JP6420139B2 - 半導体デバイス - Google Patents

半導体デバイス Download PDF

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Publication number
JP6420139B2
JP6420139B2 JP2014263772A JP2014263772A JP6420139B2 JP 6420139 B2 JP6420139 B2 JP 6420139B2 JP 2014263772 A JP2014263772 A JP 2014263772A JP 2014263772 A JP2014263772 A JP 2014263772A JP 6420139 B2 JP6420139 B2 JP 6420139B2
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JP
Japan
Prior art keywords
test
unit
semiconductor device
status information
register
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Expired - Fee Related
Application number
JP2014263772A
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English (en)
Japanese (ja)
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JP2016126357A (ja
JP2016126357A5 (enExample
Inventor
明仁 熊本
明仁 熊本
和生 西前
和生 西前
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Synaptics Japan GK
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Synaptics Japan GK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Synaptics Japan GK filed Critical Synaptics Japan GK
Priority to JP2014263772A priority Critical patent/JP6420139B2/ja
Priority to US14/972,660 priority patent/US9837027B2/en
Priority to CN201510983011.0A priority patent/CN105738791B/zh
Publication of JP2016126357A publication Critical patent/JP2016126357A/ja
Publication of JP2016126357A5 publication Critical patent/JP2016126357A5/ja
Application granted granted Critical
Publication of JP6420139B2 publication Critical patent/JP6420139B2/ja
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31724—Test controller, e.g. BIST state machine
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Microcomputers (AREA)
  • Debugging And Monitoring (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP2014263772A 2014-12-26 2014-12-26 半導体デバイス Expired - Fee Related JP6420139B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2014263772A JP6420139B2 (ja) 2014-12-26 2014-12-26 半導体デバイス
US14/972,660 US9837027B2 (en) 2014-12-26 2015-12-17 Semiconductor device
CN201510983011.0A CN105738791B (zh) 2014-12-26 2015-12-24 半导体设备

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014263772A JP6420139B2 (ja) 2014-12-26 2014-12-26 半導体デバイス

Publications (3)

Publication Number Publication Date
JP2016126357A JP2016126357A (ja) 2016-07-11
JP2016126357A5 JP2016126357A5 (enExample) 2018-02-15
JP6420139B2 true JP6420139B2 (ja) 2018-11-07

Family

ID=56163863

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014263772A Expired - Fee Related JP6420139B2 (ja) 2014-12-26 2014-12-26 半導体デバイス

Country Status (3)

Country Link
US (1) US9837027B2 (enExample)
JP (1) JP6420139B2 (enExample)
CN (1) CN105738791B (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102703487B1 (ko) * 2018-08-03 2024-09-06 에스케이하이닉스 주식회사 데이터 저장 장치 및 그것의 동작 방법
US12204782B2 (en) * 2023-06-20 2025-01-21 Stmicroelectronics International N.V. Communication logic to enhance area effectiveness for memory repair mechanism

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3526019B2 (ja) * 1999-11-30 2004-05-10 インターナショナル・ビジネス・マシーンズ・コーポレーション 画像表示システム、画像表示装置、および画像表示方法
US6728798B1 (en) * 2000-07-28 2004-04-27 Micron Technology, Inc. Synchronous flash memory with status burst output
JP2003044315A (ja) * 2001-07-31 2003-02-14 Matsushita Electric Ind Co Ltd 半導体集積回路用デバッグ回路、および、半導体集積回路のデバッグ方法
JP2003271413A (ja) * 2002-03-15 2003-09-26 Ricoh Co Ltd 半導体集積回路
JP2003315423A (ja) 2002-04-26 2003-11-06 Hitachi Ltd 半導体集積回路
JP2004198367A (ja) * 2002-12-20 2004-07-15 Fujitsu Ltd 半導体装置及びその試験方法
JP2004246979A (ja) * 2003-02-14 2004-09-02 Fujitsu Ltd 半導体試験回路、半導体記憶装置および半導体試験方法
JP2006139485A (ja) * 2004-11-11 2006-06-01 Denso Corp コンピュータ制御装置
US7308534B2 (en) * 2005-01-13 2007-12-11 Hitachi, Ltd. Apparatus and method for managing a plurality of kinds of storage devices
CN100395557C (zh) * 2005-03-04 2008-06-18 清华大学 采用加权扫描选通信号的基于扫描的自测试结构的自测试方法
JP4450787B2 (ja) * 2005-11-28 2010-04-14 株式会社ルネサステクノロジ 半導体集積回路装置
JP2008216980A (ja) * 2007-02-08 2008-09-18 Nec Electronics Corp ドライバ
JP2008269669A (ja) * 2007-04-17 2008-11-06 Renesas Technology Corp 半導体装置及びデータ処理システム
KR20090061247A (ko) * 2007-12-11 2009-06-16 삼성전자주식회사 디지털 방송 수신 장치의 ｏｓｄ 인터페이스
US8327066B2 (en) * 2008-09-30 2012-12-04 Samsung Electronics Co., Ltd. Method of managing a solid state drive, associated systems and implementations
JP2011154547A (ja) * 2010-01-27 2011-08-11 Toshiba Corp メモリ管理装置及びメモリ管理方法
US8819507B2 (en) * 2010-05-10 2014-08-26 Raytheon Company Field programmable gate arrays with built-in self test mechanisms
TW201234335A (en) * 2011-02-10 2012-08-16 Novatek Microelectronics Corp Display controller driver and testing method therefor
CN102969027A (zh) * 2012-11-28 2013-03-13 中国人民解放军国防科学技术大学 基于存储器内建自测试的片上存储器调试方法及装置
TWI475539B (zh) * 2013-01-17 2015-03-01 Raydium Semiconductor Corp 具有內建自我測試功能之驅動電路
CN104122497B (zh) * 2014-08-11 2016-09-21 中国科学院自动化研究所 集成电路内建自测试所需测试向量的生成电路及方法

Also Published As

Publication number Publication date
US20160187422A1 (en) 2016-06-30
CN105738791A (zh) 2016-07-06
CN105738791B (zh) 2020-05-26
US9837027B2 (en) 2017-12-05
JP2016126357A (ja) 2016-07-11

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