JPWO2010007989A1 - 複合酸化物焼結体、複合酸化物焼結体の製造方法、スパッタリングターゲット及び薄膜の製造方法 - Google Patents
複合酸化物焼結体、複合酸化物焼結体の製造方法、スパッタリングターゲット及び薄膜の製造方法 Download PDFInfo
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- JPWO2010007989A1 JPWO2010007989A1 JP2010520870A JP2010520870A JPWO2010007989A1 JP WO2010007989 A1 JPWO2010007989 A1 JP WO2010007989A1 JP 2010520870 A JP2010520870 A JP 2010520870A JP 2010520870 A JP2010520870 A JP 2010520870A JP WO2010007989 A1 JPWO2010007989 A1 JP WO2010007989A1
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- sintered body
- powder
- composite oxide
- indium
- oxide sintered
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- 239000002131 composite material Substances 0.000 title claims abstract description 98
- 238000005477 sputtering target Methods 0.000 title claims description 32
- 238000004519 manufacturing process Methods 0.000 title claims description 28
- 239000010409 thin film Substances 0.000 title claims description 25
- 239000002245 particle Substances 0.000 claims abstract description 124
- 229910044991 metal oxide Inorganic materials 0.000 claims abstract description 91
- 150000004706 metal oxides Chemical class 0.000 claims abstract description 91
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims abstract description 87
- 229910052751 metal Inorganic materials 0.000 claims abstract description 48
- 239000002184 metal Substances 0.000 claims abstract description 46
- 229910003437 indium oxide Inorganic materials 0.000 claims abstract description 42
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims abstract description 34
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical group [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 24
- 239000011787 zinc oxide Substances 0.000 claims abstract description 24
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 23
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims abstract description 14
- 229910052733 gallium Inorganic materials 0.000 claims abstract description 14
- 229910052596 spinel Inorganic materials 0.000 claims abstract description 13
- 239000011029 spinel Substances 0.000 claims abstract description 13
- 239000000843 powder Substances 0.000 claims description 109
- 239000011812 mixed powder Substances 0.000 claims description 48
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 claims description 41
- 229910052738 indium Inorganic materials 0.000 claims description 33
- 238000002156 mixing Methods 0.000 claims description 33
- 239000011701 zinc Substances 0.000 claims description 24
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 16
- 229910052725 zinc Inorganic materials 0.000 claims description 16
- 238000000465 moulding Methods 0.000 claims description 12
- 238000010304 firing Methods 0.000 claims description 11
- 239000002002 slurry Substances 0.000 description 39
- 238000011156 evaluation Methods 0.000 description 38
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- 230000002159 abnormal effect Effects 0.000 description 24
- 239000010408 film Substances 0.000 description 22
- 238000000034 method Methods 0.000 description 19
- 239000000203 mixture Substances 0.000 description 18
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 16
- 238000009694 cold isostatic pressing Methods 0.000 description 13
- 239000012299 nitrogen atmosphere Substances 0.000 description 11
- 230000000052 comparative effect Effects 0.000 description 10
- 239000011324 bead Substances 0.000 description 9
- 238000002441 X-ray diffraction Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 239000002019 doping agent Substances 0.000 description 5
- 238000004453 electron probe microanalysis Methods 0.000 description 5
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- 239000012298 atmosphere Substances 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- 238000001035 drying Methods 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 238000001755 magnetron sputter deposition Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 239000007921 spray Substances 0.000 description 3
- 229910052718 tin Inorganic materials 0.000 description 3
- 229910052984 zinc sulfide Inorganic materials 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 239000012300 argon atmosphere Substances 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000010298 pulverizing process Methods 0.000 description 2
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- 239000000758 substrate Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
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- 230000000996 additive effect Effects 0.000 description 1
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- 230000002776 aggregation Effects 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
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- 229910052796 boron Inorganic materials 0.000 description 1
- 239000004566 building material Substances 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000002772 conduction electron Substances 0.000 description 1
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- 238000011161 development Methods 0.000 description 1
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 229910001195 gallium oxide Inorganic materials 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
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- 239000011261 inert gas Substances 0.000 description 1
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- 229910052719 titanium Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/453—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
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- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
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Abstract
Description
本実施形態に係る複合酸化物焼結体は、六方晶系層状構造を有し、酸化亜鉛及びインジウムを含む金属酸化物粒子(a)と、スピネル構造を有し、金属元素M(但し、Mはアルミニウム及び/又はガリウム)を含む金属酸化物粒子(b)と、を含む。そして、上記金属酸化物粒子(a)の長径の平均値は10μm以下であり、個数基準で上記金属酸化物粒子(a)の全体の20%以上はアスペクト比(長径/短径)が2以上である。このような構成を有する複合酸化物焼結体によれば、スパッタリング中の異常放電現象の発生を著しく低減することが可能なスパッタリングターゲットを得ることができる。そして、当該スパッタリングターゲットを用いて薄膜を成膜することで、パーティクルの発生が抑制され、生産性良く薄膜を得ることができる。
アスペクト比=長径/短径 (I)
In/(Zn+M+In)=0.001〜0.02 (II)
M/(Zn+M+In)=0.005〜0.05 (III)
In/(Zn+M+In)=0.001〜0.01 (IV)
M/(Zn+M+In)=0.005〜0.04 (V)
本実施形態に係る複合酸化物焼結体の製造方法は、酸化亜鉛粉末と酸化インジウム粉末とを予備混合して第1の混合粉末を得る第1の工程と、上記第1の混合粉末と金属元素M(但し、Mはアルミニウム及び/又はガリウム)を含む酸化物粉末とを混合して第2の混合粉末を得る第2の工程と、上記第2の混合粉末を成形して焼成し、複合酸化物焼結体を得る第3の工程と、を有しており、上記第1の工程では、第1の混合粉末のBET値が、混合前の上記酸化亜鉛粉末と上記酸化インジウム粉末のBET値の加重平均値よりも2m2/g以上大きくなるように混合することを特徴とする。このような製造方法によれば、上記複合酸化物焼結体を効率よく製造することができる。
In/(Zn+M+In)=0.001〜0.02 (VI)
M/(Zn+M+In)=0.005〜0.05 (VII)
本実施形態に係るスパッタリングターゲットは、上記複合酸化物焼結体からなり、例えば、上記複合酸化物焼結体を所定の形状に加工して製造することができる。このようなスパッタリングターゲットは、スパッタリング中の異常放電現象が抑制され、生産性よく金属酸化物の薄膜を製造することができる。
本実施形態に係る薄膜の製造方法は、上記複合酸化物焼結体をスパッタリングターゲットとして用いることを特徴とする。従来のスパッタリングターゲットを用いた場合には異常放電現象が多発し、生産性良く薄膜を得ることが困難であった。しかし、本実施形態の製造方法によれば、異常放電現象を十分に抑制することが可能となり、生産性良く薄膜を得ることができる。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、湿式ボールミルで予備混合して混合粉末を得た。この混合粉末のBET値は、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、2.0m2/g大きくなっていた。
BET値14m2/g、純度99.99%の酸化アルミニウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、表1に示した組成になるように乾式ボールミルで混合して混合粉末を得た。この混合粉末のBET値は、混合前の酸化アルミニウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、1.4m2/g大きくなっていた。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを湿式ボールミルで予備混合してスラリー1を調製した。このスラリー1の一部を乾燥し、BET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、2.3m2/g大きくなっていた。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、湿式ボールミルで予備混合してスラリー1を調製した。調製したスラリー1の一部を乾燥し、BET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、2.2m2/g大きくなっていた。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、湿式ビーズミルで予備混合してスラリー1を調製した。このスラリー1を乾燥して乾燥粉末1を得た。この乾燥粉末1のBET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、2.8m2/g大きくなっていた。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、乾式ボールミルで予備混合して混合粉末1を得た。この混合粉末1のBET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、2.0m2/g大きくなっていた。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、湿式ビーズミルで予備混合してスラリー1を得た。このスラリー1を乾燥して乾燥粉末1を得た。この乾燥粉末1のBET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、3.0m2/g大きくなっていた。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、乾式ボールミルで予備混合して混合粉末1を得た。この混合粉末1のBET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、2.1m2/g大きくなっていた。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、湿式ボールミルで予備混合してスラリー1を得た。このスラリー1の一部を乾燥し、BET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値と比較して、2.2m2/g大きくなっていた。
BET値14m2/g、純度99.99%の酸化アルミニウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを湿式ボールミルで混合してスラリーを得た。このスラリーを噴霧乾燥して乾燥粉末を得た。この乾燥粉末のBET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、2.3m2/g大きくなっていた。乾燥粉末の組成は表2に記載のとおりであった。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、乾式ボールミルで予備混合して混合粉末1を得た。この混合粉末1のBET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、1.0m2/g大きくなっていた。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、湿式ボールミルで予備混合してスラリー1を調製した。このスラリー1の一部を乾燥し、BET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、1.5m2/g大きくなっていた。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値4m2/g、純度99.8%の酸化亜鉛粉末とを、湿式ボールミルで予備混合してスラリー1を得た。スラリー1の一部を乾燥し、BET値を測定したところ、混合前の酸化インジウム粉末と酸化亜鉛粉末のBET値の加重平均値よりも、1.3m2/g大きくなっていた。
BET値10m2/g、純度99.99%の酸化インジウム粉末と、BET値3m2/g、純度99.8%の酸化亜鉛粉末と、BET値14m2/g、純度99.99%の酸化アルミニウム粉末とを、湿式ボールミルで混合してスラリーを調製した。スラリーを噴霧乾燥して乾燥粉末を得た。乾燥粉末のBET値を測定したところ、混合前の酸化インジウム粉末、酸化亜鉛粉末及び酸化アルミニウム粉末のBET値の加重平均値よりも、2.1m2/g大きくなっていた。この乾燥粉末の組成は表2に記載のとおりであった。
Claims (11)
- 六方晶系層状構造を有し、酸化亜鉛及びインジウムを含む金属酸化物粒子(a)と、
スピネル構造を有し、金属元素M(但し、Mはアルミニウム及び/又はガリウム)を含む金属酸化物粒子(b)と、を含んでおり、
前記金属酸化物粒子(a)の長径の平均値は10μm以下であり、
個数基準で前記金属酸化物粒子(a)の全体の20%以上はアスペクト比(長径/短径)が2以上である、複合酸化物焼結体。 - 前記金属酸化物粒子(b)の最大粒径は10μm以下である、請求項1に記載の複合酸化物焼結体。
- 亜鉛、インジウム及び前記金属元素Mの合計に対するインジウムの原子比が0.001〜0.02であり、
前記合計に対する前記金属元素Mの原子比が0.005〜0.05である、請求項1又は2に記載の複合酸化物焼結体。 - 前記金属酸化物粒子(b)はZnM2O4を主成分として含有する、請求項1〜3のいずれか一項に記載の複合酸化物焼結体。
- 前記金属元素Mはアルミニウムである、請求項1〜4のいずれか一項に記載の複合酸化物焼結体。
- 酸化亜鉛粉末と酸化インジウム粉末とを混合して第1の混合粉末を得る第1の工程と、
前記第1の混合粉末と金属元素M(但し、Mはアルミニウム及び/又はガリウム)を含む酸化物粉末とを混合して第2の混合粉末を得る第2の工程と、
前記第2の混合粉末を成形して焼成し、複合酸化物焼結体を得る第3の工程と、を有しており、
前記第1の工程では、第1の混合粉末のBET値が、混合前の前記酸化亜鉛粉末と前記酸化インジウム粉末のBET値の加重平均値よりも2m2/g以上大きくなるように前記酸化亜鉛粉末と前記酸化インジウム粉末とを混合する、複合酸化物焼結体の製造方法。 - 前記第3の工程で得られる前記複合酸化物焼結体は、
六方晶系層状構造を有し、酸化亜鉛及びインジウムを含む金属酸化物粒子(a)と、
スピネル構造を有し、金属元素M(但し、Mはアルミニウム及び/又はガリウム)を含む金属酸化物粒子(b)と、を含んでおり、
前記金属酸化物粒子(a)の長径の平均値は10μm以下であり、
個数基準で前記金属酸化物粒子(a)の全体の20%以上はアスペクト比(長径/短径)が2以上である、請求項6に記載の複合酸化物焼結体の製造方法。 - 前記第2の混合粉末において、亜鉛、インジウム及び前記金属元素Mの合計に対するインジウムの原子比が0.001〜0.02であり、前記合計に対する前記金属元素Mの原子比が0.005〜0.05である、請求項6又は7に記載の複合酸化物焼結体の製造方法。
- 前記金属元素Mはアルミニウムである、請求項6〜8のいずれか一項に記載の複合酸化物焼結体の製造方法。
- 請求項1〜5のいずれか一項に記載の複合酸化物焼結体からなる、スパッタリングターゲット。
- 請求項10記載のスパッタリングターゲットを用いる薄膜の製造方法。
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JP4948634B2 (ja) | 2010-09-01 | 2012-06-06 | Jx日鉱日石金属株式会社 | インジウムターゲット及びその製造方法 |
JP5935315B2 (ja) | 2010-12-20 | 2016-06-15 | 東ソー株式会社 | 窒化ガリウム焼結体または窒化ガリウム成形体ならびにそれらの製造方法 |
JP5140169B2 (ja) * | 2011-03-01 | 2013-02-06 | Jx日鉱日石金属株式会社 | インジウムターゲット及びその製造方法 |
KR20140027241A (ko) * | 2011-05-10 | 2014-03-06 | 이데미쓰 고산 가부시키가이샤 | In₂O₃-ZnO계 스퍼터링 타겟 |
CN103608310B (zh) * | 2011-06-15 | 2016-02-03 | 住友电气工业株式会社 | 导电性氧化物及其制造方法以及氧化物半导体膜 |
JP5074628B1 (ja) | 2012-01-05 | 2012-11-14 | Jx日鉱日石金属株式会社 | インジウム製スパッタリングターゲット及びその製造方法 |
KR102142845B1 (ko) * | 2012-05-31 | 2020-08-10 | 이데미쓰 고산 가부시키가이샤 | 스퍼터링 타겟 |
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US20160056409A1 (en) * | 2013-03-28 | 2016-02-25 | National Institute For Materials Science | Organic el element and method for manufacturing same |
JP5855319B2 (ja) | 2013-07-08 | 2016-02-09 | Jx日鉱日石金属株式会社 | スパッタリングターゲット及び、それの製造方法 |
JP6602550B2 (ja) * | 2014-04-28 | 2019-11-06 | 株式会社アライドマテリアル | スパッタリングターゲット用材料 |
CN108947518A (zh) * | 2018-08-14 | 2018-12-07 | 宁波森利电子材料有限公司 | 多元掺杂的ZnO镀膜材料及其制备方法和应用 |
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TWI433823B (zh) | 2014-04-11 |
US8569192B2 (en) | 2013-10-29 |
EP2301904A1 (en) | 2011-03-30 |
CN102089257A (zh) | 2011-06-08 |
KR101590429B1 (ko) | 2016-02-01 |
JP5625907B2 (ja) | 2014-11-19 |
EP2301904B1 (en) | 2012-11-07 |
KR20110039449A (ko) | 2011-04-18 |
EP2301904A4 (en) | 2011-10-05 |
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