TW374848B - Patterns generator - Google Patents
Patterns generatorInfo
- Publication number
- TW374848B TW374848B TW086117990A TW86117990A TW374848B TW 374848 B TW374848 B TW 374848B TW 086117990 A TW086117990 A TW 086117990A TW 86117990 A TW86117990 A TW 86117990A TW 374848 B TW374848 B TW 374848B
- Authority
- TW
- Taiwan
- Prior art keywords
- address
- pattern
- dut
- signals
- testing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31924996 | 1996-11-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW374848B true TW374848B (en) | 1999-11-21 |
Family
ID=18108088
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086117990A TW374848B (en) | 1996-11-29 | 1997-11-29 | Patterns generator |
Country Status (6)
Country | Link |
---|---|
US (1) | US6249533B1 (zh) |
JP (1) | JP3091234B2 (zh) |
KR (1) | KR100310969B1 (zh) |
DE (1) | DE19781563C2 (zh) |
TW (1) | TW374848B (zh) |
WO (1) | WO1998023968A1 (zh) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100379721B1 (ko) * | 2001-05-23 | 2003-04-10 | 송동섭 | 경계주사 테스트용 테스트벡터의 생성방법 |
US7743305B2 (en) | 2007-03-20 | 2010-06-22 | Advantest Corporation | Test apparatus, and electronic device |
US7716541B2 (en) | 2007-03-21 | 2010-05-11 | Advantest Corporation | Test apparatus and electronic device for generating test signal to a device under test |
US8891872B2 (en) * | 2011-12-16 | 2014-11-18 | General Electric Company | System and method for identifying physical markings on objects |
KR20170023439A (ko) | 2015-08-24 | 2017-03-06 | 삼성전자주식회사 | 메모리 테스트 시스템 및 메모리 시스템 |
US10872394B2 (en) * | 2017-04-27 | 2020-12-22 | Daegu Gyeongbuk Institute Of Science And Technology | Frequent pattern mining method and apparatus |
US11102596B2 (en) | 2019-11-19 | 2021-08-24 | Roku, Inc. | In-sync digital waveform comparison to determine pass/fail results of a device under test (DUT) |
CN111294022B (zh) * | 2020-03-23 | 2022-10-28 | 中国科学技术大学 | 序列信号发生器 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3237365A1 (de) * | 1982-10-08 | 1984-04-12 | Siemens AG, 1000 Berlin und 8000 München | Anordnung zur erzeugung von mustern von pruefsignalen bei einem pruefgeraet |
JPS5990067A (ja) * | 1982-11-15 | 1984-05-24 | Advantest Corp | 論理回路試験用パタ−ン発生装置 |
JPS59225368A (ja) | 1983-06-06 | 1984-12-18 | Fujitsu Ltd | 論理回路試験装置 |
JPH0641966B2 (ja) * | 1984-02-15 | 1994-06-01 | 株式会社アドバンテスト | パタ−ン発生装置 |
JPS61241674A (ja) | 1985-04-19 | 1986-10-27 | Hitachi Ltd | テストパタ−ン発生器 |
JP2936547B2 (ja) | 1989-06-16 | 1999-08-23 | 株式会社アドバンテスト | 試験パターン発生器 |
US5321700A (en) | 1989-10-11 | 1994-06-14 | Teradyne, Inc. | High speed timing generator |
JP2882426B2 (ja) * | 1991-03-29 | 1999-04-12 | 株式会社アドバンテスト | アドレス発生装置 |
JP2753407B2 (ja) | 1991-09-17 | 1998-05-20 | 三菱電機株式会社 | Icテストパターン発生装置 |
JPH0630786A (ja) | 1992-07-14 | 1994-02-08 | Kyowa Hakko Kogyo Co Ltd | バイスペシフィック抗体 |
JPH0630786U (ja) * | 1992-09-25 | 1994-04-22 | 安藤電気株式会社 | パターン発生器 |
JP3154444B2 (ja) | 1992-10-20 | 2001-04-09 | 株式会社アドバンテスト | 試験パターン発生器 |
JPH08271592A (ja) | 1995-03-28 | 1996-10-18 | Advantest Corp | パターン発生器におけるループシーケンス発生回路 |
US6094738A (en) * | 1995-09-06 | 2000-07-25 | Advantest Corp. | Test pattern generation apparatus and method for SDRAM |
-
1997
- 1997-11-28 WO PCT/JP1997/004367 patent/WO1998023968A1/ja active IP Right Grant
- 1997-11-28 JP JP10524534A patent/JP3091234B2/ja not_active Expired - Fee Related
- 1997-11-28 DE DE19781563T patent/DE19781563C2/de not_active Expired - Fee Related
- 1997-11-28 KR KR1019980705320A patent/KR100310969B1/ko not_active IP Right Cessation
- 1997-11-28 US US09/117,323 patent/US6249533B1/en not_active Expired - Fee Related
- 1997-11-29 TW TW086117990A patent/TW374848B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR20000004903A (ko) | 2000-01-25 |
DE19781563C2 (de) | 2001-02-15 |
JP3091234B2 (ja) | 2000-09-25 |
WO1998023968A1 (fr) | 1998-06-04 |
DE19781563T1 (de) | 1998-12-17 |
KR100310969B1 (ko) | 2001-11-15 |
US6249533B1 (en) | 2001-06-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |