JPH10104174A5 - - Google Patents

Info

Publication number
JPH10104174A5
JPH10104174A5 JP1997241418A JP24141897A JPH10104174A5 JP H10104174 A5 JPH10104174 A5 JP H10104174A5 JP 1997241418 A JP1997241418 A JP 1997241418A JP 24141897 A JP24141897 A JP 24141897A JP H10104174 A5 JPH10104174 A5 JP H10104174A5
Authority
JP
Japan
Prior art keywords
image
electrical connection
test object
level
transmission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP1997241418A
Other languages
English (en)
Japanese (ja)
Other versions
JPH10104174A (ja
Filing date
Publication date
Priority claimed from US08/713,379 external-priority patent/US5687209A/en
Application filed filed Critical
Publication of JPH10104174A publication Critical patent/JPH10104174A/ja
Publication of JPH10104174A5 publication Critical patent/JPH10104174A5/ja
Ceased legal-status Critical Current

Links

JP9241418A 1996-09-13 1997-09-05 電気接続検査装置 Ceased JPH10104174A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/713,379 US5687209A (en) 1995-04-11 1996-09-13 Automatic warp compensation for laminographic circuit board inspection
US713-379 1996-09-13

Publications (2)

Publication Number Publication Date
JPH10104174A JPH10104174A (ja) 1998-04-24
JPH10104174A5 true JPH10104174A5 (OSRAM) 2005-06-09

Family

ID=24865904

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9241418A Ceased JPH10104174A (ja) 1996-09-13 1997-09-05 電気接続検査装置

Country Status (3)

Country Link
US (1) US5687209A (OSRAM)
JP (1) JPH10104174A (OSRAM)
DE (1) DE19723074C2 (OSRAM)

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JP3913253B2 (ja) 2004-07-30 2007-05-09 キヤノン株式会社 光半導体装置およびその製造方法
JP4636500B2 (ja) * 2005-03-28 2011-02-23 名古屋電機工業株式会社 Ｘ線検査装置、ｘ線検査方法およびｘ線検査プログラム
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US7529336B2 (en) * 2007-05-31 2009-05-05 Test Research, Inc. System and method for laminography inspection
US8331525B2 (en) 2007-10-01 2012-12-11 Pratt & Whitney Rocketdyne, Inc. Characteristic X-ray computed laminography system for home made explosives (HME) detection
WO2009078415A1 (ja) * 2007-12-17 2009-06-25 Uni-Hite System Corporation Ｘ線検査装置および方法
GB0817487D0 (en) * 2008-09-24 2008-10-29 Durham Scient Crystals Ltd Radiographic data interpretation
JP5559471B2 (ja) * 2008-11-11 2014-07-23 浜松ホトニクス株式会社 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法
EP2256069A1 (en) * 2009-05-29 2010-12-01 Mettler-Toledo Safeline X-Ray Limited Conveyor chain for a radiographic inspection system and radiographic inspection system
KR101096366B1 (ko) * 2009-11-27 2011-12-20 한국원자력연구원 스테레오 엑스레이 투과검사 시스템
JP5559551B2 (ja) * 2010-01-19 2014-07-23 株式会社サキコーポレーション 検査装置
WO2012169374A1 (ja) * 2011-06-08 2012-12-13 村田機械株式会社 ワーク処理システム
US9733193B2 (en) * 2015-03-12 2017-08-15 Proton Products International Limited Measurement of industrial products manufactured by extrusion techniques
JP7373840B2 (ja) * 2019-10-03 2023-11-06 株式会社 システムスクエア 検査装置
JP2023053558A (ja) * 2021-10-01 2023-04-13 株式会社サキコーポレーション 検査装置

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