TW200811452A - Contact-type probe using ball - Google Patents

Contact-type probe using ball Download PDF

Info

Publication number
TW200811452A
TW200811452A TW096125193A TW96125193A TW200811452A TW 200811452 A TW200811452 A TW 200811452A TW 096125193 A TW096125193 A TW 096125193A TW 96125193 A TW96125193 A TW 96125193A TW 200811452 A TW200811452 A TW 200811452A
Authority
TW
Taiwan
Prior art keywords
steel ball
contact
sphere
steel
ball
Prior art date
Application number
TW096125193A
Other languages
English (en)
Chinese (zh)
Other versions
TWI340248B (ja
Inventor
Tak Eun
Jong-In Park
Original Assignee
Microinspection Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microinspection Inc filed Critical Microinspection Inc
Publication of TW200811452A publication Critical patent/TW200811452A/zh
Application granted granted Critical
Publication of TWI340248B publication Critical patent/TWI340248B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
TW096125193A 2006-08-03 2007-07-11 Contact-type probe using ball TW200811452A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060073520A KR100752938B1 (ko) 2006-08-03 2006-08-03 볼을 이용한 접촉식 프로브

Publications (2)

Publication Number Publication Date
TW200811452A true TW200811452A (en) 2008-03-01
TWI340248B TWI340248B (ja) 2011-04-11

Family

ID=38615639

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096125193A TW200811452A (en) 2006-08-03 2007-07-11 Contact-type probe using ball

Country Status (4)

Country Link
JP (1) JP4584961B2 (ja)
KR (1) KR100752938B1 (ja)
CN (1) CN101118271B (ja)
TW (1) TW200811452A (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101233070B1 (ko) * 2011-09-30 2013-02-25 마이크로 인스펙션 주식회사 비접촉 프로브
CN109668663B (zh) * 2018-12-14 2021-02-05 河南科技大学 微型轴承摩擦力矩测试装置及测试方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5814170U (ja) * 1981-07-20 1983-01-28 株式会社ミツトヨ タツチ信号プロ−ブ
JPH02278161A (ja) * 1989-04-19 1990-11-14 Fujitsu Ltd 測定用接触針
NL8902695A (nl) * 1989-11-01 1991-06-03 Philips Nv Interconnectiestructuur.
JP2820233B2 (ja) * 1993-06-11 1998-11-05 シャープ株式会社 表示装置の検査装置および検査方法
JP3130883B2 (ja) * 1998-12-11 2001-01-31 九州日本電気株式会社 コンタクタ
JP2001033483A (ja) * 1999-07-19 2001-02-09 Toshiba Corp プロービング試験装置
KR100350513B1 (ko) * 2000-04-03 2002-08-28 박태욱 피디피 전극 검사 프로브장치
JP3973406B2 (ja) * 2001-11-12 2007-09-12 株式会社アドバンテスト Ｉｃソケット
JP2004045109A (ja) * 2002-07-10 2004-02-12 Ricoh Co Ltd 薄膜の電気抵抗測定方法と測定装置及び定着ローラの検査装置
JP2005055343A (ja) * 2003-08-06 2005-03-03 Tokyo Cathode Laboratory Co Ltd フラットパネルディスプレイ検査用プローブ装置

Also Published As

Publication number Publication date
CN101118271B (zh) 2010-09-01
JP2008039774A (ja) 2008-02-21
CN101118271A (zh) 2008-02-06
JP4584961B2 (ja) 2010-11-24
KR100752938B1 (ko) 2007-08-30
TWI340248B (ja) 2011-04-11

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