KR101013172B1 - 도전성 접촉자 홀더 - Google Patents
도전성 접촉자 홀더 Download PDFInfo
- Publication number
- KR101013172B1 KR101013172B1 KR1020087028992A KR20087028992A KR101013172B1 KR 101013172 B1 KR101013172 B1 KR 101013172B1 KR 1020087028992 A KR1020087028992 A KR 1020087028992A KR 20087028992 A KR20087028992 A KR 20087028992A KR 101013172 B1 KR101013172 B1 KR 101013172B1
- Authority
- KR
- South Korea
- Prior art keywords
- conductive contact
- conductive
- holder
- block member
- insertion hole
- Prior art date
Links
- 238000003780 insertion Methods 0.000 claims abstract description 54
- 230000037431 insertion Effects 0.000 claims abstract description 54
- 239000011810 insulating material Substances 0.000 claims abstract description 8
- 239000004020 conductor Substances 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 6
- 239000000853 adhesive Substances 0.000 claims description 5
- 230000001070 adhesive effect Effects 0.000 claims description 5
- 238000007689 inspection Methods 0.000 abstract description 19
- 230000010354 integration Effects 0.000 abstract description 6
- 239000004065 semiconductor Substances 0.000 description 22
- 239000000758 substrate Substances 0.000 description 14
- 238000010586 diagram Methods 0.000 description 8
- 238000012986 modification Methods 0.000 description 6
- 230000004048 modification Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 238000012360 testing method Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- 229910001374 Invar Inorganic materials 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 230000010485 coping Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 229910000833 kovar Inorganic materials 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
Abstract
Description
Claims (7)
- 회로구조에 대하여 신호의 입출력을 행하는 신호용 도전성 접촉자와, 상기 회로구조에 대하여 어스전위의 공급을 행하는 어스용 도전성 접촉자를 수용하는 도전성 접촉자 홀더에 있어서,절연성재료에 의하여 형성되고 판 두께방향으로 적층된 2개의 홀더부재를 가지며, 상기 신호용 도전성 접촉자를 대략 전체 길이에 걸쳐 직접 삽입하는 제 1 삽입구멍을 가지는 절연성 홀더부재와,도전성재료에 의하여 형성되고, 상기 어스용 도전성 접촉자의 일부를 접촉 가능하게 삽입하는 제 2 삽입구멍을 가지고, 상기 2개의 홀더부재에 의하여 끼워 유지됨과 동시에, 체결부재 및 접착제 중 적어도 어느 한쪽에 의하여 상기 절연성 홀더부재에 조립되는 도전성 블럭부재와,도전성재료에 의하여 형성되고, 상기 도전성 블럭부재를 배치 가능한 중공부를 가지며, 상기 중공부에, 상기 절연성 홀더부재에 형성된 상기 제 1 삽입구멍의 적어도 일부와 상기 도전성 블럭부재를 배치한 도전성 중공 블럭부재를 구비한 것을 특징으로 하는 도전성 접촉자 홀더.
- 제 1항에 있어서,상기 도전성 블럭부재의 일부는, 상기 도전성 접촉자 홀더의 표면에 노출되어 있는 것을 특징으로 하는 도전성 접촉자 홀더.
- 제 1항 또는 제 2항에 있어서,상기 도전성 중공 블럭부재는, 상기 어스용 도전성 접촉자보다 전체 길이가 짧은 제 2 어스용 도전성 접촉자의 끝부를 삽입하는 오목부를 가지는 것을 특징으로 하는 도전성 접촉자 홀더.
- 제 3항에 있어서,상기 도전성 중공 블럭부재의 일부는, 상기 도전성 접촉자 홀더의 표면에 노출되어 있는 것을 특징으로 하는 도전성 접촉자 홀더.
- 제 3항에 있어서,상기 도전성 블럭부재는, 상기 제 2 어스용 도전성 접촉자의 끝부를 삽입하는 오목부를 가지는 것을 특징으로 하는 도전성 접촉자 홀더.
- 삭제
- 삭제
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006126515 | 2006-04-28 | ||
JPJP-P-2006-00126515 | 2006-04-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20090012249A KR20090012249A (ko) | 2009-02-02 |
KR101013172B1 true KR101013172B1 (ko) | 2011-02-10 |
Family
ID=38655500
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020087028992A KR101013172B1 (ko) | 2006-04-28 | 2007-04-25 | 도전성 접촉자 홀더 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7845955B2 (ko) |
EP (1) | EP2017629B1 (ko) |
JP (1) | JP5379474B2 (ko) |
KR (1) | KR101013172B1 (ko) |
CN (1) | CN101454676B (ko) |
TW (1) | TW200745559A (ko) |
WO (1) | WO2007125974A1 (ko) |
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EP2239587B1 (en) * | 2008-02-01 | 2017-12-27 | NHK Spring Co., Ltd. | Probe unit |
JP5374079B2 (ja) * | 2008-06-20 | 2013-12-25 | 東京エレクトロン株式会社 | 検査用接触構造体 |
TWI424617B (zh) * | 2009-11-20 | 2014-01-21 | Hon Hai Prec Ind Co Ltd | 電連接器 |
CN101710659B (zh) * | 2009-12-11 | 2011-07-27 | 安拓锐高新测试技术(苏州)有限公司 | 一种电抗可控芯片测试插座 |
TWM388122U (en) * | 2009-12-18 | 2010-09-01 | Hon Hai Prec Ind Co Ltd | Electrical connector |
JP5742235B2 (ja) * | 2011-01-18 | 2015-07-01 | 富士通株式会社 | 接続部品 |
US8491315B1 (en) * | 2011-11-29 | 2013-07-23 | Plastronics Socket Partners, Ltd. | Micro via adapter socket |
KR101679499B1 (ko) * | 2012-05-22 | 2016-11-24 | 니혼 하츠쵸 가부시키가이샤 | 소켓 설치 구조 및 스프링 부재 |
TWI514695B (zh) * | 2012-08-02 | 2015-12-21 | Hon Hai Prec Ind Co Ltd | 電連接器 |
WO2014123235A1 (ja) * | 2013-02-08 | 2014-08-14 | 日本発條株式会社 | プローブユニット用ベース部材、プローブホルダ、プローブユニット、プローブユニット用ベース部材の製造方法およびプローブユニット用積層構造体 |
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JP6706079B2 (ja) * | 2016-01-18 | 2020-06-03 | 新光電気工業株式会社 | プローブガイド板及びプローブ装置とそれらの製造方法 |
MY179228A (en) * | 2016-02-22 | 2020-11-02 | Jf Microtechnology Sdn Bhd | Kelvin contact assembly and method of installation thereof |
KR101882209B1 (ko) * | 2016-03-23 | 2018-07-27 | 리노공업주식회사 | 동축 테스트소켓 조립체 |
JP7021874B2 (ja) * | 2017-06-28 | 2022-02-17 | 株式会社ヨコオ | コンタクトプローブ及び検査治具 |
JP6663084B2 (ja) * | 2017-07-13 | 2020-03-11 | 日本発條株式会社 | プローブユニット |
CN109411937B (zh) * | 2017-08-14 | 2021-09-21 | 富顶精密组件(深圳)有限公司 | 电连接器及其制造方法 |
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JP7039259B2 (ja) * | 2017-11-16 | 2022-03-22 | 株式会社ヨコオ | プローブヘッド |
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JP2020030918A (ja) * | 2018-08-21 | 2020-02-27 | 東芝デバイス&ストレージ株式会社 | コネクタ及び積層基板モジュール |
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JP2005156530A (ja) * | 2003-11-05 | 2005-06-16 | Nhk Spring Co Ltd | 導電性接触子ホルダ、導電性接触子ユニット |
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- 2007-04-25 CN CN2007800154830A patent/CN101454676B/zh not_active Expired - Fee Related
- 2007-04-25 US US12/226,682 patent/US7845955B2/en active Active
- 2007-04-25 JP JP2008513247A patent/JP5379474B2/ja active Active
- 2007-04-25 KR KR1020087028992A patent/KR101013172B1/ko active IP Right Grant
- 2007-04-25 WO PCT/JP2007/058984 patent/WO2007125974A1/ja active Application Filing
- 2007-04-27 TW TW096114932A patent/TW200745559A/zh not_active IP Right Cessation
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JP2001116806A (ja) * | 1999-08-23 | 2001-04-27 | Agilent Technol Inc | インターフェイス |
JP2005156530A (ja) * | 2003-11-05 | 2005-06-16 | Nhk Spring Co Ltd | 導電性接触子ホルダ、導電性接触子ユニット |
Also Published As
Publication number | Publication date |
---|---|
JP5379474B2 (ja) | 2013-12-25 |
EP2017629A1 (en) | 2009-01-21 |
EP2017629B1 (en) | 2018-02-21 |
TWI346205B (ko) | 2011-08-01 |
TW200745559A (en) | 2007-12-16 |
JPWO2007125974A1 (ja) | 2009-09-10 |
US7845955B2 (en) | 2010-12-07 |
EP2017629A4 (en) | 2016-06-29 |
US20090311890A1 (en) | 2009-12-17 |
KR20090012249A (ko) | 2009-02-02 |
CN101454676A (zh) | 2009-06-10 |
WO2007125974A1 (ja) | 2007-11-08 |
CN101454676B (zh) | 2011-12-07 |
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