JP4151164B2 - 半導体装置の製造方法 - Google Patents
半導体装置の製造方法 Download PDFInfo
- Publication number
- JP4151164B2 JP4151164B2 JP19634599A JP19634599A JP4151164B2 JP 4151164 B2 JP4151164 B2 JP 4151164B2 JP 19634599 A JP19634599 A JP 19634599A JP 19634599 A JP19634599 A JP 19634599A JP 4151164 B2 JP4151164 B2 JP 4151164B2
- Authority
- JP
- Japan
- Prior art keywords
- protective sheet
- jig
- semiconductor wafer
- manufacturing
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H10P72/7402—
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00865—Multistep processes for the separation of wafers into individual elements
- B81C1/00888—Multistep processes involving only mechanical separation, e.g. grooving followed by cleaving
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00865—Multistep processes for the separation of wafers into individual elements
- B81C1/00896—Temporary protection during separation into individual elements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/02—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
- B29C43/021—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles characterised by the shape of the surface
- B29C2043/023—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles characterised by the shape of the surface having a plurality of grooves
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/0022—Multi-cavity moulds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/05—Temporary protection of devices or parts of the devices during manufacturing
- B81C2201/053—Depositing a protective layers
-
- H10P72/7416—
-
- H10W72/07251—
-
- H10W72/20—
-
- H10W72/536—
-
- H10W72/5363—
-
- H10W72/5366—
-
- H10W72/5522—
-
- H10W72/5524—
-
- H10W72/884—
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Dicing (AREA)
- Micromachines (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19634599A JP4151164B2 (ja) | 1999-03-19 | 1999-07-09 | 半導体装置の製造方法 |
| US09/525,514 US6429506B1 (en) | 1999-03-19 | 2000-03-15 | Semiconductor device produced by dicing |
| DE10013067A DE10013067B4 (de) | 1999-03-19 | 2000-03-17 | Verfahren zum Herstellen von einer Halbleitervorrichtung durch Chipvereinzelung und Wafer-Lösevorrichtung |
| US10/091,497 US6787866B2 (en) | 1999-03-19 | 2002-03-07 | Semiconductor device having a moveable member therein and a protective member disposed thereon |
| US10/896,042 US7091109B2 (en) | 1999-03-19 | 2004-07-22 | Semiconductor device and method for producing the same by dicing |
| US11/075,881 US7298022B2 (en) | 1999-03-19 | 2005-03-10 | Semiconductor sensor |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7656699 | 1999-03-19 | ||
| JP11-76566 | 1999-03-19 | ||
| JP19634599A JP4151164B2 (ja) | 1999-03-19 | 1999-07-09 | 半導体装置の製造方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008054386A Division JP4636096B2 (ja) | 1999-03-19 | 2008-03-05 | 半導体装置およびその製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000340526A JP2000340526A (ja) | 2000-12-08 |
| JP2000340526A5 JP2000340526A5 (enExample) | 2005-10-27 |
| JP4151164B2 true JP4151164B2 (ja) | 2008-09-17 |
Family
ID=26417706
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19634599A Expired - Fee Related JP4151164B2 (ja) | 1999-03-19 | 1999-07-09 | 半導体装置の製造方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (4) | US6429506B1 (enExample) |
| JP (1) | JP4151164B2 (enExample) |
| DE (1) | DE10013067B4 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020167276A (ja) * | 2019-03-29 | 2020-10-08 | 三井化学東セロ株式会社 | 電子装置の製造方法 |
Families Citing this family (79)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000223446A (ja) * | 1998-11-27 | 2000-08-11 | Denso Corp | 半導体装置およびその製造方法 |
| JP4636096B2 (ja) * | 1999-03-19 | 2011-02-23 | 株式会社デンソー | 半導体装置およびその製造方法 |
| TW522531B (en) * | 2000-10-20 | 2003-03-01 | Matsushita Electric Industrial Co Ltd | Semiconductor device, method of manufacturing the device and mehtod of mounting the device |
| JP3748375B2 (ja) * | 2000-11-24 | 2006-02-22 | シャープ株式会社 | 半導体チップのピックアップ装置 |
| WO2002074686A2 (en) * | 2000-12-05 | 2002-09-26 | Analog Devices, Inc. | A method and device for protecting micro electromechanical systems structures during dicing of a wafer |
| US6995034B2 (en) * | 2000-12-07 | 2006-02-07 | Reflectivity, Inc | Methods for depositing, releasing and packaging micro-electromechanical devices on wafer substrates |
| AUPR245301A0 (en) * | 2001-01-10 | 2001-02-01 | Silverbrook Research Pty Ltd | An apparatus (WSM06) |
| AUPR245501A0 (en) | 2001-01-10 | 2001-02-01 | Silverbrook Research Pty Ltd | An apparatus (WSM08) |
| AUPR245001A0 (en) * | 2001-01-10 | 2001-02-01 | Silverbrook Research Pty Ltd | A method (WSM03) |
| AU2004202411B2 (en) * | 2001-01-10 | 2005-11-10 | Silverbrook Research Pty Ltd | An apparatus for fabricating packaged semiconductor devices |
| AUPR245101A0 (en) * | 2001-01-10 | 2001-02-01 | Silverbrook Research Pty Ltd | A method (WSM04) |
| AUPR244801A0 (en) * | 2001-01-10 | 2001-02-01 | Silverbrook Research Pty Ltd | A method and apparatus (WSM01) |
| AU2002218868C1 (en) * | 2001-01-10 | 2005-11-10 | Silverbrook Research Pty Ltd | Accelerometer protected by caps applied at the wafer scale |
| US6544898B2 (en) * | 2001-06-25 | 2003-04-08 | Adc Telecommunications, Inc. | Method for improved die release of a semiconductor device from a wafer |
| DE10149689A1 (de) * | 2001-10-09 | 2003-04-10 | Philips Corp Intellectual Pty | Elektrisches oder elektronische Bauteil und Verfahren zum Herstellen desselben |
| JP3857118B2 (ja) * | 2001-12-04 | 2006-12-13 | 富士通株式会社 | レジンダイヤモンドブレード及び該ブレードを使用した光導波路の製造方法 |
| SG115459A1 (en) * | 2002-03-04 | 2005-10-28 | Micron Technology Inc | Flip chip packaging using recessed interposer terminals |
| JP3831287B2 (ja) * | 2002-04-08 | 2006-10-11 | 株式会社日立製作所 | 半導体装置の製造方法 |
| US6582983B1 (en) * | 2002-07-12 | 2003-06-24 | Keteca Singapore Singapore | Method and wafer for maintaining ultra clean bonding pads on a wafer |
| JP2004055860A (ja) * | 2002-07-22 | 2004-02-19 | Renesas Technology Corp | 半導体装置の製造方法 |
| US7514283B2 (en) | 2003-03-20 | 2009-04-07 | Robert Bosch Gmbh | Method of fabricating electromechanical device having a controlled atmosphere |
| US7994877B1 (en) | 2008-11-10 | 2011-08-09 | Hrl Laboratories, Llc | MEMS-based quartz hybrid filters and a method of making the same |
| US8766745B1 (en) | 2007-07-25 | 2014-07-01 | Hrl Laboratories, Llc | Quartz-based disk resonator gyro with ultra-thin conductive outer electrodes and method of making same |
| US6936491B2 (en) | 2003-06-04 | 2005-08-30 | Robert Bosch Gmbh | Method of fabricating microelectromechanical systems and devices having trench isolated contacts |
| US7075160B2 (en) | 2003-06-04 | 2006-07-11 | Robert Bosch Gmbh | Microelectromechanical systems and devices having thin film encapsulated mechanical structures |
| US6952041B2 (en) | 2003-07-25 | 2005-10-04 | Robert Bosch Gmbh | Anchors for microelectromechanical systems having an SOI substrate, and method of fabricating same |
| JP2005051150A (ja) * | 2003-07-31 | 2005-02-24 | Seiko Epson Corp | 半導体装置及びその製造方法、回路基板並びに電子機器 |
| US7005317B2 (en) * | 2003-10-27 | 2006-02-28 | Intel Corporation | Controlled fracture substrate singulation |
| US7068125B2 (en) | 2004-03-04 | 2006-06-27 | Robert Bosch Gmbh | Temperature controlled MEMS resonator and method for controlling resonator frequency |
| US7102467B2 (en) | 2004-04-28 | 2006-09-05 | Robert Bosch Gmbh | Method for adjusting the frequency of a MEMS resonator |
| US7534702B2 (en) * | 2004-06-29 | 2009-05-19 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing a semiconductor device |
| US20060099733A1 (en) * | 2004-11-09 | 2006-05-11 | Geefay Frank S | Semiconductor package and fabrication method |
| DE602005001386T2 (de) * | 2004-11-26 | 2008-02-14 | Stmicroelectronics S.A. | Verfahren zur Häusung von Mikrobauteilen mittels einer Pressform |
| US7897436B2 (en) * | 2004-11-26 | 2011-03-01 | Stmicroelectronics, S.A. | Process for packaging micro-components using a matrix |
| JP4528668B2 (ja) * | 2005-05-17 | 2010-08-18 | Okiセミコンダクタ株式会社 | 半導体装置の製造方法 |
| JP4552783B2 (ja) * | 2005-07-06 | 2010-09-29 | 株式会社デンソー | 半導体センサ |
| JP2007095780A (ja) * | 2005-09-27 | 2007-04-12 | Oki Electric Ind Co Ltd | 半導体装置製造用治具と半導体装置製造方法 |
| US7723718B1 (en) * | 2005-10-11 | 2010-05-25 | SemiLEDs Optoelectronics Co., Ltd. | Epitaxial structure for metal devices |
| US8153464B2 (en) * | 2005-10-18 | 2012-04-10 | International Rectifier Corporation | Wafer singulation process |
| US7838331B2 (en) * | 2005-11-16 | 2010-11-23 | Denso Corporation | Method for dicing semiconductor substrate |
| US20070155131A1 (en) * | 2005-12-21 | 2007-07-05 | Intel Corporation | Method of singulating a microelectronic wafer |
| US20070170528A1 (en) | 2006-01-20 | 2007-07-26 | Aaron Partridge | Wafer encapsulated microelectromechanical structure and method of manufacturing same |
| US7452739B2 (en) * | 2006-03-09 | 2008-11-18 | Semi-Photonics Co., Ltd. | Method of separating semiconductor dies |
| US7968379B2 (en) * | 2006-03-09 | 2011-06-28 | SemiLEDs Optoelectronics Co., Ltd. | Method of separating semiconductor dies |
| US7682860B2 (en) * | 2006-03-21 | 2010-03-23 | Dalsa Semiconductor Inc. | Protection capsule for MEMS devices |
| TWI293201B (en) * | 2006-03-24 | 2008-02-01 | Advanced Semiconductor Eng | Manufacturing method of a package structure |
| US20070232107A1 (en) * | 2006-04-03 | 2007-10-04 | Denso Corporation | Cap attachment structure, semiconductor sensor device and method |
| US7555824B2 (en) * | 2006-08-09 | 2009-07-07 | Hrl Laboratories, Llc | Method for large scale integration of quartz-based devices |
| JP4957158B2 (ja) * | 2006-10-02 | 2012-06-20 | 株式会社デンソー | 電子装置の製造方法 |
| US10266398B1 (en) | 2007-07-25 | 2019-04-23 | Hrl Laboratories, Llc | ALD metal coatings for high Q MEMS structures |
| JP5074125B2 (ja) * | 2007-08-09 | 2012-11-14 | リンテック株式会社 | 固定治具並びにワークの処理方法 |
| US8048781B2 (en) * | 2008-01-24 | 2011-11-01 | National Semiconductor Corporation | Methods and systems for packaging integrated circuits |
| US8151640B1 (en) | 2008-02-05 | 2012-04-10 | Hrl Laboratories, Llc | MEMS on-chip inertial navigation system with error correction |
| US7802356B1 (en) | 2008-02-21 | 2010-09-28 | Hrl Laboratories, Llc | Method of fabricating an ultra thin quartz resonator component |
| EP2098478A1 (en) * | 2008-03-07 | 2009-09-09 | Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO | Manufacturing micro components including a cover structure. |
| DE102008040775A1 (de) * | 2008-07-28 | 2010-02-04 | Robert Bosch Gmbh | Verkapselung, MEMS sowie Verfahren zum selektiven Verkapseln |
| US8176607B1 (en) | 2009-10-08 | 2012-05-15 | Hrl Laboratories, Llc | Method of fabricating quartz resonators |
| US8912711B1 (en) | 2010-06-22 | 2014-12-16 | Hrl Laboratories, Llc | Thermal stress resistant resonator, and a method for fabricating same |
| US8623763B2 (en) * | 2011-06-01 | 2014-01-07 | Texas Instruments Incorporated | Protective layer for protecting TSV tips during thermo-compressive bonding |
| US9250074B1 (en) | 2013-04-12 | 2016-02-02 | Hrl Laboratories, Llc | Resonator assembly comprising a silicon resonator and a quartz resonator |
| US9599470B1 (en) | 2013-09-11 | 2017-03-21 | Hrl Laboratories, Llc | Dielectric high Q MEMS shell gyroscope structure |
| US10224260B2 (en) | 2013-11-26 | 2019-03-05 | Infineon Technologies Ag | Semiconductor package with air gap |
| US9977097B1 (en) | 2014-02-21 | 2018-05-22 | Hrl Laboratories, Llc | Micro-scale piezoelectric resonating magnetometer |
| US9991863B1 (en) | 2014-04-08 | 2018-06-05 | Hrl Laboratories, Llc | Rounded and curved integrated tethers for quartz resonators |
| US10308505B1 (en) | 2014-08-11 | 2019-06-04 | Hrl Laboratories, Llc | Method and apparatus for the monolithic encapsulation of a micro-scale inertial navigation sensor suite |
| US9967984B1 (en) | 2015-01-14 | 2018-05-08 | Vlt, Inc. | Power adapter packaging |
| US10031191B1 (en) | 2015-01-16 | 2018-07-24 | Hrl Laboratories, Llc | Piezoelectric magnetometer capable of sensing a magnetic field in multiple vectors |
| US10264664B1 (en) | 2015-06-04 | 2019-04-16 | Vlt, Inc. | Method of electrically interconnecting circuit assemblies |
| US10110198B1 (en) | 2015-12-17 | 2018-10-23 | Hrl Laboratories, Llc | Integrated quartz MEMS tuning fork resonator/oscillator |
| US10175307B1 (en) | 2016-01-15 | 2019-01-08 | Hrl Laboratories, Llc | FM demodulation system for quartz MEMS magnetometer |
| DE102016113347A1 (de) | 2016-07-20 | 2018-01-25 | Infineon Technologies Ag | Verfahren zum produzieren eines halbleitermoduls |
| CN111432978B (zh) * | 2017-09-13 | 2022-10-28 | 诚解电子私人有限公司 | 用于以聚合物树脂铸模化合物为基底的基板的切割方法及其系统 |
| DE102020103732B4 (de) | 2020-02-13 | 2023-02-16 | Infineon Technologies Ag | Verfahren mit mechanischem Dicing-Prozess zur Herstellung von MEMS-Bauelementen |
| CN111892013A (zh) * | 2020-06-28 | 2020-11-06 | 深圳清华大学研究院 | 一种硅基底薄膜的制备方法 |
| TWI761060B (zh) * | 2021-02-03 | 2022-04-11 | 南茂科技股份有限公司 | 薄膜覆晶封裝結構 |
| JP2022125682A (ja) * | 2021-02-17 | 2022-08-29 | レノボ・シンガポール・プライベート・リミテッド | 電子基板および電子機器 |
| DE102022114332B3 (de) | 2022-06-08 | 2023-10-12 | Audi Aktiengesellschaft | Verfahren zur Montage eines Gehäuses |
| DE102023202714A1 (de) | 2023-03-24 | 2024-09-26 | Robert Bosch Gesellschaft mit beschränkter Haftung | Herstellung einer MEMS-basierten Vorrichtung unter Zuhilfenahme von temporären Schutzkappen |
| WO2025168326A1 (de) * | 2024-02-05 | 2025-08-14 | Robert Bosch Gmbh | Verfahren zur handhabung von mems-chips |
Family Cites Families (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2535173A1 (de) * | 1973-01-30 | 1977-02-24 | Siemens Ag | Verfahren zum herstellen einer feuchtedichten umhuellung fuer elektrische bauelemente oder bauelementekombinationen |
| US4921564A (en) | 1988-05-23 | 1990-05-01 | Semiconductor Equipment Corp. | Method and apparatus for removing circuit chips from wafer handling tape |
| US5362681A (en) | 1992-07-22 | 1994-11-08 | Anaglog Devices, Inc. | Method for separating circuit dies from a wafer |
| US5435876A (en) | 1993-03-29 | 1995-07-25 | Texas Instruments Incorporated | Grid array masking tape process |
| JPH06347475A (ja) | 1993-06-08 | 1994-12-22 | Murata Mfg Co Ltd | 加速度センサおよびその製造方法 |
| FR2710741B1 (fr) * | 1993-09-30 | 1995-10-27 | Commissariat Energie Atomique | Capteur électronique destiné à la caractérisation de grandeurs physiques et procédé de réalisation d'un tel capteur. |
| EP0759231B1 (de) * | 1994-05-02 | 1998-12-23 | SIEMENS MATSUSHITA COMPONENTS GmbH & CO. KG | Verkapselung für elektronische bauelemente |
| US5597767A (en) | 1995-01-06 | 1997-01-28 | Texas Instruments Incorporated | Separation of wafer into die with wafer-level processing |
| JP3463398B2 (ja) | 1995-03-10 | 2003-11-05 | 株式会社デンソー | 半導体装置の製造方法 |
| JP3646349B2 (ja) | 1995-05-17 | 2005-05-11 | 株式会社デンソー | 半導体装置の製造方法 |
| JP3613838B2 (ja) * | 1995-05-18 | 2005-01-26 | 株式会社デンソー | 半導体装置の製造方法 |
| JP3496347B2 (ja) | 1995-07-13 | 2004-02-09 | 株式会社デンソー | 半導体装置及びその製造方法 |
| US5872051A (en) * | 1995-08-02 | 1999-02-16 | International Business Machines Corporation | Process for transferring material to semiconductor chip conductive pads using a transfer substrate |
| EP0794616B1 (en) * | 1996-03-08 | 2003-01-29 | Matsushita Electric Industrial Co., Ltd. | An electronic part and a method of production thereof |
| US5859475A (en) * | 1996-04-24 | 1999-01-12 | Amkor Technology, Inc. | Carrier strip and molded flex circuit ball grid array |
| US5965933A (en) * | 1996-05-28 | 1999-10-12 | Young; William R. | Semiconductor packaging apparatus |
| JPH1090299A (ja) * | 1996-09-12 | 1998-04-10 | Mitsubishi Electric Corp | 静電容量式加速度センサ |
| JPH10242253A (ja) | 1997-02-28 | 1998-09-11 | Denso Corp | 半導体基板の保護シート剥離方法及び半導体基板の保護シート剥離装置 |
| US6316288B1 (en) * | 1997-03-21 | 2001-11-13 | Seiko Epson Corporation | Semiconductor device and methods of manufacturing film camera tape |
| JPH10270496A (ja) * | 1997-03-27 | 1998-10-09 | Hitachi Ltd | 電子装置、情報処理装置、半導体装置並びに半導体チップの実装方法 |
| US6069392A (en) * | 1997-04-11 | 2000-05-30 | California Institute Of Technology | Microbellows actuator |
| JP3335575B2 (ja) * | 1997-06-06 | 2002-10-21 | 松下電器産業株式会社 | 半導体装置およびその製造方法 |
| JPH1154658A (ja) * | 1997-07-30 | 1999-02-26 | Hitachi Ltd | 半導体装置及びその製造方法並びにフレーム構造体 |
| TW434646B (en) * | 1997-11-21 | 2001-05-16 | Rohm Co Ltd | Semiconductor device and method for making the same |
| JP3481117B2 (ja) * | 1998-02-25 | 2003-12-22 | 富士通株式会社 | 半導体装置及びその製造方法 |
| JP3846094B2 (ja) * | 1998-03-17 | 2006-11-15 | 株式会社デンソー | 半導体装置の製造方法 |
| US6333565B1 (en) * | 1998-03-23 | 2001-12-25 | Seiko Epson Corporation | Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument |
| US6287885B1 (en) * | 1998-05-08 | 2001-09-11 | Denso Corporation | Method for manufacturing semiconductor dynamic quantity sensor |
| JP3506211B2 (ja) * | 1998-05-28 | 2004-03-15 | シャープ株式会社 | 絶縁性配線基板及び樹脂封止型半導体装置 |
| JP3310617B2 (ja) * | 1998-05-29 | 2002-08-05 | シャープ株式会社 | 樹脂封止型半導体装置及びその製造方法 |
| JP2000100851A (ja) * | 1998-09-25 | 2000-04-07 | Sony Corp | 半導体部品及びその製造方法、半導体部品の実装構造及びその実装方法 |
| EP1041618A4 (en) * | 1998-09-30 | 2001-08-22 | Seiko Epson Corp | SEMICONDUCTOR ARRANGEMENT AND METHOD FOR THE PRODUCTION THEREOF, CIRCUIT BOARD AND ELECTRONIC SYSTEM |
| JP2000223446A (ja) * | 1998-11-27 | 2000-08-11 | Denso Corp | 半導体装置およびその製造方法 |
-
1999
- 1999-07-09 JP JP19634599A patent/JP4151164B2/ja not_active Expired - Fee Related
-
2000
- 2000-03-15 US US09/525,514 patent/US6429506B1/en not_active Expired - Lifetime
- 2000-03-17 DE DE10013067A patent/DE10013067B4/de not_active Expired - Fee Related
-
2002
- 2002-03-07 US US10/091,497 patent/US6787866B2/en not_active Expired - Lifetime
-
2004
- 2004-07-22 US US10/896,042 patent/US7091109B2/en not_active Expired - Fee Related
-
2005
- 2005-03-10 US US11/075,881 patent/US7298022B2/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020167276A (ja) * | 2019-03-29 | 2020-10-08 | 三井化学東セロ株式会社 | 電子装置の製造方法 |
| JP7408291B2 (ja) | 2019-03-29 | 2024-01-05 | 三井化学東セロ株式会社 | 電子装置の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20050156309A1 (en) | 2005-07-21 |
| US6787866B2 (en) | 2004-09-07 |
| US20040259330A1 (en) | 2004-12-23 |
| US7091109B2 (en) | 2006-08-15 |
| US7298022B2 (en) | 2007-11-20 |
| DE10013067A1 (de) | 2000-09-21 |
| DE10013067B4 (de) | 2008-10-16 |
| US6429506B1 (en) | 2002-08-06 |
| US20020093076A1 (en) | 2002-07-18 |
| JP2000340526A (ja) | 2000-12-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4151164B2 (ja) | 半導体装置の製造方法 | |
| KR100609806B1 (ko) | 반도체 장치의 제조 방법 | |
| JP4510095B2 (ja) | 固体撮像素子モジュールの製造方法 | |
| KR100506109B1 (ko) | 접착성 테이프의 박리 기구, 접착성 테이프의 박리 장치,접착성 테이프의 박리 방법, 반도체 칩의 픽업 장치,반도체 칩의 픽업 방법, 반도체 장치의 제조 방법 및반도체 장치의 제조 장치 | |
| KR100762208B1 (ko) | 반도체 장치 및 반도체 장치의 제조 방법과 반도체 장치의 실장 방법 | |
| US7294531B2 (en) | Wafer level chip stack method | |
| TWI278943B (en) | Semiconductor manufacturing apparatus and method of manufacturing semiconductor device | |
| KR100332967B1 (ko) | 디지털 마이크로-미러 디바이스 패키지의 제조 방법 | |
| JP2000340526A5 (enExample) | ||
| TW200415754A (en) | Fabrication method of semiconductor integrated circuit device | |
| JP2007227439A (ja) | 半導体装置の製造方法および製造装置 | |
| KR100486290B1 (ko) | 반도체 패키지 조립방법 및 반도체 패키지 공정의보호테이프 제거장치 | |
| KR102061369B1 (ko) | 제품 기판을 캐리어 기판에 임시로 결합하기 위한 방법 | |
| JP4636096B2 (ja) | 半導体装置およびその製造方法 | |
| JP2004273639A (ja) | 半導体装置の製造方法 | |
| JP2005209829A (ja) | 半導体ウェハ固定方法及び装置、並びに半導体ウェハが固定された構造体 | |
| JP4926630B2 (ja) | 固体撮像装置の製造方法および製造装置、並びに貼付装置 | |
| JP3580240B2 (ja) | 半導体装置および半導体装置の製造方法 | |
| JPH0621219A (ja) | 半導体装置の製造方法 | |
| JP3580244B2 (ja) | 半導体装置および半導体装置の製造方法 | |
| JP4043720B2 (ja) | 半導体装置および半導体装置の製造方法 | |
| JP2008277454A (ja) | 固体撮像素子モジュールの製造方法 | |
| JP4697014B2 (ja) | 半導体装置の製造方法および半導体製造装置。 | |
| JP2007329352A (ja) | 固体撮像素子モジュールの製造方法 | |
| JPH08181090A (ja) | 半導体素子の製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050728 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050728 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20080116 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080122 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20080305 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20080610 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20080623 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110711 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120711 Year of fee payment: 4 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120711 Year of fee payment: 4 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130711 Year of fee payment: 5 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |