KR920007133A - 표면 장착중에 균열을 방지하기 위한 집적 회로 디바이스 및 그 방법 - Google Patents
표면 장착중에 균열을 방지하기 위한 집적 회로 디바이스 및 그 방법 Download PDFInfo
- Publication number
- KR920007133A KR920007133A KR1019910016546A KR910016546A KR920007133A KR 920007133 A KR920007133 A KR 920007133A KR 1019910016546 A KR1019910016546 A KR 1019910016546A KR 910016546 A KR910016546 A KR 910016546A KR 920007133 A KR920007133 A KR 920007133A
- Authority
- KR
- South Korea
- Prior art keywords
- chip
- semiconductor
- lead
- lead frame
- integrated circuit
- Prior art date
Links
- 238000005336 cracking Methods 0.000 title claims 2
- 238000000034 method Methods 0.000 title claims 2
- 239000004065 semiconductor Substances 0.000 claims description 20
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 claims description 6
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 238000005538 encapsulation Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 claims 1
- 238000004806 packaging method and process Methods 0.000 claims 1
- 239000002390 adhesive tape Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000000463 material Substances 0.000 description 1
Classifications
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/01—Chemical elements
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- H01L2924/013—Alloys
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49121—Beam lead frame or beam lead device
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Lead Frames For Integrated Circuits (AREA)
- Die Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 전형적인 집적회로 디바이스 패키지를 도시한 단면도,
제2도는 리드 프레임, 접착 테이프 및 반도체 칩을 나타낸 리드오버 칩 중앙 본드 디바이스의 분해 사시도,
제2a도는 반도체 칩의 접속 상태를 나타낸 리드 오버 칩 중앙본드 디바이스의 정면도.
제2b도는 와이어 본드 접속을 나타낸 리드 오버 칩 중앙본드 디바이스의 정면도.
제2c도는 봉입 몰드 화합물이 투명한 리드 오버 칩 중앙본드 디바이스의 정면도.
제2d도는 완성될 리드 오버 칩 중앙본드 패키지의 측면도.
제2e도는 완성된 리드 오버 칩 중앙본드 집적 회로 패키지를 부분적으로 절취하여 도시한 사시도.
제3도는 봉입물질의 균일 상태를 나타낸 LOC 패키지의 단면도.
제4도는 반도체 칩의 비활성 면상의 아미노프로필트리에톡시실란 코팅을 나타낸 LOC 패키지의 단면도.
Claims (9)
- 리드 오버 칩 리드 프레임을 장착시키기에 적합한 반도체 집적 회로 칩에 있어서, 리드 오버 칩 리드 프레임에 부착된 활성 면과 비활성 배면을 포함하는 집적 회로 칩 및 집적 회로 칩의 비활성 배면상의 아미노프로필트리에톡시실란 코팅막을 포함하는 것을 특징으로 하는 반도체 집적 회로 칩.
- 제1항에 있어서, 상기 아미노프로필트리에톡시실란 코팅막의 두께가 1미크론 이하인 것을 특징으로 하는 반도체 집적 회로 칩.
- 활성면 및 배면을 갖고 있는 반도체 회로 칩, 상기 반도체 칩을 지지하고 외부 접속부를 제공하며, 한 단부에 의해 반도체 칩에 접속된 리드 핑거를 포함하는 리드 프레임 및 반도체 칩, 리드 프레임, 봉입물을 거쳐 연장하는 리드 핑거의 다른 단부들을 봉입시키는 봉입물을 포함하고, 상기 반도체 칩이 봉입물에 대한 접착력을 촉진시키기 위해 배면상에 아미노프로필트리에톡시실란층을 포함하는 것을 특징으로 하는 반도체 패키지 디바이스.
- 제3항에 있어서, 상기 아미노프로필트리에톡시실란층의 두께가 1미크론 까지인 것을 특징으로 하는 반도체 패키지 디바이스.
- 제4항에 있어서, 상기 봉입물이 플라스틱인 것을 특징으로 하는 반도체 패키지 디바이스.
- 제5항에 있어서, 사기 리드 프레임이 리드 오버 칩 리드 프레임인 것을 특징으로 하는 반도체 패키지 디바이스.
- 제5항에 있어서, 상기 리드 프레임이 탭팩 테이프인 것을 특징으로 하는 반도체 패키지 디바이스.
- 제5항에 있어서, 상기 리드 프레임이 플립 칩 리드 프레임인 것을 특징으로 하는 반도체 패키지 디바이스.
- 인쇄 회로 기판의 표면 장착중에 패키지 균열에 저항력이 있는 반도체 패키지 디바이스를 제조하는 방법에 있어서, 반도체 칩의 활성 측면을 리드 오버 칩 리드 프레임에 접속시키는 단계, 아미노프로필트리에톡시실란막을 반도체 칩의 비활성 측면에 제공하는 단계 및 인쇄 회로 기판에 표면 장착되는 패키지 디바이스를 형성하기 위한 형태로 플라스틱으로 반도체 및 리드 오버 칩 리드 프레임을 패키징시키는 단계를 포함하는 것을 특징으로 하는 방법.※ 참고사항 : 최초출원 내용에 의하여 공개되는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/586,821 US5227661A (en) | 1990-09-24 | 1990-09-24 | Integrated circuit device having an aminopropyltriethoxysilane coating |
US586,821 | 1990-09-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR920007133A true KR920007133A (ko) | 1992-04-28 |
Family
ID=24347242
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1019910016546A KR920007133A (ko) | 1990-09-24 | 1991-09-20 | 표면 장착중에 균열을 방지하기 위한 집적 회로 디바이스 및 그 방법 |
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Country | Link |
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US (2) | US5227661A (ko) |
EP (1) | EP0478250A1 (ko) |
JP (1) | JPH0613502A (ko) |
KR (1) | KR920007133A (ko) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0576708A1 (de) * | 1992-07-01 | 1994-01-05 | Siemens Aktiengesellschaft | Integrierter Schaltkreis mit Leiterrahmen |
KR950005269B1 (ko) * | 1992-07-29 | 1995-05-22 | 삼성전자주식회사 | 반도체 패키지 구조 및 제조방법 |
US5331200A (en) * | 1992-09-30 | 1994-07-19 | Texas Instruments Incorporated | Lead-on-chip inner lead bonding lead frame method and apparatus |
US5567655A (en) * | 1993-05-05 | 1996-10-22 | Lsi Logic Corporation | Method for forming interior bond pads having zig-zag linear arrangement |
JPH0794539A (ja) * | 1993-09-20 | 1995-04-07 | Fujitsu Ltd | 半導体装置 |
JP3534347B2 (ja) * | 1993-11-04 | 2004-06-07 | 日東電工株式会社 | 半導体素子の製造方法,ウエハ貼付用粘着シート |
US6236107B1 (en) * | 1994-04-29 | 2001-05-22 | Texas Instruments Incorporated | Encapsulate resin LOC package and method of fabrication |
US5429992A (en) * | 1994-05-25 | 1995-07-04 | Texas Instruments Incorporated | Lead frame structure for IC devices with strengthened encapsulation adhesion |
US5554569A (en) * | 1994-06-06 | 1996-09-10 | Motorola, Inc. | Method and apparatus for improving interfacial adhesion between a polymer and a metal |
US6066514A (en) * | 1996-10-18 | 2000-05-23 | Micron Technology, Inc. | Adhesion enhanced semiconductor die for mold compound packaging |
US5583372A (en) * | 1994-09-14 | 1996-12-10 | Micron Technology, Inc. | Adhesion enhanced semiconductor die for mold compound packaging |
US5923538A (en) * | 1994-10-17 | 1999-07-13 | Lsi Logic Corporation | Support member for mounting a microelectronic circuit package |
US5545921A (en) * | 1994-11-04 | 1996-08-13 | International Business Machines, Corporation | Personalized area leadframe coining or half etching for reduced mechanical stress at device edge |
US5811875A (en) * | 1995-06-29 | 1998-09-22 | Samsung Electronics Co., Ltd. | Lead frames including extended tie-bars, and semiconductor chip packages using same |
KR0167297B1 (ko) * | 1995-12-18 | 1998-12-15 | 문정환 | 엘.오.씨 패키지 및 그 제조방법 |
US6007920A (en) * | 1996-01-22 | 1999-12-28 | Texas Instruments Japan, Ltd. | Wafer dicing/bonding sheet and process for producing semiconductor device |
US6277225B1 (en) | 1996-03-13 | 2001-08-21 | Micron Technology, Inc. | Stress reduction feature for LOC lead frame |
US5717246A (en) * | 1996-07-29 | 1998-02-10 | Micron Technology, Inc. | Hybrid frame with lead-lock tape |
US6426484B1 (en) | 1996-09-10 | 2002-07-30 | Micron Technology, Inc. | Circuit and method for heating an adhesive to package or rework a semiconductor die |
US5938956A (en) | 1996-09-10 | 1999-08-17 | Micron Technology, Inc. | Circuit and method for heating an adhesive to package or rework a semiconductor die |
US5811883A (en) * | 1996-09-30 | 1998-09-22 | Intel Corporation | Design for flip chip joint pad/LGA pad |
US5776799A (en) * | 1996-11-08 | 1998-07-07 | Samsung Electronics Co., Ltd. | Lead-on-chip type semiconductor chip package using an adhesive deposited on chip active surfaces at a wafer level and method for manufacturing same |
US6355881B1 (en) | 1997-05-05 | 2002-03-12 | Brant P. Braeges | Means for sealing an electronic or optical component within an enclosure housing |
US5923081A (en) * | 1997-05-15 | 1999-07-13 | Micron Technology, Inc. | Compression layer on the leadframe to reduce stress defects |
US5780923A (en) | 1997-06-10 | 1998-07-14 | Micron Technology, Inc. | Modified bus bar with Kapton™ tape or insulative material on LOC packaged part |
US6580157B2 (en) * | 1997-06-10 | 2003-06-17 | Micron Technology, Inc. | Assembly and method for modified bus bar with Kapton™ tape or insulative material in LOC packaged part |
US5986209A (en) | 1997-07-09 | 1999-11-16 | Micron Technology, Inc. | Package stack via bottom leaded plastic (BLP) packaging |
AU1310399A (en) | 1997-11-05 | 1999-05-24 | Robert A. Martin | Chip housing, methods of making same and methods for mounting chips therein |
US6124150A (en) * | 1998-08-20 | 2000-09-26 | Micron Technology, Inc. | Transverse hybrid LOC package |
JP2000124235A (ja) * | 1998-10-16 | 2000-04-28 | Oki Electric Ind Co Ltd | 樹脂封止半導体装置 |
US6852567B1 (en) | 1999-05-31 | 2005-02-08 | Infineon Technologies A.G. | Method of assembling a semiconductor device package |
US6387732B1 (en) | 1999-06-18 | 2002-05-14 | Micron Technology, Inc. | Methods of attaching a semiconductor chip to a leadframe with a footprint of about the same size as the chip and packages formed thereby |
US6875640B1 (en) * | 2000-06-08 | 2005-04-05 | Micron Technology, Inc. | Stereolithographic methods for forming a protective layer on a semiconductor device substrate and substrates including protective layers so formed |
US20070117114A1 (en) * | 2005-07-07 | 2007-05-24 | Quanta Biosciences, Inc. | Compositions and methods for increasing amplification efficiency |
CN100446230C (zh) * | 2006-01-25 | 2008-12-24 | 矽品精密工业股份有限公司 | 半导体封装结构及其制法 |
CN100446231C (zh) * | 2006-01-25 | 2008-12-24 | 矽品精密工业股份有限公司 | 半导体封装结构及其制法 |
US8450148B2 (en) | 2006-12-14 | 2013-05-28 | Infineon Technologies, Ag | Molding compound adhesion for map-molded flip-chip |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USRE31967E (en) * | 1975-07-07 | 1985-08-13 | National Semiconductor Corporation | Gang bonding interconnect tape for semiconductive devices and method of making same |
US4040874A (en) * | 1975-08-04 | 1977-08-09 | General Electric Company | Semiconductor element having a polymeric protective coating and glass coating overlay |
US4395527A (en) * | 1978-05-17 | 1983-07-26 | M & T Chemicals Inc. | Siloxane-containing polymers |
US4238528A (en) * | 1978-06-26 | 1980-12-09 | International Business Machines Corporation | Polyimide coating process and material |
US4230754A (en) * | 1978-11-07 | 1980-10-28 | Sprague Electric Company | Bonding electronic component to molded package |
US4499149A (en) * | 1980-12-15 | 1985-02-12 | M&T Chemicals Inc. | Siloxane-containing polymers |
US4480009A (en) * | 1980-12-15 | 1984-10-30 | M&T Chemicals Inc. | Siloxane-containing polymers |
US4477828A (en) * | 1982-10-12 | 1984-10-16 | Scherer Jeremy D | Microcircuit package and sealing method |
US4862245A (en) * | 1985-04-18 | 1989-08-29 | International Business Machines Corporation | Package semiconductor chip |
US4908086A (en) * | 1985-06-24 | 1990-03-13 | National Semiconductor Corporation | Low-cost semiconductor device package process |
US4732858A (en) * | 1986-09-17 | 1988-03-22 | Brewer Science, Inc. | Adhesion promoting product and process for treating an integrated circuit substrate |
KR880014671A (ko) * | 1987-05-27 | 1988-12-24 | 미다 가쓰시게 | 수지로 충진된 반도체 장치 |
US5026667A (en) * | 1987-12-29 | 1991-06-25 | Analog Devices, Incorporated | Producing integrated circuit chips with reduced stress effects |
US4985751A (en) * | 1988-09-13 | 1991-01-15 | Shin-Etsu Chemical Co., Ltd. | Resin-encapsulated semiconductor devices |
US4916519A (en) * | 1989-05-30 | 1990-04-10 | International Business Machines Corporation | Semiconductor package |
US5164815A (en) * | 1989-12-22 | 1992-11-17 | Texas Instruments Incorporated | Integrated circuit device and method to prevent cracking during surface mount |
-
1990
- 1990-09-24 US US07/586,821 patent/US5227661A/en not_active Expired - Lifetime
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1991
- 1991-09-20 KR KR1019910016546A patent/KR920007133A/ko not_active Application Discontinuation
- 1991-09-23 EP EP19910308626 patent/EP0478250A1/en not_active Withdrawn
- 1991-09-24 JP JP24355091A patent/JPH0613502A/ja active Pending
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1994
- 1994-08-25 US US08/296,077 patent/US5418189A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
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EP0478250A1 (en) | 1992-04-01 |
US5418189A (en) | 1995-05-23 |
JPH0613502A (ja) | 1994-01-21 |
US5227661A (en) | 1993-07-13 |
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