JPS5251871A - Projecting method for charge particle beams - Google Patents

Projecting method for charge particle beams

Info

Publication number
JPS5251871A
JPS5251871A JP50127833A JP12783375A JPS5251871A JP S5251871 A JPS5251871 A JP S5251871A JP 50127833 A JP50127833 A JP 50127833A JP 12783375 A JP12783375 A JP 12783375A JP S5251871 A JPS5251871 A JP S5251871A
Authority
JP
Japan
Prior art keywords
particle beams
projecting method
charge particle
beams
charge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50127833A
Other languages
English (en)
Other versions
JPS5320391B2 (ja
Inventor
Hidekazu Goto
Takashi Soma
Masanori Idesawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIKEN Institute of Physical and Chemical Research
Original Assignee
RIKEN Institute of Physical and Chemical Research
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIKEN Institute of Physical and Chemical Research filed Critical RIKEN Institute of Physical and Chemical Research
Priority to JP50127833A priority Critical patent/JPS5251871A/ja
Priority to FR7630468A priority patent/FR2329069A1/fr
Priority to US05/732,919 priority patent/US4112305A/en
Priority to GB43205/76A priority patent/GB1567187A/en
Priority to DE19762647855 priority patent/DE2647855A1/de
Publication of JPS5251871A publication Critical patent/JPS5251871A/ja
Publication of JPS5320391B2 publication Critical patent/JPS5320391B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002—Details
    • H01J37/3007—Electron or ion-optical systems

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
JP50127833A 1975-10-23 1975-10-23 Projecting method for charge particle beams Granted JPS5251871A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP50127833A JPS5251871A (en) 1975-10-23 1975-10-23 Projecting method for charge particle beams
FR7630468A FR2329069A1 (fr) 1975-10-23 1976-10-11 Procede de projection d'un faisceau de particules chargees
US05/732,919 US4112305A (en) 1975-10-23 1976-10-15 Method of projecting a beam of charged particles
GB43205/76A GB1567187A (en) 1975-10-23 1976-10-18 Particle projection method and apparatus
DE19762647855 DE2647855A1 (de) 1975-10-23 1976-10-22 Verfahren zum projizieren eines buendels aus geladenen partikeln

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50127833A JPS5251871A (en) 1975-10-23 1975-10-23 Projecting method for charge particle beams

Publications (2)

Publication Number Publication Date
JPS5251871A true JPS5251871A (en) 1977-04-26
JPS5320391B2 JPS5320391B2 (ja) 1978-06-26

Family

ID=14969779

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50127833A Granted JPS5251871A (en) 1975-10-23 1975-10-23 Projecting method for charge particle beams

Country Status (5)

Country Link
US (1) US4112305A (ja)
JP (1) JPS5251871A (ja)
DE (1) DE2647855A1 (ja)
FR (1) FR2329069A1 (ja)
GB (1) GB1567187A (ja)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5316578A (en) * 1976-07-30 1978-02-15 Toshiba Corp Electron beam exposure apparatus
JPS5316577A (en) * 1976-07-30 1978-02-15 Toshiba Corp Electron beam exposure apparatus
JPS543476A (en) * 1977-06-09 1979-01-11 Jeol Ltd Electron beam exposure device
JPS5410678A (en) * 1977-06-24 1979-01-26 Zeiss Jena Veb Carl Nonnthermal electron beam processor
JPS5435680A (en) * 1977-08-25 1979-03-15 Cho Lsi Gijutsu Kenkyu Kumiai Device for exposing electron beam
JPS5461879A (en) * 1977-10-27 1979-05-18 Fujitsu Ltd Electron beam exposure apparatus
JPS54108580A (en) * 1978-02-13 1979-08-25 Jeol Ltd Electron-beam exposure device
JPS5515212A (en) * 1978-07-20 1980-02-02 Nippon Telegr & Teleph Corp <Ntt> Electronic beam exposure apparatus
JPS5591125A (en) * 1978-12-28 1980-07-10 Agency Of Ind Science & Technol Pattern formation method and apparatus using charged particle beam

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52151568A (en) * 1976-06-11 1977-12-16 Jeol Ltd Electron beam exposure apparatus
CA1166766A (en) * 1977-02-23 1984-05-01 Hans C. Pfeiffer Method and apparatus for forming a variable size electron beam
US4182958A (en) * 1977-05-31 1980-01-08 Rikagaku Kenkyusho Method and apparatus for projecting a beam of electrically charged particles
GB1598219A (en) * 1977-08-10 1981-09-16 Ibm Electron beam system
US4263514A (en) * 1979-09-13 1981-04-21 Hughes Aircraft Company Electron beam system
US4282437A (en) * 1979-12-17 1981-08-04 Bell Telephone Laboratories, Incorporated Charged particle beam lithography
GB2076589B (en) * 1980-05-19 1985-03-06 Hughes Aircraft Co Electron-beam shaping apparatus
US4376249A (en) * 1980-11-06 1983-03-08 International Business Machines Corporation Variable axis electron beam projection system
US4445041A (en) * 1981-06-02 1984-04-24 Hewlett-Packard Company Electron beam blanker
US4469950A (en) * 1982-03-04 1984-09-04 Varian Associates, Inc. Charged particle beam exposure system utilizing variable line scan
JPS6251218A (ja) * 1985-08-30 1987-03-05 Hitachi Ltd 電子線描画装置
US5828730A (en) * 1995-01-19 1998-10-27 Sten-Tel, Inc. Method and apparatus for recording and managing communications for transcription

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2988660A (en) * 1958-07-02 1961-06-13 Gen Dynamics Corp Electro optical system in a cathode ray tube
US3020441A (en) * 1957-10-09 1962-02-06 Gen Dynamics Corp Character beam-shaped tube
US3638231A (en) * 1968-05-27 1972-01-25 Tno Device for recording with electron rays
JPS5283177A (en) * 1975-12-31 1977-07-11 Fujitsu Ltd Electron beam exposure device
JPS52103967A (en) * 1976-02-05 1977-08-31 Western Electric Co Method of iluminating surface of material to be machined and apparatus therefor

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3644700A (en) * 1969-12-15 1972-02-22 Ibm Method and apparatus for controlling an electron beam
US3922546A (en) * 1972-04-14 1975-11-25 Radiant Energy Systems Electron beam pattern generator
US3936693A (en) * 1972-10-02 1976-02-03 General Electric Company Two-aperture immersion lens

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3020441A (en) * 1957-10-09 1962-02-06 Gen Dynamics Corp Character beam-shaped tube
US2988660A (en) * 1958-07-02 1961-06-13 Gen Dynamics Corp Electro optical system in a cathode ray tube
US3638231A (en) * 1968-05-27 1972-01-25 Tno Device for recording with electron rays
JPS5283177A (en) * 1975-12-31 1977-07-11 Fujitsu Ltd Electron beam exposure device
JPS52103967A (en) * 1976-02-05 1977-08-31 Western Electric Co Method of iluminating surface of material to be machined and apparatus therefor

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5316577A (en) * 1976-07-30 1978-02-15 Toshiba Corp Electron beam exposure apparatus
JPS54374B2 (ja) * 1976-07-30 1979-01-10
JPS5316578A (en) * 1976-07-30 1978-02-15 Toshiba Corp Electron beam exposure apparatus
JPS5415665B2 (ja) * 1977-06-09 1979-06-16
JPS543476A (en) * 1977-06-09 1979-01-11 Jeol Ltd Electron beam exposure device
JPS5410678A (en) * 1977-06-24 1979-01-26 Zeiss Jena Veb Carl Nonnthermal electron beam processor
JPS5428270B2 (ja) * 1977-08-25 1979-09-14
JPS5435680A (en) * 1977-08-25 1979-03-15 Cho Lsi Gijutsu Kenkyu Kumiai Device for exposing electron beam
JPS5461879A (en) * 1977-10-27 1979-05-18 Fujitsu Ltd Electron beam exposure apparatus
JPS5647694B2 (ja) * 1977-10-27 1981-11-11
JPS54108580A (en) * 1978-02-13 1979-08-25 Jeol Ltd Electron-beam exposure device
JPS6231488B2 (ja) * 1978-02-13 1987-07-08 Nippon Denshi Kk
JPS5515212A (en) * 1978-07-20 1980-02-02 Nippon Telegr & Teleph Corp <Ntt> Electronic beam exposure apparatus
JPS5591125A (en) * 1978-12-28 1980-07-10 Agency Of Ind Science & Technol Pattern formation method and apparatus using charged particle beam
JPS5759657B2 (ja) * 1978-12-28 1982-12-15 Kogyo Gijutsu Incho

Also Published As

Publication number Publication date
JPS5320391B2 (ja) 1978-06-26
DE2647855C2 (ja) 1987-01-29
DE2647855A1 (de) 1977-05-05
US4112305A (en) 1978-09-05
FR2329069A1 (fr) 1977-05-20
FR2329069B1 (ja) 1980-05-23
GB1567187A (en) 1980-05-14

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