JP4094515B2 - 半導体装置の製造方法 - Google Patents
半導体装置の製造方法 Download PDFInfo
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- JP4094515B2 JP4094515B2 JP2003334858A JP2003334858A JP4094515B2 JP 4094515 B2 JP4094515 B2 JP 4094515B2 JP 2003334858 A JP2003334858 A JP 2003334858A JP 2003334858 A JP2003334858 A JP 2003334858A JP 4094515 B2 JP4094515 B2 JP 4094515B2
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- wiring board
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Description
本実施の形態1では、例えば配線基板に搭載された複数の半導体チップを一括して封止するMAP(Mold Array Package)方式の半導体装置の製造方法に本発明を適用した場合について図1〜図14により説明する。
本実施の形態2では、基板母体の厚さに応じて成型金型における基板母体へのクランプ圧力(保持圧力)を変える方法の一例を説明する。なお、本実施の形態2では、基板母体1や成型金型8については前記実施の形態1と同じなので、前記実施の形態1で用いた図を参照しながら説明を進める。
1A 配線基板
2 絶縁基材
3 配線層
3a〜3e 導体パターン
4 ソルダレジスト
6 半導体チップ
7 ボンディングワイヤ
8 成型金型
8A 下型(第1金型)
8A1 ポッドホルダ
8A2 ポッド
8A3 プランジャ
8A4 下型キャビティ台
8A41 段部
8A5 弾性体
8A6 ベース体
8A61 段部
8A7 ガイドピン
8B 上型(第2金型)
8B1 キャビティ
8B2 溝
8B3 ゲート
8B4 ヒータ
8Bp ブロックピン
8Bph ガイドホール
8Bpb ボルト
8Bv エアベント
8Bv1 可動ピン前部
8Bv2 可動ピン後部
8Bvp 可動ピン
8Bvp1 溝
8Bvs 弾性体
8Brp リターンピン
8C ラミネートフィルム
9 一括封止体
9A 封止体
9M 溶融樹脂
11 バンプ保持ツール
12 半田バンプ
12A バンプ電極
14 ダイシングブレード
16 半導体装置
17 接着剤
20 自動モールド装置
21 タブレット整列部
22 タブレットパーツフィーダ
23 基板ローダ
24 基板整列部
25a 搬入搬送部
25b 搬出搬送部
26 ゲートブレイク部
27 アンローダ
AR 製品領域
TH スルーホール
GH ガイドホール
BP ボンディングパッド
Claims (23)
- (a)基板を用意する工程、
(b)前記基板に半導体チップを搭載する工程、
(c)前記半導体チップが搭載された基板を樹脂成型用の成型金型の第1金型の成型面に載置する工程、
(d)前記基板を前記成型金型の前記第1金型と第2金型とで挟み込むように保持する工程、
(e)前記成型金型のキャビティに封止用樹脂を充填する工程を有し、
前記成型金型の前記第1金型は、前記成型面に交差する方向に動作可能な弾性構造を備え、
前記(d)工程においては、前記成型金型の前記第2金型の成型面が前記基板に当たった後に、前記第1金型または前記第2金型の成型面であって、前記基板の外形よりも外れた箇所に設けられた突出部により前記第1金型を押し下げることを特徴とする半導体装置の製造方法。 - 請求項1記載の半導体装置の製造方法において、前記基板が多層配線基板であることを特徴とする半導体装置の製造方法。
- 請求項2記載の半導体装置の製造方法において、前記多層配線基板は、樹脂と金属箔との積層構成を有することを特徴とする半導体装置の製造方法。
- 請求項2記載の半導体装置の製造方法の前記(d)工程において、前記第2金型の成型面が前記多層配線基板に当たる箇所での圧力は、前記突出部での圧力よりも小さいことを特徴とする半導体装置の製造方法。
- 請求項2記載の半導体装置の製造方法において、前記突出部の前記成型面に対する対向面の平面形状が円形状であることを特徴とする半導体装置の製造方法。
- 請求項2記載の半導体装置の製造方法において、前記突出部の突出長さは、前記多層配線基板の厚さと同等またはそれより長いことを特徴とする半導体装置の製造方法。
- 請求項2記載の半導体装置の製造方法において、前記成型金型は、前記キャビティに通じるエアベントと、前記エアベントに突出する可動ピンとを備え、前記可動ピンは弾性体により前記成型面に交差する方向に動作可能な状態で設けられ、前記可動ピンの前記多層配線基板の対向面には溝が設けられており、
前記(d)工程において、前記多層配線基板を前記第1金型と前記第2金型とで挟み込むように保持すると、前記可動ピンが前記多層配線基板から押圧される一方、前記可動ピンは前記弾性体の反発力により前記多層配線基板を押圧し、
前記(e)工程において、前記キャビティ内の空気を、前記エアベントおよび前記溝を通じて前記キャビティの外部に逃がすことを特徴とする半導体装置の製造方法。 - 請求項7記載の半導体装置の製造方法において、前記弾性体の弾性力は、前記成型金型の前記多層配線基板の保持力よりも小さいことを特徴とする半導体装置の製造方法。
- 請求項7記載の半導体装置の製造方法において、前記エアベントは複数設けられており、前記可動ピンは前記エアベント毎に設けられていることを特徴とする半導体装置の製造方法。
- 請求項2記載の半導体装置の製造方法において、前記多層配線基板の厚さを測定し、その測定値に応じて、前記(d)工程の基板の保持圧力を調整することを特徴とする半導体装置の製造方法。
- (a)複数の製品領域を有する多層配線基板を用意する工程、
(b)前記多層配線基板の前記複数の製品領域の各々に半導体チップを搭載する工程、
(c)前記半導体チップが搭載された多層配線基板を樹脂成型用の成型金型の第1金型の成型面に載置する工程、
(d)前記多層配線基板を前記成型金型の前記第1金型と第2金型とで挟み込むように保持する工程、
(e)前記成型金型のキャビティに封止用樹脂を充填する工程を有し、
前記成型金型の前記第1金型は、前記成型面に交差する方向に動作可能な弾性構造を備え、
前記(d)工程においては、前記成型金型の前記第2金型の成型面が前記多層配線基板に当たった後に、前記第1金型または前記第2金型の成型面であって、前記多層配線基板の外形よりも外れた箇所に設けられた突出部により前記第1金型を押し下げることを特徴とする半導体装置の製造方法。 - 請求項11記載の半導体装置の製造方法において、前記多層配線基板は、樹脂と金属箔との積層構成を有することを特徴とする半導体装置の製造方法。
- 請求項11記載の半導体装置の製造方法の前記(d)工程において、前記第2金型の成型面が前記多層配線基板に当たる箇所での圧力は、前記突出部での圧力よりも小さいことを特徴とする半導体装置の製造方法。
- 請求項11記載の半導体装置の製造方法において、前記突出部の前記成型面に対する対向面の平面形状が円形状であることを特徴とする半導体装置の製造方法。
- 請求項11記載の半導体装置の製造方法において、前記突出部の突出長さは、前記多層配線基板の厚さと同等またはそれより長いことを特徴とする半導体装置の製造方法。
- 請求項11記載の半導体装置の製造方法において、前記成型金型は、前記キャビティに通じるエアベントと、前記エアベントに突出する可動ピンとを備え、前記可動ピンは弾性体により前記成型面に交差する方向に動作可能な状態で設けられ、前記可動ピンの前記多層配線基板の対向面には溝が設けられており、
前記(d)工程において、前記多層配線基板を前記第1金型と前記第2金型とで挟み込むように保持すると、前記可動ピンが前記多層配線基板から押圧される一方、前記可動ピンは前記弾性体の反発力により前記多層配線基板を押圧し、
前記(e)工程において、前記キャビティ内の空気を、前記エアベントおよび前記溝を通じて前記キャビティの外部に逃がすことを特徴とする半導体装置の製造方法。 - 請求項16記載の半導体装置の製造方法において、前記弾性体の弾性力は、前記成型金型の前記多層配線基板の保持力よりも小さいことを特徴とする半導体装置の製造方法。
- 請求項16記載の半導体装置の製造方法において、前記エアベントは複数設けられており、前記可動ピンは前記エアベント毎に設けられていることを特徴とする半導体装置の製造方法。
- 請求項11記載の半導体装置の製造方法において、前記多層配線基板の厚さを測定し、その測定値に応じて、前記(d)工程の前記多層配線基板の保持圧力を調整することを特徴とする半導体装置の製造方法。
- 請求項11記載の半導体装置の製造方法において、前記封止用樹脂により形成される封止体は、前記複数の半導体チップを一括して封止するものであることを特徴とする半導体装置の製造方法。
- 請求項11記載の半導体装置の製造方法において、
前記(e)工程後、
(f)前記多層配線基板にバンプ電極を形成する工程、
(g)前記(f)工程後、前記封止用樹脂により形成された封止体および前記多層配線基板を前記複数の半導体チップ毎に切断する工程を有することを特徴とする半導体装置の製造方法。 - (a)複数の製品領域を有する多層配線基板を用意する工程、
(b)前記多層配線基板の前記複数の製品領域の各々に半導体チップを搭載する工程、
(c)前記半導体チップが搭載された多層配線基板を樹脂成型用の成型金型の第1金型の第1成型面に載置する工程、
(d)前記多層配線基板を前記成型金型の前記第1金型と第2金型とで挟み込むように保持する工程、
(e)前記成型金型のキャビティに封止用樹脂を充填する工程、
(f)前記多層配線基板にバンプ電極を形成する工程、
(g)前記(f)工程後、前記封止用樹脂により形成された封止体および多層配線基板を前記複数の半導体チップ毎に切断する工程を有し、
前記第1金型は、前記成型面に交差する方向に動作可能な弾性構造を備え、
前記第2金型の第2成型面において、前記多層配線基板の外形よりも外れた位置には、前記第2成型面に対して交差する方向に突出する突出部が着脱自在の状態で設けられており、
前記(d)工程においては、前記成型金型の前記第2金型の第2成型面が前記多層配線基板に当たった後に、前記第2金型の前記第2成型面の突出部が前記第1金型を直接押圧し前記第1金型を押し下げることを特徴とする半導体装置の製造方法。 - 請求項22記載の半導体装置の製造方法において、前記多層配線基板の厚さに応じて、前記突出部を交換する工程を有することを特徴とする半導体装置の製造方法。
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US10/947,261 US7288440B2 (en) | 2003-09-26 | 2004-09-23 | Method of manufacturing a semiconductor device |
KR1020040076740A KR20050030865A (ko) | 2003-09-26 | 2004-09-24 | 반도체장치의 제조방법 |
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US9722479B2 (en) | 2012-08-03 | 2017-08-01 | Eocycle Technologies Inc. | Wind turbine comprising a transverse flux electrical machine |
US9755492B2 (en) | 2012-08-03 | 2017-09-05 | Eocycle Technologies Inc. | Rotatable transverse flux electrical machine |
US9419486B2 (en) | 2012-09-24 | 2016-08-16 | Eocycle Technologies Inc. | Housing less transverse flux electrical machine |
US9559560B2 (en) | 2012-09-24 | 2017-01-31 | Eocycle Technologies Inc. | Transverse flux electrical machine stator phases assembly |
US9559558B2 (en) | 2012-09-24 | 2017-01-31 | Eocycle Technologies Inc. | Modular transverse flux electrical machine assembly |
US9559559B2 (en) | 2012-09-24 | 2017-01-31 | Eocycle Technologies Inc. | Transverse flux electrical machine stator with stator skew and assembly thereof |
US9331531B2 (en) | 2012-10-17 | 2016-05-03 | Eocycle Technologies Inc. | Method of manufacturing a transverse flux electrical machine rotor |
US9876401B2 (en) | 2012-10-17 | 2018-01-23 | Eocycle Technologies Inc. | Transverse flux electrical machine rotor |
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KR20050030865A (ko) | 2005-03-31 |
US7445969B2 (en) | 2008-11-04 |
US20080057626A1 (en) | 2008-03-06 |
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CN1601711A (zh) | 2005-03-30 |
US20050070047A1 (en) | 2005-03-31 |
JP2005101407A (ja) | 2005-04-14 |
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