JP4768280B2 - 相変化メモリ装置及びそのライティング方法 - Google Patents
相変化メモリ装置及びそのライティング方法 Download PDFInfo
- Publication number
- JP4768280B2 JP4768280B2 JP2005029813A JP2005029813A JP4768280B2 JP 4768280 B2 JP4768280 B2 JP 4768280B2 JP 2005029813 A JP2005029813 A JP 2005029813A JP 2005029813 A JP2005029813 A JP 2005029813A JP 4768280 B2 JP4768280 B2 JP 4768280B2
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- write driver
- memory cell
- memory
- phase change
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0069—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0004—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0023—Address circuits or decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0069—Writing or programming circuits or methods
- G11C2013/0078—Write using current through the cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0069—Writing or programming circuits or methods
- G11C2013/0092—Write characterized by the shape, e.g. form, length, amplitude of the write pulse
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2004-0007112A KR100520228B1 (ko) | 2004-02-04 | 2004-02-04 | 상변화 메모리 장치 및 그에 따른 데이터 라이팅 방법 |
| KR2004-007112 | 2004-02-04 | ||
| US10/919,371 US7110286B2 (en) | 2004-02-04 | 2004-08-17 | Phase-change memory device and method of writing a phase-change memory device |
| US10/919371 | 2004-08-17 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005222687A JP2005222687A (ja) | 2005-08-18 |
| JP2005222687A5 JP2005222687A5 (enExample) | 2008-03-13 |
| JP4768280B2 true JP4768280B2 (ja) | 2011-09-07 |
Family
ID=34829542
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005029813A Expired - Fee Related JP4768280B2 (ja) | 2004-02-04 | 2005-02-04 | 相変化メモリ装置及びそのライティング方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7502251B2 (enExample) |
| JP (1) | JP4768280B2 (enExample) |
| CN (1) | CN1664953B (enExample) |
| DE (1) | DE102005004338B4 (enExample) |
Families Citing this family (54)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080209114A1 (en) * | 1999-08-04 | 2008-08-28 | Super Talent Electronics, Inc. | Reliability High Endurance Non-Volatile Memory Device with Zone-Based Non-Volatile Memory File System |
| US7889544B2 (en) | 2004-04-05 | 2011-02-15 | Super Talent Electronics, Inc. | High-speed controller for phase-change memory peripheral device |
| US7471556B2 (en) * | 2007-05-15 | 2008-12-30 | Super Talent Electronics, Inc. | Local bank write buffers for accelerating a phase-change memory |
| US7966429B2 (en) * | 2007-05-28 | 2011-06-21 | Super Talent Electronics, Inc. | Peripheral devices using phase-change memory |
| US20080195798A1 (en) * | 2000-01-06 | 2008-08-14 | Super Talent Electronics, Inc. | Non-Volatile Memory Based Computer Systems and Methods Thereof |
| US20110029723A1 (en) * | 2004-08-06 | 2011-02-03 | Super Talent Electronics, Inc. | Non-Volatile Memory Based Computer Systems |
| JP4469319B2 (ja) * | 2005-06-17 | 2010-05-26 | シャープ株式会社 | 半導体記憶装置 |
| US7907435B2 (en) * | 2005-09-21 | 2011-03-15 | Renesas Electronics Corporation | Semiconductor device |
| KR100857742B1 (ko) | 2006-03-31 | 2008-09-10 | 삼성전자주식회사 | 상 변화 메모리 장치 및 그것의 프로그램 전류 인가 방법 |
| US7499316B2 (en) | 2006-03-31 | 2009-03-03 | Samsung Electronics Co., Ltd. | Phase change memory devices and program methods |
| KR100791341B1 (ko) * | 2006-09-04 | 2008-01-03 | 삼성전자주식회사 | 비휘발성 메모리 장치의 기입 방법 및 그 방법을 사용하는비휘발성 메모리 장치 |
| TWI330846B (en) * | 2007-03-08 | 2010-09-21 | Ind Tech Res Inst | A writing method and system for a phase change memory |
| US7579616B2 (en) * | 2007-04-10 | 2009-08-25 | International Business Machines Corporation | Four-terminal programmable via-containing structure and method of fabricating same |
| US7643334B1 (en) | 2007-04-26 | 2010-01-05 | Super Talent Electronics, Inc. | High-speed controller for phase-change memory peripheral device |
| US20080270811A1 (en) * | 2007-04-26 | 2008-10-30 | Super Talent Electronics Inc. | Fast Suspend-Resume of Computer Motherboard Using Phase-Change Memory |
| US7440316B1 (en) | 2007-04-30 | 2008-10-21 | Super Talent Electronics, Inc | 8/9 and 8/10-bit encoding to reduce peak surge currents when writing phase-change memory |
| US7577023B2 (en) * | 2007-05-04 | 2009-08-18 | Qimonda North America Corp. | Memory including write circuit for providing multiple reset pulses |
| KR101311499B1 (ko) * | 2007-08-23 | 2013-09-25 | 삼성전자주식회사 | 가변 저항 메모리 장치 및 그것의 프로그램 방법 |
| US8027186B2 (en) * | 2007-09-26 | 2011-09-27 | Intel Corporation | Programming a phase change memory |
| KR101408876B1 (ko) | 2007-11-13 | 2014-06-18 | 삼성전자주식회사 | 상 변화 메모리 장치의 기입 드라이버 회로 |
| TWI358827B (en) | 2007-11-26 | 2012-02-21 | Nanya Technology Corp | Data programming circuits and memory programming m |
| KR101291222B1 (ko) * | 2007-11-29 | 2013-07-31 | 삼성전자주식회사 | 상변화 메모리 소자의 동작 방법 |
| CN101458959B (zh) * | 2007-12-12 | 2011-09-21 | 南亚科技股份有限公司 | 数据编程电路 |
| KR101369362B1 (ko) * | 2008-01-09 | 2014-03-05 | 삼성전자주식회사 | 상 변화 메모리 장치, 이의 리던던시 셀 테스트 방법 및액세스 방법 |
| JP5106297B2 (ja) | 2008-07-30 | 2012-12-26 | 株式会社東芝 | 半導体記憶装置 |
| KR101086858B1 (ko) | 2009-04-15 | 2011-11-25 | 주식회사 하이닉스반도체 | 라이트 전압을 생성하는 비휘발성 반도체 메모리 회로 |
| US8488362B2 (en) | 2009-04-29 | 2013-07-16 | Macronix International Co., Ltd. | Graded metal oxide resistance based semiconductor memory device |
| JP2011040112A (ja) | 2009-08-06 | 2011-02-24 | Toshiba Corp | 不揮発性半導体記憶装置 |
| KR20110015907A (ko) * | 2009-08-10 | 2011-02-17 | 삼성전자주식회사 | 저항체를 이용한 멀티 레벨 메모리 장치 |
| KR101176503B1 (ko) * | 2009-09-04 | 2012-08-24 | 에스케이하이닉스 주식회사 | 라이트 드라이버를 구비한 상변화 메모리 장치 |
| WO2011074021A1 (en) | 2009-12-18 | 2011-06-23 | Mattia Boniardi | Modified reset state for enhanced read margin of phase change memory |
| CN101770807B (zh) * | 2009-12-29 | 2013-03-27 | 中国科学院上海微系统与信息技术研究所 | 相变存储器的写优化电路及其写优化方法 |
| KR101583738B1 (ko) | 2009-12-30 | 2016-01-12 | 에스케이하이닉스 주식회사 | 비휘발성 메모리 장치 |
| US8582353B2 (en) * | 2009-12-30 | 2013-11-12 | Hynix Semiconductor Inc. | Nonvolatile memory device |
| EP2355105B1 (en) * | 2010-02-02 | 2013-01-09 | Nxp B.V. | Phase change memory programming method and phase change memory |
| KR101131552B1 (ko) | 2010-02-24 | 2012-04-04 | 주식회사 하이닉스반도체 | 상 변화 메모리 장치 |
| US8526227B2 (en) | 2010-06-23 | 2013-09-03 | Mosaid Technologies Incorporated | Phase change memory word line driver |
| US8699258B2 (en) | 2011-01-21 | 2014-04-15 | Macronix International Co., Ltd. | Verification algorithm for metal-oxide resistive memory |
| WO2013061191A1 (en) | 2011-10-28 | 2013-05-02 | International Business Machines Corporation | Conditioning phase change memory cells |
| US9082496B2 (en) * | 2013-02-07 | 2015-07-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for adaptive timing write control in a memory |
| CN103839580B (zh) * | 2014-02-25 | 2016-08-17 | 中国科学院计算技术研究所 | 一种相变存储器写加速方法及其系统 |
| KR102217243B1 (ko) * | 2014-10-28 | 2021-02-18 | 삼성전자주식회사 | 저항성 메모리 장치, 저항성 메모리 시스템 및 저항성 메모리 장치의 동작방법 |
| CN105810242A (zh) * | 2016-03-02 | 2016-07-27 | 中国科学院上海微系统与信息技术研究所 | 一种相变存储器和提高其疲劳寿命的操作方法 |
| CN105869671B (zh) * | 2016-03-25 | 2018-09-25 | 中国科学院上海微系统与信息技术研究所 | 相变存储器单元的写初始化方法及其阵列的写初始化方法 |
| KR20180032391A (ko) | 2016-09-22 | 2018-03-30 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 |
| DE102018100391B4 (de) * | 2017-04-24 | 2025-06-12 | Taiwan Semiconductor Manufacturing Co., Ltd. | Speicherbaustein zum Erzeugen von Wortleitungssignalen mit veränderlichen Impulsbreiten |
| US10276223B2 (en) * | 2017-04-24 | 2019-04-30 | Taiwan Semiconductor Manufacturing Company Limited | Memory device for generating word line signals having varying pulse widths |
| KR102449194B1 (ko) | 2017-11-17 | 2022-09-29 | 삼성전자주식회사 | 공통 모드 추출기를 포함하는 메모리 장치 |
| KR102749204B1 (ko) * | 2019-04-22 | 2025-01-06 | 삼성전자주식회사 | 상이한 동작 모드들에서 동작하는 뱅크들을 포함하는 불휘발성 메모리 장치, 메모리 컨트롤러의 동작 방법, 및 불휘발성 메모리 장치 및 메모리 컨트롤러를 포함하는 저장 장치 |
| IT201900011523A1 (it) * | 2019-07-11 | 2021-01-11 | St Microelectronics Srl | Memoria a cambiamento di fase con circuito di regolazione della tensione di alimentazione |
| KR102778101B1 (ko) * | 2019-08-21 | 2025-03-11 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치, 이를 포함하는 반도체 메모리 시스템, 및 반도체 메모리 시스템의 구동방법 |
| IT201900019976A1 (it) * | 2019-10-29 | 2021-04-29 | St Microelectronics Srl | Metodo di programmazione di un dispositivo di memoria a cambiamento di fase di tipo differenziale, dispositivo di memoria a cambiamento di fase, e sistema elettronico |
| CN110797064A (zh) * | 2019-10-31 | 2020-02-14 | 重庆邮电大学 | 一种低功耗的相变存储器初始化操作方法 |
| CN115035933B (zh) * | 2022-06-30 | 2025-04-01 | 长江先进存储产业创新中心有限责任公司 | 一种相变存储器的操作方法、相变存储器及存储器系统 |
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| US3922648A (en) * | 1974-08-19 | 1975-11-25 | Energy Conversion Devices Inc | Method and means for preventing degradation of threshold voltage of filament-forming memory semiconductor device |
| US5166758A (en) * | 1991-01-18 | 1992-11-24 | Energy Conversion Devices, Inc. | Electrically erasable phase change memory |
| DE69318842T2 (de) * | 1993-12-02 | 1998-12-24 | Stmicroelectronics S.R.L., Agrate Brianza, Mailand/Milano | Vorspannungsschaltung für einen Treiber eines Speicherleitungsdekodierer für nichtflüchtige Speicher |
| US5586080A (en) * | 1995-06-26 | 1996-12-17 | Micron Technology, Inc. | Local word line phase driver |
| US6480438B1 (en) * | 2001-06-12 | 2002-11-12 | Ovonyx, Inc. | Providing equal cell programming conditions across a large and high density array of phase-change memory cells |
| US6570784B2 (en) * | 2001-06-29 | 2003-05-27 | Ovonyx, Inc. | Programming a phase-change material memory |
| JP2003109389A (ja) * | 2001-09-28 | 2003-04-11 | Fujitsu Ltd | 半導体記憶装置 |
| US6625054B2 (en) * | 2001-12-28 | 2003-09-23 | Intel Corporation | Method and apparatus to program a phase change memory |
| JP2004110871A (ja) * | 2002-09-13 | 2004-04-08 | Fujitsu Ltd | 不揮発性半導体記憶装置 |
| JP2004158119A (ja) * | 2002-11-06 | 2004-06-03 | Sharp Corp | 不揮発性半導体記憶装置 |
| US6813177B2 (en) * | 2002-12-13 | 2004-11-02 | Ovoynx, Inc. | Method and system to store information |
| US6937507B2 (en) * | 2003-12-05 | 2005-08-30 | Silicon Storage Technology, Inc. | Memory device and method of operating same |
| KR100520228B1 (ko) * | 2004-02-04 | 2005-10-11 | 삼성전자주식회사 | 상변화 메모리 장치 및 그에 따른 데이터 라이팅 방법 |
-
2005
- 2005-01-25 DE DE102005004338A patent/DE102005004338B4/de not_active Expired - Fee Related
- 2005-02-02 CN CN2005100062460A patent/CN1664953B/zh not_active Expired - Fee Related
- 2005-02-04 JP JP2005029813A patent/JP4768280B2/ja not_active Expired - Fee Related
-
2006
- 2006-08-11 US US11/502,563 patent/US7502251B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US20060274574A1 (en) | 2006-12-07 |
| JP2005222687A (ja) | 2005-08-18 |
| CN1664953A (zh) | 2005-09-07 |
| US7502251B2 (en) | 2009-03-10 |
| DE102005004338B4 (de) | 2009-04-09 |
| DE102005004338A1 (de) | 2005-09-01 |
| CN1664953B (zh) | 2011-09-28 |
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