JP5535851B2 - エッチングおよびドーピング複合物質 - Google Patents
エッチングおよびドーピング複合物質 Download PDFInfo
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- JP5535851B2 JP5535851B2 JP2010211256A JP2010211256A JP5535851B2 JP 5535851 B2 JP5535851 B2 JP 5535851B2 JP 2010211256 A JP2010211256 A JP 2010211256A JP 2010211256 A JP2010211256 A JP 2010211256A JP 5535851 B2 JP5535851 B2 JP 5535851B2
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- 238000005530 etching Methods 0.000 title claims abstract description 73
- 239000002131 composite material Substances 0.000 title description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims description 32
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 28
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 28
- 235000011007 phosphoric acid Nutrition 0.000 claims description 16
- 238000002161 passivation Methods 0.000 claims description 14
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 11
- 229910052710 silicon Inorganic materials 0.000 claims description 11
- 239000010703 silicon Substances 0.000 claims description 11
- 239000002562 thickening agent Substances 0.000 claims description 9
- 150000003839 salts Chemical class 0.000 claims description 7
- 239000000654 additive Substances 0.000 claims description 6
- 239000003795 chemical substances by application Substances 0.000 claims description 5
- 239000002904 solvent Substances 0.000 claims description 4
- 239000002318 adhesion promoter Substances 0.000 claims description 3
- 150000003863 ammonium salts Chemical class 0.000 claims description 3
- UEZVMMHDMIWARA-UHFFFAOYSA-N Metaphosphoric acid Chemical compound OP(=O)=O UEZVMMHDMIWARA-UHFFFAOYSA-N 0.000 claims description 2
- 239000002518 antifoaming agent Substances 0.000 claims description 2
- XPPKVPWEQAFLFU-UHFFFAOYSA-N diphosphoric acid Chemical compound OP(O)(=O)OP(O)(O)=O XPPKVPWEQAFLFU-UHFFFAOYSA-N 0.000 claims description 2
- 229940005657 pyrophosphoric acid Drugs 0.000 claims description 2
- 239000013008 thixotropic agent Substances 0.000 claims description 2
- 239000004480 active ingredient Substances 0.000 claims 4
- DLYUQMMRRRQYAE-UHFFFAOYSA-N tetraphosphorus decaoxide Chemical compound O1P(O2)(=O)OP3(=O)OP1(=O)OP2(=O)O3 DLYUQMMRRRQYAE-UHFFFAOYSA-N 0.000 claims 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims 1
- 238000007872 degassing Methods 0.000 claims 1
- 150000005690 diesters Chemical class 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 46
- 230000008569 process Effects 0.000 abstract description 2
- 238000004519 manufacturing process Methods 0.000 description 14
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 13
- 239000000758 substrate Substances 0.000 description 13
- 229910004298 SiO 2 Inorganic materials 0.000 description 10
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 10
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 9
- 238000010438 heat treatment Methods 0.000 description 9
- 239000000203 mixture Substances 0.000 description 8
- 239000011574 phosphorus Substances 0.000 description 8
- 229910052698 phosphorus Inorganic materials 0.000 description 8
- 238000007639 printing Methods 0.000 description 8
- 238000000576 coating method Methods 0.000 description 7
- 239000007789 gas Substances 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 239000012071 phase Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 4
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- 230000009471 action Effects 0.000 description 3
- -1 deaerators Substances 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 230000005284 excitation Effects 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- RLOWWWKZYUNIDI-UHFFFAOYSA-N phosphinic chloride Chemical compound ClP=O RLOWWWKZYUNIDI-UHFFFAOYSA-N 0.000 description 3
- 238000007650 screen-printing Methods 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 229920000881 Modified starch Polymers 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 2
- 229910019142 PO4 Inorganic materials 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- 239000001913 cellulose Substances 0.000 description 2
- 229920002678 cellulose Polymers 0.000 description 2
- 239000002800 charge carrier Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 2
- 230000000873 masking effect Effects 0.000 description 2
- 238000001000 micrograph Methods 0.000 description 2
- 235000019426 modified starch Nutrition 0.000 description 2
- 229910017604 nitric acid Inorganic materials 0.000 description 2
- 238000007649 pad printing Methods 0.000 description 2
- 235000021317 phosphate Nutrition 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- 229920000036 polyvinylpyrrolidone Polymers 0.000 description 2
- 239000001267 polyvinylpyrrolidone Substances 0.000 description 2
- 235000013855 polyvinylpyrrolidone Nutrition 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000005215 recombination Methods 0.000 description 2
- 230000006798 recombination Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- RMAQACBXLXPBSY-UHFFFAOYSA-N silicic acid Chemical compound O[Si](O)(O)O RMAQACBXLXPBSY-UHFFFAOYSA-N 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 159000000000 sodium salts Chemical class 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 239000008107 starch Substances 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 1
- 229910002012 Aerosil® Inorganic materials 0.000 description 1
- 229910002016 Aerosil® 200 Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229920001479 Hydroxyethyl methyl cellulose Chemical class 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 1
- 229910002651 NO3 Inorganic materials 0.000 description 1
- NHNBFGGVMKEFGY-UHFFFAOYSA-N Nitrate Chemical compound [O-][N+]([O-])=O NHNBFGGVMKEFGY-UHFFFAOYSA-N 0.000 description 1
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- 229920003082 Povidone K 90 Polymers 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 229920002472 Starch Polymers 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 125000000129 anionic group Chemical group 0.000 description 1
- 230000003667 anti-reflective effect Effects 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000000872 buffer Substances 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 229920003123 carboxymethyl cellulose sodium Chemical class 0.000 description 1
- 125000002057 carboxymethyl group Chemical group [H]OC(=O)C([H])([H])[*] 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000005352 clarification Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000010017 direct printing Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- 239000001761 ethyl methyl cellulose Substances 0.000 description 1
- 235000010944 ethyl methyl cellulose Nutrition 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 239000001866 hydroxypropyl methyl cellulose Chemical class 0.000 description 1
- 229920003088 hydroxypropyl methyl cellulose Chemical class 0.000 description 1
- 235000010979 hydroxypropyl methyl cellulose Nutrition 0.000 description 1
- 238000007641 inkjet printing Methods 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- 239000003049 inorganic solvent Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000009533 lab test Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- OYLRFHLPEAGKJU-UHFFFAOYSA-N phosphane silicic acid Chemical compound P.[Si](O)(O)(O)O OYLRFHLPEAGKJU-UHFFFAOYSA-N 0.000 description 1
- 239000010452 phosphate Substances 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
- 150000003013 phosphoric acid derivatives Chemical class 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- WQGWDDDVZFFDIG-UHFFFAOYSA-N pyrogallol Chemical compound OC1=CC=CC(O)=C1O WQGWDDDVZFFDIG-UHFFFAOYSA-N 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 239000005368 silicate glass Substances 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 235000019698 starch Nutrition 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 150000005846 sugar alcohols Polymers 0.000 description 1
- 230000008685 targeting Effects 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- JLGLQAWTXXGVEM-UHFFFAOYSA-N triethylene glycol monomethyl ether Chemical compound COCCOCCOCCO JLGLQAWTXXGVEM-UHFFFAOYSA-N 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000003631 wet chemical etching Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31105—Etching inorganic layers
- H01L21/31111—Etching inorganic layers by chemical means
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- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
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- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
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- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02167—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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Description
以下で用いる用語「太陽電池」は、他の材料に基づく太陽電池のタイプとは無関係に、単結晶または多結晶シリコン太陽電池として定義される。
シリコン太陽電池では、予めドーピングされたシリコン基材(通常はpドーピングされたSi、図1の領域1)は、このために、異なる名称の逆の電荷キャリアでドーピングされ(例えばリンによるドーピングはn+伝導をもたらす)、すなわち、p−n遷移が生成される。
1. pドーピングされたSi板前面のテクスチャリング
2. n+ドーピング(通常はリンによる)
3. PSG(リン−ケイ酸ガラス)のエッチング
4. 酸化シリコンまたは窒化シリコン層によるパシベーション/反射防止コーティング
5. 前面および背面の金属化
からなる。
本発明のさらなる考察には、段階4のより詳細な記載が必要である。
非常に複雑で高価な方法のため、これらの方法は実験室段階以上には実施されていない。
これらの方法全てに共通する特徴は、フッ化水素酸またはフッ化水素酸の塩類を用いてパシベーション層を局所的に開放しなければならないことである。さらに、気相でのドーピングはリンスおよび乾燥の段階の後に行わなければならない。
使用されるエッチング媒体は、HF/フッ化物を含まず操作が容易な、鉱酸またはその塩および/またはその混合物であり、溶液またはペーストの形態であってよい。
このエッチングおよびドーピング媒体の選択的適用は、材料消費の点で有利であるばかりでなく、スループットがかなり早いという点でも、レーザーを用いる連続的領域書き込みに比べて有利である。
ペーストがさらにドーピング成分、例えばリンを含む場合、それらは実際のエッチング段階の後のドーピングソースとして作用する。
ペーストは、エッチングすべき表面の所望の領域に一段階で適用される。ペーストを表面に移動させるのに適した自動化が進んだ方法は、印刷法である。スクリーン印刷、ステンシル印刷、パッド印刷およびスタンプ印刷は、当業者に知られた方法である。
a.エッチングおよび随意的にドーピング成分
b.溶媒
c.増粘剤
d.随意的に添加剤、例えば、消泡剤、チクソ性剤(thixotropy agent)、流量調整剤(flow-control agent)、脱気剤(deaerator)、付着促進剤(adhesion promoter)。
・ スターチ/スターチ誘導体、例えばカルボキシメチルスターチ(ナトリウム塩)(商標登録vivastar)、アニオン性ヘテロポリサッカライド
・ アクリレート(商標登録Borchigel)
・ ポリマー、例えばポリビニルアルコール(商標登録Mowiol)、ポリビニルピロリドン(PVP)
・ 拡散性の高いケイ酸、例えば商標登録Aerosil
などである。
より良い理解のためおよび明確化のために、本発明の保護の範囲である例を以下に示すが、これらは本発明をこれらの例のみに限定するには適さない。
ペーストの製造および組成
Aerosil200(Degussa−Huels AG)6gを、100gの85%オルトリン酸(Merck Art.1.00573)中に攪拌する。形成されたペーストは、プロペラ攪拌器を用いてさらに20分間攪拌する。
ペーストの製造および組成
3重量%のPVP K90を、48.5重量%のH3PO4(85%)および48.5重量%の1−メチル−2−ピロリドンからなる混合物中に攪拌する。形成されたペーストは、プロペラ攪拌器を用いてさらに20分間攪拌する。
リンガラス層の除去の後、領域において約1020cm−3の局所的に高いリンによるドーピングを検出することができる。
Claims (6)
- 太陽電池の窒化シリコンのパシベーションおよび反射防止層を選択的にエッチングし、さらにその下のシリコン層をドーピングするためのエッチングおよびドーピングペーストであって、活性成分として、オルトリン酸、メタリン酸、ピロリン酸、それらの塩類、それらのモノエステル、それらのジエステル、およびメタ−五酸化リンからなる群から選択される1種または2種以上を含み、銀粉末を含まない、前記エッチングおよびドーピングペースト。
- エネルギーの熱的な入力を介してエッチングを作用させる、請求項1に記載のエッチングおよびドーピングペースト。
- 活性成分としてオルトリン酸またはその塩類を含む、請求項1または2に記載のエッチングおよびドーピングペースト。
- 活性成分としてオルトリン酸のアンモニウム塩を含む、請求項1〜3のいずれか1項に記載のエッチングおよびドーピングペースト。
- エッチングおよびドーピング成分に加えて、溶媒、増粘剤、および随意的に添加剤、例えば消泡剤、チクソ性剤、流量調整剤、脱気剤および付着促進剤を含む、請求項1〜4のいずれか1項に記載のエッチングおよびドーピングペースト。
- 活性成分を、エッチングおよびドーピングペーストの総重量に基づき、1〜80重量%の濃度範囲で含む、請求項1〜5のいずれか1項に記載のエッチングおよびドーピングペースト。
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2001
- 2001-10-10 DE DE10150040A patent/DE10150040A1/de not_active Withdrawn
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2002
- 2002-09-13 EP EP02774613A patent/EP1435116B1/de not_active Expired - Lifetime
- 2002-09-13 JP JP2003537127A patent/JP4837252B2/ja not_active Expired - Fee Related
- 2002-09-13 US US10/492,308 patent/US7629257B2/en not_active Expired - Fee Related
- 2002-09-13 WO PCT/EP2002/010264 patent/WO2003034504A1/de active Application Filing
- 2002-09-13 AT AT02774613T patent/ATE539451T1/de active
- 2002-09-13 ES ES02774613T patent/ES2379249T3/es not_active Expired - Lifetime
- 2002-10-09 TW TW091123306A patent/TWI292390B/zh not_active IP Right Cessation
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- 2004-04-09 KR KR1020047005301A patent/KR100923040B1/ko not_active IP Right Cessation
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Also Published As
Publication number | Publication date |
---|---|
KR100923040B1 (ko) | 2009-10-22 |
US7629257B2 (en) | 2009-12-08 |
US20040242019A1 (en) | 2004-12-02 |
US20090071540A1 (en) | 2009-03-19 |
US8148191B2 (en) | 2012-04-03 |
EP1435116A1 (de) | 2004-07-07 |
JP2005506705A (ja) | 2005-03-03 |
ATE539451T1 (de) | 2012-01-15 |
JP4837252B2 (ja) | 2011-12-14 |
WO2003034504A1 (de) | 2003-04-24 |
KR20050033530A (ko) | 2005-04-12 |
DE10150040A1 (de) | 2003-04-17 |
TWI292390B (en) | 2008-01-11 |
ES2379249T3 (es) | 2012-04-24 |
JP2011029651A (ja) | 2011-02-10 |
EP1435116B1 (de) | 2011-12-28 |
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