JP5987573B2 - 光学モジュール、電子機器、及び駆動方法 - Google Patents
光学モジュール、電子機器、及び駆動方法 Download PDFInfo
- Publication number
- JP5987573B2 JP5987573B2 JP2012200218A JP2012200218A JP5987573B2 JP 5987573 B2 JP5987573 B2 JP 5987573B2 JP 2012200218 A JP2012200218 A JP 2012200218A JP 2012200218 A JP2012200218 A JP 2012200218A JP 5987573 B2 JP5987573 B2 JP 5987573B2
- Authority
- JP
- Japan
- Prior art keywords
- wavelength
- gap
- light
- reflective film
- order
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/001—Optical devices or arrangements for the control of light using movable or deformable optical elements based on interference in an adjustable optical cavity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0264—Electrical interface; User interface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/06—Scanning arrangements arrangements for order-selection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/32—Investigating bands of a spectrum in sequence by a single detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Human Computer Interaction (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
- Spectrometry And Color Measurement (AREA)
- Micromachines (AREA)
Priority Applications (10)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012200218A JP5987573B2 (ja) | 2012-09-12 | 2012-09-12 | 光学モジュール、電子機器、及び駆動方法 |
| CN201810768082.2A CN108955877B (zh) | 2012-09-12 | 2013-09-06 | 驱动方法以及分光测定方法 |
| CN201310404583.XA CN103675977A (zh) | 2012-09-12 | 2013-09-06 | 光学模块、电子设备以及驱动方法 |
| EP21190095.6A EP3929545A1 (en) | 2012-09-12 | 2013-09-10 | Optical module, electronic device, and driving method |
| EP13183692.6A EP2708861B1 (en) | 2012-09-12 | 2013-09-10 | Electronic device and driving method |
| US14/025,050 US20140071445A1 (en) | 2012-09-12 | 2013-09-12 | Optical Module, Electronic Device, and Driving Method |
| US15/819,227 US20180088316A1 (en) | 2012-09-12 | 2017-11-21 | Optical module, electronic device, and driving method |
| US16/788,602 US11029509B2 (en) | 2012-09-12 | 2020-02-12 | Optical module, electronic device, and driving method |
| US17/314,553 US20210263298A1 (en) | 2012-09-12 | 2021-05-07 | Optical Module, Electronic Device, And Driving Method |
| US18/813,478 US20240418981A1 (en) | 2012-09-12 | 2024-08-23 | Optical Module, Electronic Device, And Driving Method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012200218A JP5987573B2 (ja) | 2012-09-12 | 2012-09-12 | 光学モジュール、電子機器、及び駆動方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014056073A JP2014056073A (ja) | 2014-03-27 |
| JP2014056073A5 JP2014056073A5 (enExample) | 2015-10-29 |
| JP5987573B2 true JP5987573B2 (ja) | 2016-09-07 |
Family
ID=49150805
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012200218A Active JP5987573B2 (ja) | 2012-09-12 | 2012-09-12 | 光学モジュール、電子機器、及び駆動方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (5) | US20140071445A1 (enExample) |
| EP (2) | EP3929545A1 (enExample) |
| JP (1) | JP5987573B2 (enExample) |
| CN (2) | CN103675977A (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5987573B2 (ja) * | 2012-09-12 | 2016-09-07 | セイコーエプソン株式会社 | 光学モジュール、電子機器、及び駆動方法 |
| JP6413325B2 (ja) * | 2014-05-01 | 2018-10-31 | セイコーエプソン株式会社 | アクチュエーター装置、電子機器、及び制御方法 |
| JP6394189B2 (ja) * | 2014-08-29 | 2018-09-26 | セイコーエプソン株式会社 | 分光画像取得装置、及び分光画像取得方法 |
| EP3290879B1 (en) * | 2015-04-28 | 2023-10-11 | Panasonic Holdings Corporation | Spectroscopic module control method |
| JP2017187333A (ja) * | 2016-04-04 | 2017-10-12 | パイオニア株式会社 | 光測定器 |
| US10288483B2 (en) * | 2017-04-09 | 2019-05-14 | Cymer, Llc | Recovering spectral shape from spatial output |
| JP6930869B2 (ja) * | 2017-06-28 | 2021-09-01 | パイオニア株式会社 | 撮像装置、撮像方法及びプログラム |
| JP7025903B2 (ja) * | 2017-11-24 | 2022-02-25 | 浜松ホトニクス株式会社 | 電気的検査方法 |
| JP7313115B2 (ja) * | 2017-11-24 | 2023-07-24 | 浜松ホトニクス株式会社 | 光検査装置及び光検査方法 |
| JP6526771B1 (ja) * | 2017-11-24 | 2019-06-05 | 浜松ホトニクス株式会社 | ウェハ |
| JP2019109374A (ja) * | 2017-12-19 | 2019-07-04 | セイコーエプソン株式会社 | 光モジュール、分光測定装置、分光測定方法及び電子機器 |
| JP7238385B2 (ja) * | 2018-12-20 | 2023-03-14 | セイコーエプソン株式会社 | 分光フィルターモジュール、分光カメラおよび電子機器 |
| WO2020130940A1 (en) | 2018-12-21 | 2020-06-25 | Ams Sensors Singapore Pte. Ltd. | Linear temperature calibration compensation for spectrometer systems |
| KR102571019B1 (ko) * | 2020-02-21 | 2023-08-28 | 장민준 | 깊이 이미징 장치 및 입사각에 따른 크로스토크가 저감된 간섭필터 |
| KR20240140097A (ko) * | 2022-01-26 | 2024-09-24 | 트리나미엑스 게엠베하 | 휴대용 분광계 장치 |
| CN114582991A (zh) * | 2022-02-22 | 2022-06-03 | 南京信息工程大学 | 一种量子点集成微型紫外光谱传感芯片及其制备方法 |
| WO2025248169A1 (en) * | 2024-05-31 | 2025-12-04 | Teknologian Tutkimuskeskus Vtt Oy | Fabry-perot interferometer having a wide tuning range |
Family Cites Families (182)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2885923A (en) * | 1954-08-13 | 1959-05-12 | Phillips Petroleum Co | Reflection refractometer |
| US3635562A (en) * | 1968-11-12 | 1972-01-18 | Comp Generale Electricite | Optical interferometer for detection of small displacements |
| US4172663A (en) * | 1977-04-27 | 1979-10-30 | Board of Trustees Leland Stanford Jr., University | Optical wavelength meter |
| NL8001281A (nl) * | 1980-03-04 | 1981-10-01 | Philips Nv | Weergeefinrichting. |
| DE3689537T2 (de) * | 1985-10-16 | 1994-04-28 | British Telecomm | Befestigung einer Komponente auf einem Substrat. |
| GB2186708B (en) * | 1985-11-26 | 1990-07-11 | Sharp Kk | A variable interferometric device and a process for the production of the same |
| US4822998A (en) * | 1986-05-15 | 1989-04-18 | Minolta Camera Kabushiki Kaisha | Spectral sensor with interference filter |
| JPH0194312A (ja) | 1987-10-06 | 1989-04-13 | Sharp Corp | 可変干渉装置 |
| US4979821A (en) * | 1988-01-27 | 1990-12-25 | Ortho Diagnostic Systems Inc. | Cuvette for receiving liquid sample |
| US4918704A (en) * | 1989-01-10 | 1990-04-17 | Quantel International, Inc. | Q-switched solid state pulsed laser with injection seeding and a gaussian output coupling mirror |
| WO1991005988A1 (de) * | 1989-10-12 | 1991-05-02 | Hartmann & Braun Aktiengesellschaft | Verfahren und anordnung zur fabry-perot-spektroskopie |
| US5039201A (en) * | 1990-04-30 | 1991-08-13 | International Business Machines Corporation | Double-pass tunable fabry-perot optical filter |
| US5170221A (en) * | 1990-06-15 | 1992-12-08 | Okuma Corp. | Parallel light ray measuring apparatus |
| US5142414A (en) * | 1991-04-22 | 1992-08-25 | Koehler Dale R | Electrically actuatable temporal tristimulus-color device |
| US6381022B1 (en) * | 1992-01-22 | 2002-04-30 | Northeastern University | Light modulating device |
| US5909280A (en) * | 1992-01-22 | 1999-06-01 | Maxam, Inc. | Method of monolithically fabricating a microspectrometer with integrated detector |
| US5572543A (en) * | 1992-04-09 | 1996-11-05 | Deutsch Aerospace Ag | Laser system with a micro-mechanically moved mirror |
| US5736410A (en) * | 1992-09-14 | 1998-04-07 | Sri International | Up-converting reporters for biological and other assays using laser excitation techniques |
| US5674698A (en) * | 1992-09-14 | 1997-10-07 | Sri International | Up-converting reporters for biological and other assays using laser excitation techniques |
| US5550373A (en) * | 1994-12-30 | 1996-08-27 | Honeywell Inc. | Fabry-Perot micro filter-detector |
| EP0729017B1 (en) * | 1995-02-25 | 1998-07-08 | Hewlett-Packard GmbH | Method for measurement and compensation of stray light in a spectrometer |
| WO1997015810A1 (de) * | 1995-10-25 | 1997-05-01 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Farbaufnahmesystem |
| US6008492A (en) * | 1996-10-23 | 1999-12-28 | Slater; Mark | Hyperspectral imaging method and apparatus |
| US6545739B1 (en) * | 1997-09-19 | 2003-04-08 | Nippon Telegraph And Telephone Corporation | Tunable wavelength filter using nano-sized droplets of liquid crystal dispersed in a polymer |
| WO1999052006A2 (en) * | 1998-04-08 | 1999-10-14 | Etalon, Inc. | Interferometric modulation of radiation |
| US6981804B2 (en) * | 1998-06-08 | 2006-01-03 | Arrayed Fiberoptics Corporation | Vertically integrated optical devices coupled to optical fibers |
| US6275324B1 (en) * | 1998-12-14 | 2001-08-14 | Lucent Technologies Inc. | Micromachined tunable optical filter with controllable finesse and passband wavelength position |
| US6384458B1 (en) * | 1999-05-04 | 2002-05-07 | Soft Imaging System Gmbh | Semiconductor system for registering spectra, color signals, color signals, color images and the like |
| GB2351840A (en) * | 1999-06-02 | 2001-01-10 | Seiko Epson Corp | Multicolour light emitting devices. |
| US6181717B1 (en) * | 1999-06-04 | 2001-01-30 | Bandwidth 9 | Tunable semiconductor laser system |
| US6614568B1 (en) * | 1999-07-14 | 2003-09-02 | At&T Corp. | Wavelength-cyclic communication network and wavelength-cyclic modules |
| IT1309923B1 (it) | 1999-09-03 | 2002-02-05 | Ferrania Spa | Foglio recettore per stampa a getto di inchiostro comprendentegelatina e un sale metallico. |
| US6814933B2 (en) * | 2000-09-19 | 2004-11-09 | Aurora Biosciences Corporation | Multiwell scanner and scanning method |
| JP2001221913A (ja) * | 2000-02-08 | 2001-08-17 | Yokogawa Electric Corp | ファブリペローフィルタ及び赤外線ガス分析計 |
| GB2359636B (en) * | 2000-02-22 | 2002-05-01 | Marconi Comm Ltd | Wavelength selective optical filter |
| US6836366B1 (en) * | 2000-03-03 | 2004-12-28 | Axsun Technologies, Inc. | Integrated tunable fabry-perot filter and method of making same |
| US6407376B1 (en) * | 2000-03-03 | 2002-06-18 | Axsun Technologies, Inc. | Optical channel monitoring system with self-calibration |
| US6747775B2 (en) * | 2000-03-20 | 2004-06-08 | Np Photonics, Inc. | Detunable Fabry-Perot interferometer and an add/drop multiplexer using the same |
| US6592817B1 (en) * | 2000-03-31 | 2003-07-15 | Applied Materials, Inc. | Monitoring an effluent from a chamber |
| US6608685B2 (en) * | 2000-05-15 | 2003-08-19 | Ilx Lightwave Corporation | Tunable Fabry-Perot interferometer, and associated methods |
| US6466354B1 (en) * | 2000-09-19 | 2002-10-15 | Silicon Light Machines | Method and apparatus for interferometric modulation of light |
| US6768756B2 (en) * | 2001-03-12 | 2004-07-27 | Axsun Technologies, Inc. | MEMS membrane with integral mirror/lens |
| US6763718B1 (en) * | 2001-06-26 | 2004-07-20 | The United States Of America As Represented By The Secretary Of The Navy | Micro-electro-mechanical systems ultra-sensitive accelerometer with independent sensitivity adjustment |
| US6580843B2 (en) * | 2001-04-05 | 2003-06-17 | Fujitsu Limited | Optical device |
| US6915048B2 (en) * | 2001-06-18 | 2005-07-05 | Cidra Corporation | Fabry-perot filter/resonator |
| US6747742B1 (en) * | 2001-06-22 | 2004-06-08 | Tanner Research, Inc. | Microspectrometer based on a tunable fabry-perot interferometer and microsphere cavities |
| US6697159B2 (en) * | 2001-07-17 | 2004-02-24 | The University Of Kansas | Optical domain signal analyzer |
| US7015457B2 (en) * | 2002-03-18 | 2006-03-21 | Honeywell International Inc. | Spectrally tunable detector |
| NO315177B1 (no) * | 2001-11-29 | 2003-07-21 | Sinvent As | Optisk forskyvnings-sensor |
| US6770882B2 (en) * | 2002-01-14 | 2004-08-03 | Multispectral Imaging, Inc. | Micromachined pyro-optical structure |
| SE0202160D0 (sv) * | 2002-07-10 | 2002-07-10 | Proximion Fiber Optics Ab | Wavelength selective switch |
| US7265429B2 (en) * | 2002-08-07 | 2007-09-04 | Chang-Feng Wan | System and method of fabricating micro cavities |
| US6844975B2 (en) * | 2002-10-09 | 2005-01-18 | Jds Uniphase Corporation | Etalon devices employing multiple materials |
| TW200408824A (en) * | 2002-11-21 | 2004-06-01 | Delta Electronics Inc | Method for finesse compensation in a Fabry-Perot device and a Fabry-Perot device with high finesse |
| US7432508B2 (en) * | 2003-02-21 | 2008-10-07 | Ric Investments, Llc | Gas measurement system |
| TW567355B (en) * | 2003-04-21 | 2003-12-21 | Prime View Int Co Ltd | An interference display cell and fabrication method thereof |
| US7218438B2 (en) | 2003-04-30 | 2007-05-15 | Hewlett-Packard Development Company, L.P. | Optical electronic device with partial reflector layer |
| US7447891B2 (en) * | 2003-04-30 | 2008-11-04 | Hewlett-Packard Development Company, L.P. | Light modulator with concentric control-electrode structure |
| US7072093B2 (en) | 2003-04-30 | 2006-07-04 | Hewlett-Packard Development Company, L.P. | Optical interference pixel display with charge control |
| JP4916647B2 (ja) * | 2003-05-23 | 2012-04-18 | サムスン エレクトロニクス カンパニー リミテッド | 外部共振器半導体レーザーおよびその製造方法 |
| JP2005077964A (ja) * | 2003-09-03 | 2005-03-24 | Fujitsu Ltd | 分光装置 |
| US7420738B2 (en) * | 2003-12-22 | 2008-09-02 | Axsun Technologies, Inc. | Dual membrane single cavity Fabry-Perot MEMS filter |
| US7187453B2 (en) * | 2004-04-23 | 2007-03-06 | Opsens Inc. | Optical MEMS cavity having a wide scanning range for measuring a sensing interferometer |
| RU2389983C2 (ru) * | 2004-05-14 | 2010-05-20 | Кемометек А/С | Способ и система для оценки образцов |
| JP4479351B2 (ja) * | 2004-05-28 | 2010-06-09 | セイコーエプソン株式会社 | 波長可変フィルタおよび波長可変フィルタの製造方法 |
| US7110122B2 (en) * | 2004-07-21 | 2006-09-19 | Hewlett-Packard Development Company, L.P. | Interferometer calibration methods and apparatus |
| US7420725B2 (en) * | 2004-09-27 | 2008-09-02 | Idc, Llc | Device having a conductive light absorbing mask and method for fabricating same |
| US7653371B2 (en) * | 2004-09-27 | 2010-01-26 | Qualcomm Mems Technologies, Inc. | Selectable capacitance circuit |
| US7289259B2 (en) * | 2004-09-27 | 2007-10-30 | Idc, Llc | Conductive bus structure for interferometric modulator array |
| US7372613B2 (en) * | 2004-09-27 | 2008-05-13 | Idc, Llc | Method and device for multistate interferometric light modulation |
| US8008736B2 (en) * | 2004-09-27 | 2011-08-30 | Qualcomm Mems Technologies, Inc. | Analog interferometric modulator device |
| US7333208B2 (en) * | 2004-12-20 | 2008-02-19 | Xerox Corporation | Full width array mechanically tunable spectrophotometer |
| US7340127B1 (en) * | 2005-01-31 | 2008-03-04 | Sunrise Telecom Incorporated | Full-band optical spectrum analyzer and method |
| US7385704B2 (en) * | 2005-03-30 | 2008-06-10 | Xerox Corporation | Two-dimensional spectral cameras and methods for capturing spectral information using two-dimensional spectral cameras |
| CN101189505B (zh) * | 2005-04-01 | 2011-11-09 | 3M创新有限公司 | 具有可移除光学模块的多重荧光检测装置 |
| US7709249B2 (en) * | 2005-04-01 | 2010-05-04 | 3M Innovative Properties Company | Multiplex fluorescence detection device having fiber bundle coupling multiple optical modules to a common detector |
| NO322368B1 (no) * | 2005-04-15 | 2006-09-25 | Sinvent As | Infrarod deteksjon av gass - diffraktiv. |
| NO322438B1 (no) * | 2005-04-15 | 2006-10-02 | Sinvent As | Justerbart interferensfilter |
| US7319552B2 (en) * | 2005-06-09 | 2008-01-15 | Hewlett-Packard Development Company, L.P. | Micro-electro mechanical light modulator device |
| JP4424331B2 (ja) * | 2005-08-01 | 2010-03-03 | セイコーエプソン株式会社 | 静電アクチュエータ、液滴吐出ヘッド、液滴吐出ヘッドの駆動方法及び静電アクチュエータの製造方法 |
| US20080239494A1 (en) * | 2005-08-16 | 2008-10-02 | Zander Dennis R | Tunable Light Filter |
| US7733553B2 (en) * | 2005-09-21 | 2010-06-08 | Hewlett-Packard Development Company, L.P. | Light modulator with tunable optical state |
| US7417746B2 (en) * | 2005-12-29 | 2008-08-26 | Xerox Corporation | Fabry-perot tunable filter systems and methods |
| US7355714B2 (en) * | 2005-12-29 | 2008-04-08 | Xerox Corporation | Reconfigurable MEMS fabry-perot tunable matrix filter systems and methods |
| US7589840B2 (en) * | 2006-01-10 | 2009-09-15 | Sunrise Telecom Incorporated | Broad- and inter-band multi-wavelength-reference method and apparatus for wavelength measurement or monitoring systems |
| US7499182B2 (en) | 2006-01-10 | 2009-03-03 | Sunrise Telecom Incorporated | Optical signal measurement system |
| US7916980B2 (en) * | 2006-01-13 | 2011-03-29 | Qualcomm Mems Technologies, Inc. | Interconnect structure for MEMS device |
| JP4466634B2 (ja) * | 2006-01-19 | 2010-05-26 | セイコーエプソン株式会社 | 光学デバイス、波長可変フィルタ、波長可変フィルタモジュール、および光スペクトラムアナライザ |
| US20070242358A1 (en) * | 2006-04-18 | 2007-10-18 | Xerox Corporation | Fabry-perot tunable filter |
| US7628493B2 (en) * | 2006-04-18 | 2009-12-08 | Xerox Corporation | Projector based on tunable individually-addressable Fabry-Perot filters |
| FI119830B (fi) * | 2006-05-24 | 2009-03-31 | Valtion Teknillinen | Spektrometri ja inferferometrinen menetelmä |
| US20100220331A1 (en) * | 2006-06-06 | 2010-09-02 | Anis Zribi | Micro-electromechanical system fabry-perot filter cavity |
| EP2045645A1 (en) * | 2006-07-06 | 2009-04-08 | Nikon Corporation | Micro actuator, optical unit, exposure device, and device manufacturing method |
| JP5080117B2 (ja) | 2006-08-04 | 2012-11-21 | ダイセルポリマー株式会社 | めっき樹脂成形体 |
| JP2008036199A (ja) * | 2006-08-08 | 2008-02-21 | Olympus Corp | 内視鏡システム |
| JP4432947B2 (ja) * | 2006-09-12 | 2010-03-17 | 株式会社デンソー | 赤外線式ガス検出器 |
| US7583418B2 (en) * | 2006-09-26 | 2009-09-01 | Xerox Corporation | Array based sensor to measure single separation or mixed color (or IOI) patches on the photoreceptor using MEMS based hyperspectral imaging technology |
| US7623278B2 (en) * | 2006-09-26 | 2009-11-24 | Xerox Corporation | MEMS Fabry-Perot inline color scanner for printing applications using stationary membranes |
| JP2008183350A (ja) * | 2007-01-31 | 2008-08-14 | Olympus Corp | 可変分光素子、分光装置および内視鏡システム |
| JP2010525305A (ja) * | 2007-04-18 | 2010-07-22 | シェモメテック・アクティーゼルスカブ | 干渉計アクチュエータ |
| US8717572B2 (en) * | 2007-06-12 | 2014-05-06 | Hewlett-Packard Development Company, L.P. | Spectrophotometer |
| US7630121B2 (en) * | 2007-07-02 | 2009-12-08 | Qualcomm Mems Technologies, Inc. | Electromechanical device with optical function separated from mechanical and electrical function |
| US7911623B2 (en) * | 2007-08-07 | 2011-03-22 | Xerox Corporation | Fabry-Perot piezoelectric tunable filter |
| JP5141213B2 (ja) * | 2007-11-29 | 2013-02-13 | セイコーエプソン株式会社 | 光学デバイス、波長可変フィルタモジュール、および光スペクトラムアナライザ |
| US8320983B2 (en) * | 2007-12-17 | 2012-11-27 | Palo Alto Research Center Incorporated | Controlling transfer of objects affecting optical characteristics |
| DE102008012635A1 (de) * | 2008-03-05 | 2009-09-10 | Carl Zeiss Microlmaging Gmbh | Verfahren und Anordnung zur zeitaufgelösten Spektroskopie |
| JP4949297B2 (ja) | 2008-03-12 | 2012-06-06 | 富士フイルム株式会社 | 画像記録方法、インクセット、及びインクジェット記録物 |
| KR20110007144A (ko) * | 2008-04-22 | 2011-01-21 | 콤스코프 인코포레이티드 오브 노스 캐롤라이나 | 이중필터 광통신망 접속장치 및 이를 이용한 노이즈 제거방법 |
| JP5142803B2 (ja) * | 2008-04-24 | 2013-02-13 | 株式会社日立製作所 | 半導体レーザ装置 |
| US7773222B2 (en) * | 2008-05-27 | 2010-08-10 | Xerox Corporation | UV enhanced full width array scanning spectrophotometer |
| US8559090B2 (en) * | 2008-07-31 | 2013-10-15 | Lightwaves 2020, Inc. | Tunable optical filter and method of manufacture thereof |
| US8203769B2 (en) * | 2008-10-10 | 2012-06-19 | Xerox Corporation | In-line linear variable filter based spectrophotometer |
| JP5151944B2 (ja) * | 2008-12-09 | 2013-02-27 | セイコーエプソン株式会社 | 光フィルタ及びそれを備えた光モジュール |
| JP5440110B2 (ja) * | 2009-03-30 | 2014-03-12 | 株式会社リコー | 分光特性取得装置、分光特性取得方法、画像評価装置、及び画像形成装置 |
| FI20095356A0 (fi) * | 2009-04-02 | 2009-04-02 | Valtion Teknillinen | Järjestelmä ja menetelmä kohteen optiseksi mittaamiseksi |
| US20100292581A1 (en) * | 2009-05-13 | 2010-11-18 | Peter Guy Howard | Dynamic Calibration of an Optical Spectrometer |
| JP5421684B2 (ja) * | 2009-07-29 | 2014-02-19 | キヤノン株式会社 | 回折光学素子、それを用いた分光測色装置および画像形成装置 |
| CN102574406B (zh) | 2009-08-21 | 2015-01-07 | 株式会社理光 | 图像形成方法和图像形成物 |
| US20110075142A1 (en) * | 2009-09-25 | 2011-03-31 | General Electric Company | Optical detection system |
| IL201742A0 (en) * | 2009-10-25 | 2010-06-16 | Elbit Sys Electro Optics Elop | Tunable spectral filter |
| US9664563B2 (en) * | 2009-12-02 | 2017-05-30 | University Of Hawaii | Fabry-perot fourier transform spectrometer |
| JP5569002B2 (ja) * | 2010-01-21 | 2014-08-13 | セイコーエプソン株式会社 | 分析機器および特性測定方法 |
| JP5048795B2 (ja) * | 2010-01-21 | 2012-10-17 | 浜松ホトニクス株式会社 | 分光装置 |
| JP5589459B2 (ja) * | 2010-03-15 | 2014-09-17 | セイコーエプソン株式会社 | 光フィルター及び光フィルターモジュール並びに分析機器及び光機器 |
| WO2011126953A1 (en) * | 2010-04-09 | 2011-10-13 | Qualcomm Mems Technologies, Inc. | Mechanical layer of an electromechanical device and methods of forming the same |
| MX2012012033A (es) * | 2010-04-16 | 2013-05-20 | Flex Lighting Ii Llc | Dispositivo de iluminacion que comprende una guia de luz a base de pelicula. |
| JP5668345B2 (ja) * | 2010-07-13 | 2015-02-12 | セイコーエプソン株式会社 | 光フィルター、光フィルターモジュール、分光測定器および光機器 |
| JP2012042584A (ja) * | 2010-08-17 | 2012-03-01 | Seiko Epson Corp | 光フィルター、光フィルターモジュール、分光測定器および光機器 |
| KR20130091763A (ko) * | 2010-08-17 | 2013-08-19 | 퀄컴 엠이엠에스 테크놀로지스, 인크. | 간섭 디스플레이 장치에서의 전하 중성 전극의 작동 및 교정 |
| JP5640549B2 (ja) * | 2010-08-19 | 2014-12-17 | セイコーエプソン株式会社 | 光フィルター、光フィルターの製造方法および光機器 |
| JP5625614B2 (ja) * | 2010-08-20 | 2014-11-19 | セイコーエプソン株式会社 | 光フィルター、光フィルターモジュール、分光測定器および光機器 |
| JP5707780B2 (ja) * | 2010-08-25 | 2015-04-30 | セイコーエプソン株式会社 | 波長可変干渉フィルター、光モジュール、及び光分析装置 |
| JP5779852B2 (ja) * | 2010-08-25 | 2015-09-16 | セイコーエプソン株式会社 | 波長可変干渉フィルター、光モジュール、および光分析装置 |
| JP5810512B2 (ja) * | 2010-11-12 | 2015-11-11 | セイコーエプソン株式会社 | 光学装置 |
| JP5177209B2 (ja) * | 2010-11-24 | 2013-04-03 | 株式会社デンソー | ファブリペロー干渉計 |
| JP5720200B2 (ja) * | 2010-11-25 | 2015-05-20 | セイコーエプソン株式会社 | 光モジュール、および光測定装置 |
| JP5545199B2 (ja) * | 2010-12-16 | 2014-07-09 | 株式会社デンソー | ファブリペロー干渉計 |
| JP5601190B2 (ja) * | 2010-12-17 | 2014-10-08 | 株式会社デンソー | 波長選択型赤外線検出装置 |
| JP2012150353A (ja) * | 2011-01-20 | 2012-08-09 | Seiko Epson Corp | 波長可変干渉フィルター、光モジュール、および光分析装置 |
| JP5716412B2 (ja) * | 2011-01-24 | 2015-05-13 | セイコーエプソン株式会社 | 波長可変干渉フィルター、光モジュール、及び光分析装置 |
| JP5834418B2 (ja) * | 2011-02-04 | 2015-12-24 | セイコーエプソン株式会社 | 光フィルター、光フィルターモジュール、分析機器及び光機器 |
| US8963159B2 (en) * | 2011-04-04 | 2015-02-24 | Qualcomm Mems Technologies, Inc. | Pixel via and methods of forming the same |
| US9134527B2 (en) * | 2011-04-04 | 2015-09-15 | Qualcomm Mems Technologies, Inc. | Pixel via and methods of forming the same |
| JP5786424B2 (ja) * | 2011-04-11 | 2015-09-30 | セイコーエプソン株式会社 | 波長可変干渉フィルター、光モジュール、及び電子機器 |
| JP2012237794A (ja) * | 2011-05-10 | 2012-12-06 | Seiko Epson Corp | 光フィルター、光フィルターモジュールおよび光分析装置 |
| EP2724856B1 (en) * | 2011-06-27 | 2020-11-25 | Toray Industries, Inc. | Laminate film and automotive window glass using same |
| JP5895414B2 (ja) * | 2011-09-16 | 2016-03-30 | セイコーエプソン株式会社 | 分光測定装置、及び分光測定方法 |
| US8908177B2 (en) * | 2012-01-16 | 2014-12-09 | Filmetrics, Inc. | Correction of second-order diffraction effects in fiber-optic-based spectrometers |
| US9132681B2 (en) * | 2012-02-07 | 2015-09-15 | Hewlett-Packard Development Company, L.P. | Color analysis |
| DE102012007030C5 (de) * | 2012-04-05 | 2019-01-10 | Drägerwerk AG & Co. KGaA | Vorrichtung und Verfahren zur schnellen Aufnahme eines Absorptionsspektrums eines Fluids |
| JP6003168B2 (ja) * | 2012-04-11 | 2016-10-05 | セイコーエプソン株式会社 | 波長可変干渉フィルター、光学フィルターデバイス、光学モジュール、及び電子機器 |
| JP2013238755A (ja) * | 2012-05-16 | 2013-11-28 | Seiko Epson Corp | 光学モジュール、電子機器、食物分析装置、分光カメラ、及び波長可変干渉フィルターの駆動方法 |
| JP6098051B2 (ja) * | 2012-07-04 | 2017-03-22 | セイコーエプソン株式会社 | 分光測定装置 |
| JP5987573B2 (ja) * | 2012-09-12 | 2016-09-07 | セイコーエプソン株式会社 | 光学モジュール、電子機器、及び駆動方法 |
| US9255844B2 (en) * | 2012-09-12 | 2016-02-09 | Teknologian Tutkimuskeskus Vtt | System and method for optical measurement of a target at multiple positions |
| JP6160055B2 (ja) * | 2012-10-01 | 2017-07-12 | セイコーエプソン株式会社 | 波長可変干渉フィルター、波長可変干渉フィルターの製造方法、光学装置および光学部品 |
| JP5987618B2 (ja) * | 2012-10-03 | 2016-09-07 | セイコーエプソン株式会社 | 波長可変干渉フィルター、光学フィルターデバイス、光学モジュール、及び電子機器 |
| US9429474B2 (en) * | 2012-10-08 | 2016-08-30 | Si-Ware Systems | Fourier transform micro spectrometer based on spatially-shifted interferogram bursts |
| US9466628B2 (en) * | 2012-12-21 | 2016-10-11 | Imec | Spectral imaging device and method to calibrate the same |
| US20140198388A1 (en) * | 2013-01-11 | 2014-07-17 | Gooch And Housego Plc | Fabry-perot device with a movable mirror |
| JP6036341B2 (ja) * | 2013-01-29 | 2016-11-30 | セイコーエプソン株式会社 | 光学モジュール、及び電子機器 |
| JPWO2014119198A1 (ja) * | 2013-01-31 | 2017-01-26 | ギガフォトン株式会社 | レーザ装置及び極端紫外光生成装置 |
| WO2014119199A1 (ja) * | 2013-01-31 | 2014-08-07 | ギガフォトン株式会社 | レーザ装置及び極端紫外光生成装置 |
| JP6194592B2 (ja) * | 2013-02-22 | 2017-09-13 | セイコーエプソン株式会社 | 分光カメラ |
| JP2014164018A (ja) * | 2013-02-22 | 2014-09-08 | Seiko Epson Corp | 波長可変干渉フィルター、光学フィルターデバイス、光学モジュール、及び電子機器 |
| JP2014164068A (ja) * | 2013-02-25 | 2014-09-08 | Seiko Epson Corp | 波長可変干渉フィルター、光学フィルターデバイス、光学モジュール、および電子機器 |
| JP6123360B2 (ja) * | 2013-03-07 | 2017-05-10 | セイコーエプソン株式会社 | 分光測定装置 |
| JP6211833B2 (ja) * | 2013-07-02 | 2017-10-11 | 浜松ホトニクス株式会社 | ファブリペロー干渉フィルタ |
| JP6201484B2 (ja) * | 2013-07-26 | 2017-09-27 | セイコーエプソン株式会社 | 光学フィルターデバイス、光学モジュール、電子機器、及びmemsデバイス |
| EP2857811B1 (de) * | 2013-10-02 | 2015-09-23 | Sick Ag | Spektrometer zur Gasanalyse |
| JP6390090B2 (ja) * | 2013-11-19 | 2018-09-19 | セイコーエプソン株式会社 | 光学フィルターデバイス、光学モジュール、及び電子機器 |
| US20170010153A1 (en) * | 2014-01-30 | 2017-01-12 | Horiba Instruments Incorporated | Spectroscopic mapping system and method |
| US10545049B2 (en) * | 2014-06-27 | 2020-01-28 | Spectral Engines Oy | Method for stabilizing a spectrometer using single spectral notch |
| JP6394189B2 (ja) * | 2014-08-29 | 2018-09-26 | セイコーエプソン株式会社 | 分光画像取得装置、及び分光画像取得方法 |
| CN107250739A (zh) * | 2014-10-23 | 2017-10-13 | 威利食品有限公司 | 手持式光谱仪的附件 |
| US10247604B2 (en) * | 2014-10-30 | 2019-04-02 | Infineon Technologies Ag | Spectrometer, method for manufacturing a spectrometer, and method for operating a spectrometer |
| CN113358223B (zh) * | 2015-10-02 | 2024-08-06 | 浜松光子学株式会社 | 光检测装置 |
| TWI579540B (zh) * | 2015-12-02 | 2017-04-21 | 財團法人工業技術研究院 | 多點光譜系統 |
| EP3184976B1 (en) * | 2015-12-23 | 2024-10-16 | Spectricity | User device comprising a camera and a spectrometer module |
| JP6897226B2 (ja) * | 2017-03-28 | 2021-06-30 | セイコーエプソン株式会社 | 光学モジュール及び光学モジュールの駆動方法 |
| JP7142419B2 (ja) * | 2017-05-01 | 2022-09-27 | 浜松ホトニクス株式会社 | 光計測制御プログラム、光計測システム及び光計測方法 |
| JP7043885B2 (ja) * | 2018-02-26 | 2022-03-30 | セイコーエプソン株式会社 | 分光装置、温度特性導出装置、分光システム、分光方法、及び温度特性導出方法 |
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| CN108955877A (zh) | 2018-12-07 |
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| US20240418981A1 (en) | 2024-12-19 |
| CN108955877B (zh) | 2021-02-09 |
| EP2708861B1 (en) | 2021-10-13 |
| EP2708861A1 (en) | 2014-03-19 |
| EP3929545A1 (en) | 2021-12-29 |
| US20210263298A1 (en) | 2021-08-26 |
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