TW200745567A - Probe assembly - Google Patents

Probe assembly

Info

Publication number
TW200745567A
TW200745567A TW096112792A TW96112792A TW200745567A TW 200745567 A TW200745567 A TW 200745567A TW 096112792 A TW096112792 A TW 096112792A TW 96112792 A TW96112792 A TW 96112792A TW 200745567 A TW200745567 A TW 200745567A
Authority
TW
Taiwan
Prior art keywords
probe
support
slit
supported
bar
Prior art date
Application number
TW096112792A
Other languages
Chinese (zh)
Other versions
TWI325963B (en
Inventor
Tomoaki Kuga
Takao Yasuta
Harutada Dewa
Juri Rokunohe
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200745567A publication Critical patent/TW200745567A/en
Application granted granted Critical
Publication of TWI325963B publication Critical patent/TWI325963B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

To provide an electric connection device capable of surely preventing the flexural deformation of the supporting bar when the over drive force is activated to the probe supported by a support through the supporting bar. Each probe of the probe assembly is composed of platy members which are arranged in thickness direction under the support while keeping intervals. The probe is supported by a supporting bar made of electric insulation material which is supported by the support while passing through the plate thickness direction. The probe is made into a slit bar arranged on the front edge of the support and received in the slit groove opened to downward. The needle tip of the probe is arranged through each slit groove protrusively to downward. On the slit bar or the support a rigid fulcrum for restricting the deformation of probe by abutting to the probe before the probe is abutting the groove on the top surface of the slit groove.
TW096112792A 2006-05-08 2007-04-12 Probe assembly TW200745567A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006129333A JP4916763B2 (en) 2006-05-08 2006-05-08 Probe assembly

Publications (2)

Publication Number Publication Date
TW200745567A true TW200745567A (en) 2007-12-16
TWI325963B TWI325963B (en) 2010-06-11

Family

ID=38837893

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096112792A TW200745567A (en) 2006-05-08 2007-04-12 Probe assembly

Country Status (3)

Country Link
JP (1) JP4916763B2 (en)
KR (1) KR100863987B1 (en)
TW (1) TW200745567A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116908500A (en) * 2023-09-12 2023-10-20 上海泽丰半导体科技有限公司 Method for disassembling and assembling probe tower of universal test platform

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5396104B2 (en) * 2009-03-05 2014-01-22 株式会社日本マイクロニクス Probe assembly
JP5690105B2 (en) * 2009-11-26 2015-03-25 株式会社日本マイクロニクス Probe device
JP5588892B2 (en) * 2010-12-03 2014-09-10 株式会社日本マイクロニクス Probe assembly
KR102265960B1 (en) * 2020-12-29 2021-06-17 주식회사 프로이천 Probe block
KR102477553B1 (en) * 2021-01-22 2022-12-15 주식회사 디앤에스시스템 Probe pin block for display panel test
KR102294168B1 (en) * 2021-06-18 2021-08-25 이시훈 Blade type probe block

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3750831B2 (en) * 1996-10-28 2006-03-01 株式会社日本マイクロニクス Probe assembly
JP2000111574A (en) * 1998-10-01 2000-04-21 Mitsubishi Electric Corp Probe card
JP2004069485A (en) * 2002-08-06 2004-03-04 Yamaha Corp Probe unit, its manufacturing method, probe card, and its manufacturing method
JP2006098278A (en) * 2004-09-30 2006-04-13 Micronics Japan Co Ltd Probe and probe assembly
KR100615907B1 (en) 2005-12-12 2006-08-28 (주)엠씨티코리아 Probe unit for testing flat display panel

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116908500A (en) * 2023-09-12 2023-10-20 上海泽丰半导体科技有限公司 Method for disassembling and assembling probe tower of universal test platform
CN116908500B (en) * 2023-09-12 2023-12-01 上海泽丰半导体科技有限公司 Method for disassembling and assembling probe tower of universal test platform

Also Published As

Publication number Publication date
JP2007303834A (en) 2007-11-22
KR20070108824A (en) 2007-11-13
KR100863987B1 (en) 2008-10-16
JP4916763B2 (en) 2012-04-18
TWI325963B (en) 2010-06-11

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