KR101438161B1 - 프로브 카드 컨테이너 - Google Patents
프로브 카드 컨테이너 Download PDFInfo
- Publication number
- KR101438161B1 KR101438161B1 KR1020110131656A KR20110131656A KR101438161B1 KR 101438161 B1 KR101438161 B1 KR 101438161B1 KR 1020110131656 A KR1020110131656 A KR 1020110131656A KR 20110131656 A KR20110131656 A KR 20110131656A KR 101438161 B1 KR101438161 B1 KR 101438161B1
- Authority
- KR
- South Korea
- Prior art keywords
- probe card
- main case
- container
- roller
- case
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67363—Closed carriers specially adapted for containing substrates other than wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67353—Closed carriers specially adapted for a single substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Details Of Rigid Or Semi-Rigid Containers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011005135U JP3171687U (ja) | 2011-09-01 | 2011-09-01 | プローブカード収納ケース |
| JPJP-U-2011-005135 | 2011-09-01 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20130025316A KR20130025316A (ko) | 2013-03-11 |
| KR101438161B1 true KR101438161B1 (ko) | 2014-09-04 |
Family
ID=47756748
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020110131656A Active KR101438161B1 (ko) | 2011-09-01 | 2011-12-09 | 프로브 카드 컨테이너 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8490796B2 (enExample) |
| JP (1) | JP3171687U (enExample) |
| KR (1) | KR101438161B1 (enExample) |
| TW (1) | TWI451999B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20160109748A (ko) * | 2015-03-13 | 2016-09-21 | 세메스 주식회사 | 캐리어 유닛 및 이를 저장하는 시스템 |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3171687U (ja) | 2011-09-01 | 2011-11-10 | 株式会社協同 | プローブカード収納ケース |
| JP6054150B2 (ja) * | 2012-11-22 | 2016-12-27 | 日本電子材料株式会社 | プローブカードケース及びプローブカードの搬送方法 |
| JP6185285B2 (ja) * | 2013-05-14 | 2017-08-23 | 日本電子材料株式会社 | 係止機構及びその係止機構を備えた車輪付き収納ケース |
| KR101595940B1 (ko) * | 2014-10-23 | 2016-02-19 | 주식회사 인아텍 | 반도체 관련 부품을 테스트하는 다양한 사이즈의 프루브카드를 운반하는 안전 케이스 |
| JP6595025B2 (ja) * | 2018-02-27 | 2019-10-23 | 株式会社協同 | プローブカード収納ケース |
| JP2019149435A (ja) * | 2018-02-27 | 2019-09-05 | 株式会社協同 | プローブカード収納ケース |
| JP2019197010A (ja) * | 2018-05-11 | 2019-11-14 | 株式会社協同 | プローブカード収納ケース |
| MX2019015279A (es) * | 2018-12-27 | 2020-07-24 | Big Time Products Llc | Contenedor de almacenamiento de lados blandos con armazón de exosqueleto. |
| TWI862256B (zh) * | 2023-05-02 | 2024-11-11 | 家登精密工業股份有限公司 | 探針卡之定位環及保護盒 |
| KR102888617B1 (ko) | 2023-07-05 | 2025-11-20 | 가부시키가이샤 교도 | 포토마스크 수납 케이스 |
| KR102655758B1 (ko) * | 2023-07-14 | 2024-04-12 | 이동욱 | 프로브 카드 캐리어 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6561328B1 (en) * | 2002-03-26 | 2003-05-13 | Ming-Ter Huang | Multifunctional container |
| KR200383169Y1 (ko) | 2005-01-31 | 2005-05-03 | 구남호 | 보조 체인바퀴가 부설된 여행용 가방 |
| KR20110007660U (ko) * | 2010-01-27 | 2011-08-03 | 리노공업주식회사 | 프로브 카드용 캐리어 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2521840A1 (fr) | 1982-02-24 | 1983-08-26 | Delsey Soc | Valise a roulettes |
| JPH03171687A (ja) | 1989-11-29 | 1991-07-25 | Matsushita Electric Ind Co Ltd | レーザダイオード駆動装置 |
| JPH0667366B2 (ja) | 1990-07-31 | 1994-08-31 | 義夫 渡辺 | 真空掃除機用ノズル装置 |
| JPH07285604A (ja) | 1994-04-21 | 1995-10-31 | Gifu Plast Ind Co Ltd | 屋外ゴミ収集用容器 |
| US5695068A (en) * | 1994-09-09 | 1997-12-09 | Digital Equipment Corporation | Probe card shipping and handling system |
| JPH11127935A (ja) | 1997-10-29 | 1999-05-18 | Fuji Kowa Kogyo Kk | 精密機器運搬用ケース |
| DE19748088A1 (de) | 1997-10-30 | 1999-05-12 | Wacker Siltronic Halbleitermat | Verfahren und Vorrichtung zum Erkennen einer Fehllage einer Halbleiterscheibe |
| JP3035519B2 (ja) | 1998-01-22 | 2000-04-24 | 株式会社山本製作所 | 穀粒貯蔵庫 |
| JP3887253B2 (ja) * | 2002-03-19 | 2007-02-28 | 日鉱金属株式会社 | スパッタリングターゲット用運搬箱 |
| JP2004170267A (ja) | 2002-11-20 | 2004-06-17 | Tokyo Seimitsu Co Ltd | プローブカード搬送台車 |
| JP2009107638A (ja) | 2007-10-26 | 2009-05-21 | Daiwa Seiko Inc | 保冷箱 |
| US8350191B2 (en) * | 2008-05-21 | 2013-01-08 | Formfactor, Inc. | Probe card thermal conditioning system |
| JP3171687U (ja) | 2011-09-01 | 2011-11-10 | 株式会社協同 | プローブカード収納ケース |
-
2011
- 2011-09-01 JP JP2011005135U patent/JP3171687U/ja not_active Expired - Lifetime
- 2011-11-23 US US13/304,166 patent/US8490796B2/en active Active
- 2011-11-24 TW TW100143151A patent/TWI451999B/zh active
- 2011-12-09 KR KR1020110131656A patent/KR101438161B1/ko active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6561328B1 (en) * | 2002-03-26 | 2003-05-13 | Ming-Ter Huang | Multifunctional container |
| KR200383169Y1 (ko) | 2005-01-31 | 2005-05-03 | 구남호 | 보조 체인바퀴가 부설된 여행용 가방 |
| KR20110007660U (ko) * | 2010-01-27 | 2011-08-03 | 리노공업주식회사 | 프로브 카드용 캐리어 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20160109748A (ko) * | 2015-03-13 | 2016-09-21 | 세메스 주식회사 | 캐리어 유닛 및 이를 저장하는 시스템 |
| KR102221110B1 (ko) | 2015-03-13 | 2021-02-26 | 세메스 주식회사 | 캐리어 유닛 및 이를 저장하는 시스템 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3171687U (ja) | 2011-11-10 |
| US20130056390A1 (en) | 2013-03-07 |
| KR20130025316A (ko) | 2013-03-11 |
| US8490796B2 (en) | 2013-07-23 |
| TWI451999B (zh) | 2014-09-11 |
| TW201311522A (zh) | 2013-03-16 |
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