KR100863987B1 - 프로브 조립체 - Google Patents

프로브 조립체 Download PDF

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Publication number
KR100863987B1
KR100863987B1 KR1020070044361A KR20070044361A KR100863987B1 KR 100863987 B1 KR100863987 B1 KR 100863987B1 KR 1020070044361 A KR1020070044361 A KR 1020070044361A KR 20070044361 A KR20070044361 A KR 20070044361A KR 100863987 B1 KR100863987 B1 KR 100863987B1
Authority
KR
South Korea
Prior art keywords
probe
support
slit
bar
needle
Prior art date
Application number
KR1020070044361A
Other languages
English (en)
Korean (ko)
Other versions
KR20070108824A (ko
Inventor
토모아키 쿠가
타카오 야스다
하루타다 데와
쥬리 로꾸노헤
Original Assignee
가부시키가이샤 니혼 마이크로닉스
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 니혼 마이크로닉스 filed Critical 가부시키가이샤 니혼 마이크로닉스
Publication of KR20070108824A publication Critical patent/KR20070108824A/ko
Application granted granted Critical
Publication of KR100863987B1 publication Critical patent/KR100863987B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
KR1020070044361A 2006-05-08 2007-05-08 프로브 조립체 KR100863987B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006129333A JP4916763B2 (ja) 2006-05-08 2006-05-08 プローブ組立体
JPJP-P-2006-00129333 2006-05-08

Publications (2)

Publication Number Publication Date
KR20070108824A KR20070108824A (ko) 2007-11-13
KR100863987B1 true KR100863987B1 (ko) 2008-10-16

Family

ID=38837893

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020070044361A KR100863987B1 (ko) 2006-05-08 2007-05-08 프로브 조립체

Country Status (3)

Country Link
JP (1) JP4916763B2 (ja)
KR (1) KR100863987B1 (ja)
TW (1) TW200745567A (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5396104B2 (ja) * 2009-03-05 2014-01-22 株式会社日本マイクロニクス プローブ組立体
JP5690105B2 (ja) * 2009-11-26 2015-03-25 株式会社日本マイクロニクス プローブ装置
JP5588892B2 (ja) * 2010-12-03 2014-09-10 株式会社日本マイクロニクス プローブ組立体
KR102265960B1 (ko) * 2020-12-29 2021-06-17 주식회사 프로이천 프로브 블록
KR102477553B1 (ko) * 2021-01-22 2022-12-15 주식회사 디앤에스시스템 디스플레이 패널 검사용 프로브 핀 블록
KR102294168B1 (ko) * 2021-06-18 2021-08-25 이시훈 블레이드형 프로브 블록
CN116908500B (zh) * 2023-09-12 2023-12-01 上海泽丰半导体科技有限公司 一种通用测试平台探针塔的拆装方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10132853A (ja) 1996-10-28 1998-05-22 Micronics Japan Co Ltd プローブ組立体およびプローブ
KR100615907B1 (ko) 2005-12-12 2006-08-28 (주)엠씨티코리아 평판표시패널 검사용 프로브 장치

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000111574A (ja) * 1998-10-01 2000-04-21 Mitsubishi Electric Corp プローブカード
JP2004069485A (ja) * 2002-08-06 2004-03-04 Yamaha Corp プローブユニットおよびその製造方法、プローブカードおよびその製造方法
JP2006098278A (ja) * 2004-09-30 2006-04-13 Micronics Japan Co Ltd プローブ及びプローブ組立体

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10132853A (ja) 1996-10-28 1998-05-22 Micronics Japan Co Ltd プローブ組立体およびプローブ
KR100615907B1 (ko) 2005-12-12 2006-08-28 (주)엠씨티코리아 평판표시패널 검사용 프로브 장치

Also Published As

Publication number Publication date
JP4916763B2 (ja) 2012-04-18
TWI325963B (ja) 2010-06-11
JP2007303834A (ja) 2007-11-22
KR20070108824A (ko) 2007-11-13
TW200745567A (en) 2007-12-16

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