TW200811452A - Contact-type probe using ball - Google Patents

Contact-type probe using ball Download PDF

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Publication number
TW200811452A
TW200811452A TW096125193A TW96125193A TW200811452A TW 200811452 A TW200811452 A TW 200811452A TW 096125193 A TW096125193 A TW 096125193A TW 96125193 A TW96125193 A TW 96125193A TW 200811452 A TW200811452 A TW 200811452A
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TW
Taiwan
Prior art keywords
steel ball
contact
sphere
steel
ball
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TW096125193A
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Chinese (zh)
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TWI340248B (en
Inventor
Tak Eun
Jong-In Park
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Microinspection Inc
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Publication of TW200811452A publication Critical patent/TW200811452A/en
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Publication of TWI340248B publication Critical patent/TWI340248B/zh

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • G01R1/06738Geometry aspects related to tip portion
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

To provide a contact-type probe, using a ball that can be easily rolled, even with a small amount of power which can inspect wire breakages and short circuits, while scanning a pattern electrode. The contact-type probe uses a ball, and a large steel ball disposed between two small steel balls so as to make contact with either of the steel balls with magnetic force is used as a probe element. The probe element is linked to a small steel ball in a point-contact manner. The probe element can be displaced freely vertically. The probe element can be rolled even with a small amount of power. The probe can measure a pattern electrode for wire breakages and short circuits without damages, such as scratches. Furthermore, there is an advantage that the low contact resistance of the probe element causes less wear, and prolongs the lifetime of the probe. Since the steel ball, serving as the probe element, can be manufactured with a small diameter, the probe can be used for measuring micropatterns.

Description

200811452 九、發明說明: 【發明所屬之技術領域】 本發明係有關於使用球體之接觸式偵測器,更詳細說 明之,係有關於使用球體之接觸式備測器,其係將作成利 用磁力接觸2個小鋼球間之任一個鋼球的大鋼球作為偵測 頭,藉此,偵測頭以點接觸和小鋼球連結,並可上下自由 地位移,而且即使係小力亦可易於轉動,並可一面掃描圖 案電極一面檢查斷線及短路。 【先前技術】 在現在使用的影像顯示元件,有陰極射線管(〔π)、係 平面顯示元件之液晶顯示元件(LCD)、電漿顯示面板(PDP) 等。 其中尤其,陰極射線管具有在晝質及亮度上比其他的 元件格外優異之性能,但是因為體積和重量大,所以不適 合大型銀幕。 而平面顯示元件因為體積和重量遠比陰極射線管的 J所以其使用範圍正愈擴大,作為下世代顯示元件,其 研究正盛行。 一般,PDP(PlaSma Display Panel)意指對利用上板玻 璃和下板玻璃以及其中間之隔板所密閉的玻璃間裝入 k + Ar Ne + Xe等之氣體,並利用陽極和陰極的電極施加電 壓,使發出氖光,將其用作顯示光的電子顯示裝置。 因此,PDP將相向之上板玻璃和下板玻璃的縱圖案電200811452 IX. Description of the Invention: [Technical Field of the Invention] The present invention relates to a contact type detector using a sphere, and more specifically relates to a contact type detector using a sphere, which is to be made using a magnetic force A large steel ball that contacts any one of the two small steel balls is used as a detecting head, whereby the detecting head is connected by a point contact and a small steel ball, and can be freely displaced up and down, and even if it is small force, It is easy to rotate and can check for disconnection and short circuit while scanning the pattern electrode. [Prior Art] The image display elements currently used include a cathode ray tube ([π], a liquid crystal display element (LCD) which is a flat display element, a plasma display panel (PDP), and the like. Among them, the cathode ray tube has excellent performance superior to other components in enamel and brightness, but is not suitable for a large screen because of its large volume and weight. The flat display element is much larger in size and weight than the cathode ray tube, and its research is becoming more and more popular as a next generation display element. In general, a PDP (PlaSma Display Panel) means a gas in which k + Ar Ne + Xe or the like is interposed between glass sealed by an upper plate glass and a lower plate glass and a separator therebetween, and is applied by electrodes of an anode and a cathode. The voltage is such that it emits light and is used as an electronic display device for displaying light. Therefore, the PDP will face the vertical pattern of the upper and lower glass

5151-8991-PF 5 200811452 極和橫圖案電極間所構成之交又點作為放電單元,藉由開 關放電,而顯示各種文字或圖案。 因此,PDP為發光型,因為可進行鮮明的大型顯示, 所以常用於FA(工廉自動化),而現在隨著顯示裝置之小型 輕量化、高性能化,而常用於個人電腦等的〇A化(辦公室 自動化),雖然係大型顯示面板,除了顯示品質高以外,因 為響應速度快,所以以壁掛式TV為開端,需求急增。 又,液晶因為使用容易,因為具有藉由施加外部電場 而結晶的排列變化之固有的特性,所以使用液晶的顯示元 件,廣用於例如 FLCD(Ferr〇electric Uquid Crystal5151-8991-PF 5 200811452 The intersection between the electrode of the pole and the horizontal pattern is used as a discharge cell, and various characters or patterns are displayed by discharge of the switch. Therefore, the PDP is an illuminating type, and it is often used for FA (Industrial Automation) because it can perform a large-scale display. However, it is often used for personal computers, etc., as the display device is compact, lightweight, and high-performance. (Office automation), although it is a large display panel, in addition to high display quality, because of the fast response speed, the wall-mounted TV is the beginning, and the demand is increasing rapidly. Further, since the liquid crystal is easy to use, it has characteristics inherent in the arrangement change of crystals by application of an external electric field, and therefore display elements using liquid crystals are widely used, for example, in FLCD (Ferr〇electric Uquid Crystal).

Device) > TN(Twisted Nematic) - LCD ^ STN(Super TwistedDevice) > TN(Twisted Nematic) - LCD ^ STN(Super Twisted

Nematic) — LCD、TFT(Thin Film Transistor) — LCD、塑膠 (Plastic) — LCD、EL(Electro Luminescence ;電場發光元 件)等。 一般,用以驅動這種平面顯示面板的驅動用驅動器工c 以C0G(Chip On Glass)形態直接安裝,或以預先裝入 FPC(Flexible PCB)或 TS(Tape Substrate)的 TCP(TapeNematic) — LCD, TFT (Thin Film Transistor) — LCD, Plastic — LCD, EL (Electro Luminescence), etc. Generally, the driver driver c for driving such a flat display panel is directly mounted in the form of C0G (Chip On Glass), or is pre-loaded with FPC (Flexible PCB) or TS (Tape Substrate) TCP (Tape).

Carrier Package)形態安裝於面板。 現在42英吋PDP的情況,圖案電極一個的線寬和間距 (Pitch)各自達到50//m及300//m,TFT — LCD面板之圖案 電極間距亦達到約7 0 // m,因而,對應於這種大型化,裝 載驅動IC之電路板的圖案電極亦正進行微細化及多端子 化。Carrier Package) is mounted on the panel. In the case of a 42-inch PDP, the line width and pitch of the pattern electrodes are 50//m and 300//m, respectively, and the pattern electrode spacing of the TFT-LCD panel is also about 70 // m. In response to such an increase in size, the pattern electrode of the board on which the driver IC is mounted is also being miniaturized and multi-terminal.

為了檢查如上述所示在面板所形成的圖案電極或在TS 5151-8991-PF 6 200811452 電路板所形成之圖案電極的斷線及短路,&第1圖所示, 個針偵測器3G而形成偵測11組件20,使其與圖案 雷炼】广壓接觸後’將來自信號產生器之信號施加於圖案 電極15的-侧,並在另—側量測,藉此檢查斷線及短路、。 【發明内容】 【發明要解決之課題】 可疋,如上述所示藉針偵測器之圖案電極的檢查 具有如下之問題點。 而針偵測器的接觸 第一,針偵測器因反復的接觸作業 腳發生變形,引起接觸不良。 第-’為了解決這種問題點,在為了應付高解析度之 窄電極的接觸面’而將㈣測器之直徑設為相對地很小的 It因針制器的剛性而對f曲力矩弱,因為在導線發 生彎曲變形’所以在電極的接觸面發生接觸不良。' 第三,藉針偵測器之檢查方<,因為使用針偵測器和 案電極的加壓接觸方式,所以雖然係昂t,無耐久性之 針偵測器卻在加壓接觸時易受損,其更換費用貴。 第四,在變更產品型式或設計而圖案電極之位置及間 距等變化的情況’因為針偵測器之位置及間距係固定,所 以必須更換全部之與其相關的機構部,而欠缺對型式或設 計變更的適應性,無法泛用。 < 接觸 第五,必須使針㈣器對圖案電極加壓接觸,而發生 所引起的刮傷(scratch)等之圖案電極的損害,成為另In order to check the pattern electrode formed on the panel as shown above or the disconnection and short circuit of the pattern electrode formed on the TS 5151-8991-PF 6 200811452 circuit board, <Fig. 1, the needle detector 3G The detecting 11 component 20 is formed to apply a signal from the signal generator to the side of the pattern electrode 15 after being in contact with the pattern refining, and is measured on the other side, thereby checking the disconnection and Short circuit. SUMMARY OF THE INVENTION [Problem to be Solved by the Invention] The inspection of the pattern electrode of the borrowing needle detector as described above has the following problems. The contact of the needle detector first, the needle detector is deformed due to repeated contact with the working foot, causing poor contact. In order to solve this problem, the diameter of the (four) detector is set to be relatively small in order to cope with the contact surface of the narrow electrode of high resolution, and it is weak to the f-torque due to the rigidity of the needle. Since the wire is bent and deformed, contact failure occurs at the contact surface of the electrode. 'Third, the inspection side of the needle detector is used because of the pressure contact between the needle detector and the case electrode. Therefore, although the needle detector is not in use, the needle detector without durability is under pressure contact. It is easily damaged and its replacement cost is expensive. Fourth, when changing the product type or design and changing the position and spacing of the pattern electrodes, 'Because the position and spacing of the needle detectors are fixed, it is necessary to replace all the related mechanism parts, but the type or design is lacking. The adaptability of changes cannot be generalized. < Contact Fifth, the needle (four) device must be pressed into contact with the pattern electrode, and the scratch of the pattern electrode caused by the scratch is caused to become another

5151-8991-PF 7 200811452 外的不良要因。 另方面纟用以解決這種針偵測器之問題點 方式之碟輪型式的偵測器,亦因 ”、、滾動 發生的摩擦而使用滾珠軸承,具有難,V在碟輪滾動時 的镇測器之問題點。 /、難氣作低於某固定大小 本發明係為了解決上述之問題點 於提供使用球體之接觸式價測器:目的在 總〇知, /、1系將作成利用磁力技 ”鋼球間之 >[壬-個鋼球的大鋼球作為们“ 此,偵測頭以點接觸和小鋼球連結, ,精 :::小力亦可易於轉動,並可-面掃描圖二^ 查斷線及短路。 面檢 【解決課題之手段】 鋼 第 隔 以 觸^、A述之目的’本發明提供—種使用球體之接 觸式備測器,其包括:第三鋼球,係在第一鋼球和第 球之間,利用磁力和任一個鋼球接觸並以電氣式連姓 一支持構件與第二支持構件’係固定該第-鋼球和該。 鋼球’而且使該第—鋼球或該第二鋼球以電氣式連結 離手段,係按照固定間隔保持該第一及第二支持 < 保持第一、第一以;^势一 2丄 〜 第—以及第二鋼球之任意^固的間隔;以及磁 鐵,係使该第一鋼球和該第二鋼球具有磁性。 在本發日月,其特徵在於:第三鋼球之直徑比第— 一鋼球的直徑更大。 在本發明,其特徵在於··隔離手段設置於第一及第二 支持構件之間。 一5151-8991-PF 7 200811452 Bad causes outside. On the other hand, the disc wheel type detector used to solve the problem of the needle detector is also difficult to use because of the friction caused by the rolling, and the V is in the town when the disc is rolling. The problem of the detector is. /, the difficulty is lower than a certain fixed size. The present invention is to provide a contact type price measuring device using a sphere in order to solve the above problem: the purpose is to know that the /, 1 system will be made using magnetic force. "Technology" between steel balls [壬 - a large steel ball of steel balls as a "this, the detection head is connected by point contact and small steel ball, fine::: small force can also be easily rotated, and - Scanning picture 2 ^ Checking the line and short circuit. Surface inspection [means for solving the problem] The steel is separated by the touch of ^, A. The present invention provides a contact type detector using a sphere, which includes: A steel ball is attached between the first steel ball and the first ball, and is contacted by a magnetic force and any one of the steel balls and electrically connected to the support member and the second support member to fix the first steel ball and the steel ball. 'And the first steel ball or the second steel ball is electrically connected to the means, according to Maintaining the first and second supports at regular intervals < maintaining the first, first, and second intervals of the first and second steel balls; and the magnets, the first steel ball And the second steel ball has magnetic properties. In the present invention, the diameter of the third steel ball is larger than the diameter of the first steel ball. In the present invention, the isolation means is provided in the first Between the first and second support members.

5151-8991-PF 8 200811452 其特徵在於:第一及第二支持構件係磁性 其特徵在於:磁鐵係設置於第一及第二支 在本發明 體。 在本發明 持構件之間。 在本發明,其特徵在於:第一鋼球及第二鋼球各自被 埋入第一及第二支持構件並被固定。 在本發明,其特徵在於:第一、第二以及第三鋼球之 中心線位於一直線上。 本發明之特徵為經由該第一支持構件及該第二支持構 件以電氣式施加介面。 又,本發明之使用球體的接觸式偵測器,其特徵在於 包括:第-支持構件與第二支持構件,係相對向地配置, 各自在下部侧面形成凹部;第—鋼球與第二㈣,係各自 嵌入凹部;第三鋼球,酉己置成中心線位於第一鋼球與第二 鋼球之中心線上,並配置成向第—及第二支持構件的下部 突出;以及磁鐵,酉己置於第-支持構件和第二支持構件之 間丄不僅施加磁力’而且保持第一、第二以及第三鋼球之 任意2個的距離。 第一及第二支持構件係磁性 第三鋼球之直徑比第一與第 經由第一支持構件及第二支 在本發明,其特徵在於 體。 在本發明,其特徵在於 二鋼球的直徑更大。 在本發明,其特徵在於 持構件以電氣式施加介面。5151-8991-PF 8 200811452 characterized in that the first and second support members are magnetically characterized in that the magnets are disposed on the first and second support bodies of the present invention. Between the members of the present invention. In the invention, the first steel ball and the second steel ball are each embedded in the first and second support members and fixed. In the present invention, the center line of the first, second and third steel balls is located on a straight line. The invention is characterized by electrically applying an interface via the first support member and the second support member. Moreover, the contact type detector using the sphere according to the present invention includes: the first support member and the second support member are disposed opposite to each other, and each of the concave portions is formed on the lower side; the first steel ball and the second (four) Each of the third steel balls is placed on a center line of the first steel ball and the second steel ball, and is disposed to protrude toward a lower portion of the first and second support members; and a magnet, 酉Between the first support member and the second support member, not only the magnetic force is applied but also any two distances of the first, second and third steel balls are maintained. The first and second support members are magnetic third ball diameter ratio first and first via first support member and second support in the present invention, which is characterized by a body. In the present invention, it is characterized in that the diameter of the two steel balls is larger. In the present invention, the holding member is electrically applied to the interface.

5151-8991-PF 9 200811452 U如上 球和第二鋼球;;法所構成的本發明,係位於第-鋼 球和第二鋼球曰…鋼球利用磁力,不會脫離第-鋼 鋼球為基準,對:’不僅以第—鋼球和第二鋼球之任-個 小而滑動,可—了自由地移動,而且不會因為接觸阻力 球的直徑變小,:t圖案電極進行點接觸一面轉動’使鋼 【發明效果】’、可應付間距微細的圖案電極。 伽4d 111為將作成利用磁力接觸2個小鋼球間之任一 個鋼球的大鋼破你 一 / 、、、測頭,所以具有此偵測頭以點接觸 和小鋼球連妹, ^ "、’ σ上下自由地位移,而且即使係小力亦 可易於轉動之優點。 本發明因為偵測頭可上下自由地位移,而且即使係小 力亦可易於轉動’戶斤以無損害圖案電極並接觸,而且有可 量測斷線及短路之優點。 本t明因為偵測頭的接觸阻力小而磨耗少,所以 具有偵測器之壽命長的優點。 又,本發明和為了降低轉動摩擦而使用滾珠軸承之習 知技術相異,因為鋼球利用磁力以點接觸連結並轉動,所 以以小直徑製作鋼球,具有亦可應付微細圖案之量測的優 【實施方式】 以下,一面參照附加之圖面一面說明本發明之最佳實 施例。但,以下之實施例不是用以限定本發明之權利範圍5151-8991-PF 9 200811452 U such as the ball and the second steel ball; the invention of the invention is located in the first steel ball and the second steel ball... the steel ball utilizes magnetic force and does not deviate from the first steel ball For the benchmark, the pair: 'not only the first - steel ball and the second steel ball - sliding small, can - move freely, and will not become smaller because of the diameter of the contact resistance ball: t pattern electrode When the contact is turned, the steel [invention effect] is used to cope with the pattern electrode having a fine pitch. Gam 4d 111 is a large steel that will make contact with any steel ball between two small steel balls by magnetic force, and it has a probe and a small steel ball. ", ' σ is free to move up and down, and even if it is small force, it can be easily rotated. The invention has the advantages that the detecting head can be displaced up and down freely, and even if it is small, it can be easily rotated to damage the pattern electrode and contact, and the advantages of disconnection and short circuit can be measured. This is because the contact resistance of the detecting head is small and the wear is small, so that the life of the detector is long. Moreover, the present invention differs from the conventional technique of using a ball bearing for reducing the rotational friction. Since the steel ball is connected and rotated by point contact by magnetic force, the steel ball is made of a small diameter, and it is also possible to cope with the measurement of the fine pattern. BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings. However, the following examples are not intended to limit the scope of the invention.

5151-8991-PF 10 200811452 的’而係為了對本發明舉例表示而提示者,對具有在該領 域之^又的知識者,可在本發明之技術思想内實施各種變 形。 $ 2圖係表示本發明之使用球體的接觸式偵測器之使 用狀態的立體圖。 第3圖係第2圖之側視圖。 士第2圖及第3圖所示,使用球體之接觸式偵測器4〇, 、、,;图案電極1 5之斷線及短路檢查裝置(未圖示)之移 、乂手奴5 0,使圖案電極丨5和球體5 3接觸,並朝向圖案電 極15之垂亩& ^ 向移動,藉此,一面使球體Μ轉動並和圖 案電極15,袞動接觸,—面進行斷、線及短路檢查。 弟4圖係使用第3圖所示之使用球體53的接觸式偵測 益40之A—Α線剖面圖。 ^ ’在㈣式偵測器4G具備有:磁性體之 =持構件41|^二支持構件42,係相對向地設置, 52 :下部側面形成凹部45;第一鋼球”與第 3 Z ’係甘欠入凹部4 R ·,、,议# 第一 ,乂及苐二鋼球53,配置成中心線位於 弟鋼球51與第二鋼球52 支掊椹杜^ w之中〜線上,並比第一及第二 、 牛41、42更向下邻空ψ 目七 51、52的吉〜 P犬出,具有比第-與第二鋼球 Z的直徑更大的直徑。 此外,又具備有磁鐵 第二支持構件42之門 配置於第-支持構件f口 鋼球51、52 53 :間:竭^ 而且使第一與第個間的距離之隔離手段的功用, 、弟一鋼球51、52具有磁性。 5151-8991-Pf 11 200811452 作為其他的實施例’如第5圖所示,亦可將隔離手段 7〇配設於第一及第二支持構件4卜42之間,在這些隔離 手段70之間’將使第—與第二鋼球51、52具有磁性的磁 鐵6。設置成和第-及第二支持構件41、42之内側接觸。 在此情況,雖然利用磁力將第一及第二支持構件41、 4 2和磁鐵6 0固定,作是发^ 疋為了防止被外力推,亦可使用黏 接劑將第一及第二支持構件41、42和磁鐵60固定。 此外,為了與圖案電極15接觸之第三鋼球53和斷線 及短路檢查裝置的電氣式介叙 、、、工由支持和苐二鋼球53連 …之弟一與第二鋼球51、5 d 、㊉、 的苐一及第二支持構件41、 42 ’以電氣式施加介面。 ::此配置於由第一及第二支持構件41、42所支 吳弟一鋼球51、5 2之間的笫:::4 、、 的第二鋼球53’在磁力綠允 會脫離第一與第二鋼球51 、、友内不 w之間,因為和第—與第二鋼 ^ 之任一個鋼球進行點接觸,並和 ::保持以點接觸的任-個鋼球為基準之上下:: 又’因為利用磁力而第三鋼球53和第— 、1、52之任一個以點接觸連結,並和剩 二-鋼球 以即使係小力亦以接觸點為基準易於轉動。Μ離,所 因此,在為了檢查圖案電極15之 鋼球53和圖案雷榀丨ς— 、、次及紐路而使第三 況,不僅對各種^ 仃點接觸並以滾動 不僅對各種南度之圖案電極i 勒的障 上下移動而進行接鎇品R —技 曰由弟二鋼球53之 仃接觸,而且在掃描時第三鋼球53亦圓滑地5151-8991-PF 10 200811452 The present invention is intended to be illustrative of the present invention, and various modifications may be made within the technical idea of the present invention for those skilled in the art. The $2 diagram shows a perspective view of the use state of the contact type detector using the sphere of the present invention. Figure 3 is a side view of Figure 2. In the second and third figures, the contact detectors using the spheres 4〇, , , , and the disconnection of the pattern electrode 15 and the short-circuit inspection device (not shown) are removed. The pattern electrode 丨5 and the sphere 53 are brought into contact with each other, and are moved toward the sag & ^ direction of the pattern electrode 15, whereby the sphere Μ is rotated and swayed with the pattern electrode 15, and the surface is broken and lined. And short circuit check. The 4th figure is a cross-sectional view of the A-Α line of the contact type detection 40 using the sphere 53 shown in Fig. 3. ^ 'The (four) type detector 4G is provided with: a magnetic body = holding member 41 | ^ two supporting members 42, which are disposed opposite to each other, 52: a lower side forming a concave portion 45; a first steel ball" and a third Z' The system is owed to the concave portion 4 R ·,,, ##, 乂 and 苐二钢球53, which are arranged such that the center line is located on the line between the young steel ball 51 and the second steel ball 52. And more than the first and second, the cattle 41, 42 are closer to the air, the head of the seven 51, 52 ji ~ P dog out, has a diameter larger than the diameter of the first - and the second steel ball Z. In addition, The door having the second support member 42 of the magnet is disposed on the first support member f-port steel ball 51, 52 53 : the function of the separation means between the first and the first, and the ball of the brother 51, 52 has magnetic properties. 5151-8991-Pf 11 200811452 As another embodiment, as shown in Fig. 5, the isolation means 7A may be disposed between the first and second support members 4b, 42 These isolation means 70 are disposed between the first and second support members 41, 42 so as to be in contact with the inner sides of the first and second support members 41, 42. Although the first and second supporting members 41, 4 2 and the magnet 60 are fixed by magnetic force, in order to prevent the external force from being pushed, the first and second supporting members 41 may be bonded using an adhesive. 42 and the magnet 60 are fixed. In addition, the third steel ball 53 in contact with the pattern electrode 15 and the electrical description of the disconnection and short-circuit inspection device, the work support and the second steel ball 53... The second steel balls 51, 5d, 10, and the second support members 41, 42' are electrically applied to the interface. :: This configuration is supported by the first and second support members 41, 42 The second steel ball 53' between the steel balls 51, 5 2, and the second steel ball 53' in the magnetic green will be separated from the first and second steel balls 51, and between the friends, because Point contact with any one of the steel balls of the second steel, and with:: keep any one of the steel balls in point contact as the benchmark:: 'Because the magnetic force and the third steel ball 53 and the first, 1 Any one of 52 is connected by point contact, and the remaining two-steel ball is easy to rotate based on the contact point even if it is small force. Check the steel ball 53 of the pattern electrode 15 and the pattern Thunder -, the second and the New Zealand to make the third condition, not only for the various points, but also for rolling, not only for the various pattern electrodes of the south degree. Move up and down to pick up the product R - the technique is contacted by the second steel ball 53 and the third steel ball 53 is also smooth during scanning.

5151-8991-PF 12 200811452 轉動,而可無刮傷等之損害地-面和圖案電極15接觸 面進行電氣式檢查。 之鋼球,一面和圖案電 ’ 一面可檢查斷線及短 況’亦可檢查間距微小 因為如此使用利用磁力所連結 極進行點接觸並以滚動方式轉動 路,所以在製作直徑小之鋼球的情 之圖案電極。 【圖式簡單說明】 第1圖係表示一般之針偵測器組件的圖。 第2圖係表示本發明之使用球體的接觸式偵測器之使 用狀態的立體圖。 第3圖係第2圖之側視圖。 第4圖係表示本發明的一實施例之使用球體的接觸式 偵測器之剖面圖。 第5圖係表示本發明之其他的實施例之使用球體的接 觸式偵測器之剖面圖。 【主要元件符號說明】 10電路板 15圖案電極 20 偵測器組件 3〇針偵測器 4〇使用球體之接觸式偵測器 41第一支持構件5151-8991-PF 12 200811452 Rotate, and the ground surface and the pattern electrode 15 can be electrically inspected without damage such as scratches. The steel ball, one side and the pattern electric 'one side can check the broken line and short condition' can also check the small spacing because the use of the magnetic connection pole to make point contact and rotate the road in a rolling manner, so in the production of small diameter steel ball The pattern of the emotional electrode. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a view showing a general needle detector assembly. Fig. 2 is a perspective view showing the use state of the contact type detector using the sphere of the present invention. Figure 3 is a side view of Figure 2. Fig. 4 is a cross-sectional view showing a contact type detector using a sphere according to an embodiment of the present invention. Fig. 5 is a cross-sectional view showing a contact type detector using a sphere according to another embodiment of the present invention. [Main component symbol description] 10 circuit board 15 pattern electrode 20 detector component 3 pin detector 4〇 contact detector using sphere 41 first support member

5151-8991-PF 13 200811452 42 第二支持構件 45 凹部 50 移送手段 51 第一鋼球 52 第二鋼球 53 第三鋼球 6 0 磁鐵 70 隔離手段 145151-8991-PF 13 200811452 42 Second support member 45 Recess 50 Transfer means 51 First steel ball 52 Second steel ball 53 Third steel ball 6 0 Magnet 70 Isolation means 14

5151-8991-PF5151-8991-PF

Claims (1)

200811452 十、申請專利範圍·· 1.-種使用球體之接觸式偵測器,其特徵在於包括·· 第三鋼球,係在第一鋼球和第二鋼球之間,利用磁力 和任一個鋼球接觸並以電氣式連結; 第-支持構件與第二支持構件’係固定該第一鋼球和 該第二鋼球,而且使該第一鋼球或該第二鋼球以電氣 結; 、工 及第二支持構 2個的間隔; 隔離手段,係按照固定間隔保持該第一 件,以保持第一、第二以及第三鋼球之任意 以及 磁鐵,係使該第一鋼球和該第二鋼球具有磁性。 ^ 2·如申請專利範圍第1項之使用球體之接觸式備測 器,其中忒第二鋼球之直徑比第一與第二鋼球的直徑更大。 3.如申請專利範圍第1項之使用球體之接觸式偵測 器,其中該隔離手段設置於第一及第二支持構件之間。 4·如申請專利範圍第丨項之使用球體之接觸式偵測 器’其中該第一及第二支持構件係磁性體。 5·如申請專利範圍第1項之使用球體之接觸式偵測 器,其中該磁鐵係設置於第一及第二支持構件之間。 6. 如申請專利範圍第1項之使用球體之接觸式偵測 器’其中第一鋼球及第二鋼球各自被埋入第一及第二支持 構件並被固定。 7. 如申請專利範圍第1項之使用球體之接觸式偵測 器,其中第一、第二以及第三鋼球之中心線位於一直線上。 5151-8991-PF 15 200811452 8·如申請專利範圍第]货 未 ..^ ^ 、之使用球體之接觸式偵測 為,其中經由該第一支持構件 茨弟一支持構件以電氣式 施加介面。 9. 一種使用球體之接觸式偵測器,其特徵在於包括: 第一支持構件與第二支持構件,係相對向地配置,各 自在下部側面形成凹部; 第一鋼球與第二鋼球,係各自嵌入該凹部; 第三鋼球,配置成中心線位於該第—鋼球與該第二鋼 球之中心線上,並配置成向該第—及第二支持構件的下部 突出;以及 磁鐵,配置於該第一支持構件和該第二支持構件之 間’不僅施加磁力’而且保持該第—鋼球和該第三鋼球之 距離。 。10.如申請專利範圍第9項之使用球體之接觸式偵測 器,其中該苐一及第一支持構件係磁性體。 11·如申請專利範圍第9項之使用球體之接觸式偵測 器,其中該第三鋼球之直徑比第一與第二鋼球的直徑更大。 12.如申請專利範圍第9項之使用球體之接觸式偵測 裔,其中經由該第一支持構件及該第二支持構件以電氣式 施加介面。 5151-8991-PF 16200811452 X. Patent application scope · 1. A type of contact detector using a sphere, which is characterized by including a third steel ball, which is between the first steel ball and the second steel ball, using magnetic force and any a steel ball is in contact and electrically connected; the first support member and the second support member fix the first steel ball and the second steel ball, and the first steel ball or the second steel ball is electrically connected And the second support structure; the isolation means maintains the first piece at a fixed interval to maintain any of the first, second and third steel balls and the magnet, and the first steel ball And the second steel ball is magnetic. ^2. The contact type detector using a sphere as claimed in claim 1, wherein the diameter of the second steel ball is larger than the diameter of the first and second steel balls. 3. The contact detector using a sphere according to claim 1, wherein the isolation means is disposed between the first and second support members. 4. The contact detector using a sphere according to the scope of the patent application, wherein the first and second support members are magnetic bodies. 5. The contact detector using a sphere according to claim 1, wherein the magnet is disposed between the first and second support members. 6. The contact detector using a sphere as claimed in claim 1 wherein the first steel ball and the second steel ball are each embedded in the first and second support members and fixed. 7. The contact detector using a sphere as claimed in claim 1, wherein the centerlines of the first, second and third steel balls are in a straight line. 5151-8991-PF 15 200811452 8·As claimed in the patent application No.. ^ ^, the contact detection using the sphere is wherein the interface is electrically applied via the first support member. 9. A touch detector using a sphere, comprising: a first support member and a second support member disposed opposite to each other, each forming a concave portion on a lower side; a first steel ball and a second steel ball, Each of the third steel balls is disposed such that a center line is located on a center line of the first steel ball and the second steel ball, and is disposed to protrude toward a lower portion of the first and second support members; and a magnet, Between the first supporting member and the second supporting member, 'not only applying a magnetic force' but also maintaining the distance between the first steel ball and the third steel ball. . 10. The contact detector using a sphere according to claim 9, wherein the first support member and the first support member are magnetic bodies. 11. The contact detector using a sphere of claim 9, wherein the third steel ball has a larger diameter than the first and second steel balls. 12. The contact type detecting body using a sphere according to claim 9, wherein the interface is electrically applied via the first supporting member and the second supporting member. 5151-8991-PF 16
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