KR101254360B1 - 이미지 센서 및 이를 포함하는 카메라 - Google Patents
이미지 센서 및 이를 포함하는 카메라 Download PDFInfo
- Publication number
- KR101254360B1 KR101254360B1 KR1020077027911A KR20077027911A KR101254360B1 KR 101254360 B1 KR101254360 B1 KR 101254360B1 KR 1020077027911 A KR1020077027911 A KR 1020077027911A KR 20077027911 A KR20077027911 A KR 20077027911A KR 101254360 B1 KR101254360 B1 KR 101254360B1
- Authority
- KR
- South Korea
- Prior art keywords
- charge
- pixel
- voltage conversion
- conversion region
- pixels
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/46—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
- H04N25/59—Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/813—Electronic components shared by multiple pixels, e.g. one amplifier shared by two pixels
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US68610405P | 2005-06-01 | 2005-06-01 | |
| US60/686,104 | 2005-06-01 | ||
| US11/408,640 | 2006-04-21 | ||
| US11/408,640 US7705900B2 (en) | 2005-06-01 | 2006-04-21 | CMOS image sensor pixel with selectable binning and conversion gain |
| PCT/US2006/020586 WO2006130518A1 (en) | 2005-06-01 | 2006-05-26 | Cmos image sensor pixel with selectable binning |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20080011680A KR20080011680A (ko) | 2008-02-05 |
| KR101254360B1 true KR101254360B1 (ko) | 2013-04-12 |
Family
ID=37027543
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020077027911A Active KR101254360B1 (ko) | 2005-06-01 | 2006-05-26 | 이미지 센서 및 이를 포함하는 카메라 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7705900B2 (https=) |
| EP (1) | EP1900191B1 (https=) |
| JP (1) | JP5355079B2 (https=) |
| KR (1) | KR101254360B1 (https=) |
| TW (1) | TWI432022B (https=) |
| WO (1) | WO2006130518A1 (https=) |
Families Citing this family (79)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100680469B1 (ko) * | 2005-01-31 | 2007-02-08 | 매그나칩 반도체 유한회사 | 인접한 화소들 사이의 센싱노드들이 공유된 씨모스 이미지센서 |
| US8274715B2 (en) | 2005-07-28 | 2012-09-25 | Omnivision Technologies, Inc. | Processing color and panchromatic pixels |
| US8139130B2 (en) | 2005-07-28 | 2012-03-20 | Omnivision Technologies, Inc. | Image sensor with improved light sensitivity |
| US7916362B2 (en) | 2006-05-22 | 2011-03-29 | Eastman Kodak Company | Image sensor with improved light sensitivity |
| US8031258B2 (en) | 2006-10-04 | 2011-10-04 | Omnivision Technologies, Inc. | Providing multiple video signals from single sensor |
| US7674648B2 (en) * | 2007-03-21 | 2010-03-09 | Eastman Kodak Company | Extended dynamic range using variable sensitivity pixels |
| FR2914528B1 (fr) * | 2007-03-26 | 2009-07-24 | Commissariat Energie Atomique | Capteur d'image apte a fonctionner dans un mode de sous resolution. |
| KR20090005843A (ko) * | 2007-07-10 | 2009-01-14 | 삼성전자주식회사 | 촬상 장치 및 촬상 장치의 감도 개선 방법 |
| US7755121B2 (en) * | 2007-08-23 | 2010-07-13 | Aptina Imaging Corp. | Imagers, apparatuses and systems utilizing pixels with improved optical resolution and methods of operating the same |
| US7999870B2 (en) | 2008-02-01 | 2011-08-16 | Omnivision Technologies, Inc. | Sampling and readout of an image sensor having a sparse color filter array pattern |
| GB2457716A (en) * | 2008-02-22 | 2009-08-26 | Cmosis Nv | Active pixel sensor (APS) array with selective passive pixel (charge binning) mode |
| US7781716B2 (en) | 2008-03-17 | 2010-08-24 | Eastman Kodak Company | Stacked image sensor with shared diffusion regions in respective dropped pixel positions of a pixel array |
| US20090321799A1 (en) * | 2008-06-25 | 2009-12-31 | Velichko Sergey A | Method and apparatus for increasing conversion gain in imagers |
| EP2154879A1 (en) | 2008-08-13 | 2010-02-17 | Thomson Licensing | CMOS image sensor with selectable hard-wired binning |
| US7777171B2 (en) * | 2008-08-26 | 2010-08-17 | Eastman Kodak Company | In-pixel summing of charge generated by two or more pixels having two reset transistors connected in series |
| US8130302B2 (en) * | 2008-11-07 | 2012-03-06 | Aptina Imaging Corporation | Methods and apparatus providing selective binning of pixel circuits |
| FR2939919A1 (fr) * | 2008-12-16 | 2010-06-18 | New Imaging Technologies Sas | Capteur matriciel |
| US8913166B2 (en) * | 2009-01-21 | 2014-12-16 | Canon Kabushiki Kaisha | Solid-state imaging apparatus |
| JP5267867B2 (ja) * | 2009-03-06 | 2013-08-21 | ルネサスエレクトロニクス株式会社 | 撮像装置 |
| US8780101B2 (en) * | 2009-08-26 | 2014-07-15 | Sharp Kabushiki Kaisha | Photosensor operating in accordacne with specific voltages and display device including same |
| JP4881987B2 (ja) * | 2009-10-06 | 2012-02-22 | キヤノン株式会社 | 固体撮像装置および撮像装置 |
| US8531567B2 (en) * | 2009-10-22 | 2013-09-10 | Stmicroelectronics (Crolles 2) Sas | Image sensor with vertical transfer gate |
| US8546737B2 (en) * | 2009-10-30 | 2013-10-01 | Invisage Technologies, Inc. | Systems and methods for color binning |
| FR2959320B1 (fr) | 2010-04-26 | 2013-01-04 | Trixell | Detecteur de rayonnement electromagnetique a selection de gamme de gain |
| JP5775570B2 (ja) * | 2010-06-01 | 2015-09-09 | 博立▲碼▼杰通▲訊▼(深▲せん▼)有限公司Boly Media Communications(Shenzhen)Co.,Ltd. | マルチスペクトル感光素子及びそのサンプリング方法 |
| WO2011150553A1 (zh) * | 2010-06-01 | 2011-12-08 | 博立码杰通讯(深圳)有限公司 | 一种感光器件及其读取方法、读取电路 |
| JP5126305B2 (ja) * | 2010-07-02 | 2013-01-23 | 株式会社ニコン | 固体撮像素子 |
| JP5633216B2 (ja) * | 2010-07-08 | 2014-12-03 | 株式会社ニコン | 固体撮像素子 |
| JP5885403B2 (ja) * | 2011-06-08 | 2016-03-15 | キヤノン株式会社 | 撮像装置 |
| US10051210B2 (en) | 2011-06-10 | 2018-08-14 | Flir Systems, Inc. | Infrared detector array with selectable pixel binning systems and methods |
| WO2013011844A1 (en) | 2011-07-15 | 2013-01-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for driving the same |
| JP5686765B2 (ja) * | 2011-07-21 | 2015-03-18 | キヤノン株式会社 | 撮像装置およびその制御方法 |
| JP6128776B2 (ja) * | 2011-12-01 | 2017-05-17 | オリンパス株式会社 | 固体撮像装置、撮像装置、および信号読み出し方法 |
| JP6057511B2 (ja) * | 2011-12-21 | 2017-01-11 | キヤノン株式会社 | 撮像装置及び放射線撮像システム |
| JP5895525B2 (ja) * | 2011-12-28 | 2016-03-30 | 株式会社ニコン | 撮像素子 |
| JP6000589B2 (ja) * | 2012-03-21 | 2016-09-28 | キヤノン株式会社 | 固体撮像装置 |
| US9247170B2 (en) * | 2012-09-20 | 2016-01-26 | Semiconductor Components Industries, Llc | Triple conversion gain image sensor pixels |
| KR101933994B1 (ko) * | 2012-10-16 | 2018-12-31 | 삼성전자주식회사 | 깊이 영상과 컬러 영상을 획득하는 픽셀 구조를 가진 이미지 센서 |
| JP5971078B2 (ja) * | 2012-10-19 | 2016-08-17 | 株式会社ニコン | 固体撮像素子および撮像装置 |
| EP2782331A1 (en) * | 2013-03-22 | 2014-09-24 | Harvest Imaging bvba | Image sensor with focus-detection pixel, and method for reading focus-information |
| KR102180814B1 (ko) * | 2013-05-20 | 2020-11-19 | 인텔렉추얼디스커버리 주식회사 | 래디오그라피 센서 및 이를 포함하는 장치 |
| KR101985701B1 (ko) * | 2013-05-20 | 2019-06-04 | 에스케이하이닉스 주식회사 | 비닝 모드 시 전력 소모 감소를 위한 카운팅 장치 및 그 방법 |
| KR102087225B1 (ko) * | 2013-05-30 | 2020-03-11 | 에스케이하이닉스 주식회사 | 이미지 센싱 장치 |
| GB201318404D0 (en) | 2013-10-17 | 2013-12-04 | Cmosis Nv | An image sensor |
| JP6375614B2 (ja) * | 2013-11-19 | 2018-08-22 | 株式会社ニコン | 固体撮像素子及び撮像装置 |
| JP6217338B2 (ja) * | 2013-11-19 | 2017-10-25 | 株式会社ニコン | 固体撮像素子及び撮像装置 |
| KR102015900B1 (ko) | 2013-11-18 | 2019-08-29 | 가부시키가이샤 니콘 | 고체 촬상 소자 및 촬상 장치 |
| JP6075646B2 (ja) * | 2014-03-17 | 2017-02-08 | ソニー株式会社 | 固体撮像装置およびその駆動方法、並びに電子機器 |
| US9674470B2 (en) * | 2014-04-11 | 2017-06-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, method for driving semiconductor device, and method for driving electronic device |
| FR3022397B1 (fr) | 2014-06-13 | 2018-03-23 | New Imaging Technologies | Cellule photoelectrique de type c-mos a transfert de charge, et capteur matriciel comprenant un ensemble de telles cellules |
| KR102191245B1 (ko) * | 2014-06-20 | 2020-12-15 | 삼성전자주식회사 | 이미지 센서 구동 방법, 이를 채용한 이미지 센서 및 이를 포함하는 휴대용 전자 기기 |
| US9967501B2 (en) | 2014-10-08 | 2018-05-08 | Panasonic Intellectual Property Management Co., Ltd. | Imaging device |
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| JPWO2017085848A1 (ja) * | 2015-11-19 | 2018-09-06 | オリンパス株式会社 | 固体撮像装置および撮像装置 |
| JP6782431B2 (ja) | 2016-01-22 | 2020-11-11 | パナソニックIpマネジメント株式会社 | 撮像装置 |
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| WO2018012316A1 (ja) * | 2016-07-15 | 2018-01-18 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像素子および固体撮像素子の動作方法、撮像装置、並びに電子機器 |
| CN107888807B (zh) * | 2016-09-29 | 2020-07-24 | 普里露尼库斯股份有限公司 | 固体摄像装置、固体摄像装置的驱动方法以及电子设备 |
| US10616519B2 (en) | 2016-12-20 | 2020-04-07 | Microsoft Technology Licensing, Llc | Global shutter pixel structures with shared transfer gates |
| US10389957B2 (en) | 2016-12-20 | 2019-08-20 | Microsoft Technology Licensing, Llc | Readout voltage uncertainty compensation in time-of-flight imaging pixels |
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| KR102012767B1 (ko) * | 2018-03-14 | 2019-08-21 | (주) 픽셀플러스 | 이미지 센서 |
| US10785425B2 (en) | 2018-09-28 | 2020-09-22 | Semiconductor Components Industries, Llc | Image sensor with selective pixel binning |
| JP7329963B2 (ja) * | 2019-05-17 | 2023-08-21 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像装置及び電子機器 |
| US11343454B2 (en) * | 2019-08-16 | 2022-05-24 | Semiconductor Components Industries, Llc | Imaging systems and methods for performing pixel binning and variable integration for analog domain regional feature extraction |
| KR102902358B1 (ko) | 2019-11-20 | 2025-12-22 | 기가조트 테크널러지 인코포레이티드 | 스케일러블 픽셀 크기 이미지센서 |
| TWI882059B (zh) * | 2020-01-29 | 2025-05-01 | 日商索尼半導體解決方案公司 | 攝像元件、攝像裝置及測距裝置 |
| JP7557172B2 (ja) * | 2020-03-06 | 2024-09-27 | Gpixel Japan株式会社 | 固体撮像装置用画素 |
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| US20240056699A1 (en) * | 2022-08-09 | 2024-02-15 | Sony Semiconductor Solutions Corporation | Imaging device and electronic apparatus |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10136264A (ja) * | 1996-10-30 | 1998-05-22 | Toshiba Corp | 固体撮像装置 |
| JP2002050752A (ja) * | 2000-08-01 | 2002-02-15 | Canon Inc | 光電変換装置およびこれを用いた撮像システム |
| KR20040064239A (ko) * | 2003-01-09 | 2004-07-16 | 다이얼로그 세미컨덕터 | 리셋 노이즈 억제 및 프로그램가능 비닝 능력을 갖춘aps 화소 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3031606B2 (ja) * | 1995-08-02 | 2000-04-10 | キヤノン株式会社 | 固体撮像装置と画像撮像装置 |
| EP1102323B1 (en) | 1999-11-19 | 2012-08-15 | CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement | Method for detecting electromagnetic radiation using an optoelectronic sensor |
| JP3715873B2 (ja) * | 2000-07-27 | 2005-11-16 | キヤノン株式会社 | 撮像装置、放射線撮像装置及びそれを用いた放射線撮像システム |
| US6759641B1 (en) * | 2000-09-27 | 2004-07-06 | Rockwell Scientific Licensing, Llc | Imager with adjustable resolution |
| US6914227B2 (en) * | 2001-06-25 | 2005-07-05 | Canon Kabushiki Kaisha | Image sensing apparatus capable of outputting image by converting resolution by adding and reading out a plurality of pixels, its control method, and image sensing system |
| JP4551588B2 (ja) * | 2001-07-03 | 2010-09-29 | キヤノン株式会社 | 撮像装置および撮像システム |
| JP3890207B2 (ja) * | 2001-06-25 | 2007-03-07 | キヤノン株式会社 | 撮像装置および撮像システム |
| JP4228947B2 (ja) * | 2003-05-20 | 2009-02-25 | 日産自動車株式会社 | 撮像装置 |
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| KR100680469B1 (ko) * | 2005-01-31 | 2007-02-08 | 매그나칩 반도체 유한회사 | 인접한 화소들 사이의 센싱노드들이 공유된 씨모스 이미지센서 |
| US7238926B2 (en) * | 2005-06-01 | 2007-07-03 | Eastman Kodak Company | Shared amplifier pixel with matched coupling capacitances |
-
2006
- 2006-04-21 US US11/408,640 patent/US7705900B2/en active Active
- 2006-05-26 WO PCT/US2006/020586 patent/WO2006130518A1/en not_active Ceased
- 2006-05-26 KR KR1020077027911A patent/KR101254360B1/ko active Active
- 2006-05-26 EP EP06760459.5A patent/EP1900191B1/en active Active
- 2006-05-26 JP JP2008514728A patent/JP5355079B2/ja active Active
- 2006-05-30 TW TW095119292A patent/TWI432022B/zh active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10136264A (ja) * | 1996-10-30 | 1998-05-22 | Toshiba Corp | 固体撮像装置 |
| JP2002050752A (ja) * | 2000-08-01 | 2002-02-15 | Canon Inc | 光電変換装置およびこれを用いた撮像システム |
| KR20040064239A (ko) * | 2003-01-09 | 2004-07-16 | 다이얼로그 세미컨덕터 | 리셋 노이즈 억제 및 프로그램가능 비닝 능력을 갖춘aps 화소 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20080011680A (ko) | 2008-02-05 |
| TWI432022B (zh) | 2014-03-21 |
| US20060274176A1 (en) | 2006-12-07 |
| EP1900191A1 (en) | 2008-03-19 |
| WO2006130518A1 (en) | 2006-12-07 |
| TW200704169A (en) | 2007-01-16 |
| US7705900B2 (en) | 2010-04-27 |
| JP5355079B2 (ja) | 2013-11-27 |
| JP2008546313A (ja) | 2008-12-18 |
| EP1900191B1 (en) | 2015-07-08 |
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