JP4353281B2 - A/d変換回路、a/d変換回路の制御方法、固体撮像装置および撮像装置 - Google Patents

A/d変換回路、a/d変換回路の制御方法、固体撮像装置および撮像装置 Download PDF

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JP4353281B2
JP4353281B2 JP2007149904A JP2007149904A JP4353281B2 JP 4353281 B2 JP4353281 B2 JP 4353281B2 JP 2007149904 A JP2007149904 A JP 2007149904A JP 2007149904 A JP2007149904 A JP 2007149904A JP 4353281 B2 JP4353281 B2 JP 4353281B2
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switch
input
signal
operational amplifier
capacitor
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Expired - Fee Related
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JP2007149904A
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Japanese (ja)
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JP2008306325A (ja
Inventor
雅樹 榊原
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Sony Corp
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Sony Corp
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Priority to JP2007149904A priority Critical patent/JP4353281B2/ja
Priority to TW097117049A priority patent/TW200915732A/zh
Priority to US12/156,222 priority patent/US7616146B2/en
Priority to KR1020080052896A priority patent/KR101450904B1/ko
Priority to CN2008101084899A priority patent/CN101320974B/zh
Publication of JP2008306325A publication Critical patent/JP2008306325A/ja
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Publication of JP4353281B2 publication Critical patent/JP4353281B2/ja
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0656Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal
    • H03M1/0658Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal by calculating a running average of a number of subsequent samples
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/50Analogue/digital converters with intermediate conversion to time interval
    • H03M1/56Input signal compared with linear ramp

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Analogue/Digital Conversion (AREA)
JP2007149904A 2007-06-06 2007-06-06 A/d変換回路、a/d変換回路の制御方法、固体撮像装置および撮像装置 Expired - Fee Related JP4353281B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2007149904A JP4353281B2 (ja) 2007-06-06 2007-06-06 A/d変換回路、a/d変換回路の制御方法、固体撮像装置および撮像装置
TW097117049A TW200915732A (en) 2007-06-06 2008-05-08 A/D conversion circuit, control method of A/D conversion circuit, solid-state imaging device, and imaging apparatus
US12/156,222 US7616146B2 (en) 2007-06-06 2008-05-30 A/D conversion circuit, control method thereof, solid-state imaging device, and imaging apparatus
KR1020080052896A KR101450904B1 (ko) 2007-06-06 2008-06-05 A/d 변환 회로, a/d 변환 회로의 제어 방법, 고체 촬상장치 및 촬상 장치
CN2008101084899A CN101320974B (zh) 2007-06-06 2008-06-06 模数转换电路、其控制方法、固态成像设备和成像装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007149904A JP4353281B2 (ja) 2007-06-06 2007-06-06 A/d変換回路、a/d変換回路の制御方法、固体撮像装置および撮像装置

Publications (2)

Publication Number Publication Date
JP2008306325A JP2008306325A (ja) 2008-12-18
JP4353281B2 true JP4353281B2 (ja) 2009-10-28

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JP2007149904A Expired - Fee Related JP4353281B2 (ja) 2007-06-06 2007-06-06 A/d変換回路、a/d変換回路の制御方法、固体撮像装置および撮像装置

Country Status (5)

Country Link
US (1) US7616146B2 (enExample)
JP (1) JP4353281B2 (enExample)
KR (1) KR101450904B1 (enExample)
CN (1) CN101320974B (enExample)
TW (1) TW200915732A (enExample)

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US9590592B2 (en) * 2014-11-24 2017-03-07 Cypress Semiconductor Corporation Configurable capacitor arrays and switched capacitor circuits
JP2018078350A (ja) * 2015-03-19 2018-05-17 パナソニックIpマネジメント株式会社 Ad変換器、イメージセンサ、および撮像装置
US9958993B2 (en) 2015-06-30 2018-05-01 Synaptics Incorporated Active matrix capacitive fingerprint sensor with 1-TFT pixel architecture for display integration
CN107924259B (zh) * 2015-06-30 2021-09-24 辛纳普蒂克斯公司 用于显示集成的具有1-tft像素架构的有源矩阵电容性指纹传感器
KR20170010515A (ko) * 2015-07-20 2017-02-01 삼성전자주식회사 적분기 및 sar adc를 포함하는 반도체 장치
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CN105631432B (zh) 2016-01-04 2020-12-08 京东方科技集团股份有限公司 指纹探测电路及驱动方法和显示装置
JP2018037921A (ja) * 2016-09-01 2018-03-08 ルネサスエレクトロニクス株式会社 撮像素子
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TWI755462B (zh) 2017-03-02 2022-02-21 日商索尼半導體解決方案公司 影像感測器、控制影像感測器之方法及電子裝置
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WO2019017092A1 (ja) 2017-07-20 2019-01-24 ソニーセミコンダクタソリューションズ株式会社 アナログデジタル変換器、固体撮像素子、および、アナログデジタル変換器の制御方法
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CN114830634B (zh) * 2019-12-19 2025-09-16 索尼半导体解决方案公司 固态成像装置和电子设备
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Also Published As

Publication number Publication date
CN101320974B (zh) 2012-02-01
JP2008306325A (ja) 2008-12-18
TWI360953B (enExample) 2012-03-21
KR20080107295A (ko) 2008-12-10
TW200915732A (en) 2009-04-01
KR101450904B1 (ko) 2014-10-14
CN101320974A (zh) 2008-12-10
US20080303705A1 (en) 2008-12-11
US7616146B2 (en) 2009-11-10

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