CN101320974B - 模数转换电路、其控制方法、固态成像设备和成像装置 - Google Patents

模数转换电路、其控制方法、固态成像设备和成像装置 Download PDF

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Publication number
CN101320974B
CN101320974B CN2008101084899A CN200810108489A CN101320974B CN 101320974 B CN101320974 B CN 101320974B CN 2008101084899 A CN2008101084899 A CN 2008101084899A CN 200810108489 A CN200810108489 A CN 200810108489A CN 101320974 B CN101320974 B CN 101320974B
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input
signal
switch
operational amplifier
change
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CN101320974A (zh
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榊原雅树
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Sony Corp
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Sony Corp
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0656—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal
    • H03M1/0658—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal by calculating a running average of a number of subsequent samples
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H03M1/56—Input signal compared with linear ramp

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Analogue/Digital Conversion (AREA)
CN2008101084899A 2007-06-06 2008-06-06 模数转换电路、其控制方法、固态成像设备和成像装置 Expired - Fee Related CN101320974B (zh)

Applications Claiming Priority (2)

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JP149904/07 2007-06-06
JP2007149904A JP4353281B2 (ja) 2007-06-06 2007-06-06 Ａ／ｄ変換回路、ａ／ｄ変換回路の制御方法、固体撮像装置および撮像装置

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CN101320974A CN101320974A (zh) 2008-12-10
CN101320974B true CN101320974B (zh) 2012-02-01

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US (1) US7616146B2 (enExample)
JP (1) JP4353281B2 (enExample)
KR (1) KR101450904B1 (enExample)
CN (1) CN101320974B (enExample)
TW (1) TW200915732A (enExample)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100790969B1 (ko) * 2005-08-23 2008-01-02 삼성전자주식회사 화질 개선을 위하여 자동 교정된 램프 신호를 이용한이미지 센서 및 방법
US8044943B2 (en) * 2008-06-03 2011-10-25 Himax Technologies Limited Touch panel
JP5178458B2 (ja) * 2008-10-31 2013-04-10 キヤノン株式会社 固体撮像装置、撮像システム、および、固体撮像装置の駆動方法
TWI410849B (zh) * 2009-10-19 2013-10-01 Orise Technology Co Ltd 電容式觸控面板的感測電路
JP5127862B2 (ja) * 2010-03-24 2013-01-23 株式会社東芝 固体撮像装置
JP5645505B2 (ja) * 2010-06-29 2014-12-24 キヤノン株式会社 撮像装置及びその制御方法
CN102347758B (zh) * 2010-08-05 2014-10-15 中国人民解放军国防科学技术大学 一种斜率可配置的斜坡补偿与求和电路
JP5814539B2 (ja) 2010-11-17 2015-11-17 キヤノン株式会社 撮像装置
JP5704939B2 (ja) * 2011-01-31 2015-04-22 オリンパス株式会社 撮像装置
JP5449290B2 (ja) * 2011-10-07 2014-03-19 キヤノン株式会社 ランプ信号出力回路、アナログデジタル変換回路、撮像装置、ランプ信号出力回路の駆動方法
JP5887827B2 (ja) * 2011-10-20 2016-03-16 ソニー株式会社 固体撮像素子およびカメラシステム
JP2013153380A (ja) * 2012-01-26 2013-08-08 Hitachi Kokusai Electric Inc 撮像装置および撮像方法
JP2013153381A (ja) * 2012-01-26 2013-08-08 Hitachi Kokusai Electric Inc 撮像装置および撮像方法
JP6004664B2 (ja) * 2012-02-17 2016-10-12 キヤノン株式会社 光電変換装置、光電変換装置の駆動方法
JP6317568B2 (ja) * 2013-11-15 2018-04-25 キヤノン株式会社 比較回路およびそれを用いた撮像素子並びに比較回路の制御方法
KR102148801B1 (ko) * 2014-03-17 2020-08-28 에스케이하이닉스 주식회사 램프 신호 발생 장치 및 그를 이용한 씨모스 이미지 센서
CN103957411A (zh) * 2014-04-08 2014-07-30 天津大学 基于cmos图像传感器的焦平面图像压缩装置
JP6338440B2 (ja) * 2014-05-02 2018-06-06 キヤノン株式会社 撮像装置の駆動方法、撮像装置、撮像システム
JP2015231051A (ja) 2014-06-03 2015-12-21 ソニー株式会社 信号処理装置、制御方法、撮像素子、並びに、電子機器
JP5861012B1 (ja) * 2014-07-02 2016-02-16 オリンパス株式会社 撮像素子、撮像装置、内視鏡、内視鏡システム
CN104079845A (zh) * 2014-07-14 2014-10-01 昆山锐芯微电子有限公司 触发电路、计数器、cmos图像传感器及其读取电路
KR101659492B1 (ko) * 2014-11-10 2016-09-23 한신대학교 산학협력단 정전 용량 감지용 전하 전송 회로 및 이를 포함하는 지문인식장치
US9590592B2 (en) * 2014-11-24 2017-03-07 Cypress Semiconductor Corporation Configurable capacitor arrays and switched capacitor circuits
JP2018078350A (ja) * 2015-03-19 2018-05-17 パナソニックＩｐマネジメント株式会社 Ａｄ変換器、イメージセンサ、および撮像装置
US9958993B2 (en) 2015-06-30 2018-05-01 Synaptics Incorporated Active matrix capacitive fingerprint sensor with 1-TFT pixel architecture for display integration
CN107924259B (zh) * 2015-06-30 2021-09-24 辛纳普蒂克斯公司 用于显示集成的具有1-tft像素架构的有源矩阵电容性指纹传感器
KR20170010515A (ko) * 2015-07-20 2017-02-01 삼성전자주식회사 적분기 및 sar adc를 포함하는 반도체 장치
WO2017076747A1 (en) * 2015-11-06 2017-05-11 Cmosis Bvba Analog-to-digital conversion and method of analog-to-digital conversion
CN105631432B (zh) 2016-01-04 2020-12-08 京东方科技集团股份有限公司 指纹探测电路及驱动方法和显示装置
JP2018037921A (ja) * 2016-09-01 2018-03-08 ルネサスエレクトロニクス株式会社 撮像素子
JP7029890B2 (ja) * 2017-03-02 2022-03-04 ソニーセミコンダクタソリューションズ株式会社 撮像素子、撮像素子の制御方法、及び、電子機器
TWI755462B (zh) 2017-03-02 2022-02-21 日商索尼半導體解決方案公司 影像感測器、控制影像感測器之方法及電子裝置
KR101855648B1 (ko) * 2017-03-28 2018-05-09 주식회사 센소니아 향상된 지문 인식 센서 및 이에 포함되는 전하 누적 감지 회로
KR101886034B1 (ko) * 2017-06-09 2018-09-07 주식회사 센소니아 성능이 강화되는 지문 인식 시스템 및 이에 포함되는 누적 측정 회로
WO2019017092A1 (ja) 2017-07-20 2019-01-24 ソニーセミコンダクタソリューションズ株式会社 アナログデジタル変換器、固体撮像素子、および、アナログデジタル変換器の制御方法
US10574922B2 (en) * 2018-03-12 2020-02-25 Semiconductor Components Industries, Llc Imaging systems with boosted control signals
FR3084545B1 (fr) * 2018-07-27 2021-05-14 Soc Fr De Detecteurs Infrarouges Sofradir Dispositif d’echantillonnage avec gestion de la consommation electrique
CN110149489A (zh) * 2019-05-23 2019-08-20 Oppo广东移动通信有限公司 采样方法、装置以及计算机存储介质和图像传感器
CN114830634B (zh) * 2019-12-19 2025-09-16 索尼半导体解决方案公司 固态成像装置和电子设备
GB202014008D0 (en) 2020-09-07 2020-10-21 Touch Biometrix Ltd Biometric skin contact sensor and methods of operating a biometric skin contact sensor
GB202014049D0 (en) 2020-09-07 2020-10-21 Touch Biometrix Ltd Biometric skin contact sensor and methods of operating a biometric skin contact sensor
GB202014011D0 (en) 2020-09-07 2020-10-21 Touch Biometrix Ltd Biometric skin contact sensor and methods of operating a biometric skin contact sensor
CN114627514B (zh) * 2022-02-28 2024-12-03 敦泰电子（深圳）有限公司 指纹检测放大电路以及指纹识别装置
CN115855271B (zh) * 2023-02-22 2023-05-23 昆明钍晶科技有限公司 一种具有大电荷处理能力的读出电路及红外热成像仪

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001004681A (ja) * 1999-06-24 2001-01-12 Olympus Optical Co Ltd 電荷検出装置
CN1297287A (zh) * 1999-11-18 2001-05-30 合邦电子股份有限公司 数字模拟转换器的低动态误差取样/保持电路

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5392043A (en) * 1993-10-04 1995-02-21 General Electric Company Double-rate sampled signal integrator
US6002352A (en) 1997-06-24 1999-12-14 International Business Machines Corporation Method of sampling, downconverting, and digitizing a bandpass signal using a digital predictive coder
JP3844699B2 (ja) 2001-02-19 2006-11-15 イノテック株式会社 可変利得アンプ
JP3795338B2 (ja) * 2001-02-27 2006-07-12 旭化成マイクロシステム株式会社 全差動型サンプリング回路及びデルタシグマ型変調器
JP3810318B2 (ja) * 2001-12-28 2006-08-16 有限会社ニューロソリューション アナログデジタル変換装置
JP2005027232A (ja) 2003-07-03 2005-01-27 Tadashi Sugiki Ａｄ変換回路及び固体撮像装置
JP3962788B2 (ja) 2003-10-29 2007-08-22 国立大学法人静岡大学 Ａ／ｄ変換アレイ及びイメージセンサ
US7289055B2 (en) * 2004-02-05 2007-10-30 Sanyo Electric Co., Ltd. Analog-digital converter with gain adjustment for high-speed operation
US6967611B2 (en) * 2004-03-19 2005-11-22 Freescale Semiconductor, Inc. Optimized reference voltage generation using switched capacitor scaling for data converters
JP4315032B2 (ja) 2004-03-22 2009-08-19 ソニー株式会社 固体撮像装置および固体撮像装置の駆動方法
US7417574B2 (en) * 2004-12-13 2008-08-26 Texas Instruments Incorporated Efficient amplifier sharing in a multi-stage analog to digital converter
JP2006173807A (ja) * 2004-12-13 2006-06-29 Sanyo Electric Co Ltd アナログデジタル変換器
US7126523B2 (en) * 2004-12-13 2006-10-24 Texas Instruments Incorporated Reducing errors and power consumption in a multi-stage analog to digital converter (ADC) using amplifier sharing techniques
US7009549B1 (en) * 2004-12-30 2006-03-07 Texas Instruments Incorporated Switched-capacitor circuit with scaled reference voltage
US7265705B1 (en) * 2006-08-10 2007-09-04 National Semiconductor Corporation Opamp and capacitor sharing scheme for low-power pipeline ADC
US7319419B1 (en) * 2006-08-30 2008-01-15 Texas Instruments Incorporated Switched capacitor circuit with current source offset DAC and method
US7511648B2 (en) * 2007-04-23 2009-03-31 Texas Instruments Incorporated Integrating/SAR ADC and method with low integrator swing and low complexity
US7453389B1 (en) * 2007-08-28 2008-11-18 National Semiconductor Corporation Correlated double sampling ping-pong architecture with reduced DAC capacitors

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001004681A (ja) * 1999-06-24 2001-01-12 Olympus Optical Co Ltd 電荷検出装置
CN1297287A (zh) * 1999-11-18 2001-05-30 合邦电子股份有限公司 数字模拟转换器的低动态误差取样/保持电路

Also Published As

Publication number Publication date
JP2008306325A (ja) 2008-12-18
TWI360953B (enExample) 2012-03-21
JP4353281B2 (ja) 2009-10-28
KR20080107295A (ko) 2008-12-10
TW200915732A (en) 2009-04-01
KR101450904B1 (ko) 2014-10-14
CN101320974A (zh) 2008-12-10
US20080303705A1 (en) 2008-12-11
US7616146B2 (en) 2009-11-10

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