JP6171066B1 - 半導体記憶装置 - Google Patents
半導体記憶装置 Download PDFInfo
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- JP6171066B1 JP6171066B1 JP2016170625A JP2016170625A JP6171066B1 JP 6171066 B1 JP6171066 B1 JP 6171066B1 JP 2016170625 A JP2016170625 A JP 2016170625A JP 2016170625 A JP2016170625 A JP 2016170625A JP 6171066 B1 JP6171066 B1 JP 6171066B1
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1057—Data output buffers, e.g. comprising level conversion circuits, circuits for adapting load
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
- G11C7/109—Control signal input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4093—Input/output [I/O] data interface arrangements, e.g. data buffers
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/32—Timing circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1063—Control signal output circuits, e.g. status or busy flags, feedback command signals
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1066—Output synchronization
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
- G11C7/1084—Data input buffers, e.g. comprising level conversion circuits, circuits for adapting load
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
- G11C7/1093—Input synchronization
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/18—Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe [RAS] or column address strobe [CAS] signals
Abstract
Description
120:選択部 130:メモリアレイ部
140:データ出力部 150:信号受取部
160:制御部 162:読書き制御部
164:遅延補償部 200:外部制御信号検出部
210:内部回路遅延評価部 220:遅延情報記憶部
230:タイミング調整部 300:フラッシュメモリ
310:メモリアレイ 320:入出力バッファ
330:アドレスレジスタ 340:制御部
350:ワード線選択回路 360:ページバッファ/センス回路
370:列選択回路 380:内部電圧発生回路
Claims (12)
- 外部制御信号に応答して入力データを受け取るデータ入力手段と、
前記入力データが受け取られている間に、外部制御信号に応じて動作可能な内部回路の遅延時間を評価し、評価により得られた遅延情報を記憶手段に記憶する遅延評価手段と、
複数のメモリ素子を含むメモリアレイと、
外部制御信号に応答して前記メモリアレイから読み出されたデータを出力するデータ出力手段と、
前記記憶手段に記憶された遅延情報に基づき前記データ出力手段の出力タイミングを調整するタイミング調整手段と、
を含む半導体記憶装置。 - 前記遅延評価手段はさらに、前記データ出力手段がデータを出力する間に、内部回路の遅延時間を評価し、当該評価により得られた遅延情報により前記記憶手段に記憶された遅延情報を更新する、請求項1に記載の半導体記憶装置。
- 半導体記憶装置はさらに、動作温度に関する温度情報を検出する検出手段を含み、
前記遅延評価手段は、前記温度情報に基づき前記遅延情報を校正する校正手段を含む、請求項1または2に記載の半導体記憶装置。 - 前記内部回路は、遅延時間を表すパルス信号を生成するためのRC遅延素子を含む、請求項1ないし3いずれか1つに記載の半導体記憶装置。
- 前記遅延評価手段は、前記内部回路から出力されるパルス信号に基づき遅延コードを生成する遅延コード生成手段を含み、生成された遅延コードが前記遅延情報として前記記憶手段に記憶される、請求項4に記載の半導体記憶装置。
- 前記タイミング調整手段は、前記遅延情報に基づき前記データ出力手段のRC遅延を調整する、請求項1または2に記載の半導体記憶装置。
- 前記タイミング調整手段は、前記遅延情報に基づき前記データ出力手段のゲート遅延を調整する、請求項1または2に記載の半導体記憶装置。
- 前記外部制御信号は、前記データ入力手段にデータを取り込むためのライトイネーブル信号である、請求項1ないし7いずれか1つに記載の半導体記憶装置。
- 前記外部制御信号は、前記データ出力手段からデータを出力するためのリードイネーブル信号である、請求項1ないし7いずれか1つに記載の半導体記憶装置。
- 前記入力データは、コマンドである、請求項1に記載の半導体記憶装置。
- 前記入力データは、読出しに関するコマンドであり、前記タイミング調整手段は、前記データ出力手段が読出しデータを出力するときのタイミングを調整する、請求項1または10に記載の半導体記憶装置。
- 半導体記憶装置は、NAND型フラッシュメモリである、請求項9ないし11いずれか1つに記載の半導体記憶装置。
Priority Applications (5)
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JP2016170625A JP6171066B1 (ja) | 2016-09-01 | 2016-09-01 | 半導体記憶装置 |
TW106122204A TWI645409B (zh) | 2016-09-01 | 2017-07-03 | 半導體記憶裝置 |
CN201710611353.9A CN107799134B (zh) | 2016-09-01 | 2017-07-25 | 半导体存储装置 |
KR1020170102599A KR102006971B1 (ko) | 2016-09-01 | 2017-08-11 | 반도체 기억장치 |
US15/692,381 US10297295B2 (en) | 2016-09-01 | 2017-08-31 | Semiconductor memory device |
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JP2016170625A JP6171066B1 (ja) | 2016-09-01 | 2016-09-01 | 半導体記憶装置 |
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JP6171066B1 true JP6171066B1 (ja) | 2017-07-26 |
JP2018037129A JP2018037129A (ja) | 2018-03-08 |
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KR (1) | KR102006971B1 (ja) |
CN (1) | CN107799134B (ja) |
TW (1) | TWI645409B (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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KR102632452B1 (ko) * | 2016-10-17 | 2024-02-05 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 및 그 동작 방법 |
JP6501325B1 (ja) * | 2018-01-30 | 2019-04-17 | ウィンボンド エレクトロニクス コーポレーション | 半導体記憶装置 |
JP6550502B1 (ja) * | 2018-05-10 | 2019-07-24 | ウィンボンド エレクトロニクス コーポレーション | 固有データ生成装置、半導体装置および認証システム |
US10504581B1 (en) * | 2018-06-26 | 2019-12-10 | Nanya Technology Corporation | Memory apparatus and operating method thereof |
TWI682404B (zh) * | 2018-10-12 | 2020-01-11 | 新唐科技股份有限公司 | 時序校正系統及其方法 |
JP7332406B2 (ja) | 2019-09-13 | 2023-08-23 | キオクシア株式会社 | メモリシステム |
US11726721B2 (en) * | 2020-09-09 | 2023-08-15 | Samsung Electronics Co., Ltd. | Memory device for adjusting delay on data clock path, memory system including the memory device, and operating method of the memory system |
JP7043578B1 (ja) * | 2020-12-18 | 2022-03-29 | 華邦電子股▲ふん▼有限公司 | 半導体記憶装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011508335A (ja) * | 2007-12-27 | 2011-03-10 | インディリンクス カンパニー., リミテッド. | 読み出し信号タイミングを調整するフラッシュメモリ装置およびフラッシュメモリ装置の読み出し制御方法 |
JP2015007989A (ja) * | 2014-08-06 | 2015-01-15 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置及びその調整方法並びにデータ処理システム |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6172935B1 (en) * | 1997-04-25 | 2001-01-09 | Micron Technology, Inc. | Synchronous dynamic random access memory device |
US6665624B2 (en) * | 2001-03-02 | 2003-12-16 | Intel Corporation | Generating and using calibration information |
JP4125138B2 (ja) | 2003-01-09 | 2008-07-30 | 株式会社日立製作所 | 半導体試験装置 |
KR100532973B1 (ko) * | 2004-04-30 | 2005-12-01 | 주식회사 하이닉스반도체 | 메모리 장치의 데이타 출력 드라이버 제어 장치 |
JP4416580B2 (ja) * | 2004-06-28 | 2010-02-17 | 株式会社リコー | 遅延制御装置 |
TWI295425B (en) | 2005-04-01 | 2008-04-01 | Integrated Circuit Solution Inc | High access speed flash controller |
CN1933015A (zh) * | 2005-09-13 | 2007-03-21 | 株式会社瑞萨科技 | 半导体集成电路器件 |
KR100808052B1 (ko) * | 2005-09-28 | 2008-03-07 | 주식회사 하이닉스반도체 | 반도체 메모리 장치 |
JP2007141383A (ja) * | 2005-11-18 | 2007-06-07 | Elpida Memory Inc | 半導体記憶装置 |
JP2007128646A (ja) | 2006-12-19 | 2007-05-24 | Renesas Technology Corp | 半導体記憶装置 |
JPWO2010137330A1 (ja) * | 2009-05-27 | 2012-11-12 | パナソニック株式会社 | 遅延調整装置、遅延調整方法 |
KR101110819B1 (ko) * | 2009-11-30 | 2012-03-13 | 주식회사 하이닉스반도체 | 반도체 메모리의 동작 타이밍 제어 장치 및 그 방법 |
WO2012021380A2 (en) | 2010-08-13 | 2012-02-16 | Rambus Inc. | Fast-wake memory |
US8897084B2 (en) * | 2011-09-08 | 2014-11-25 | Apple Inc. | Dynamic data strobe detection |
KR101861184B1 (ko) * | 2011-11-02 | 2018-05-28 | 삼성전자주식회사 | 스토리지의 동작 성능 조절방법 및 그에 따른 반도체 저장장치 |
US9275706B2 (en) * | 2013-02-28 | 2016-03-01 | Sandisk Technologies Inc. | Auto-calibration for high speed input/output |
KR102138110B1 (ko) * | 2013-10-04 | 2020-07-27 | 삼성전자주식회사 | 플래시 메모리를 기반으로 하는 저장 장치 및 그것의 동작 방법 |
US9697145B2 (en) | 2015-06-12 | 2017-07-04 | Apple Inc. | Memory interface system |
-
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011508335A (ja) * | 2007-12-27 | 2011-03-10 | インディリンクス カンパニー., リミテッド. | 読み出し信号タイミングを調整するフラッシュメモリ装置およびフラッシュメモリ装置の読み出し制御方法 |
JP2015007989A (ja) * | 2014-08-06 | 2015-01-15 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置及びその調整方法並びにデータ処理システム |
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CN107799134B (zh) | 2021-04-27 |
US20180061462A1 (en) | 2018-03-01 |
KR20180025811A (ko) | 2018-03-09 |
JP2018037129A (ja) | 2018-03-08 |
KR102006971B1 (ko) | 2019-09-06 |
TW201822208A (zh) | 2018-06-16 |
TWI645409B (zh) | 2018-12-21 |
CN107799134A (zh) | 2018-03-13 |
US10297295B2 (en) | 2019-05-21 |
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|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |