KR100752938B1 - 볼을 이용한 접촉식 프로브 - Google Patents

볼을 이용한 접촉식 프로브 Download PDF

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Publication number
KR100752938B1
KR100752938B1 KR1020060073520A KR20060073520A KR100752938B1 KR 100752938 B1 KR100752938 B1 KR 100752938B1 KR 1020060073520 A KR1020060073520 A KR 1020060073520A KR 20060073520 A KR20060073520 A KR 20060073520A KR 100752938 B1 KR100752938 B1 KR 100752938B1
Authority
KR
South Korea
Prior art keywords
support member
steel ball
ball
steel
steel balls
Prior art date
Application number
KR1020060073520A
Other languages
English (en)
Korean (ko)
Inventor
은탁
박종인
Original Assignee
마이크로 인스펙션 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 마이크로 인스펙션 주식회사 filed Critical 마이크로 인스펙션 주식회사
Priority to KR1020060073520A priority Critical patent/KR100752938B1/ko
Priority to TW096125193A priority patent/TW200811452A/zh
Priority to JP2007189592A priority patent/JP4584961B2/ja
Priority to CN200710137691XA priority patent/CN101118271B/zh
Application granted granted Critical
Publication of KR100752938B1 publication Critical patent/KR100752938B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
KR1020060073520A 2006-08-03 2006-08-03 볼을 이용한 접촉식 프로브 KR100752938B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020060073520A KR100752938B1 (ko) 2006-08-03 2006-08-03 볼을 이용한 접촉식 프로브
TW096125193A TW200811452A (en) 2006-08-03 2007-07-11 Contact-type probe using ball
JP2007189592A JP4584961B2 (ja) 2006-08-03 2007-07-20 ボールを用いた接触式プローブ
CN200710137691XA CN101118271B (zh) 2006-08-03 2007-08-02 使用球体的接触式探测器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060073520A KR100752938B1 (ko) 2006-08-03 2006-08-03 볼을 이용한 접촉식 프로브

Publications (1)

Publication Number Publication Date
KR100752938B1 true KR100752938B1 (ko) 2007-08-30

Family

ID=38615639

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020060073520A KR100752938B1 (ko) 2006-08-03 2006-08-03 볼을 이용한 접촉식 프로브

Country Status (4)

Country Link
JP (1) JP4584961B2 (ja)
KR (1) KR100752938B1 (ja)
CN (1) CN101118271B (ja)
TW (1) TW200811452A (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101233070B1 (ko) * 2011-09-30 2013-02-25 마이크로 인스펙션 주식회사 비접촉 프로브
CN109668663B (zh) * 2018-12-14 2021-02-05 河南科技大学 微型轴承摩擦力矩测试装置及测试方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02278161A (ja) * 1989-04-19 1990-11-14 Fujitsu Ltd 測定用接触針

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5814170U (ja) * 1981-07-20 1983-01-28 株式会社ミツトヨ タツチ信号プロ−ブ
NL8902695A (nl) * 1989-11-01 1991-06-03 Philips Nv Interconnectiestructuur.
JP2820233B2 (ja) * 1993-06-11 1998-11-05 シャープ株式会社 表示装置の検査装置および検査方法
JP3130883B2 (ja) * 1998-12-11 2001-01-31 九州日本電気株式会社 コンタクタ
JP2001033483A (ja) * 1999-07-19 2001-02-09 Toshiba Corp プロービング試験装置
KR100350513B1 (ko) * 2000-04-03 2002-08-28 박태욱 피디피 전극 검사 프로브장치
JP3973406B2 (ja) * 2001-11-12 2007-09-12 株式会社アドバンテスト Ｉｃソケット
JP2004045109A (ja) * 2002-07-10 2004-02-12 Ricoh Co Ltd 薄膜の電気抵抗測定方法と測定装置及び定着ローラの検査装置
JP2005055343A (ja) * 2003-08-06 2005-03-03 Tokyo Cathode Laboratory Co Ltd フラットパネルディスプレイ検査用プローブ装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02278161A (ja) * 1989-04-19 1990-11-14 Fujitsu Ltd 測定用接触針

Also Published As

Publication number Publication date
TW200811452A (en) 2008-03-01
JP2008039774A (ja) 2008-02-21
TWI340248B (ja) 2011-04-11
CN101118271A (zh) 2008-02-06
CN101118271B (zh) 2010-09-01
JP4584961B2 (ja) 2010-11-24

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