JP5291001B2 - ページ消去機能におけるアドレス変化検出によるデコーディング制御 - Google Patents
ページ消去機能におけるアドレス変化検出によるデコーディング制御 Download PDFInfo
- Publication number
- JP5291001B2 JP5291001B2 JP2009551083A JP2009551083A JP5291001B2 JP 5291001 B2 JP5291001 B2 JP 5291001B2 JP 2009551083 A JP2009551083 A JP 2009551083A JP 2009551083 A JP2009551083 A JP 2009551083A JP 5291001 B2 JP5291001 B2 JP 5291001B2
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- Prior art keywords
- address
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- circuit
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000008859 change Effects 0.000 title claims description 49
- 238000000034 method Methods 0.000 claims abstract description 19
- 230000008569 process Effects 0.000 claims abstract description 5
- 238000001514 detection method Methods 0.000 claims description 27
- 230000000630 rising effect Effects 0.000 claims description 8
- 238000012545 processing Methods 0.000 claims description 4
- 230000008878 coupling Effects 0.000 claims description 3
- 238000010168 coupling process Methods 0.000 claims description 3
- 238000005859 coupling reaction Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 14
- 230000006870 function Effects 0.000 description 14
- 239000000758 substrate Substances 0.000 description 4
- 230000006399 behavior Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
- G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/10—Decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/20—Address safety or protection circuits, i.e. arrangements for preventing unauthorized or accidental access
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Security & Cryptography (AREA)
- Read Only Memory (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/711,043 US7577059B2 (en) | 2007-02-27 | 2007-02-27 | Decoding control with address transition detection in page erase function |
| US11/711,043 | 2007-02-27 | ||
| PCT/CA2008/000252 WO2008104049A1 (en) | 2007-02-27 | 2008-02-08 | Decoding control with address transition detection in page erase function |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013120173A Division JP5544442B2 (ja) | 2007-02-27 | 2013-06-06 | ページ消去機能におけるアドレス変化検出によるデコーディング制御 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010519674A JP2010519674A (ja) | 2010-06-03 |
| JP2010519674A5 JP2010519674A5 (enExample) | 2011-03-03 |
| JP5291001B2 true JP5291001B2 (ja) | 2013-09-18 |
Family
ID=39715719
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009551083A Expired - Fee Related JP5291001B2 (ja) | 2007-02-27 | 2008-02-08 | ページ消去機能におけるアドレス変化検出によるデコーディング制御 |
| JP2013120173A Expired - Fee Related JP5544442B2 (ja) | 2007-02-27 | 2013-06-06 | ページ消去機能におけるアドレス変化検出によるデコーディング制御 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013120173A Expired - Fee Related JP5544442B2 (ja) | 2007-02-27 | 2013-06-06 | ページ消去機能におけるアドレス変化検出によるデコーディング制御 |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US7577059B2 (enExample) |
| EP (1) | EP2132748B1 (enExample) |
| JP (2) | JP5291001B2 (enExample) |
| KR (2) | KR20140019881A (enExample) |
| CN (1) | CN101636790B (enExample) |
| CA (1) | CA2676639A1 (enExample) |
| ES (1) | ES2423283T3 (enExample) |
| TW (1) | TWI456576B (enExample) |
| WO (1) | WO2008104049A1 (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7577059B2 (en) * | 2007-02-27 | 2009-08-18 | Mosaid Technologies Incorporated | Decoding control with address transition detection in page erase function |
| US8189390B2 (en) * | 2009-03-05 | 2012-05-29 | Mosaid Technologies Incorporated | NAND flash architecture with multi-level row decoding |
| KR101636015B1 (ko) * | 2010-02-11 | 2016-07-05 | 삼성전자주식회사 | 불휘발성 데이터 저장 장치, 그것의 프로그램 방법, 그리고 그것을 포함하는 메모리 시스템 |
| KR101605911B1 (ko) | 2010-07-09 | 2016-03-23 | 에스케이하이닉스 주식회사 | 불휘발성 메모리 소자 및 그 소거방법 |
| TWI473114B (zh) * | 2012-03-19 | 2015-02-11 | Macronix Int Co Ltd | 偵測位址轉變之電路與方法 |
| US9047936B2 (en) * | 2012-05-29 | 2015-06-02 | Lsi Corporation | Memory device having control circuitry for write tracking using feedback-based controller |
| KR20140007990A (ko) | 2012-07-09 | 2014-01-21 | 삼성전자주식회사 | 불휘발성 램을 포함하는 사용자 장치 및 그것의 데이터 관리 방법 |
| KR102025088B1 (ko) | 2012-09-03 | 2019-09-25 | 삼성전자 주식회사 | 메모리 컨트롤러 및 상기 메모리 컨트롤러를 포함하는 전자장치 |
| US20140071783A1 (en) * | 2012-09-13 | 2014-03-13 | Lsi Corporation | Memory device with clock generation based on segmented address change detection |
| CN104217751A (zh) * | 2013-06-03 | 2014-12-17 | 辉达公司 | 一种存储器 |
| FR3006804A1 (fr) * | 2013-06-05 | 2014-12-12 | St Microelectronics Rousset | Procede d’effacement par bloc d’une memoire de type eeprom effacable par page |
| EP3023990A1 (en) * | 2014-11-20 | 2016-05-25 | Nxp B.V. | Multi independent page erase |
| CN108962319B (zh) * | 2018-06-20 | 2021-03-26 | 芯天下技术股份有限公司 | 一种译码器控制电路及Nor Flash存储器的版图布局方法 |
| CN110910923A (zh) * | 2018-09-14 | 2020-03-24 | 北京兆易创新科技股份有限公司 | 一种字线译码方法及非易失存储器系统 |
| US11250895B1 (en) * | 2020-11-04 | 2022-02-15 | Qualcomm Incorporated | Systems and methods for driving wordlines using set-reset latches |
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| US5440518A (en) * | 1991-06-12 | 1995-08-08 | Hazani; Emanuel | Non-volatile memory circuits, architecture and methods |
| US5099297A (en) | 1988-02-05 | 1992-03-24 | Emanuel Hazani | EEPROM cell structure and architecture with programming and erase terminals shared between several cells |
| GB8828817D0 (en) * | 1988-12-09 | 1989-01-18 | Int Computers Ltd | Data processing apparatus |
| KR930000869B1 (ko) | 1989-11-30 | 1993-02-08 | 삼성전자 주식회사 | 페이지 소거 가능한 플래쉬형 이이피롬 장치 |
| JPH043394A (ja) * | 1990-04-20 | 1992-01-08 | Citizen Watch Co Ltd | 半導体不揮発性記憶装置 |
| US5256254A (en) * | 1991-07-12 | 1993-10-26 | Betz Paperchem, Inc. | Methods of controlling deposition in a paper machine dryer section |
| US6230233B1 (en) | 1991-09-13 | 2001-05-08 | Sandisk Corporation | Wear leveling techniques for flash EEPROM systems |
| US5270980A (en) | 1991-10-28 | 1993-12-14 | Eastman Kodak Company | Sector erasable flash EEPROM |
| KR950000273B1 (ko) | 1992-02-21 | 1995-01-12 | 삼성전자 주식회사 | 불휘발성 반도체 메모리장치 및 그 최적화 기입방법 |
| KR960000616B1 (ko) | 1993-01-13 | 1996-01-10 | 삼성전자주식회사 | 불휘발성 반도체 메모리 장치 |
| US5365484A (en) | 1993-08-23 | 1994-11-15 | Advanced Micro Devices, Inc. | Independent array grounds for flash EEPROM array with paged erase architechture |
| US5448529A (en) * | 1994-11-17 | 1995-09-05 | Alliance Semiconductor Corporation | High speed and hierarchical address transition detection circuit |
| KR0142367B1 (ko) | 1995-02-04 | 1998-07-15 | 김광호 | 열 리던던씨를 가지는 불휘발성 반도체 메모리의 소거 검증회로 |
| US5835935A (en) | 1995-09-13 | 1998-11-10 | Lexar Media, Inc. | Method of and architecture for controlling system data with automatic wear leveling in a semiconductor non-volatile mass storage memory |
| KR0169418B1 (ko) | 1995-10-30 | 1999-02-01 | 김광호 | 페이지 소거시 데이터의 자기 보존회로를 가지는 불휘발성 반도체 메모리 |
| US5805510A (en) | 1996-10-18 | 1998-09-08 | Kabushiki Kaisha Toshiba | Data erase mechanism for nonvolatile memory of boot block type |
| US6308328B1 (en) * | 1997-01-17 | 2001-10-23 | Scientific-Atlanta, Inc. | Usage statistics collection for a cable data delivery system |
| KR100272037B1 (ko) | 1997-02-27 | 2000-12-01 | 니시무로 타이죠 | 불휘발성 반도체 기억 장치 |
| US5847994A (en) | 1997-09-08 | 1998-12-08 | Mitsubishi Denki Kabushiki Kaisha | Non-volatile semiconductor memory device having a back ground operation mode |
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| JP2000330967A (ja) * | 1999-05-25 | 2000-11-30 | Nec Corp | 半導体記憶装置とその製造方法 |
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| JP2006107326A (ja) * | 2004-10-08 | 2006-04-20 | Oki Electric Ind Co Ltd | 半導体集積回路 |
| JP2006164408A (ja) | 2004-12-08 | 2006-06-22 | Toshiba Corp | 不揮発性半導体記憶装置及びそのデータ消去方法。 |
| KR100672125B1 (ko) | 2005-03-15 | 2007-01-19 | 주식회사 하이닉스반도체 | 사전 소거 검증을 위한 페이지 버퍼를 갖는 불휘발성 메모리 장치 |
| US20060256623A1 (en) | 2005-05-12 | 2006-11-16 | Micron Technology, Inc. | Partial string erase scheme in a flash memory device |
| US7577059B2 (en) | 2007-02-27 | 2009-08-18 | Mosaid Technologies Incorporated | Decoding control with address transition detection in page erase function |
-
2007
- 2007-02-27 US US11/711,043 patent/US7577059B2/en not_active Expired - Fee Related
-
2008
- 2008-02-08 CN CN2008800063130A patent/CN101636790B/zh not_active Expired - Fee Related
- 2008-02-08 KR KR1020147002657A patent/KR20140019881A/ko not_active Ceased
- 2008-02-08 JP JP2009551083A patent/JP5291001B2/ja not_active Expired - Fee Related
- 2008-02-08 KR KR1020097020083A patent/KR101469295B1/ko not_active Expired - Fee Related
- 2008-02-08 CA CA002676639A patent/CA2676639A1/en not_active Abandoned
- 2008-02-08 EP EP08714575.1A patent/EP2132748B1/en not_active Not-in-force
- 2008-02-08 WO PCT/CA2008/000252 patent/WO2008104049A1/en not_active Ceased
- 2008-02-08 ES ES08714575T patent/ES2423283T3/es active Active
- 2008-02-19 TW TW097105784A patent/TWI456576B/zh not_active IP Right Cessation
-
2009
- 2009-04-01 US US12/416,512 patent/US7778107B2/en not_active Expired - Fee Related
-
2013
- 2013-06-06 JP JP2013120173A patent/JP5544442B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP2132748A4 (en) | 2010-04-07 |
| US7577059B2 (en) | 2009-08-18 |
| TWI456576B (zh) | 2014-10-11 |
| US7778107B2 (en) | 2010-08-17 |
| EP2132748A1 (en) | 2009-12-16 |
| EP2132748B1 (en) | 2013-05-22 |
| US20080205164A1 (en) | 2008-08-28 |
| WO2008104049A1 (en) | 2008-09-04 |
| JP5544442B2 (ja) | 2014-07-09 |
| CA2676639A1 (en) | 2008-09-04 |
| ES2423283T3 (es) | 2013-09-19 |
| KR101469295B1 (ko) | 2014-12-04 |
| JP2010519674A (ja) | 2010-06-03 |
| US20090185424A1 (en) | 2009-07-23 |
| KR20140019881A (ko) | 2014-02-17 |
| KR20090125142A (ko) | 2009-12-03 |
| TW200905686A (en) | 2009-02-01 |
| CN101636790B (zh) | 2013-04-03 |
| CN101636790A (zh) | 2010-01-27 |
| JP2013168211A (ja) | 2013-08-29 |
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