KR900008070B1 - 용착 및 플라나화 방법 및 장치 - Google Patents
용착 및 플라나화 방법 및 장치 Download PDFInfo
- Publication number
- KR900008070B1 KR900008070B1 KR1019870012800A KR870012800A KR900008070B1 KR 900008070 B1 KR900008070 B1 KR 900008070B1 KR 1019870012800 A KR1019870012800 A KR 1019870012800A KR 870012800 A KR870012800 A KR 870012800A KR 900008070 B1 KR900008070 B1 KR 900008070B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- layer
- welding
- temperature
- during
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3435—Applying energy to the substrate during sputtering
- C23C14/345—Applying energy to the substrate during sputtering using substrate bias
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/225—Oblique incidence of vaporised material on substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
- H01J37/3408—Planar magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/332—Coating
- H01J2237/3322—Problems associated with coating
- H01J2237/3327—Coating high aspect ratio workpieces
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Electrodes Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US938043 | 1986-12-04 | ||
| US06/938,043 US4756810A (en) | 1986-12-04 | 1986-12-04 | Deposition and planarizing methods and apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR880008423A KR880008423A (ko) | 1988-08-31 |
| KR900008070B1 true KR900008070B1 (ko) | 1990-10-31 |
Family
ID=25470774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019870012800A Expired KR900008070B1 (ko) | 1986-12-04 | 1987-11-13 | 용착 및 플라나화 방법 및 장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4756810A (enExample) |
| EP (1) | EP0273550A1 (enExample) |
| JP (1) | JPS63152146A (enExample) |
| KR (1) | KR900008070B1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20170076817A (ko) * | 2008-10-22 | 2017-07-04 | 어플라이드 머티어리얼스, 인코포레이티드 | 강화된 구리 이온화를 이용한 pvd 구리 시드 오버행 재-스퍼터링 |
Families Citing this family (102)
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| US5906688A (en) * | 1989-01-11 | 1999-05-25 | Ohmi; Tadahiro | Method of forming a passivation film |
| US5591267A (en) * | 1988-01-11 | 1997-01-07 | Ohmi; Tadahiro | Reduced pressure device |
| US4963239A (en) * | 1988-01-29 | 1990-10-16 | Hitachi, Ltd. | Sputtering process and an apparatus for carrying out the same |
| US5283087A (en) * | 1988-02-05 | 1994-02-01 | Semiconductor Energy Laboratory Co., Ltd. | Plasma processing method and apparatus |
| US4874493A (en) * | 1988-03-28 | 1989-10-17 | Microelectronics And Computer Technology Corporation | Method of deposition of metal into cavities on a substrate |
| US4950377A (en) * | 1988-09-23 | 1990-08-21 | Siemens Aktiengesellschaft | Apparatus and method for reactive ion etching |
| US5683072A (en) * | 1988-11-01 | 1997-11-04 | Tadahiro Ohmi | Thin film forming equipment |
| US5789086A (en) * | 1990-03-05 | 1998-08-04 | Ohmi; Tadahiro | Stainless steel surface having passivation film |
| JPH02219225A (ja) * | 1989-02-20 | 1990-08-31 | Matsushita Electric Ind Co Ltd | 膜堆積装置および膜堆積方法 |
| US5419822A (en) * | 1989-02-28 | 1995-05-30 | Raytheon Company | Method for applying a thin adherent layer |
| US5017439A (en) * | 1989-07-19 | 1991-05-21 | Seagate Technology, Inc. | Micro-contamination-free coating for die-cast component in magnetic disk drive |
| US6068784A (en) * | 1989-10-03 | 2000-05-30 | Applied Materials, Inc. | Process used in an RF coupled plasma reactor |
| US5556501A (en) * | 1989-10-03 | 1996-09-17 | Applied Materials, Inc. | Silicon scavenger in an inductively coupled RF plasma reactor |
| US5472912A (en) * | 1989-11-30 | 1995-12-05 | Sgs-Thomson Microelectronics, Inc. | Method of making an integrated circuit structure by using a non-conductive plug |
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| US5108951A (en) * | 1990-11-05 | 1992-04-28 | Sgs-Thomson Microelectronics, Inc. | Method for forming a metal contact |
| US6271137B1 (en) | 1989-11-30 | 2001-08-07 | Stmicroelectronics, Inc. | Method of producing an aluminum stacked contact/via for multilayer |
| US5658828A (en) | 1989-11-30 | 1997-08-19 | Sgs-Thomson Microelectronics, Inc. | Method for forming an aluminum contact through an insulating layer |
| US6242811B1 (en) | 1989-11-30 | 2001-06-05 | Stmicroelectronics, Inc. | Interlevel contact including aluminum-refractory metal alloy formed during aluminum deposition at an elevated temperature |
| JP2758948B2 (ja) * | 1989-12-15 | 1998-05-28 | キヤノン株式会社 | 薄膜形成方法 |
| US5114556A (en) * | 1989-12-27 | 1992-05-19 | Machine Technology, Inc. | Deposition apparatus and method for enhancing step coverage and planarization on semiconductor wafers |
| EP0440377B1 (en) * | 1990-01-29 | 1998-03-18 | Varian Associates, Inc. | Collimated deposition apparatus and method |
| GB9006073D0 (en) * | 1990-03-17 | 1990-05-16 | D G Teer Coating Services Limi | Magnetron sputter ion plating |
| US5108570A (en) * | 1990-03-30 | 1992-04-28 | Applied Materials, Inc. | Multistep sputtering process for forming aluminum layer over stepped semiconductor wafer |
| US6287963B1 (en) * | 1990-11-05 | 2001-09-11 | Stmicroelectronics, Inc. | Method for forming a metal contact |
| KR950009939B1 (ko) * | 1990-11-30 | 1995-09-01 | 가부시끼가이샤 히다찌세이사꾸쇼 | 박막 형성 방법 및 그에 의해 형성된 반도체 장치 |
| JP2725944B2 (ja) * | 1991-04-19 | 1998-03-11 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 金属層堆積方法 |
| CA2061119C (en) * | 1991-04-19 | 1998-02-03 | Pei-Ing P. Lee | Method of depositing conductors in high aspect ratio apertures |
| EP0581902A4 (en) * | 1991-04-19 | 1994-03-23 | Surface Solutions Inc | METHOD AND APPARATUS FOR LINEAR MAGNETRON SPRAYING. |
| US6514376B1 (en) | 1991-06-27 | 2003-02-04 | Applied Materials Inc. | Thermal control apparatus for inductively coupled RF plasma reactor having an overhead solenoidal antenna |
| US6238588B1 (en) | 1991-06-27 | 2001-05-29 | Applied Materials, Inc. | High pressure high non-reactive diluent gas content high plasma ion density plasma oxide etch process |
| US5477975A (en) * | 1993-10-15 | 1995-12-26 | Applied Materials Inc | Plasma etch apparatus with heated scavenging surfaces |
| US6074512A (en) | 1991-06-27 | 2000-06-13 | Applied Materials, Inc. | Inductively coupled RF plasma reactor having an overhead solenoidal antenna and modular confinement magnet liners |
| US6488807B1 (en) | 1991-06-27 | 2002-12-03 | Applied Materials, Inc. | Magnetic confinement in a plasma reactor having an RF bias electrode |
| US6024826A (en) * | 1996-05-13 | 2000-02-15 | Applied Materials, Inc. | Plasma reactor with heated source of a polymer-hardening precursor material |
| US6063233A (en) | 1991-06-27 | 2000-05-16 | Applied Materials, Inc. | Thermal control apparatus for inductively coupled RF plasma reactor having an overhead solenoidal antenna |
| US6036877A (en) | 1991-06-27 | 2000-03-14 | Applied Materials, Inc. | Plasma reactor with heated source of a polymer-hardening precursor material |
| US6077384A (en) * | 1994-08-11 | 2000-06-20 | Applied Materials, Inc. | Plasma reactor having an inductive antenna coupling power through a parallel plate electrode |
| US5772832A (en) * | 1991-06-27 | 1998-06-30 | Applied Materials, Inc | Process for etching oxides in an electromagnetically coupled planar plasma apparatus |
| US6165311A (en) | 1991-06-27 | 2000-12-26 | Applied Materials, Inc. | Inductively coupled RF plasma reactor having an overhead solenoidal antenna |
| US6090303A (en) * | 1991-06-27 | 2000-07-18 | Applied Materials, Inc. | Process for etching oxides in an electromagnetically coupled planar plasma apparatus |
| US5171412A (en) * | 1991-08-23 | 1992-12-15 | Applied Materials, Inc. | Material deposition method for integrated circuit manufacturing |
| US5849136A (en) * | 1991-10-11 | 1998-12-15 | Applied Materials, Inc. | High frequency semiconductor wafer processing apparatus and method |
| US5300813A (en) * | 1992-02-26 | 1994-04-05 | International Business Machines Corporation | Refractory metal capped low resistivity metal conductor lines and vias |
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| JP3231900B2 (ja) * | 1992-10-28 | 2001-11-26 | 株式会社アルバック | 成膜装置 |
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| JP4583868B2 (ja) * | 2004-10-15 | 2010-11-17 | 株式会社昭和真空 | スパッタ装置 |
| JP4336320B2 (ja) * | 2005-02-25 | 2009-09-30 | キヤノンアネルバ株式会社 | ウエハホルダ |
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| US8460519B2 (en) * | 2005-10-28 | 2013-06-11 | Applied Materials Inc. | Protective offset sputtering |
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| CN112349742A (zh) * | 2020-11-24 | 2021-02-09 | 武汉新芯集成电路制造有限公司 | 背照式图像传感器及其制造方法 |
| CN112635305A (zh) * | 2020-11-24 | 2021-04-09 | 武汉新芯集成电路制造有限公司 | 半导体器件及其制造方法 |
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| US3804738A (en) * | 1973-06-29 | 1974-04-16 | Ibm | Partial planarization of electrically insulative films by resputtering |
| US4036723A (en) * | 1975-08-21 | 1977-07-19 | International Business Machines Corporation | RF bias sputtering method for producing insulating films free of surface irregularities |
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-
1986
- 1986-12-04 US US06/938,043 patent/US4756810A/en not_active Expired - Fee Related
-
1987
- 1987-10-19 EP EP87309228A patent/EP0273550A1/en not_active Withdrawn
- 1987-11-13 KR KR1019870012800A patent/KR900008070B1/ko not_active Expired
- 1987-11-13 JP JP62288283A patent/JPS63152146A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20170076817A (ko) * | 2008-10-22 | 2017-07-04 | 어플라이드 머티어리얼스, 인코포레이티드 | 강화된 구리 이온화를 이용한 pvd 구리 시드 오버행 재-스퍼터링 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0273550A1 (en) | 1988-07-06 |
| US4756810A (en) | 1988-07-12 |
| JPS63152146A (ja) | 1988-06-24 |
| JPH0365013B2 (enExample) | 1991-10-09 |
| KR880008423A (ko) | 1988-08-31 |
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