closed, validly open or invalid |
KR970017759A (ko) * | 1995-09-14 | 1997-04-30 | 김광호 | 반도체 장치의 퓨즈용단 선택회로 |
US5731733A (en) * | 1995-09-29 | 1998-03-24 | Intel Corporation | Static, low current sensing circuit for sensing the state of a fuse device |
KR100228522B1 (ko) * | 1996-08-06 | 1999-11-01 | 윤종용 | 부분칩을 통한 전류 절감특성을 갖는 반도체메모리장치 |
JP3361018B2 (ja) * | 1996-11-11 | 2003-01-07 | 株式会社東芝 | 半導体記憶装置 |
KR100250755B1 (ko) * | 1996-12-28 | 2000-05-01 | 김영환 | 플래쉬 메모리 장치 |
JP3401522B2 (ja) * | 1998-07-06 | 2003-04-28 | 日本電気株式会社 | ヒューズ回路及び冗長デコーダ回路 |
US6172929B1 (en) * | 1999-06-25 | 2001-01-09 | Micron Technology, Inc. | Integrated circuit having aligned fuses and methods for forming and programming the fuses |
JP3848022B2 (ja) | 1999-08-27 | 2006-11-22 | 株式会社東芝 | 電気フューズ素子を備えた半導体集積回路装置 |
US6346846B1 (en) * | 1999-12-17 | 2002-02-12 | International Business Machines Corporation | Methods and apparatus for blowing and sensing antifuses |
KR100363327B1 (ko) * | 2000-03-23 | 2002-11-30 | 삼성전자 주식회사 | 퓨즈 회로 및 그것의 프로그램 상태 검출 방법 |
JP3526446B2 (ja) * | 2000-06-09 | 2004-05-17 | 株式会社東芝 | フューズプログラム回路 |
JP2002133895A (ja) * | 2000-08-17 | 2002-05-10 | Toshiba Corp | アンチフューズを用いたリダンダンシ回路及び半導体メモリにおける不良アドレス検索方法 |
US6426911B1 (en) * | 2000-10-19 | 2002-07-30 | Infineon Technologies Ag | Area efficient method for programming electrical fuses |
JP2002134620A (ja) * | 2000-10-27 | 2002-05-10 | Mitsubishi Electric Corp | 半導体装置 |
JP2002217295A (ja) * | 2001-01-12 | 2002-08-02 | Toshiba Corp | 半導体装置 |
-
2000
- 2000-12-27 JP JP2000399222A patent/JP2002203901A/ja active Pending
-
2001
- 2001-12-21 EP EP01130511A patent/EP1221699B1/de not_active Expired - Lifetime
- 2001-12-21 US US10/026,230 patent/US6657531B2/en not_active Expired - Fee Related
- 2001-12-21 DE DE60129292T patent/DE60129292T2/de not_active Expired - Lifetime
- 2001-12-26 TW TW090132334A patent/TW521392B/zh active
- 2001-12-27 KR KR10-2001-0085949A patent/KR100458884B1/ko not_active IP Right Cessation
- 2001-12-27 CN CN01143949A patent/CN1362741A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
JP2002203901A (ja) | 2002-07-19 |
TW521392B (en) | 2003-02-21 |
CN1362741A (zh) | 2002-08-07 |
DE60129292T2 (de) | 2008-03-20 |
EP1221699B1 (de) | 2007-07-11 |
US6657531B2 (en) | 2003-12-02 |
US20020080004A1 (en) | 2002-06-27 |
EP1221699A3 (de) | 2004-11-17 |
KR100458884B1 (ko) | 2004-12-03 |
EP1221699A2 (de) | 2002-07-10 |
KR20020053769A (ko) | 2002-07-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |