TW200915732A - A/D conversion circuit, control method of A/D conversion circuit, solid-state imaging device, and imaging apparatus - Google Patents

A/D conversion circuit, control method of A/D conversion circuit, solid-state imaging device, and imaging apparatus Download PDF

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Publication number
TW200915732A
TW200915732A TW097117049A TW97117049A TW200915732A TW 200915732 A TW200915732 A TW 200915732A TW 097117049 A TW097117049 A TW 097117049A TW 97117049 A TW97117049 A TW 97117049A TW 200915732 A TW200915732 A TW 200915732A
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TW
Taiwan
Prior art keywords
input
switch
signal
capacitor
analog
Prior art date
Application number
TW097117049A
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English (en)
Chinese (zh)
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TWI360953B (enExample
Inventor
Masaki Sakakibara
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Sony Corp filed Critical Sony Corp
Publication of TW200915732A publication Critical patent/TW200915732A/zh
Application granted granted Critical
Publication of TWI360953B publication Critical patent/TWI360953B/zh

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0656—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal
    • H03M1/0658—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal by calculating a running average of a number of subsequent samples
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H03M1/56—Input signal compared with linear ramp

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Analogue/Digital Conversion (AREA)
TW097117049A 2007-06-06 2008-05-08 A/D conversion circuit, control method of A/D conversion circuit, solid-state imaging device, and imaging apparatus TW200915732A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007149904A JP4353281B2 (ja) 2007-06-06 2007-06-06 Ａ／ｄ変換回路、ａ／ｄ変換回路の制御方法、固体撮像装置および撮像装置

Publications (2)

Publication Number Publication Date
TW200915732A true TW200915732A (en) 2009-04-01
TWI360953B TWI360953B (enExample) 2012-03-21

Family

ID=40095381

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097117049A TW200915732A (en) 2007-06-06 2008-05-08 A/D conversion circuit, control method of A/D conversion circuit, solid-state imaging device, and imaging apparatus

Country Status (5)

Country Link
US (1) US7616146B2 (enExample)
JP (1) JP4353281B2 (enExample)
KR (1) KR101450904B1 (enExample)
CN (1) CN101320974B (enExample)
TW (1) TW200915732A (enExample)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100790969B1 (ko) * 2005-08-23 2008-01-02 삼성전자주식회사 화질 개선을 위하여 자동 교정된 램프 신호를 이용한이미지 센서 및 방법
US8044943B2 (en) * 2008-06-03 2011-10-25 Himax Technologies Limited Touch panel
JP5178458B2 (ja) * 2008-10-31 2013-04-10 キヤノン株式会社 固体撮像装置、撮像システム、および、固体撮像装置の駆動方法
TWI410849B (zh) * 2009-10-19 2013-10-01 Orise Technology Co Ltd 電容式觸控面板的感測電路
JP5127862B2 (ja) * 2010-03-24 2013-01-23 株式会社東芝 固体撮像装置
JP5645505B2 (ja) * 2010-06-29 2014-12-24 キヤノン株式会社 撮像装置及びその制御方法
CN102347758B (zh) * 2010-08-05 2014-10-15 中国人民解放军国防科学技术大学 一种斜率可配置的斜坡补偿与求和电路
JP5814539B2 (ja) 2010-11-17 2015-11-17 キヤノン株式会社 撮像装置
JP5704939B2 (ja) * 2011-01-31 2015-04-22 オリンパス株式会社 撮像装置
JP5449290B2 (ja) * 2011-10-07 2014-03-19 キヤノン株式会社 ランプ信号出力回路、アナログデジタル変換回路、撮像装置、ランプ信号出力回路の駆動方法
JP5887827B2 (ja) * 2011-10-20 2016-03-16 ソニー株式会社 固体撮像素子およびカメラシステム
JP2013153380A (ja) * 2012-01-26 2013-08-08 Hitachi Kokusai Electric Inc 撮像装置および撮像方法
JP2013153381A (ja) * 2012-01-26 2013-08-08 Hitachi Kokusai Electric Inc 撮像装置および撮像方法
JP6004664B2 (ja) * 2012-02-17 2016-10-12 キヤノン株式会社 光電変換装置、光電変換装置の駆動方法
JP6317568B2 (ja) * 2013-11-15 2018-04-25 キヤノン株式会社 比較回路およびそれを用いた撮像素子並びに比較回路の制御方法
KR102148801B1 (ko) * 2014-03-17 2020-08-28 에스케이하이닉스 주식회사 램프 신호 발생 장치 및 그를 이용한 씨모스 이미지 센서
CN103957411A (zh) * 2014-04-08 2014-07-30 天津大学 基于cmos图像传感器的焦平面图像压缩装置
JP6338440B2 (ja) * 2014-05-02 2018-06-06 キヤノン株式会社 撮像装置の駆動方法、撮像装置、撮像システム
JP2015231051A (ja) 2014-06-03 2015-12-21 ソニー株式会社 信号処理装置、制御方法、撮像素子、並びに、電子機器
JP5861012B1 (ja) * 2014-07-02 2016-02-16 オリンパス株式会社 撮像素子、撮像装置、内視鏡、内視鏡システム
CN104079845A (zh) * 2014-07-14 2014-10-01 昆山锐芯微电子有限公司 触发电路、计数器、cmos图像传感器及其读取电路
KR101659492B1 (ko) * 2014-11-10 2016-09-23 한신대학교 산학협력단 정전 용량 감지용 전하 전송 회로 및 이를 포함하는 지문인식장치
US9590592B2 (en) * 2014-11-24 2017-03-07 Cypress Semiconductor Corporation Configurable capacitor arrays and switched capacitor circuits
JP2018078350A (ja) * 2015-03-19 2018-05-17 パナソニックＩｐマネジメント株式会社 Ａｄ変換器、イメージセンサ、および撮像装置
US9958993B2 (en) 2015-06-30 2018-05-01 Synaptics Incorporated Active matrix capacitive fingerprint sensor with 1-TFT pixel architecture for display integration
CN107924259B (zh) * 2015-06-30 2021-09-24 辛纳普蒂克斯公司 用于显示集成的具有1-tft像素架构的有源矩阵电容性指纹传感器
KR20170010515A (ko) * 2015-07-20 2017-02-01 삼성전자주식회사 적분기 및 sar adc를 포함하는 반도체 장치
WO2017076747A1 (en) * 2015-11-06 2017-05-11 Cmosis Bvba Analog-to-digital conversion and method of analog-to-digital conversion
CN105631432B (zh) 2016-01-04 2020-12-08 京东方科技集团股份有限公司 指纹探测电路及驱动方法和显示装置
JP2018037921A (ja) * 2016-09-01 2018-03-08 ルネサスエレクトロニクス株式会社 撮像素子
JP7029890B2 (ja) * 2017-03-02 2022-03-04 ソニーセミコンダクタソリューションズ株式会社 撮像素子、撮像素子の制御方法、及び、電子機器
TWI755462B (zh) 2017-03-02 2022-02-21 日商索尼半導體解決方案公司 影像感測器、控制影像感測器之方法及電子裝置
KR101855648B1 (ko) * 2017-03-28 2018-05-09 주식회사 센소니아 향상된 지문 인식 센서 및 이에 포함되는 전하 누적 감지 회로
KR101886034B1 (ko) * 2017-06-09 2018-09-07 주식회사 센소니아 성능이 강화되는 지문 인식 시스템 및 이에 포함되는 누적 측정 회로
WO2019017092A1 (ja) 2017-07-20 2019-01-24 ソニーセミコンダクタソリューションズ株式会社 アナログデジタル変換器、固体撮像素子、および、アナログデジタル変換器の制御方法
US10574922B2 (en) * 2018-03-12 2020-02-25 Semiconductor Components Industries, Llc Imaging systems with boosted control signals
FR3084545B1 (fr) * 2018-07-27 2021-05-14 Soc Fr De Detecteurs Infrarouges Sofradir Dispositif d’echantillonnage avec gestion de la consommation electrique
CN110149489A (zh) * 2019-05-23 2019-08-20 Oppo广东移动通信有限公司 采样方法、装置以及计算机存储介质和图像传感器
CN114830634B (zh) * 2019-12-19 2025-09-16 索尼半导体解决方案公司 固态成像装置和电子设备
GB202014008D0 (en) 2020-09-07 2020-10-21 Touch Biometrix Ltd Biometric skin contact sensor and methods of operating a biometric skin contact sensor
GB202014049D0 (en) 2020-09-07 2020-10-21 Touch Biometrix Ltd Biometric skin contact sensor and methods of operating a biometric skin contact sensor
GB202014011D0 (en) 2020-09-07 2020-10-21 Touch Biometrix Ltd Biometric skin contact sensor and methods of operating a biometric skin contact sensor
CN114627514B (zh) * 2022-02-28 2024-12-03 敦泰电子（深圳）有限公司 指纹检测放大电路以及指纹识别装置
CN115855271B (zh) * 2023-02-22 2023-05-23 昆明钍晶科技有限公司 一种具有大电荷处理能力的读出电路及红外热成像仪

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5392043A (en) * 1993-10-04 1995-02-21 General Electric Company Double-rate sampled signal integrator
US6002352A (en) 1997-06-24 1999-12-14 International Business Machines Corporation Method of sampling, downconverting, and digitizing a bandpass signal using a digital predictive coder
JP2001004681A (ja) * 1999-06-24 2001-01-12 Olympus Optical Co Ltd 電荷検出装置
CN1127804C (zh) * 1999-11-18 2003-11-12 合邦电子股份有限公司 数字模拟转换器的低动态误差取样/保持电路
JP3844699B2 (ja) 2001-02-19 2006-11-15 イノテック株式会社 可変利得アンプ
JP3795338B2 (ja) * 2001-02-27 2006-07-12 旭化成マイクロシステム株式会社 全差動型サンプリング回路及びデルタシグマ型変調器
JP3810318B2 (ja) * 2001-12-28 2006-08-16 有限会社ニューロソリューション アナログデジタル変換装置
JP2005027232A (ja) 2003-07-03 2005-01-27 Tadashi Sugiki Ａｄ変換回路及び固体撮像装置
JP3962788B2 (ja) 2003-10-29 2007-08-22 国立大学法人静岡大学 Ａ／ｄ変換アレイ及びイメージセンサ
US7289055B2 (en) * 2004-02-05 2007-10-30 Sanyo Electric Co., Ltd. Analog-digital converter with gain adjustment for high-speed operation
US6967611B2 (en) * 2004-03-19 2005-11-22 Freescale Semiconductor, Inc. Optimized reference voltage generation using switched capacitor scaling for data converters
JP4315032B2 (ja) 2004-03-22 2009-08-19 ソニー株式会社 固体撮像装置および固体撮像装置の駆動方法
US7417574B2 (en) * 2004-12-13 2008-08-26 Texas Instruments Incorporated Efficient amplifier sharing in a multi-stage analog to digital converter
JP2006173807A (ja) * 2004-12-13 2006-06-29 Sanyo Electric Co Ltd アナログデジタル変換器
US7126523B2 (en) * 2004-12-13 2006-10-24 Texas Instruments Incorporated Reducing errors and power consumption in a multi-stage analog to digital converter (ADC) using amplifier sharing techniques
US7009549B1 (en) * 2004-12-30 2006-03-07 Texas Instruments Incorporated Switched-capacitor circuit with scaled reference voltage
US7265705B1 (en) * 2006-08-10 2007-09-04 National Semiconductor Corporation Opamp and capacitor sharing scheme for low-power pipeline ADC
US7319419B1 (en) * 2006-08-30 2008-01-15 Texas Instruments Incorporated Switched capacitor circuit with current source offset DAC and method
US7511648B2 (en) * 2007-04-23 2009-03-31 Texas Instruments Incorporated Integrating/SAR ADC and method with low integrator swing and low complexity
US7453389B1 (en) * 2007-08-28 2008-11-18 National Semiconductor Corporation Correlated double sampling ping-pong architecture with reduced DAC capacitors

Also Published As

Publication number Publication date
CN101320974B (zh) 2012-02-01
JP2008306325A (ja) 2008-12-18
TWI360953B (enExample) 2012-03-21
JP4353281B2 (ja) 2009-10-28
KR20080107295A (ko) 2008-12-10
KR101450904B1 (ko) 2014-10-14
CN101320974A (zh) 2008-12-10
US20080303705A1 (en) 2008-12-11
US7616146B2 (en) 2009-11-10

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