KR100752938B1 - Contact type probe used a ball - Google Patents

Abstract

A contact type probe is provided to rotate easily a smaller ball contacting with a larger ball even with a small power. A third steel ball(53) is electrically connected with one out of first and second steel balls(51,52) due to a magnetic force. A first support member(41) and a second support member(42) are used for connecting electrically the first or second steel balls with each other as well as fixing the first and second steel balls. A spacing member(70) is used for spacing the first to third steel balls apart from each other by spacing the first and second support members apart from each other. A magnet(60) is used for magnetizing the first and second steel balls. The diameter of the third steel ball is larger than those of the first and second steel balls.

Description

Contact probe with ball {CONTACT TYPE PROBE USED A BALL}

1 is a diagram illustrating a general pin probe block.

Figure 2 is a perspective view showing the state of use of the contact probe using the ball according to the present invention, Figure 3 is a side view.

4 is a cross-sectional view showing a contact probe using a ball according to an embodiment of the present invention.

5 is a cross-sectional view showing a touch probe using a ball according to another embodiment of the present invention.

   -Explanation of symbols for the main parts of the drawings-

10: circuit board 15: pattern electrode

20: probe block 30: pin probe

40: contact probe using a ball

41: first support member 42: second support member

45: depression 50: transfer means

51: first steel ball 52: second steel ball

53: third steel ball 60: magnet

70: separation means

The present invention relates to a contact probe using a ball, and more particularly, using a large steel ball, which is attached to one side by magnetic force between two small steel balls, as a probe, connected to a small steel ball in point contact with the vertical displacement. The present invention relates to a contact probe using a ball for inspecting disconnection and short circuit while scanning a pattern electrode by enabling a rotation with a small force.

Currently used image display devices include a cathode ray tube (CRT), a liquid crystal display (LCD), a plasma display panel (PDP), and the like, which are flat panel display devices.

Among the image display devices, the cathode ray tube has superior performance to other devices in terms of image quality and brightness. However, there are disadvantages in that they are not suitable for applications requiring a large screen because they are bulky and heavy.

On the other hand, the flat panel display device has an advantage that the volume and weight is very small compared to the cathode ray tube, and its use is gradually increasing, and research on the display device as a next generation display device is being actively conducted.

In general, PDP (Plasma Display Panel) is neon by putting a gas such as Ne + Ar, Ne + Xe between the upper glass and the lower glass and the glass sealed by the partition between them It refers to an electronic display device that emits light to use as display light.

Accordingly, the plasma display displays various letters or patterns by forming a discharge point between discharge cells between the vertical pattern electrodes and the horizontal pattern electrodes of the upper and lower glass plates facing each other.

Therefore, PDP has been widely used for FA (factory automation) because it is possible to display large size with clear light emission, but now it is widely used for OA (office automation) such as personal computer with small size, light weight and high performance of display device. As the panel is not only high in display quality but also fast in response, demand is increasing rapidly as it is adopted as a wall-mounted TV.

In addition, since liquid crystals are easy to handle and have inherent characteristics in which the arrangement of crystals changes depending on whether or not an external electric field is present, display elements using liquid crystals, for example, ferroelectric liquid crystal devices (FLCDs) and twisted nematic (TN) -LCDs. , STN (Super Twisted Nematic) -LCD, Thin Film Transistor (TFT) -LCD, Plastic (LCD), Electro Luminescence (EL).

In general, driving driver ICs for driving such flat panel display panels are directly mounted in a chip on glass (COG) form or a tape carrier package (TCP) pre-assembled in a flexible PCB (FPC) or tape substrate (TS). To be mounted.

In the case of 42-inch PDP, the line width and pitch of one pattern electrode reaches 50 µm and 300 µm, respectively, and the pattern electrode pitch of TFT-LCD panel reaches 70 µm. Pattern electrodes on circuit boards with ICs are also becoming smaller and more multi-pinned.

In order to inspect the disconnection and the short circuit of the pattern electrode formed on the panel or the pattern electrode formed on the TS circuit board as shown in FIG. 1, a plurality of pin probes 30 are arranged to form the probe block 20 to form the pattern electrode. The signal generated from the signal generator (not shown) after the pressure contact with (15) is transmitted from one side of the pattern electrode 15 and then measured from the other side to check for disconnection and short circuit.

However, the inspection method of the pattern electrode by the pin probe as described above has the following problems.

First, the pin probe has a problem in that contact failure of the pin probe causes deformation due to repetitive contact operation.

Second, in order to solve this problem, if the diameter of the pin probe is smaller than the current to correspond to the contact surface of the narrow electrode of high resolution, it is vulnerable to the bending moment due to the rigidity of the pin probe, causing bending deformation in the wire. There is a problem that a poor contact occurs on the contact surface.

Third, the inspection method by the pin probe is a pressure contact method between the pin probe and the pattern electrode, there is a problem that expensive and durable pin probe is not only easily damaged during pressure contact but also takes a lot of cost due to replacement.

Fourth, if the position and pitch of the pattern electrode are changed due to the change in product model or design, the position and pitch of the pin probe are fixed. There is a problem that can not be used universally.

Fifth, there is a problem that another defective factor is generated due to damage of the pattern electrode due to the scratch (scratch) caused by the contact because the pin probe must be in pressure contact with the pattern electrode.

On the other hand, even in the case of rolling disk wheel type probe that solves the problem of the pin probe, it is difficult to produce a probe of a certain size or less because the ball bearing is used to reduce the friction generated when the disk wheel is rotated. .

The present invention has been made to solve the above problems, an object of the present invention is to use a large steel ball to be attached to one side by a magnetic force between two small steel balls as a probe is connected in small contact with the small ball The present invention provides a contact probe using a ball for inspecting disconnection and short circuit while scanning a pattern electrode by enabling free up and down displacement and easily rotating with a small force.

In order to achieve the above object, the present invention not only fixes the third steel ball and the first steel ball and the second steel ball which are electrically connected to any one steel ball by magnetic force between the first steel ball and the second steel ball. The first support member and the second support member for electrically connecting the first or second steel ball, and the first support member and the second support member so that the distance between the first and third steel balls can be maintained at regular intervals. It is characterized by consisting of a separation means for spaced to be maintained, and a magnet for magnetizing the first to second steel balls.

In the present invention, the diameter of the third steel ball is larger than the diameter of the first to second steel ball.

Spacer means in the present invention is characterized in that formed between the first support member and the second support member.

In the present invention, the first support member and the second support member is characterized in that the magnetic body.

In the present invention, the magnet is formed between the first support member and the second support member.

In the present invention, the first steel ball and the second steel ball are characterized in that each of the first support member and the second support member is embedded and fixed.

In the present invention, the center line of the first to the third steel ball is characterized in that located in a straight line.

The present invention is characterized in that it is electrically interfaced through the first support member and the second support member.

In addition, the contact probe using the ball according to the present invention, the first support member and the second support member is formed so that the depression is formed on the lower side facing the opposite, the first steel ball and the second steel ball embedded in the depression, respectively, Located between the first support member and the second support member, the third steel ball is positioned so that the center line is located on the center line between the first steel ball and the second steel ball and protrudes downward from the first support member and the second support member. It is characterized by consisting of a magnet not only to apply a magnetic force but also to maintain the distance of the first to third steel balls.

In the present invention, the first support member and the second support member is characterized in that the magnetic body.

In the present invention, the diameter of the third steel ball is larger than the diameter of the first to second steel ball.

The present invention is characterized in that it is electrically interfaced through the first support member and the second support member.

According to the present invention, the third steel ball located between the first and second steel balls is freely displaced up and down with respect to any one of the first and second steel balls without departing from the first to second steel balls by magnetic force. Not only has freedom, but also a small contact resistance can be rotated in contact with the pattern electrode without slipping, and by reducing the diameter of the steel ball it can also correspond to the pattern electrode of a fine pitch.

Hereinafter, exemplary embodiments of the present invention will be described with reference to the accompanying drawings, and the same parts as in the prior art use the same reference numerals and names. In addition, the present embodiment is not intended to limit the scope of the present invention, but is presented by way of example only and those skilled in the art will be capable of many modifications within the technical spirit of the present invention.

Figure 2 is a perspective view showing the state of use of the contact probe using the ball according to the present invention, Figure 3 is a side view.

As shown here, the contact probe 40 using the ball is fastened with the transfer means 50 of the disconnection and short-circuit inspection device (not shown) of the pattern electrode 15 to form the pattern electrode 15 and the ball 53. As the ball 53 rotates in contact with the pattern electrode 15 as it moves in the vertical direction of the pattern electrode 15, the disconnection and short circuit are inspected.

4 is a cross-sectional view taken along line A-A of the contact probe 40 using the ball shown in FIG.

As shown here, the depression 45 is formed on the lower side of the first support member 41 and the second support member 42, which are magnetic bodies installed to face each other, and the first embedded in the depression 45, respectively. The first support member 41 and the second support member are positioned such that the center line is positioned on the center line between the steel balls 51 and the second steel balls 52 and the first steel balls 51 and the second steel balls 52. A third steel ball 53 having a diameter larger than the diameter of the first to second steel balls 51 and 52 is provided to protrude downward from the 42.

In addition, it is located between the first support member 41 and the second support member 42 is used as the separation means for maintaining the distance of the first to third steel balls (51 to 53) as well as the first to second steel balls Magnets 60 for magnetizing the 51 and 52 are provided.

Alternatively, as shown in FIG. 5, the spacer 70 is provided between the first support member 41 and the second support member 42 to magnetize the first to second steel balls 51 and 52. The magnet 60 for contact may be installed in contact with the first support member 41 and the second support member 42 between the separation means 70.

At this time, the first support member 41, the second support member 42, and the magnet 60 are fixed by magnetic force, but the magnet 60, the first support member 41, and the second member are prevented from being pushed by an external force. The support member 42 may be fixed using an adhesive.

The first to second steel balls 51 and 52 connected to the third steel balls 53 are electrically connected to the third steel balls 53 contacting the pattern electrodes 15 and the disconnection and short circuit inspection devices. It is electrically interfaced through the first and second supporting members 41 and 42.

In this way, the third steel balls 53 positioned between the first to second steel balls 51 and 52 supported by the first support member 41 and the second support member 42 are formed in the magnetic lines of force. Since the point contact is made with any one of the first or second steel balls 51, 52 without being separated between the two steel balls 51, 52, and the other steel ball, the point contact is made. Based on one steel ball, it has freedom of displacement up and down.

In addition, since the third steel ball 53 is in point contact with one of the steel balls of the first to second steel balls 51 and 52 by magnetic force, the third steel ball 53 is spaced apart from the other steel ball. It can be easily rotated as a reference.

Accordingly, when the third steel ball 53 is point-contacted with the pattern electrode 15 to rotate in a rolling manner to check for disconnection and short circuit of the pattern electrode 15, the third steel ball may also be used for the pattern electrode 15 having various heights. In addition to making contact with the shanghai-dong of 53), even when scanning, the third steel ball 53 is easily rotated to be in contact with the pattern electrode 15 without scratching so that electrical inspection can be performed.

Thus, disconnection and short-circuit can be inspected while contacting the pattern electrode and the point contact by the point contact and rotating in the rolling method by using the magnetic force. It becomes possible.

As described above, the present invention uses a large steel ball that is attached to one side by magnetic force between two small steel balls as a probe, and is connected to the small steel ball by point contact, which enables free displacement up and down, and easily rotates even with a small force. There is a possible advantage.

The present invention has the advantage that the probe can be freely displaced vertically and can be easily rotated even with a small force to measure disconnection and short circuit by contacting without scratching the pattern electrode.

In addition, the present invention has the advantage that the wear life of the probe is long due to the small contact resistance of the probe.

In addition, the present invention has the advantage that can cope with the measurement of the fine pattern by producing a small diameter because the steel ball is connected to the point contact by the magnetic force to rotate without using the ball bearing used to reduce the rotational friction.

Claims (12)

A third steel ball 53 which is electrically connected to one of the steel balls by magnetic force between the first steel ball 51 and the second steel ball 52; The first support member 41 and the first support member 41 for fixing the first steel ball 51 and the second steel ball 52 as well as for electrically connecting the first steel ball 51 or the second steel ball 52. 2 support member 42, Spacing means 70 to space the first support member 41 and the second support member 42 to maintain a constant interval so that the interval between the first to third steel balls (51 ~ 53) can be maintained; , Magnet 60 for magnetizing the first steel ball 51 and the second steel ball 52 Contact probe using a ball, characterized in that consisting of. The contact probe according to claim 1, wherein the diameter of the third steel balls (53) is larger than that of the first to second steel balls (51) (52). The contact probe according to claim 1, wherein the separation means (70) is formed between the first support member (41) and the second support member (42). The contact probe according to claim 1, wherein the first support member (41) and the second support member (42) are magnetic bodies. The contact probe according to claim 1, wherein the magnet (60) is formed between the first support member (41) and the second support member (42). The method of claim 1, wherein the first steel ball 51 and the second steel ball 52 is embedded in the first support member 41 and the second support member 42 are fixed to each other using a ball Touch probe. The contact probe according to claim 1, wherein the center line of the first to third steel balls (51 to 53) is located in a straight line. The contact probe according to claim 1, wherein the first support member (41) and the second support member (42) are electrically interfaced with each other. A first supporting member 41 and a second supporting member 42 installed to face the recess 45 at a lower side thereof, A first steel ball 51 and a second steel ball 52 embedded in the depression 45, respectively, The center line is positioned on the center line between the first steel ball 51 and the second steel ball 52 and positioned to protrude downward from the first support member 41 and the second support member 42. The third steel ball 53, A magnet 60 positioned between the first support member 41 and the second support member 42 to not only apply magnetic force but also maintain the distance between the first to third steel balls 51 and 53. Contact probe using a ball, characterized in that consisting of. 10. The contact probe according to claim 9, wherein the first support member (41) and the second support member (42) are magnetic bodies. 10. The contact probe according to claim 9, wherein the diameter of the third steel balls (53) is larger than the diameter of the first to second steel balls (51) (52). 10. The contact probe according to claim 9, characterized in that it is electrically interfaced through the first support member (41) and the second support member (42).

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