JP5584011B2 - 半導体パッケージの製造方法 - Google Patents
半導体パッケージの製造方法 Download PDFInfo
- Publication number
- JP5584011B2 JP5584011B2 JP2010108688A JP2010108688A JP5584011B2 JP 5584011 B2 JP5584011 B2 JP 5584011B2 JP 2010108688 A JP2010108688 A JP 2010108688A JP 2010108688 A JP2010108688 A JP 2010108688A JP 5584011 B2 JP5584011 B2 JP 5584011B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor chip
- resin portion
- resin
- layer
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/611—Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together
- H10W70/614—Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together the multiple chips being integrally enclosed
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/0198—Manufacture or treatment batch processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/014—Manufacture or treatment using batch processing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/019—Manufacture or treatment using temporary auxiliary substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
- H10W46/601—Marks applied to devices, e.g. for alignment or identification for use after dicing
- H10W46/603—Formed on wafers or substrates before dicing and remaining on chips after dicing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
- H10W46/601—Marks applied to devices, e.g. for alignment or identification for use after dicing
- H10W46/607—Located on parts of packages, e.g. on encapsulations or on package substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
- H10W70/654—Top-view layouts
- H10W70/655—Fan-out layouts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
- H10W70/682—Shapes or dispositions thereof comprising holes having chips therein
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/29—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9413—Dispositions of bond pads on encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
- H10W74/142—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations exposing the passive side of the semiconductor body
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010108688A JP5584011B2 (ja) | 2010-05-10 | 2010-05-10 | 半導体パッケージの製造方法 |
| US13/094,316 US8431441B2 (en) | 2010-05-10 | 2011-04-26 | Semiconductor package and method of manufacturing same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010108688A JP5584011B2 (ja) | 2010-05-10 | 2010-05-10 | 半導体パッケージの製造方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014056420A Division JP5784775B2 (ja) | 2014-03-19 | 2014-03-19 | 半導体パッケージ及びその製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011238767A JP2011238767A (ja) | 2011-11-24 |
| JP2011238767A5 JP2011238767A5 (https=) | 2013-05-16 |
| JP5584011B2 true JP5584011B2 (ja) | 2014-09-03 |
Family
ID=44901403
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010108688A Expired - Fee Related JP5584011B2 (ja) | 2010-05-10 | 2010-05-10 | 半導体パッケージの製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8431441B2 (https=) |
| JP (1) | JP5584011B2 (https=) |
Families Citing this family (69)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8698303B2 (en) * | 2010-11-23 | 2014-04-15 | Ibiden Co., Ltd. | Substrate for mounting semiconductor, semiconductor device and method for manufacturing semiconductor device |
| JP2012134270A (ja) * | 2010-12-21 | 2012-07-12 | Shinko Electric Ind Co Ltd | 半導体装置及びその製造方法 |
| US9064883B2 (en) * | 2011-08-25 | 2015-06-23 | Intel Mobile Communications GmbH | Chip with encapsulated sides and exposed surface |
| TWI446501B (zh) * | 2012-01-20 | 2014-07-21 | 矽品精密工業股份有限公司 | 承載板、半導體封裝件及其製法 |
| TWI476841B (zh) * | 2012-03-03 | 2015-03-11 | 矽品精密工業股份有限公司 | 半導體封裝件及其製法 |
| JP6124513B2 (ja) * | 2012-05-17 | 2017-05-10 | 新光電気工業株式会社 | 半導体装置及びその製造方法 |
| US9583414B2 (en) | 2013-10-31 | 2017-02-28 | Qorvo Us, Inc. | Silicon-on-plastic semiconductor device and method of making the same |
| US9812350B2 (en) | 2013-03-06 | 2017-11-07 | Qorvo Us, Inc. | Method of manufacture for a silicon-on-plastic semiconductor device with interfacial adhesion layer |
| JP6125317B2 (ja) | 2013-05-09 | 2017-05-10 | 東京応化工業株式会社 | モールド材の処理方法及び構造体の製造方法 |
| JP6171583B2 (ja) * | 2013-05-31 | 2017-08-02 | 富士通株式会社 | 電子装置及びその製造方法 |
| US9704769B2 (en) | 2014-02-27 | 2017-07-11 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of forming encapsulated wafer level chip scale package (EWLCSP) |
| US9837278B2 (en) * | 2014-02-27 | 2017-12-05 | Taiwan Semiconductor Manufacturing Company Ltd. | Wafer level chip scale package and method of manufacturing the same |
| US20150311132A1 (en) * | 2014-04-28 | 2015-10-29 | Taiwan Semiconductor Manufacturing Company, Ltd. | Scribe line structure and method of forming same |
| SG11201610675UA (en) | 2014-07-28 | 2017-01-27 | Intel Corp | A multi-chip-module semiconductor chip package having dense package wiring |
| JP2016039214A (ja) * | 2014-08-06 | 2016-03-22 | イビデン株式会社 | 電子部品内蔵用キャビティ付き配線板及びその製造方法 |
| US10085352B2 (en) | 2014-10-01 | 2018-09-25 | Qorvo Us, Inc. | Method for manufacturing an integrated circuit package |
| US10121718B2 (en) | 2014-11-03 | 2018-11-06 | Qorvo Us, Inc. | Printed circuit module having a semiconductor device with a protective layer in place of a low-resistivity handle layer |
| KR101726241B1 (ko) | 2014-11-12 | 2017-04-12 | 인텔 코포레이션 | 소형 폼 팩터 또는 웨어러블 디바이스를 위한 집적 회로 패키징 기술, 구성, 장치, 조립체 및 방법 |
| US10163674B2 (en) | 2014-11-27 | 2018-12-25 | National Institute Of Advanced Industrial Science And Technology | Circular support substrate for semiconductor |
| US9613831B2 (en) | 2015-03-25 | 2017-04-04 | Qorvo Us, Inc. | Encapsulated dies with enhanced thermal performance |
| US20160343604A1 (en) | 2015-05-22 | 2016-11-24 | Rf Micro Devices, Inc. | Substrate structure with embedded layer for post-processing silicon handle elimination |
| US10276495B2 (en) | 2015-09-11 | 2019-04-30 | Qorvo Us, Inc. | Backside semiconductor die trimming |
| US10147645B2 (en) * | 2015-09-22 | 2018-12-04 | Nxp Usa, Inc. | Wafer level chip scale package with encapsulant |
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| KR101858952B1 (ko) * | 2016-05-13 | 2018-05-18 | 주식회사 네패스 | 반도체 패키지 및 이의 제조 방법 |
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| JP7035014B2 (ja) | 2016-08-12 | 2022-03-14 | コーボ ユーエス,インコーポレイティド | 性能が強化されたウェハレベルパッケージ |
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| JP6864875B2 (ja) | 2019-08-30 | 2021-04-28 | 日亜化学工業株式会社 | 発光モジュール及びその製造方法 |
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| CN115708198A (zh) * | 2021-08-20 | 2023-02-21 | 意法半导体(克洛尔2)公司 | 集成电路互连结构 |
| CN114531134B (zh) * | 2022-04-22 | 2022-07-19 | 深圳新声半导体有限公司 | 一种用于薄膜滤波器芯片级封装的方法和结构 |
| CN119864324B (zh) * | 2025-03-25 | 2025-07-01 | 合肥沛顿存储科技有限公司 | 倒装芯片封装结构中芯片取出再利用的工艺方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000277548A (ja) * | 1999-03-23 | 2000-10-06 | Rohm Co Ltd | 半導体装置の製造方法 |
| US6734534B1 (en) | 2000-08-16 | 2004-05-11 | Intel Corporation | Microelectronic substrate with integrated devices |
| AU2001283257A1 (en) | 2000-08-16 | 2002-02-25 | Intel Corporation | Direct build-up layer on an encapsulated die package |
| JP2002076237A (ja) * | 2000-08-30 | 2002-03-15 | Hitachi Maxell Ltd | 半導体装置及びその製造方法 |
| JP4016825B2 (ja) * | 2002-12-09 | 2007-12-05 | ソニー株式会社 | 半導体装置の製造方法 |
| AU2003221149A1 (en) * | 2003-03-25 | 2004-10-18 | Fujitsu Limited | Method for manufacturing electronic component-mounted board |
| JP4461801B2 (ja) * | 2003-12-25 | 2010-05-12 | カシオ計算機株式会社 | 半導体装置およびその製造方法 |
| JP4265997B2 (ja) * | 2004-07-14 | 2009-05-20 | 富士通マイクロエレクトロニクス株式会社 | 半導体装置及びその製造方法 |
| JP4602208B2 (ja) * | 2004-12-15 | 2010-12-22 | 新光電気工業株式会社 | 電子部品実装構造体及びその製造方法 |
| JP2008210912A (ja) * | 2007-02-26 | 2008-09-11 | Cmk Corp | 半導体装置及びその製造方法 |
| JPWO2008120755A1 (ja) * | 2007-03-30 | 2010-07-15 | 日本電気株式会社 | 機能素子内蔵回路基板及びその製造方法、並びに電子機器 |
-
2010
- 2010-05-10 JP JP2010108688A patent/JP5584011B2/ja not_active Expired - Fee Related
-
2011
- 2011-04-26 US US13/094,316 patent/US8431441B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20110272800A1 (en) | 2011-11-10 |
| US8431441B2 (en) | 2013-04-30 |
| JP2011238767A (ja) | 2011-11-24 |
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