JPH11335195A5 - - Google Patents
Info
- Publication number
- JPH11335195A5 JPH11335195A5 JP1999063143A JP6314399A JPH11335195A5 JP H11335195 A5 JPH11335195 A5 JP H11335195A5 JP 1999063143 A JP1999063143 A JP 1999063143A JP 6314399 A JP6314399 A JP 6314399A JP H11335195 A5 JPH11335195 A5 JP H11335195A5
- Authority
- JP
- Japan
- Prior art keywords
- compound semiconductor
- semiconductor crystal
- producing
- crystal according
- carbon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6314399A JP3596337B2 (ja) | 1998-03-25 | 1999-03-10 | 化合物半導体結晶の製造方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7730998 | 1998-03-25 | ||
| JP10-77309 | 1998-03-25 | ||
| JP6314399A JP3596337B2 (ja) | 1998-03-25 | 1999-03-10 | 化合物半導体結晶の製造方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004177249A Division JP4096919B2 (ja) | 1998-03-25 | 2004-06-15 | 化合物半導体結晶の製造方法および化合物半導体結晶 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH11335195A JPH11335195A (ja) | 1999-12-07 |
| JPH11335195A5 true JPH11335195A5 (enExample) | 2004-07-29 |
| JP3596337B2 JP3596337B2 (ja) | 2004-12-02 |
Family
ID=13630320
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6314399A Expired - Lifetime JP3596337B2 (ja) | 1998-03-25 | 1999-03-10 | 化合物半導体結晶の製造方法 |
| JP2004177249A Expired - Lifetime JP4096919B2 (ja) | 1998-03-25 | 2004-06-15 | 化合物半導体結晶の製造方法および化合物半導体結晶 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004177249A Expired - Lifetime JP4096919B2 (ja) | 1998-03-25 | 2004-06-15 | 化合物半導体結晶の製造方法および化合物半導体結晶 |
Country Status (4)
| Country | Link |
|---|---|
| US (4) | US6273947B1 (enExample) |
| EP (2) | EP1428912B1 (enExample) |
| JP (2) | JP3596337B2 (enExample) |
| DE (1) | DE69914820T2 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3596337B2 (ja) * | 1998-03-25 | 2004-12-02 | 住友電気工業株式会社 | 化合物半導体結晶の製造方法 |
| EP1456866B1 (en) * | 2001-07-05 | 2012-06-13 | Axt, Inc. | Apparatus for growing semiconductor crystals with a rigid support with carbon doping and resistivity control and thermal gradient control |
| JP5186733B2 (ja) * | 2005-07-29 | 2013-04-24 | 住友電気工業株式会社 | AlN結晶の成長方法 |
| US20080264332A1 (en) * | 2007-04-25 | 2008-10-30 | Fareed Sepehry-Fard | Method, system, and apparatus for doping and for multi-chamber high-throughput solid-phase epitaxy deposition process |
| US7566641B2 (en) * | 2007-05-09 | 2009-07-28 | Axt, Inc. | Low etch pit density (EPD) semi-insulating GaAs wafers |
| US8361225B2 (en) | 2007-05-09 | 2013-01-29 | Axt, Inc. | Low etch pit density (EPD) semi-insulating III-V wafers |
| TW200938664A (en) * | 2007-12-19 | 2009-09-16 | Schott Ag | Method for producing a monocrystalline or polycrystalline semiconductor material |
| JP5110026B2 (ja) * | 2009-04-03 | 2012-12-26 | 住友電気工業株式会社 | Iii−v族化合物半導体結晶の製造方法 |
| JP6411952B2 (ja) | 2015-06-09 | 2018-10-24 | 信越化学工業株式会社 | 熱分解窒化ほう素容器の製造方法 |
Family Cites Families (42)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4083748A (en) | 1975-10-30 | 1978-04-11 | Western Electric Company, Inc. | Method of forming and growing a single crystal of a semiconductor compound |
| US4404172A (en) | 1981-01-05 | 1983-09-13 | Western Electric Company, Inc. | Method and apparatus for forming and growing a single crystal of a semiconductor compound |
| US4521272A (en) | 1981-01-05 | 1985-06-04 | At&T Technologies, Inc. | Method for forming and growing a single crystal of a semiconductor compound |
| JPS5914440B2 (ja) | 1981-09-18 | 1984-04-04 | 住友電気工業株式会社 | CaAs単結晶への硼素のド−ピング方法 |
| JPS5954699A (ja) | 1982-09-22 | 1984-03-29 | Toshiba Corp | 単結晶の製造方法 |
| JP2529934B2 (ja) | 1984-02-21 | 1996-09-04 | 住友電気工業株式会社 | 単結晶の製造方法 |
| US5256381A (en) | 1984-02-21 | 1993-10-26 | Sumitomo Electric Industries, Ltd. | Apparatus for growing single crystals of III-V compound semiconductors |
| JPS60210599A (ja) * | 1984-04-03 | 1985-10-23 | Nec Corp | 半絶縁性GaAs結晶の成長方法 |
| JPS60264390A (ja) | 1984-06-08 | 1985-12-27 | Sumitomo Electric Ind Ltd | 単結晶の育成方法 |
| JPS6437833A (en) * | 1987-08-03 | 1989-02-08 | Nippon Mining Co | Semi-insulating gaas single crystal |
| JPS6437833U (enExample) | 1987-09-01 | 1989-03-07 | ||
| JPS6479087A (en) | 1987-09-21 | 1989-03-24 | Hitachi Cable | Gallium arsenide single crystal having low dislocation density and its production |
| JPH01239089A (ja) | 1987-11-30 | 1989-09-25 | Toshiba Corp | 化合物半導体単結晶の製造方法及び製造装置 |
| JPH0234597A (ja) * | 1988-07-26 | 1990-02-05 | Sumitomo Electric Ind Ltd | 水平ブリッジマン法によるGaAs単結晶の成長方法 |
| JPH0772120B2 (ja) | 1988-08-05 | 1995-08-02 | 日立電線株式会社 | Crドープ半絶縁性砒化ガリウム結晶の製造方法 |
| JPH08758B2 (ja) | 1988-09-08 | 1996-01-10 | 日立電線株式会社 | クロムドープ半絶縁性ガリウム・ヒ素単結晶の製造方法 |
| US4923561A (en) | 1988-09-23 | 1990-05-08 | American Telephone And Telegraph Company | Crystal growth method |
| US5057287A (en) * | 1988-11-01 | 1991-10-15 | Sfa, Inc. | Liquid encapsulated zone melting crystal growth method and apparatus |
| JP3122097B2 (ja) | 1988-12-20 | 2001-01-09 | 富士通株式会社 | 文書読み上げ制御装置および文書読み上げ方法 |
| US4946544A (en) | 1989-02-27 | 1990-08-07 | At&T Bell Laboratories | Crystal growth method |
| US5186784A (en) | 1989-06-20 | 1993-02-16 | Texas Instruments Incorporated | Process for improved doping of semiconductor crystals |
| US5259916A (en) | 1989-06-20 | 1993-11-09 | Texas Instruments Incorporated | Process for improved doping of semiconductor crystals |
| US4999082A (en) | 1989-09-14 | 1991-03-12 | Akzo America Inc. | Process for producing monocrystalline group II-IV or group III-V compounds and products thereof |
| US5131975A (en) | 1990-07-10 | 1992-07-21 | The Regents Of The University Of California | Controlled growth of semiconductor crystals |
| JPH04104989A (ja) | 1990-08-25 | 1992-04-07 | Sumitomo Electric Ind Ltd | 液相エピタキシャル成長方法および装置 |
| US5342475A (en) | 1991-06-07 | 1994-08-30 | The Furukawa Electric Co., Ltd. | Method of growing single crystal of compound semiconductor |
| EP0529963B1 (en) | 1991-08-22 | 2000-04-26 | Raytheon Company | Crystal growth process for large area GaAs and infrared window/dome made therefrom |
| JPH0570288A (ja) | 1991-09-09 | 1993-03-23 | Toshiba Corp | 化合物半導体単結晶の製造方法及び製造装置 |
| JPH05139886A (ja) | 1991-11-21 | 1993-06-08 | Toshiba Corp | 砒素化合物単結晶の製造方法 |
| JP2781097B2 (ja) | 1992-01-30 | 1998-07-30 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| JPH06128096A (ja) | 1992-10-20 | 1994-05-10 | Furukawa Electric Co Ltd:The | 化合物半導体多結晶の製造方法 |
| JPH06239691A (ja) | 1993-02-12 | 1994-08-30 | Japan Energy Corp | 単結晶の成長方法 |
| JP3015656B2 (ja) * | 1994-03-23 | 2000-03-06 | 株式会社東芝 | 半絶縁性GaAs単結晶の製造方法および製造装置 |
| DE19580737C2 (de) * | 1994-06-02 | 2002-02-21 | Kobe Steel Ltd | Verfahren und Vorrichtung zur Herstellung von Verbindungs-Einkristallen |
| JPH0930887A (ja) | 1995-07-17 | 1997-02-04 | Hitachi Cable Ltd | 炭素添加GaAs結晶の製造方法 |
| JP3201305B2 (ja) * | 1996-04-26 | 2001-08-20 | 住友電気工業株式会社 | Iii−v族化合物半導体結晶の製造方法 |
| JPH09309791A (ja) * | 1996-05-22 | 1997-12-02 | Komatsu Electron Metals Co Ltd | 半導体単結晶の製造方法 |
| JP4120016B2 (ja) | 1996-12-12 | 2008-07-16 | 住友電気工業株式会社 | 半絶縁性GaAs単結晶の製造方法 |
| JP3969865B2 (ja) | 1997-10-24 | 2007-09-05 | キヤノン株式会社 | フッ化物結晶の製造方法 |
| JPH11147785A (ja) | 1997-11-11 | 1999-06-02 | Hitachi Cable Ltd | 単結晶の製造方法 |
| JP4135239B2 (ja) * | 1997-12-26 | 2008-08-20 | 住友電気工業株式会社 | 半導体結晶およびその製造方法ならびに製造装置 |
| JP3596337B2 (ja) * | 1998-03-25 | 2004-12-02 | 住友電気工業株式会社 | 化合物半導体結晶の製造方法 |
-
1999
- 1999-03-10 JP JP6314399A patent/JP3596337B2/ja not_active Expired - Lifetime
- 1999-03-22 US US09/274,286 patent/US6273947B1/en not_active Expired - Lifetime
- 1999-03-23 EP EP04003550.3A patent/EP1428912B1/en not_active Expired - Lifetime
- 1999-03-23 DE DE69914820T patent/DE69914820T2/de not_active Expired - Lifetime
- 1999-03-23 EP EP99105861A patent/EP0947609B1/en not_active Expired - Lifetime
-
2001
- 2001-01-19 US US09/765,557 patent/US6485563B2/en not_active Ceased
-
2003
- 2003-08-13 US US10/640,430 patent/USRE40662E1/en not_active Expired - Lifetime
-
2004
- 2004-06-15 JP JP2004177249A patent/JP4096919B2/ja not_active Expired - Lifetime
-
2008
- 2008-12-22 US US12/341,876 patent/USRE42279E1/en not_active Expired - Lifetime
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