KR101450904B1 - Ａ/ｄ 변환 회로, ａ/ｄ 변환 회로의 제어 방법, 고체 촬상장치 및 촬상 장치 - Google Patents

Ａ/ｄ 변환 회로, ａ/ｄ 변환 회로의 제어 방법, 고체 촬상장치 및 촬상 장치 Download PDF

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KR101450904B1
KR101450904B1 KR1020080052896A KR20080052896A KR101450904B1 KR 101450904 B1 KR101450904 B1 KR 101450904B1 KR 1020080052896 A KR1020080052896 A KR 1020080052896A KR 20080052896 A KR20080052896 A KR 20080052896A KR 101450904 B1 KR101450904 B1 KR 101450904B1
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switch
input
turned
signal
capacitance
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KR20080107295A (ko
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마사끼 사까끼바라
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소니 주식회사
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0656—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal
    • H03M1/0658—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal by calculating a running average of a number of subsequent samples
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H03M1/56—Input signal compared with linear ramp

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Analogue/Digital Conversion (AREA)
KR1020080052896A 2007-06-06 2008-06-05 Ａ/ｄ 변환 회로, ａ/ｄ 변환 회로의 제어 방법, 고체 촬상장치 및 촬상 장치 Expired - Fee Related KR101450904B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2007-00149904 2007-06-06
JP2007149904A JP4353281B2 (ja) 2007-06-06 2007-06-06 Ａ／ｄ変換回路、ａ／ｄ変換回路の制御方法、固体撮像装置および撮像装置

Publications (2)

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KR20080107295A KR20080107295A (ko) 2008-12-10
KR101450904B1 true KR101450904B1 (ko) 2014-10-14

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US (1) US7616146B2 (enExample)
JP (1) JP4353281B2 (enExample)
KR (1) KR101450904B1 (enExample)
CN (1) CN101320974B (enExample)
TW (1) TW200915732A (enExample)

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JP5127862B2 (ja) * 2010-03-24 2013-01-23 株式会社東芝 固体撮像装置
JP5645505B2 (ja) * 2010-06-29 2014-12-24 キヤノン株式会社 撮像装置及びその制御方法
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JP5814539B2 (ja) 2010-11-17 2015-11-17 キヤノン株式会社 撮像装置
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JP5887827B2 (ja) * 2011-10-20 2016-03-16 ソニー株式会社 固体撮像素子およびカメラシステム
JP2013153380A (ja) * 2012-01-26 2013-08-08 Hitachi Kokusai Electric Inc 撮像装置および撮像方法
JP2013153381A (ja) * 2012-01-26 2013-08-08 Hitachi Kokusai Electric Inc 撮像装置および撮像方法
JP6004664B2 (ja) * 2012-02-17 2016-10-12 キヤノン株式会社 光電変換装置、光電変換装置の駆動方法
JP6317568B2 (ja) * 2013-11-15 2018-04-25 キヤノン株式会社 比較回路およびそれを用いた撮像素子並びに比較回路の制御方法
KR102148801B1 (ko) * 2014-03-17 2020-08-28 에스케이하이닉스 주식회사 램프 신호 발생 장치 및 그를 이용한 씨모스 이미지 센서
CN103957411A (zh) * 2014-04-08 2014-07-30 天津大学 基于cmos图像传感器的焦平面图像压缩装置
JP6338440B2 (ja) * 2014-05-02 2018-06-06 キヤノン株式会社 撮像装置の駆動方法、撮像装置、撮像システム
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US9590592B2 (en) * 2014-11-24 2017-03-07 Cypress Semiconductor Corporation Configurable capacitor arrays and switched capacitor circuits
JP2018078350A (ja) * 2015-03-19 2018-05-17 パナソニックＩｐマネジメント株式会社 Ａｄ変換器、イメージセンサ、および撮像装置
US9958993B2 (en) 2015-06-30 2018-05-01 Synaptics Incorporated Active matrix capacitive fingerprint sensor with 1-TFT pixel architecture for display integration
CN107924259B (zh) * 2015-06-30 2021-09-24 辛纳普蒂克斯公司 用于显示集成的具有1-tft像素架构的有源矩阵电容性指纹传感器
KR20170010515A (ko) * 2015-07-20 2017-02-01 삼성전자주식회사 적분기 및 sar adc를 포함하는 반도체 장치
WO2017076747A1 (en) * 2015-11-06 2017-05-11 Cmosis Bvba Analog-to-digital conversion and method of analog-to-digital conversion
CN105631432B (zh) 2016-01-04 2020-12-08 京东方科技集团股份有限公司 指纹探测电路及驱动方法和显示装置
JP2018037921A (ja) * 2016-09-01 2018-03-08 ルネサスエレクトロニクス株式会社 撮像素子
JP7029890B2 (ja) * 2017-03-02 2022-03-04 ソニーセミコンダクタソリューションズ株式会社 撮像素子、撮像素子の制御方法、及び、電子機器
TWI755462B (zh) 2017-03-02 2022-02-21 日商索尼半導體解決方案公司 影像感測器、控制影像感測器之方法及電子裝置
KR101855648B1 (ko) * 2017-03-28 2018-05-09 주식회사 센소니아 향상된 지문 인식 센서 및 이에 포함되는 전하 누적 감지 회로
KR101886034B1 (ko) * 2017-06-09 2018-09-07 주식회사 센소니아 성능이 강화되는 지문 인식 시스템 및 이에 포함되는 누적 측정 회로
WO2019017092A1 (ja) 2017-07-20 2019-01-24 ソニーセミコンダクタソリューションズ株式会社 アナログデジタル変換器、固体撮像素子、および、アナログデジタル変換器の制御方法
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FR3084545B1 (fr) * 2018-07-27 2021-05-14 Soc Fr De Detecteurs Infrarouges Sofradir Dispositif d’echantillonnage avec gestion de la consommation electrique
CN110149489A (zh) * 2019-05-23 2019-08-20 Oppo广东移动通信有限公司 采样方法、装置以及计算机存储介质和图像传感器
CN114830634B (zh) * 2019-12-19 2025-09-16 索尼半导体解决方案公司 固态成像装置和电子设备
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Publication number Publication date
CN101320974B (zh) 2012-02-01
JP2008306325A (ja) 2008-12-18
TWI360953B (enExample) 2012-03-21
JP4353281B2 (ja) 2009-10-28
KR20080107295A (ko) 2008-12-10
TW200915732A (en) 2009-04-01
CN101320974A (zh) 2008-12-10
US20080303705A1 (en) 2008-12-11
US7616146B2 (en) 2009-11-10

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