JP2016126357A5 - - Google Patents

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Publication number
JP2016126357A5
JP2016126357A5 JP2014263772A JP2014263772A JP2016126357A5 JP 2016126357 A5 JP2016126357 A5 JP 2016126357A5 JP 2014263772 A JP2014263772 A JP 2014263772A JP 2014263772 A JP2014263772 A JP 2014263772A JP 2016126357 A5 JP2016126357 A5 JP 2016126357A5
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JP
Japan
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test
unit
semiconductor device
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register
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JP2014263772A
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English (en)
Japanese (ja)
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JP6420139B2 (ja
JP2016126357A (ja
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Priority to JP2014263772A priority Critical patent/JP6420139B2/ja
Priority claimed from JP2014263772A external-priority patent/JP6420139B2/ja
Priority to US14/972,660 priority patent/US9837027B2/en
Priority to CN201510983011.0A priority patent/CN105738791B/zh
Publication of JP2016126357A publication Critical patent/JP2016126357A/ja
Publication of JP2016126357A5 publication Critical patent/JP2016126357A5/ja
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Publication of JP6420139B2 publication Critical patent/JP6420139B2/ja
Expired - Fee Related legal-status Critical Current
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JP2014263772A 2014-12-26 2014-12-26 半導体デバイス Expired - Fee Related JP6420139B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2014263772A JP6420139B2 (ja) 2014-12-26 2014-12-26 半導体デバイス
US14/972,660 US9837027B2 (en) 2014-12-26 2015-12-17 Semiconductor device
CN201510983011.0A CN105738791B (zh) 2014-12-26 2015-12-24 半导体设备

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014263772A JP6420139B2 (ja) 2014-12-26 2014-12-26 半導体デバイス

Publications (3)

Publication Number Publication Date
JP2016126357A JP2016126357A (ja) 2016-07-11
JP2016126357A5 true JP2016126357A5 (enExample) 2018-02-15
JP6420139B2 JP6420139B2 (ja) 2018-11-07

Family

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Family Applications (1)

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JP2014263772A Expired - Fee Related JP6420139B2 (ja) 2014-12-26 2014-12-26 半導体デバイス

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US (1) US9837027B2 (enExample)
JP (1) JP6420139B2 (enExample)
CN (1) CN105738791B (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102703487B1 (ko) * 2018-08-03 2024-09-06 에스케이하이닉스 주식회사 데이터 저장 장치 및 그것의 동작 방법
US12204782B2 (en) * 2023-06-20 2025-01-21 Stmicroelectronics International N.V. Communication logic to enhance area effectiveness for memory repair mechanism

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3526019B2 (ja) * 1999-11-30 2004-05-10 インターナショナル・ビジネス・マシーンズ・コーポレーション 画像表示システム、画像表示装置、および画像表示方法
US6728798B1 (en) * 2000-07-28 2004-04-27 Micron Technology, Inc. Synchronous flash memory with status burst output
JP2003044315A (ja) * 2001-07-31 2003-02-14 Matsushita Electric Ind Co Ltd 半導体集積回路用デバッグ回路、および、半導体集積回路のデバッグ方法
JP2003271413A (ja) * 2002-03-15 2003-09-26 Ricoh Co Ltd 半導体集積回路
JP2003315423A (ja) 2002-04-26 2003-11-06 Hitachi Ltd 半導体集積回路
JP2004198367A (ja) * 2002-12-20 2004-07-15 Fujitsu Ltd 半導体装置及びその試験方法
JP2004246979A (ja) * 2003-02-14 2004-09-02 Fujitsu Ltd 半導体試験回路、半導体記憶装置および半導体試験方法
JP2006139485A (ja) * 2004-11-11 2006-06-01 Denso Corp コンピュータ制御装置
US7308534B2 (en) * 2005-01-13 2007-12-11 Hitachi, Ltd. Apparatus and method for managing a plurality of kinds of storage devices
CN100395557C (zh) * 2005-03-04 2008-06-18 清华大学 采用加权扫描选通信号的基于扫描的自测试结构的自测试方法
JP4450787B2 (ja) * 2005-11-28 2010-04-14 株式会社ルネサステクノロジ 半導体集積回路装置
JP2008216980A (ja) * 2007-02-08 2008-09-18 Nec Electronics Corp ドライバ
JP2008269669A (ja) * 2007-04-17 2008-11-06 Renesas Technology Corp 半導体装置及びデータ処理システム
KR20090061247A (ko) * 2007-12-11 2009-06-16 삼성전자주식회사 디지털 방송 수신 장치의 ｏｓｄ 인터페이스
US8327066B2 (en) * 2008-09-30 2012-12-04 Samsung Electronics Co., Ltd. Method of managing a solid state drive, associated systems and implementations
JP2011154547A (ja) * 2010-01-27 2011-08-11 Toshiba Corp メモリ管理装置及びメモリ管理方法
US8819507B2 (en) * 2010-05-10 2014-08-26 Raytheon Company Field programmable gate arrays with built-in self test mechanisms
TW201234335A (en) * 2011-02-10 2012-08-16 Novatek Microelectronics Corp Display controller driver and testing method therefor
CN102969027A (zh) * 2012-11-28 2013-03-13 中国人民解放军国防科学技术大学 基于存储器内建自测试的片上存储器调试方法及装置
TWI475539B (zh) * 2013-01-17 2015-03-01 Raydium Semiconductor Corp 具有內建自我測試功能之驅動電路
CN104122497B (zh) * 2014-08-11 2016-09-21 中国科学院自动化研究所 集成电路内建自测试所需测试向量的生成电路及方法

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