KR880011908A - 반도체 소자 제조방법 - Google Patents

반도체 소자 제조방법 Download PDF

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Publication number
KR880011908A
KR880011908A KR1019880002276A KR880002276A KR880011908A KR 880011908 A KR880011908 A KR 880011908A KR 1019880002276 A KR1019880002276 A KR 1019880002276A KR 880002276 A KR880002276 A KR 880002276A KR 880011908 A KR880011908 A KR 880011908A
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KR
South Korea
Prior art keywords
thickness
wafer
plasma
initial thickness
oxide layer
Prior art date
Application number
KR1019880002276A
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English (en)
Inventor
안토니우스 반 데르플라스 파우루스
Original Assignee
이반 밀러 레르너
엔. 브이. 필립스 글로아이람펜파브리켄
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 이반 밀러 레르너, 엔. 브이. 필립스 글로아이람펜파브리켄 filed Critical 이반 밀러 레르너
Publication of KR880011908A publication Critical patent/KR880011908A/ko

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76—Making of isolation regions between components
    • H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76202—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO
    • H01L21/76213—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO introducing electrical inactive or active impurities in the local oxidation region, e.g. to alter LOCOS oxide growth characteristics or for additional isolation purpose
    • H01L21/76216—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO introducing electrical inactive or active impurities in the local oxidation region, e.g. to alter LOCOS oxide growth characteristics or for additional isolation purpose introducing electrical active impurities in the local oxidation region for the sole purpose of creating channel stoppers
    • H01L21/76218—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO introducing electrical inactive or active impurities in the local oxidation region, e.g. to alter LOCOS oxide growth characteristics or for additional isolation purpose introducing electrical active impurities in the local oxidation region for the sole purpose of creating channel stoppers introducing both types of electrical active impurities in the local oxidation region for the sole purpose of creating channel stoppers, e.g. for isolation of complementary doped regions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/311—Etching the insulating layers by chemical or physical means
    • H01L21/31105—Etching inorganic layers
    • H01L21/31111—Etching inorganic layers by chemical means
    • H01L21/31116—Etching inorganic layers by chemical means by dry-etching

Abstract

내용 없음

Description

반도체 소자 제조방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도 내지 제3도는 본 발명에 의한 방법에 의하여 반도체 소자 제조의 몇개의 연속적인 단계를 도시한 횡단면도.

Claims (6)

  1. 산화 마스크가 실리콘 웨이퍼의 표면에 국부적으로 제공되고 그 후에 웨이퍼는 산화 처리가 되며 산화 마스크에 의하여 덮혀지지 않은 웨이퍼의 부분 산화에 의하여 필드 산화물층이 필요한 절연 두께와 또 다른 처리 단계 동안에 두께 손실을 보상하기 위하여 필요한 부가 두께의 합과 동일한 초기 두께로 형성되는 반도체 소자 제조방법에 있어서, 상기초기 두께를 가지는 필드 산화물층이 초기 두께에 도달할 때까지 웨이퍼가 반응 이온을 가진 플라스마에서 에치된 후에 초기 두께보다 큰 두께를 가지는 것을 특징으로 하는 반도체 소자 제조방법.
  2. 제1항에 있어서, 필드 산화물층이 초기두께보다 최소한 100mm 큰 두께를 가진 것을 특징으로 하는 반도체 소자 제조방법.
  3. 제1항 또는 제2항에 있어서, 필드 산화물층이 초기 두께보다 많아야 250mm 큰 두께를 가진 것을 특징으로 하는 반도체 소자 제조방법.
  4. 전항중 어는 한 항에 있어서, 실리콘 웨이퍼는 산화처리 후에 그러나 플라스마에서 에칭 처리전에 플라즈마에서 에칭 동안에 제거된 평면의 보조층으로 덮여진 것을 특징으로 하는 반도체 소자 제조방법.
  5. 제4항중에 있어서, 평면의 보조층과 같은 실리콘 산화물층은 테트라에톡시 시래인(tetraethoxy silane)을 포함하는 대기에서 웨이퍼를 가열에 의하여 제공되는 것을 특징으로 하는 반도체 소자 제조방법.
  6. 전항 중 어느 한 항에 있어서, 반응 이온을 가진 에칭 처리는 하나는 접지되고 다른 하나는 공급 소스에 접속된 평행판을 구비하는 반응기에서 수행되며 플라스마는 판 사이에서 발생되고 웨이퍼는 접지된 판상에 제공되며, 그리고 플라스마는 테트라플루오메탄(CF4) 및 판 사이를 지나는 아르곤의 혼합기체에서 발생되는 것을 특징으로 하는 반도체 소자 제조방법.
    ※ 참고사항 : 최초출원 내용에 내용에 의하여 공개하는 것임.
KR1019880002276A 1987-03-06 1988-03-05 반도체 소자 제조방법 KR880011908A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8700541 1987-03-06
NL8700541A NL8700541A (nl) 1987-03-06 1987-03-06 Werkwijze voor het vervaardigen van een halfgeleiderinrichting waarbij een plak silicium plaatselijk wordt voorzien van veldoxidegebieden.

Publications (1)

Publication Number Publication Date
KR880011908A true KR880011908A (ko) 1988-10-31

Family

ID=19849667

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019880002276A KR880011908A (ko) 1987-03-06 1988-03-05 반도체 소자 제조방법

Country Status (5)

Country Link
US (1) US4952525A (ko)
EP (1) EP0284124A1 (ko)
JP (1) JPS63228739A (ko)
KR (1) KR880011908A (ko)
NL (1) NL8700541A (ko)

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JP3092185B2 (ja) * 1990-07-30 2000-09-25 セイコーエプソン株式会社 半導体装置の製造方法
US5290396A (en) * 1991-06-06 1994-03-01 Lsi Logic Corporation Trench planarization techniques
US5413966A (en) * 1990-12-20 1995-05-09 Lsi Logic Corporation Shallow trench etch
US5225358A (en) * 1991-06-06 1993-07-06 Lsi Logic Corporation Method of forming late isolation with polishing
US5248625A (en) * 1991-06-06 1993-09-28 Lsi Logic Corporation Techniques for forming isolation structures
US5252503A (en) * 1991-06-06 1993-10-12 Lsi Logic Corporation Techniques for forming isolation structures
US6432759B1 (en) * 1992-11-24 2002-08-13 Lsi Logic Corporation Method of forming source and drain regions for CMOS devices
JPH08316223A (ja) * 1995-05-16 1996-11-29 Mitsubishi Electric Corp 半導体装置およびその製造方法
US6008526A (en) * 1995-05-30 1999-12-28 Samsung Electronics Co., Ltd. Device isolation layer for a semiconductor device
US5861339A (en) * 1995-10-27 1999-01-19 Integrated Device Technology, Inc. Recessed isolation with double oxidation
US5672538A (en) * 1995-12-04 1997-09-30 Taiwan Semiconductor Manufacturing Company, Ltd Modified locus isolation process in which surface topology of the locos oxide is smoothed
US5686346A (en) * 1996-03-26 1997-11-11 Advanced Micro Devices, Inc. Method for enhancing field oxide thickness at field oxide perimeters
US5652177A (en) * 1996-08-22 1997-07-29 Chartered Semiconductor Manufacturing Pte Ltd Method for fabricating a planar field oxide region
US5930647A (en) 1997-02-27 1999-07-27 Micron Technology, Inc. Methods of forming field oxide and active area regions on a semiconductive substrate
US6268266B1 (en) * 1999-10-22 2001-07-31 United Microelectronics Corp. Method for forming enhanced FOX region of low voltage device in high voltage process
US6268267B1 (en) * 2000-01-24 2001-07-31 Taiwan Semiconductor Manufacturing Company Silicon-oxynitride-oxide (SXO) continuity film pad to recessed bird's beak of LOCOS
WO2003032378A1 (de) * 2001-10-08 2003-04-17 Infineon Technologies Ag Verfahren zum herstellen einer gate-struktur fuer einen mos-transistor
US20040007755A1 (en) * 2002-07-12 2004-01-15 Texas Instruments Incorporated Field oxide profile of an isolation region associated with a contact structure of a semiconductor device
US6949448B2 (en) * 2003-04-01 2005-09-27 Taiwan Semiconductor Manufacturing Co., Ltd. Local oxidation of silicon (LOCOS) method employing graded oxidation mask
US20060057765A1 (en) 2004-09-13 2006-03-16 Taiwan Semiconductor Manufacturing Company, Ltd. Image sensor including multiple lenses and method of manufacture thereof
US20080299780A1 (en) * 2007-06-01 2008-12-04 Uv Tech Systems, Inc. Method and apparatus for laser oxidation and reduction

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US204A (en) * 1837-05-22 Construction of and mode of
NL173110C (nl) * 1971-03-17 1983-12-01 Philips Nv Werkwijze ter vervaardiging van een halfgeleiderinrichting, waarbij op een oppervlak van een halfgeleiderlichaam een uit ten minste twee deellagen van verschillend materiaal samengestelde maskeringslaag wordt aangebracht.
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Also Published As

Publication number Publication date
US4952525A (en) 1990-08-28
JPS63228739A (ja) 1988-09-22
NL8700541A (nl) 1988-10-03
EP0284124A1 (en) 1988-09-28

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