KR101050676B1 - 패턴화된 표면들을 갖는 ⅲ-족 질화물층들 - Google Patents

패턴화된 표면들을 갖는 ⅲ-족 질화물층들 Download PDF

Info

Publication number
KR101050676B1
KR101050676B1 KR1020040018820A KR20040018820A KR101050676B1 KR 101050676 B1 KR101050676 B1 KR 101050676B1 KR 1020040018820 A KR1020040018820 A KR 1020040018820A KR 20040018820 A KR20040018820 A KR 20040018820A KR 101050676 B1 KR101050676 B1 KR 101050676B1
Authority
KR
South Korea
Prior art keywords
layer
nitride
group iii
substrate
polar
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020040018820A
Other languages
English (en)
Korean (ko)
Other versions
KR20040084666A (ko
Inventor
초우드허리에레프
엔지호크민
슬러셔리챠트엘리어트
Original Assignee
알카텔-루센트 유에스에이 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 알카텔-루센트 유에스에이 인코포레이티드 filed Critical 알카텔-루센트 유에스에이 인코포레이티드
Publication of KR20040084666A publication Critical patent/KR20040084666A/ko
Application granted granted Critical
Publication of KR101050676B1 publication Critical patent/KR101050676B1/ko
Assigned to 크레디트 스위스 아게 reassignment 크레디트 스위스 아게 질권설정등록 Assignors: 알카텔-루센트 유에스에이 인코포레이티드
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • DTEXTILES; PAPER
    • D06TREATMENT OF TEXTILES OR THE LIKE; LAUNDERING; FLEXIBLE MATERIALS NOT OTHERWISE PROVIDED FOR
    • D06QDECORATING TEXTILES
    • D06Q1/00Decorating textiles
    • D06Q1/10Decorating textiles by treatment with, or fixation of, a particulate material, e.g. mica, glass beads
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B1/00Devices without movable or flexible elements, e.g. microcapillary devices
    • DTEXTILES; PAPER
    • D04BRAIDING; LACE-MAKING; KNITTING; TRIMMINGS; NON-WOVEN FABRICS
    • D04DTRIMMINGS; RIBBONS, TAPES OR BANDS, NOT OTHERWISE PROVIDED FOR
    • D04D9/00Ribbons, tapes, welts, bands, beadings, or other decorative or ornamental strips, not otherwise provided for
    • DTEXTILES; PAPER
    • D06TREATMENT OF TEXTILES OR THE LIKE; LAUNDERING; FLEXIBLE MATERIALS NOT OTHERWISE PROVIDED FOR
    • D06QDECORATING TEXTILES
    • D06Q1/00Decorating textiles
    • D06Q1/12Decorating textiles by transferring a chemical agent or a metallic or non-metallic material in particulate or other form, from a solid temporary carrier to the textile
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/122Basic optical elements, e.g. light-guiding paths
    • G02B6/1225Basic optical elements, e.g. light-guiding paths comprising photonic band-gap structures or photonic lattices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J1/00Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
    • H01J1/02Main electrodes
    • H01J1/30Cold cathodes, e.g. field-emissive cathode
    • H01J1/304Field-emissive cathodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J3/00Details of electron-optical or ion-optical arrangements common to two or more basic types of discharge tubes or lamps
    • H01J3/02Electron guns
    • H01J3/021Electron guns using a field emission, photo emission, or secondary emission electron source
    • H01J3/022Electron guns using a field emission, photo emission, or secondary emission electron source with microengineered cathode, e.g. Spindt-type
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/02Manufacture of electrodes or electrode systems
    • H01J9/022Manufacture of electrodes or electrode systems of cold cathodes
    • H01J9/025Manufacture of electrodes or electrode systems of cold cathodes of field emission cathodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • H10P50/60Wet etching
    • H10P50/64Wet etching of semiconductor materials
    • H10P50/642Chemical etching
    • H10P50/646Chemical etching of Group III-V materials
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B2006/12035Materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/27Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials
    • H10P14/271Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials characterised by the preparation of substrate for selective deposition
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3402Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3414Deposited materials, e.g. layers characterised by the chemical composition being group IIIA-VIA materials
    • H10P14/3416Nitrides

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Nanotechnology (AREA)
  • Textile Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Led Devices (AREA)
  • Cold Cathode And The Manufacture (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Weting (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
  • Recrystallisation Techniques (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
KR1020040018820A 2003-03-26 2004-03-19 패턴화된 표면들을 갖는 ⅲ-족 질화물층들 Expired - Fee Related KR101050676B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/397,799 US6986693B2 (en) 2003-03-26 2003-03-26 Group III-nitride layers with patterned surfaces
US10/397799 2003-03-26

Publications (2)

Publication Number Publication Date
KR20040084666A KR20040084666A (ko) 2004-10-06
KR101050676B1 true KR101050676B1 (ko) 2011-07-21

Family

ID=32869148

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020040018820A Expired - Fee Related KR101050676B1 (ko) 2003-03-26 2004-03-19 패턴화된 표면들을 갖는 ⅲ-족 질화물층들

Country Status (6)

Country Link
US (6) US6986693B2 (https=)
EP (3) EP3035372A1 (https=)
JP (2) JP4790226B2 (https=)
KR (1) KR101050676B1 (https=)
CN (2) CN100397559C (https=)
DE (1) DE602004006043T2 (https=)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100492482B1 (ko) * 2002-09-04 2005-06-03 한국과학기술연구원 Pembe로 제조된 상온 자성반도체 및 그 소자
US6986693B2 (en) * 2003-03-26 2006-01-17 Lucent Technologies Inc. Group III-nitride layers with patterned surfaces
US6960526B1 (en) * 2003-10-10 2005-11-01 The United States Of America As Represented By The Secretary Of The Army Method of fabricating sub-100 nanometer field emitter tips comprising group III-nitride semiconductors
US7276423B2 (en) * 2003-12-05 2007-10-02 International Rectifier Corporation III-nitride device and method with variable epitaxial growth direction
EP1741144A1 (de) * 2004-04-29 2007-01-10 Osram Opto Semiconductors GmbH Verfahren zum herstellen eines strahlungsemittierenden halbleiterchips
US20050244159A1 (en) * 2004-04-30 2005-11-03 Aref Chowdhury Optical wavelength-conversion
KR101041843B1 (ko) * 2005-07-30 2011-06-17 삼성엘이디 주식회사 질화물계 화합물 반도체 발광소자 및 그 제조방법
US7952109B2 (en) * 2006-07-10 2011-05-31 Alcatel-Lucent Usa Inc. Light-emitting crystal structures
EP2171748A1 (en) * 2007-07-26 2010-04-07 S.O.I.Tec Silicon on Insulator Technologies Epitaxial methods and templates grown by the methods
JP2009145440A (ja) * 2007-12-12 2009-07-02 Sumitomo Metal Mining Co Ltd 波長変換素子
WO2009141724A1 (en) * 2008-05-23 2009-11-26 S.O.I.Tec Silicon On Insulator Technologies Formation of substantially pit free indium gallium nitride
JP5132524B2 (ja) * 2008-11-04 2013-01-30 キヤノン株式会社 窒化ガリウム系化合物半導体層の移設方法、及び窒化ガリウム系化合物半導体層が接合された基板
US8507304B2 (en) * 2009-07-17 2013-08-13 Applied Materials, Inc. Method of forming a group III-nitride crystalline film on a patterned substrate by hydride vapor phase epitaxy (HVPE)
US20110027973A1 (en) * 2009-07-31 2011-02-03 Applied Materials, Inc. Method of forming led structures
US8148241B2 (en) * 2009-07-31 2012-04-03 Applied Materials, Inc. Indium surfactant assisted HVPE of high quality gallium nitride and gallium nitride alloy films
FR2995729B1 (fr) * 2012-09-18 2016-01-01 Aledia Dispositif opto-electrique a microfils ou nanofils semiconducteurs et son procede de fabrication
JP2015061010A (ja) * 2013-09-20 2015-03-30 豊田合成株式会社 Iii族窒化物半導体発光素子とその製造方法と実装体の製造方法
US10174205B2 (en) * 2015-10-19 2019-01-08 Xerox Corporation Printing process
CN105870006A (zh) * 2016-06-08 2016-08-17 江苏新广联半导体有限公司 GaN基材料的侧壁加工工艺
CN106531614A (zh) * 2016-09-29 2017-03-22 北京科技大学 一种在蓝宝石衬底上生长具有不同极性GaN结构的方法
JP6957982B2 (ja) 2017-05-29 2021-11-02 三菱電機株式会社 半導体装置及びその製造方法
US12604572B2 (en) * 2021-11-12 2026-04-14 Lumileds Singapore Pte. Ltd. Thin-film LED array with low refractive index patterned structures and reflector
US12490570B2 (en) 2021-11-12 2025-12-02 Lumileds Singapore Pte. Ltd. Thin-film LED array with low refractive index patterned structures

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10233385A (ja) 1997-02-20 1998-09-02 Sharp Corp 窒化物半導体のエッチング方法
US5915164A (en) * 1995-12-28 1999-06-22 U.S. Philips Corporation Methods of making high voltage GaN-A1N based semiconductor devices
JP2000149765A (ja) * 1998-11-13 2000-05-30 Ise Electronics Corp 蛍光表示装置
JP2001148349A (ja) * 1999-09-21 2001-05-29 Lucent Technol Inc 第iii族の窒化物をベースとする半導体に対する選択的成長プロセス

Family Cites Families (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4987377A (en) * 1988-03-22 1991-01-22 The United States Of America As Represented By The Secretary Of The Navy Field emitter array integrated distributed amplifiers
JPH0239131A (ja) * 1988-07-29 1990-02-08 Hitachi Ltd 周波数間隔安定化方法、光ヘテロダイン又は光ホモダイン通信方法
US5334908A (en) * 1990-07-18 1994-08-02 International Business Machines Corporation Structures and processes for fabricating field emission cathode tips using secondary cusp
DE69030589T2 (de) 1990-07-18 1997-11-13 Ibm Struktur und verfahren für feldemissionskathodenherstellung
US5141459A (en) * 1990-07-18 1992-08-25 International Business Machines Corporation Structures and processes for fabricating field emission cathodes
US5536193A (en) * 1991-11-07 1996-07-16 Microelectronics And Computer Technology Corporation Method of making wide band gap field emitter
US5218771A (en) * 1992-04-15 1993-06-15 Redford Peter M Orientation sensing apparatus
US5229331A (en) * 1992-02-14 1993-07-20 Micron Technology, Inc. Method to form self-aligned gate structures around cold cathode emitter tips using chemical mechanical polishing technology
JP3244529B2 (ja) * 1992-04-16 2002-01-07 アジレント・テクノロジーズ・インク 面発光型第2高調波生成素子
US5359256A (en) * 1992-07-30 1994-10-25 The United States Of America As Represented By The Secretary Of The Navy Regulatable field emitter device and method of production thereof
US5449435A (en) * 1992-11-02 1995-09-12 Motorola, Inc. Field emission device and method of making the same
US5345456A (en) * 1993-03-11 1994-09-06 National Research Council Of Canada Spatially addressable surface emission sum frequency device
US5363021A (en) * 1993-07-12 1994-11-08 Cornell Research Foundation, Inc. Massively parallel array cathode
US5814156A (en) * 1993-09-08 1998-09-29 Uvtech Systems Inc. Photoreactive surface cleaning
JP3579127B2 (ja) * 1994-05-18 2004-10-20 株式会社東芝 電界電子放出素子、この電界電子放出素子を用いた電子放出源および平面ディスプレイ装置、および電界電子放出素子の製造方法
US5440574A (en) * 1994-06-02 1995-08-08 Spectra-Physics Laserplane, Inc. Solid-state laser
US5450429A (en) * 1994-06-02 1995-09-12 Spectra-Physics Laserplane, Inc. Efficient linear frequency doubled solid-state laser
US5420876A (en) * 1994-06-02 1995-05-30 Spectra-Physics Laserplane, Inc. Gadolinium vanadate laser
US5479431A (en) * 1994-06-02 1995-12-26 Spectra-Physics Laserplane, Inc. Solid-state laser with active etalon and method therefor
JPH07335116A (ja) * 1994-06-14 1995-12-22 Toshiba Corp 電子放出素子
JPH0851248A (ja) 1994-08-09 1996-02-20 Hitachi Ltd 内部共振型面発光shgレーザ
DE19601991A1 (de) * 1995-01-31 1996-08-01 Zeiss Carl Fa Laser-Anordung und Verfahren zum Betrieb einer derartigen Laser-Anordnung
US5628659A (en) * 1995-04-24 1997-05-13 Microelectronics And Computer Corporation Method of making a field emission electron source with random micro-tip structures
JP2917898B2 (ja) * 1996-03-29 1999-07-12 日本電気株式会社 電界放出冷陰極素子およびその使用方法
US6218771B1 (en) * 1998-06-26 2001-04-17 University Of Houston Group III nitride field emitters
US6172325B1 (en) * 1999-02-10 2001-01-09 Electro Scientific Industries, Inc. Laser processing power output stabilization apparatus and method employing processing position feedback
US7161148B1 (en) 1999-05-31 2007-01-09 Crystals And Technologies, Ltd. Tip structures, devices on their basis, and methods for their preparation
JP3639867B2 (ja) * 2000-03-21 2005-04-20 日本電信電話株式会社 電子素子
JP3882539B2 (ja) * 2000-07-18 2007-02-21 ソニー株式会社 半導体発光素子およびその製造方法、並びに画像表示装置
JP3906653B2 (ja) * 2000-07-18 2007-04-18 ソニー株式会社 画像表示装置及びその製造方法
JP3542031B2 (ja) * 2000-11-20 2004-07-14 松下電器産業株式会社 冷陰極形成方法、及び電子放出素子並びにその応用デバイス
JP4724924B2 (ja) * 2001-02-08 2011-07-13 ソニー株式会社 表示装置の製造方法
JP2002270516A (ja) * 2001-03-07 2002-09-20 Nec Corp Iii族窒化物半導体の成長方法、iii族窒化物半導体膜およびそれを用いた半導体素子
JP2002341166A (ja) * 2001-05-16 2002-11-27 Fuji Photo Film Co Ltd 光導波路素子および半導体レーザ装置
US6448100B1 (en) * 2001-06-12 2002-09-10 Hewlett-Packard Compnay Method for fabricating self-aligned field emitter tips
US6579735B1 (en) * 2001-12-03 2003-06-17 Xerox Corporation Method for fabricating GaN field emitter arrays
US6781159B2 (en) * 2001-12-03 2004-08-24 Xerox Corporation Field emission display device
JP3912117B2 (ja) 2002-01-17 2007-05-09 ソニー株式会社 結晶成長方法、半導体発光素子及びその製造方法
JP2003218395A (ja) 2002-01-18 2003-07-31 Sony Corp 半導体発光素子、半導体レーザ素子及びこれを用いた発光装置
US7002182B2 (en) 2002-09-06 2006-02-21 Sony Corporation Semiconductor light emitting device integral type semiconductor light emitting unit image display unit and illuminating unit
WO2004025733A1 (en) 2002-09-16 2004-03-25 Hrl Laboratories, Llc Non-planar nitride-based semiconductor structure and metehod for fabricating the same
US7099073B2 (en) 2002-09-27 2006-08-29 Lucent Technologies Inc. Optical frequency-converters based on group III-nitrides
JP2004288799A (ja) 2003-03-20 2004-10-14 Sony Corp 半導体発光素子およびその製造方法、集積型半導体発光装置およびその製造方法、画像表示装置およびその製造方法ならびに照明装置およびその製造方法
US6986693B2 (en) 2003-03-26 2006-01-17 Lucent Technologies Inc. Group III-nitride layers with patterned surfaces
US7161188B2 (en) * 2004-06-28 2007-01-09 Matsushita Electric Industrial Co., Ltd. Semiconductor light emitting element, semiconductor light emitting device, and method for fabricating semiconductor light emitting element
US7952109B2 (en) * 2006-07-10 2011-05-31 Alcatel-Lucent Usa Inc. Light-emitting crystal structures

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5915164A (en) * 1995-12-28 1999-06-22 U.S. Philips Corporation Methods of making high voltage GaN-A1N based semiconductor devices
JPH10233385A (ja) 1997-02-20 1998-09-02 Sharp Corp 窒化物半導体のエッチング方法
JP2000149765A (ja) * 1998-11-13 2000-05-30 Ise Electronics Corp 蛍光表示装置
JP2001148349A (ja) * 1999-09-21 2001-05-29 Lucent Technol Inc 第iii族の窒化物をベースとする半導体に対する選択的成長プロセス

Also Published As

Publication number Publication date
CN1532890A (zh) 2004-09-29
CN101261936A (zh) 2008-09-10
JP5721545B2 (ja) 2015-05-20
EP1780748B1 (en) 2016-09-21
US20050269593A1 (en) 2005-12-08
EP1467404A3 (en) 2004-10-20
EP1780748A1 (en) 2007-05-02
KR20040084666A (ko) 2004-10-06
EP1467404A2 (en) 2004-10-13
US20090139957A1 (en) 2009-06-04
EP3035372A1 (en) 2016-06-22
US6986693B2 (en) 2006-01-17
CN101261936B (zh) 2010-10-13
JP2011233531A (ja) 2011-11-17
US7468578B2 (en) 2008-12-23
USRE47767E1 (en) 2019-12-17
US20060220525A1 (en) 2006-10-05
US8070966B2 (en) 2011-12-06
US20120028448A1 (en) 2012-02-02
US20040189173A1 (en) 2004-09-30
CN100397559C (zh) 2008-06-25
US8613860B2 (en) 2013-12-24
DE602004006043D1 (de) 2007-06-06
US7084563B2 (en) 2006-08-01
EP1467404B1 (en) 2007-04-25
JP2004297070A (ja) 2004-10-21
DE602004006043T2 (de) 2007-12-27
JP4790226B2 (ja) 2011-10-12

Similar Documents

Publication Publication Date Title
USRE47767E1 (en) Group III-nitride layers with patterned surfaces
RU2569638C2 (ru) Светоизлучающий диод с наноструктурированным слоем и способы изготовления и применения
US10069049B2 (en) Semiconductor light emitting element and method for manufacturing the same
KR20120068857A (ko) 반도체 발광 소자
JP5435523B1 (ja) 半導体発光素子及びその製造方法
US12155004B2 (en) Method of separating plurality of LED structures from wafer
TWI482308B (zh) 形成細微圖案之方法及製造使用該細微圖案的半導體發光裝置之方法
CN100454486C (zh) 减少半导体材料中的缺陷的方法及其产品
CN106981543B (zh) 采用铝硅共晶薄膜辅助干法刻蚀制备黑硅层的方法
CN117219710A (zh) 一种图形化复合衬底及其制备方法、led外延片
CA2552321C (en) Micro-field emitter device for flat panel display
KR100679739B1 (ko) 광결정 발광다이오드의 제조방법
CN117277058B (zh) 一种半导体激光器及其制备方法
CN119481957A (zh) 一种AlGaN基边发射激光器腔面的制备方法
CN121815830A (zh) 一种垂直结构led芯片及其制备方法
CN121769648A (zh) 一种基于混合腔结构的连续域束缚态激光器及其制备方法
KR20110096990A (ko) 반도체 소자의 패턴 형성방법
JPH06196811A (ja) 埋め込み型ヘテロ構造レーザの製造方法

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

A201 Request for examination
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

S20-X000 Security interest recorded

St.27 status event code: A-4-4-S10-S20-lic-X000

FPAY Annual fee payment

Payment date: 20140707

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

S22-X000 Recordation of security interest cancelled

St.27 status event code: A-4-4-S10-S22-lic-X000

FPAY Annual fee payment

Payment date: 20150703

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

FPAY Annual fee payment

Payment date: 20160705

Year of fee payment: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

FPAY Annual fee payment

Payment date: 20170707

Year of fee payment: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

FPAY Annual fee payment

Payment date: 20190617

Year of fee payment: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20220715

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20220715