JP2016532919A - 論理演算を、センス回路を使用して実行する装置及び方法 - Google Patents
論理演算を、センス回路を使用して実行する装置及び方法 Download PDFInfo
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Abstract
Description
本開示は、論理演算を、センス回路を使用して実行することに関連する装置及び方法を含む。例示的な装置は、メモリセルアレイと、アレイのセンスラインに接続される1次ラッチを含むセンス回路と、を備える。センス回路は、論理演算の第1演算フェーズを、センスラインに接続されるメモリセルをセンスすることにより実行し、論理演算の複数の中間演算フェーズを、センスラインに接続される該当する複数の異なるメモリセルをセンスすることにより実行し、そして第1演算フェーズ、及び複数の中間演算フェーズの結果を、1次ラッチに接続される2次ラッチに、センスラインアドレスアクセスを行なうことなく加算するように構成することができる。
Claims (38)
- メモリセルアレイと、
前記アレイのセンスラインに接続される1次ラッチを含むセンス回路と、を備え、前記センス回路は:
論理演算の第1演算フェーズを、前記センスラインに接続されるメモリセルをセンスすることにより実行し、
前記論理演算の複数の中間演算フェーズを、前記センスラインに接続される該当する複数の異なるメモリセルをセンスすることにより実行し、そして
前記第1演算フェーズ、及び前記複数の中間演算フェーズの結果を、前記1次ラッチに接続される2次ラッチに、センスラインアドレスアクセスを行なうことなく加算するように構成される、装置。 - 前記2次ラッチに加算される前記結果は、前記論理演算の結果であり、前記センス回路は更に、前記論理演算の前記結果を前記アレイに、前記センス回路に接続される入力/出力(I/O)ラインを有効にすることなく格納するように構成される、請求項1に記載の装置。
- 前記論理演算は:
AND演算、及び
OR演算
のうちの少なくとも一方の演算である、請求項2に記載の装置。 - 前記2次ラッチに加算される前記結果は、前記論理演算の結果の反転結果であり、前記センス回路は更に、前記論理演算の前記結果を前記アレイに、前記センス回路に接続される入力/出力(I/O)ラインを有効にすることなく格納するように構成される、請求項1に記載の装置。
- 前記論理演算は:
NAND演算、及び
NOR演算
のうちの少なくとも一方の演算である、請求項4に記載の装置。 - 前記2次ラッチは、前記メモリセル群と間隔を空けて形成される第1対のトランジスタ及び第2対のトランジスタを含む、請求項1に記載の装置。
- 前記センス回路は:
前記1次ラッチを含むセンスアンプと、
演算コンポーネントと、を備え、前記演算コンポーネントは:
前記2次ラッチと、
前記2次ラッチに接続される第1パストランジスタと、
前記センスラインに接続され、かつ前記第1パストランジスタに接続される第1反転トランジスタと、を含む、請求項1に記載の装置。 - 前記センスラインは、前記1次ラッチに接続される一対の相補センスラインの第1センスラインを含み、前記演算コンポーネントは更に:
前記2次ラッチに接続される第2パストランジスタと、
前記一対の相補センスラインの第2センスラインに接続され、かつ前記第2パストランジスタに接続される第2反転トランジスタと、を含む、請求項7に記載の装置。 - 前記2次ラッチは、一対のnチャネルトランジスタと、一対のpチャネルトランジスタと、を含み:
前記一対のnチャネルトランジスタの第1nチャネルトランジスタのゲート、及び前記一対のpチャネルトランジスタの第1pチャネルトランジスタのゲートは、前記第1反転トランジスタのゲートに接続され、そして
前記一対のnチャネルトランジスタの第2nチャネルトランジスタのゲート、及び前記一対のpチャネルトランジスタの第2pチャネルトランジスタのゲートは、前記第2反転トランジスタのゲートに接続される、請求項8に記載の装置。 - 前記センス回路は、前記論理演算の結果を、前記センスラインを接地電圧から前記アレイに対応する電源電圧にまで充電するために必要なエネルギー量よりも少ないエネルギー量を使用して格納するように構成される、請求項1乃至9のいずれか一項に記載の装置。
- 前記メモリセルアレイは、1トランジスタ1キャパシタ(1T1C)メモリセル群を含む、請求項1乃至9のいずれか一項に記載の装置。
- 前記メモリセル及び前記該当する複数の異なるメモリセルはそれぞれ、前記アレイの異なるアクセスラインに接続される、請求項1乃至9のいずれか一項に記載の装置。
- 前記メモリセル及び前記該当する複数の異なるメモリセルのうちの少なくとも一方のメモリセルは、破壊読み出しメモリセルである、請求項12に記載の装置。
- 論理演算を実行する方法であって:
センスラインに接続されるセンスアンプを介して、メモリセルに格納されているデータ値をセンスし、前記データ値は、前記論理演算の第1入力として機能し、
前記導出データ値を、前記センスアンプに接続される演算コンポーネントのラッチに、前記センスラインに接続される第1パストランジスタ、及び相補センスラインに接続される第2パストランジスタを有効にすることにより転送し、
前記センスアンプを介して、前記センスラインに接続される複数の異なるメモリセルに格納されている複数のデータ値をセンスし、前記複数のデータ値は、前記論理演算の該当する複数の更に別の入力として機能し、
前記論理演算の結果を、前記演算コンポーネントを使用して、センスラインアドレスアクセスを行なうことなく導出する、方法。 - 更に、前記複数の異なるメモリセルに格納されている前記複数のデータ値をセンスしている間は、前記ラッチが活性化されている状態を維持する、請求項14に記載の方法。
- 前記論理演算の前記結果を導出する際に、加算機能を、前記メモリセルに格納されている前記データ値、及び前記複数の異なるメモリセルに格納されている前記複数のデータ値に対して実行する、請求項14に記載の方法。
- 前記加算機能を前記複数の異なるメモリセルに格納されている前記複数のデータ値に対して実行する際に、前記第1パストランジスタまたは前記第2パストランジスタのうちの一方のパストランジスタのみを有効にする、請求項16に記載の方法。
- 更に、前記第1パストランジスタ及び前記第2パストランジスタのうちの前記一方のパストランジスタのみを、実行される特定の論理演算に基づいて有効にする、請求項17に記載の方法。
- 前記論理演算は:OR演算、NOR演算、AND演算、及びNAND演算を含むグループから選択される論理演算である、請求項18に記載の方法。
- 更に、前記論理演算の前記結果をメモリセルアレイに、前記センスアンプに接続される入力/出力ラインを活性化することなく格納する、請求項14乃至19のいずれか一項に記載の方法。
- メモリセルアレイと、
前記アレイに接続されるセンス回路と、を備え、前記センス回路は:
前記アレイの第1アクセスラインに接続される第1の複数のメモリセルに格納されているデータ値を導出し、前記第1の複数のメモリセルの各メモリセルは、複数のセンスラインの該当するセンスラインに接続され、そして
論理演算を、前記第1の複数のメモリセルに格納されている前記データ値を複数の第1入力として使用して、かつ前記アレイの第2アクセスラインに接続される第2の複数のメモリセルに格納されているデータ値を複数の第2入力として使用して並列に実行し、前記第2の複数のメモリセルの各メモリセルは、前記複数のセンスラインの該当するセンスラインに接続されるように構成され、そして
前記論理演算は、データを前記アレイの入力/出力ラインを介して転送することなく並列に実行される、装置。 - 前記センス回路は更に、前記論理演算の結果を前記アレイに、前記アレイの前記入力/出力ラインを活性化することなく格納するように構成される、請求項21に記載の装置。
- 前記センス回路は、複数のセンスアンプを備え、各センスアンプは、前記複数のセンスラインの該当するセンスラインに接続され、前記複数のセンスアンプの各センスアンプは、該当する複数の演算コンポーネントの1つの演算コンポーネントに接続され、前記複数の演算コンポーネントの各演算コンポーネントは、一対のnチャネルトランジスタと、一対のpチャネルトランジスタと、一対のパストランジスタと、一対の反転トランジスタと、を含む、請求項21に記載の装置。
- 前記センス回路は更に、前記論理演算を:
前記第1の複数のメモリセルに格納されている前記データ値を前記複数の演算コンポーネントに、前記複数対のパストランジスタの各対のパストランジスタの前記パストランジスタ群が有効になっている第1演算フェーズ中に転送し、
前記第2の複数のメモリセルに格納されている前記データ値を、前記複数対のパストランジスタの各対のパストランジスタの前記パストランジスタ群が無効になっている状態で導出し、第1演算フェーズの間に転送し、そして
次に、前記複数対のパストランジスタの各対のパストランジスタの該当する1つのパストランジスタのみを有効にして、前記複数の演算コンポーネントの各演算コンポーネントが、該当するデータ値を格納することにより実行するように構成され、該当するデータ値は:
前記第1の複数のメモリセルの該当するメモリセルに格納されているデータ値、及び前記第2の複数のメモリセルの該当するメモリセルに格納されているデータ値のAND演算値、または
前記第1の複数のメモリセルの該当するメモリセルに格納されているデータ値、及び前記第2の複数のメモリセルの該当するメモリセルに格納されているデータ値のOR演算値に対応している、請求項23に記載の装置。 - 前記センス回路は更に、前記論理演算を、前記反転トランジスタ群を有効にして、前記複数の演算コンポーネントの各演算コンポーネントが該当するデータ値を格納することにより実行するように構成され、該当するデータ値は:
前記第1の複数のメモリセルの該当するメモリセルに格納されているデータ値、及び前記第2の複数のメモリセルの該当するメモリセルに格納されているデータ値のNAND演算値、または
前記第1の複数のメモリセルの該当するメモリセルに格納されているデータ値、及び前記第2の複数のメモリセルの該当するメモリセルに格納されているデータ値のNOR演算値に対応している、請求項24に記載の装置。 - 論理演算を実行する方法であって:
第1演算フェーズを:
センス回路であって、前記センス回路が:
センスラインに接続され、かつ1次ラッチを含むセンスアンプと、
2次ラッチを含む演算コンポーネントと、を含む、前記センス回路に接続されるメモリセルアレイの第1アクセスラインを活性化し、
前記センスアンプを活性化して、前記論理演算の第1入力に対応するデータ値が、前記第1アクセスラインに接続され、かつ前記センスラインに接続されるメモリセルから前記1次ラッチに転送されるようにし、
前記センスアンプに接続され、かつ前記2次ラッチに接続される一対のパストランジスタを有効にし、
前記第2ラッチを前記一対のトランジスタが有効になっているままの状態で活性化して、前記第1入力に対応する前記データ値が前記2次ラッチに転送されるようにし、そして
前記第1アクセスライン及び前記センスアンプを非活性化して、前記一対のパストランジスタを無効にすることにより実行し、
第2演算フェーズを:
前記アレイの第2アクセスラインを活性化し、
前記センスアンプを活性化して、前記論理演算の第2入力に対応するデータ値が、前記第2アクセスラインに接続され、かつ前記センスラインに接続されるメモリセルから前記1次ラッチに転送されるようにし、
実行される特定の論理演算に基づいて、前記一対のパストランジスタのうちの一方のパストランジスタのみを有効にして、前記2次ラッチが、活性化されている状態を前記第2演算フェーズ中に保持するようにし、
前記第2アクセスライン及び前記センスアンプを非活性化して、前記一対のパストランジスタのうちの前記一方のパストランジスタを無効にして、前記第2演算フェーズ後に、前記2次ラッチが、前記論理演算の結果に対応するデータ値、または前記論理演算の前記結果の反転結果に対応するデータ値のいずれかを格納することにより実行し、そして
最終演算フェーズを、前記論理演算の前記結果を前記演算コンポーネントから:
前記アレイ、
前記センスアンプ、及び
外部ロケーション
のうちの少なくとも1つに転送することにより実行する、方法。 - 更に、前記論理演算の前記結果を前記演算コンポーネントから、前記アレイ及び前記センスアンプのうちの少なくとも一方に、アドレスラインアクセスを行なうことなく転送する、請求項26に記載の方法。
- 前記第2演算フェーズは、複数の中間演算フェーズのうちの1つの中間演算であり、各中間演算フェーズは、異なるアクセスラインに接続されるメモリセルをセンスして、前記論理演算の別の入力に対応するメモリセルのデータ値を導出する処理に関連する、請求項26に記載の方法。
- 実行される前記特定の論理演算に基づいて、前記一対のパストランジスタの一方のパストランジスタのみを有効にする際に:
前記一対のパストランジスタの第1パストランジスタのみを、実行される前記特定の論理演算がAND演算またはOR演算である場合に有効にし、そして
前記一対のパストランジスタの第2パストランジスタのみを、実行される前記特定の論理演算がNAND演算またはNOR演算である場合に有効にする、請求項26に記載の方法。 - 前記最終演算フェーズを実行する際に更に:
前記2次ラッチに接続され、かつ前記センスアンプに接続される一対の反転トランジスタを、実行される前記特定の論理演算がNAND演算またはNOR演算である場合に有効にし、そして
前記一対のパストランジスタを、実行される前記特定の論理演算がAND演算またはOR演算である場合に有効にする、請求項29に記載の方法。 - 論理演算を実行する方法であって:
前記論理演算の第1入力として機能するデータ値を、前記アレイのセンスラインに接続されるセンスアンプを介して、前記アレイのアクセスラインを活性化することなく導出し、
前記導出データ値を、前記センスアンプに接続される演算コンポーネントのラッチに、前記センスアンプに接続される入力/出力(I/O)ラインを活性化することなく供給し、
前記センスアンプを介して、前記センスラインに接続される複数のメモリセルに格納されている複数のデータ値をセンスし、複数のデータ値は、前記論理演算の該当する複数の更に別の入力として機能し、
前記論理演算の結果を、前記演算コンポーネントを使用して、センスラインアドレスアクセスを行なうことなく導出する、方法。 - 前記導出データ値を前記センスアンプに接続される演算コンポーネントのラッチに、前記センスアンプに接続されるI/Oラインを活性化することなく供給する際に、前記センスラインに接続される第1パストランジスタ、及び前記アレイの相補センスラインに接続される第2パストランジスタを有効にする、請求項31に記載の方法。
- 更に、前記センスラインに接続される前記複数のメモリセルに格納されている前記複数のデータ値をセンスしている間は、前記ラッチが活性化されている状態を維持する、請求項31に記載の方法。
- 前記第1入力として機能する前記データ値を前記センスアンプに、前記アレイの外部のソースから供給し、前記アレイの外部の前記ソースは:
外部コントローラ、
ホスト、及び
異なるアレイ内に設けられるメモリセル
のうちの少なくとも1つを含む、請求項31乃至33のいずれか一項に記載の方法。 - 前記第1入力として機能する前記データ値を前記センスアンプに:
前記アレイの異なるセンスラインに接続されるセンスアンプ、及び
前記アレイの前記異なるセンスラインに接続される前記センスアンプに接続される演算コンポーネントのうちの少なくとも一方から供給する、請求項31乃至33のいずれか一項に記載の方法。 - メモリセルアレイと、
前記アレイの該当する複数のセンスラインに接続される複数のセンスアンプ/演算コンポーネントペアを含むセンス回路と、を備え、前記センス回路は:
論理演算の少なくとも1つの入力を、前記アレイのアクセスラインを活性化することなく導出し、
前記論理演算の複数の更に別の入力を、特定のセンスラインに接続される該当する複数のメモリセルをセンスすることにより導出し、そして
加算演算を、前記少なくとも1つの入力、及び前記複数の更に別の入力に対して、前記特定のセンスラインに接続される演算コンポーネントのラッチを使用して、かつセンスラインアドレスアクセスを行なうことなく実行するように構成される、装置。 - 前記少なくとも1つの入力は、異なるメモリセルアレイのセンスラインに接続されるセルに格納されているデータ値である、請求項36に記載の装置。
- 前記少なくとも1つの入力は:
前記特定のセンスライン以外のセンスラインに接続される演算コンポーネントのラッチ、及び
前記特定のセンスライン以外の前記センスラインに接続される前記演算コンポーネントに接続されるセンスアンプのうちの少なくとも一方に格納されているデータ値である、請求項36乃至37のいずれか一項に記載の装置。
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6147461B1 (ja) * | 2017-01-31 | 2017-06-14 | ゼンテルジャパン株式会社 | 半導体記憶装置 |
JP2019164870A (ja) * | 2018-03-20 | 2019-09-26 | 株式会社東芝 | 磁気デバイス |
Families Citing this family (162)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9158667B2 (en) | 2013-03-04 | 2015-10-13 | Micron Technology, Inc. | Apparatuses and methods for performing logical operations using sensing circuitry |
US8964496B2 (en) | 2013-07-26 | 2015-02-24 | Micron Technology, Inc. | Apparatuses and methods for performing compare operations using sensing circuitry |
US8971124B1 (en) | 2013-08-08 | 2015-03-03 | Micron Technology, Inc. | Apparatuses and methods for performing logical operations using sensing circuitry |
US9153305B2 (en) | 2013-08-30 | 2015-10-06 | Micron Technology, Inc. | Independently addressable memory array address spaces |
US9019785B2 (en) | 2013-09-19 | 2015-04-28 | Micron Technology, Inc. | Data shifting via a number of isolation devices |
US9449675B2 (en) | 2013-10-31 | 2016-09-20 | Micron Technology, Inc. | Apparatuses and methods for identifying an extremum value stored in an array of memory cells |
US9430191B2 (en) | 2013-11-08 | 2016-08-30 | Micron Technology, Inc. | Division operations for memory |
US9934856B2 (en) | 2014-03-31 | 2018-04-03 | Micron Technology, Inc. | Apparatuses and methods for comparing data patterns in memory |
US9455020B2 (en) | 2014-06-05 | 2016-09-27 | Micron Technology, Inc. | Apparatuses and methods for performing an exclusive or operation using sensing circuitry |
US9496023B2 (en) | 2014-06-05 | 2016-11-15 | Micron Technology, Inc. | Comparison operations on logical representations of values in memory |
US9711207B2 (en) | 2014-06-05 | 2017-07-18 | Micron Technology, Inc. | Performing logical operations using sensing circuitry |
US9830999B2 (en) | 2014-06-05 | 2017-11-28 | Micron Technology, Inc. | Comparison operations in memory |
US10074407B2 (en) | 2014-06-05 | 2018-09-11 | Micron Technology, Inc. | Apparatuses and methods for performing invert operations using sensing circuitry |
US9449674B2 (en) | 2014-06-05 | 2016-09-20 | Micron Technology, Inc. | Performing logical operations using sensing circuitry |
US9711206B2 (en) | 2014-06-05 | 2017-07-18 | Micron Technology, Inc. | Performing logical operations using sensing circuitry |
US9910787B2 (en) | 2014-06-05 | 2018-03-06 | Micron Technology, Inc. | Virtual address table |
US9786335B2 (en) | 2014-06-05 | 2017-10-10 | Micron Technology, Inc. | Apparatuses and methods for performing logical operations using sensing circuitry |
US9779019B2 (en) | 2014-06-05 | 2017-10-03 | Micron Technology, Inc. | Data storage layout |
US9704540B2 (en) | 2014-06-05 | 2017-07-11 | Micron Technology, Inc. | Apparatuses and methods for parity determination using sensing circuitry |
US9898252B2 (en) | 2014-09-03 | 2018-02-20 | Micron Technology, Inc. | Multiplication operations in memory |
US10068652B2 (en) | 2014-09-03 | 2018-09-04 | Micron Technology, Inc. | Apparatuses and methods for determining population count |
US9589602B2 (en) | 2014-09-03 | 2017-03-07 | Micron Technology, Inc. | Comparison operations in memory |
US9847110B2 (en) | 2014-09-03 | 2017-12-19 | Micron Technology, Inc. | Apparatuses and methods for storing a data value in multiple columns of an array corresponding to digits of a vector |
US9740607B2 (en) | 2014-09-03 | 2017-08-22 | Micron Technology, Inc. | Swap operations in memory |
US9747961B2 (en) | 2014-09-03 | 2017-08-29 | Micron Technology, Inc. | Division operations in memory |
US9904515B2 (en) | 2014-09-03 | 2018-02-27 | Micron Technology, Inc. | Multiplication operations in memory |
US9940026B2 (en) | 2014-10-03 | 2018-04-10 | Micron Technology, Inc. | Multidimensional contiguous memory allocation |
US9836218B2 (en) | 2014-10-03 | 2017-12-05 | Micron Technology, Inc. | Computing reduction and prefix sum operations in memory |
US10163467B2 (en) | 2014-10-16 | 2018-12-25 | Micron Technology, Inc. | Multiple endianness compatibility |
US10147480B2 (en) | 2014-10-24 | 2018-12-04 | Micron Technology, Inc. | Sort operation in memory |
US9779784B2 (en) | 2014-10-29 | 2017-10-03 | Micron Technology, Inc. | Apparatuses and methods for performing logical operations using sensing circuitry |
US10073635B2 (en) | 2014-12-01 | 2018-09-11 | Micron Technology, Inc. | Multiple endianness compatibility |
US9747960B2 (en) | 2014-12-01 | 2017-08-29 | Micron Technology, Inc. | Apparatuses and methods for converting a mask to an index |
US10032493B2 (en) | 2015-01-07 | 2018-07-24 | Micron Technology, Inc. | Longest element length determination in memory |
US10061590B2 (en) | 2015-01-07 | 2018-08-28 | Micron Technology, Inc. | Generating and executing a control flow |
US9583163B2 (en) | 2015-02-03 | 2017-02-28 | Micron Technology, Inc. | Loop structure for operations in memory |
CN107408405B (zh) | 2015-02-06 | 2021-03-05 | 美光科技公司 | 用于并行写入到多个存储器装置位置的设备及方法 |
CN107408404B (zh) | 2015-02-06 | 2021-02-12 | 美光科技公司 | 用于存储器装置的设备及方法以作为程序指令的存储 |
WO2016126472A1 (en) | 2015-02-06 | 2016-08-11 | Micron Technology, Inc. | Apparatuses and methods for scatter and gather |
US10522212B2 (en) | 2015-03-10 | 2019-12-31 | Micron Technology, Inc. | Apparatuses and methods for shift decisions |
US9741399B2 (en) | 2015-03-11 | 2017-08-22 | Micron Technology, Inc. | Data shift by elements of a vector in memory |
US9898253B2 (en) | 2015-03-11 | 2018-02-20 | Micron Technology, Inc. | Division operations on variable length elements in memory |
US10365851B2 (en) | 2015-03-12 | 2019-07-30 | Micron Technology, Inc. | Apparatuses and methods for data movement |
US10146537B2 (en) | 2015-03-13 | 2018-12-04 | Micron Technology, Inc. | Vector population count determination in memory |
US10049054B2 (en) | 2015-04-01 | 2018-08-14 | Micron Technology, Inc. | Virtual register file |
US10140104B2 (en) | 2015-04-14 | 2018-11-27 | Micron Technology, Inc. | Target architecture determination |
US9959923B2 (en) | 2015-04-16 | 2018-05-01 | Micron Technology, Inc. | Apparatuses and methods to reverse data stored in memory |
US10073786B2 (en) | 2015-05-28 | 2018-09-11 | Micron Technology, Inc. | Apparatuses and methods for compute enabled cache |
JP2018139017A (ja) * | 2015-06-08 | 2018-09-06 | 井上 克己 | メモリ型プロセッサ、メモリ型プロセッサを含んだ装置、その使用方法。 |
US9704541B2 (en) | 2015-06-12 | 2017-07-11 | Micron Technology, Inc. | Simulating access lines |
US9921777B2 (en) | 2015-06-22 | 2018-03-20 | Micron Technology, Inc. | Apparatuses and methods for data transfer from sensing circuitry to a controller |
US9996479B2 (en) | 2015-08-17 | 2018-06-12 | Micron Technology, Inc. | Encryption of executables in computational memory |
WO2016027171A2 (en) * | 2015-12-11 | 2016-02-25 | Kantorovitz Isaiah Pinchas | A note on turing machine computability of rule driven systems |
US9905276B2 (en) | 2015-12-21 | 2018-02-27 | Micron Technology, Inc. | Control of sensing components in association with performing operations |
US9952925B2 (en) | 2016-01-06 | 2018-04-24 | Micron Technology, Inc. | Error code calculation on sensing circuitry |
CN107039078B (zh) * | 2016-02-03 | 2019-09-27 | 中芯国际集成电路制造(上海)有限公司 | 非易失性存储电路及其读、写、存储和恢复方法 |
US10048888B2 (en) | 2016-02-10 | 2018-08-14 | Micron Technology, Inc. | Apparatuses and methods for partitioned parallel data movement |
US9892767B2 (en) | 2016-02-12 | 2018-02-13 | Micron Technology, Inc. | Data gathering in memory |
US9971541B2 (en) | 2016-02-17 | 2018-05-15 | Micron Technology, Inc. | Apparatuses and methods for data movement |
US9899070B2 (en) | 2016-02-19 | 2018-02-20 | Micron Technology, Inc. | Modified decode for corner turn |
US10956439B2 (en) | 2016-02-19 | 2021-03-23 | Micron Technology, Inc. | Data transfer with a bit vector operation device |
US9697876B1 (en) | 2016-03-01 | 2017-07-04 | Micron Technology, Inc. | Vertical bit vector shift in memory |
US9997232B2 (en) | 2016-03-10 | 2018-06-12 | Micron Technology, Inc. | Processing in memory (PIM) capable memory device having sensing circuitry performing logic operations |
US10262721B2 (en) | 2016-03-10 | 2019-04-16 | Micron Technology, Inc. | Apparatuses and methods for cache invalidate |
US10379772B2 (en) | 2016-03-16 | 2019-08-13 | Micron Technology, Inc. | Apparatuses and methods for operations using compressed and decompressed data |
US9910637B2 (en) | 2016-03-17 | 2018-03-06 | Micron Technology, Inc. | Signed division in memory |
US10388393B2 (en) | 2016-03-22 | 2019-08-20 | Micron Technology, Inc. | Apparatus and methods for debugging on a host and memory device |
US10120740B2 (en) | 2016-03-22 | 2018-11-06 | Micron Technology, Inc. | Apparatus and methods for debugging on a memory device |
US11074988B2 (en) | 2016-03-22 | 2021-07-27 | Micron Technology, Inc. | Apparatus and methods for debugging on a host and memory device |
US10977033B2 (en) | 2016-03-25 | 2021-04-13 | Micron Technology, Inc. | Mask patterns generated in memory from seed vectors |
US10474581B2 (en) | 2016-03-25 | 2019-11-12 | Micron Technology, Inc. | Apparatuses and methods for cache operations |
US10430244B2 (en) | 2016-03-28 | 2019-10-01 | Micron Technology, Inc. | Apparatuses and methods to determine timing of operations |
US10074416B2 (en) | 2016-03-28 | 2018-09-11 | Micron Technology, Inc. | Apparatuses and methods for data movement |
US10453502B2 (en) | 2016-04-04 | 2019-10-22 | Micron Technology, Inc. | Memory bank power coordination including concurrently performing a memory operation in a selected number of memory regions |
US10607665B2 (en) | 2016-04-07 | 2020-03-31 | Micron Technology, Inc. | Span mask generation |
US9818459B2 (en) | 2016-04-19 | 2017-11-14 | Micron Technology, Inc. | Invert operations using sensing circuitry |
US10153008B2 (en) | 2016-04-20 | 2018-12-11 | Micron Technology, Inc. | Apparatuses and methods for performing corner turn operations using sensing circuitry |
US9659605B1 (en) | 2016-04-20 | 2017-05-23 | Micron Technology, Inc. | Apparatuses and methods for performing corner turn operations using sensing circuitry |
US10042608B2 (en) | 2016-05-11 | 2018-08-07 | Micron Technology, Inc. | Signed division in memory |
US9659610B1 (en) | 2016-05-18 | 2017-05-23 | Micron Technology, Inc. | Apparatuses and methods for shifting data |
KR102548591B1 (ko) | 2016-05-30 | 2023-06-29 | 삼성전자주식회사 | 반도체 메모리 장치 및 그것의 동작 방법 |
US10049707B2 (en) | 2016-06-03 | 2018-08-14 | Micron Technology, Inc. | Shifting data |
US10387046B2 (en) | 2016-06-22 | 2019-08-20 | Micron Technology, Inc. | Bank to bank data transfer |
US10037785B2 (en) | 2016-07-08 | 2018-07-31 | Micron Technology, Inc. | Scan chain operation in sensing circuitry |
US10388360B2 (en) | 2016-07-19 | 2019-08-20 | Micron Technology, Inc. | Utilization of data stored in an edge section of an array |
US10387299B2 (en) | 2016-07-20 | 2019-08-20 | Micron Technology, Inc. | Apparatuses and methods for transferring data |
US10733089B2 (en) | 2016-07-20 | 2020-08-04 | Micron Technology, Inc. | Apparatuses and methods for write address tracking |
US9767864B1 (en) | 2016-07-21 | 2017-09-19 | Micron Technology, Inc. | Apparatuses and methods for storing a data value in a sensing circuitry element |
US9972367B2 (en) | 2016-07-21 | 2018-05-15 | Micron Technology, Inc. | Shifting data in sensing circuitry |
US10303632B2 (en) | 2016-07-26 | 2019-05-28 | Micron Technology, Inc. | Accessing status information |
US10468087B2 (en) | 2016-07-28 | 2019-11-05 | Micron Technology, Inc. | Apparatuses and methods for operations in a self-refresh state |
US9990181B2 (en) | 2016-08-03 | 2018-06-05 | Micron Technology, Inc. | Apparatuses and methods for random number generation |
US11029951B2 (en) | 2016-08-15 | 2021-06-08 | Micron Technology, Inc. | Smallest or largest value element determination |
US10606587B2 (en) | 2016-08-24 | 2020-03-31 | Micron Technology, Inc. | Apparatus and methods related to microcode instructions indicating instruction types |
US10466928B2 (en) | 2016-09-15 | 2019-11-05 | Micron Technology, Inc. | Updating a register in memory |
US10387058B2 (en) | 2016-09-29 | 2019-08-20 | Micron Technology, Inc. | Apparatuses and methods to change data category values |
US10014034B2 (en) | 2016-10-06 | 2018-07-03 | Micron Technology, Inc. | Shifting data in sensing circuitry |
US10528099B2 (en) * | 2016-10-10 | 2020-01-07 | Micron Technology, Inc. | Configuration update for a memory device based on a temperature of the memory device |
US10529409B2 (en) * | 2016-10-13 | 2020-01-07 | Micron Technology, Inc. | Apparatuses and methods to perform logical operations using sensing circuitry |
US9805772B1 (en) | 2016-10-20 | 2017-10-31 | Micron Technology, Inc. | Apparatuses and methods to selectively perform logical operations |
US10373666B2 (en) | 2016-11-08 | 2019-08-06 | Micron Technology, Inc. | Apparatuses and methods for compute components formed over an array of memory cells |
US10423353B2 (en) | 2016-11-11 | 2019-09-24 | Micron Technology, Inc. | Apparatuses and methods for memory alignment |
US9761300B1 (en) | 2016-11-22 | 2017-09-12 | Micron Technology, Inc. | Data shift apparatuses and methods |
US10402340B2 (en) | 2017-02-21 | 2019-09-03 | Micron Technology, Inc. | Memory array page table walk |
US10268389B2 (en) | 2017-02-22 | 2019-04-23 | Micron Technology, Inc. | Apparatuses and methods for in-memory operations |
US10403352B2 (en) * | 2017-02-22 | 2019-09-03 | Micron Technology, Inc. | Apparatuses and methods for compute in data path |
US10838899B2 (en) | 2017-03-21 | 2020-11-17 | Micron Technology, Inc. | Apparatuses and methods for in-memory data switching networks |
US10185674B2 (en) | 2017-03-22 | 2019-01-22 | Micron Technology, Inc. | Apparatus and methods for in data path compute operations |
US11222260B2 (en) | 2017-03-22 | 2022-01-11 | Micron Technology, Inc. | Apparatuses and methods for operating neural networks |
US10049721B1 (en) | 2017-03-27 | 2018-08-14 | Micron Technology, Inc. | Apparatuses and methods for in-memory operations |
US10147467B2 (en) | 2017-04-17 | 2018-12-04 | Micron Technology, Inc. | Element value comparison in memory |
US10043570B1 (en) | 2017-04-17 | 2018-08-07 | Micron Technology, Inc. | Signed element compare in memory |
US9997212B1 (en) | 2017-04-24 | 2018-06-12 | Micron Technology, Inc. | Accessing data in memory |
US10942843B2 (en) | 2017-04-25 | 2021-03-09 | Micron Technology, Inc. | Storing data elements of different lengths in respective adjacent rows or columns according to memory shapes |
US10127971B1 (en) * | 2017-05-01 | 2018-11-13 | Micron Technology, Inc. | Systems and methods for memory cell array initialization |
US10236038B2 (en) | 2017-05-15 | 2019-03-19 | Micron Technology, Inc. | Bank to bank data transfer |
US10068664B1 (en) | 2017-05-19 | 2018-09-04 | Micron Technology, Inc. | Column repair in memory |
US10013197B1 (en) | 2017-06-01 | 2018-07-03 | Micron Technology, Inc. | Shift skip |
US10152271B1 (en) | 2017-06-07 | 2018-12-11 | Micron Technology, Inc. | Data replication |
US10262701B2 (en) | 2017-06-07 | 2019-04-16 | Micron Technology, Inc. | Data transfer between subarrays in memory |
US10318168B2 (en) | 2017-06-19 | 2019-06-11 | Micron Technology, Inc. | Apparatuses and methods for simultaneous in data path compute operations |
US10533966B2 (en) | 2017-07-27 | 2020-01-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Digital time domain readout circuit for bioFET sensor cascades |
US10162005B1 (en) | 2017-08-09 | 2018-12-25 | Micron Technology, Inc. | Scan chain operations |
US10534553B2 (en) | 2017-08-30 | 2020-01-14 | Micron Technology, Inc. | Memory array accessibility |
US10416927B2 (en) | 2017-08-31 | 2019-09-17 | Micron Technology, Inc. | Processing in memory |
US10346092B2 (en) | 2017-08-31 | 2019-07-09 | Micron Technology, Inc. | Apparatuses and methods for in-memory operations using timing circuitry |
US10741239B2 (en) | 2017-08-31 | 2020-08-11 | Micron Technology, Inc. | Processing in memory device including a row address strobe manager |
KR102395463B1 (ko) | 2017-09-27 | 2022-05-09 | 삼성전자주식회사 | 적층형 메모리 장치, 이를 포함하는 시스템 및 그 동작 방법 |
US10409739B2 (en) | 2017-10-24 | 2019-09-10 | Micron Technology, Inc. | Command selection policy |
US10522210B2 (en) | 2017-12-14 | 2019-12-31 | Micron Technology, Inc. | Apparatuses and methods for subarray addressing |
US10332586B1 (en) | 2017-12-19 | 2019-06-25 | Micron Technology, Inc. | Apparatuses and methods for subrow addressing |
US11475951B2 (en) | 2017-12-24 | 2022-10-18 | Micron Technology, Inc. | Material implication operations in memory |
US10424376B2 (en) | 2017-12-24 | 2019-09-24 | Micron Technology, Inc. | Material implication operations in memory |
US10614875B2 (en) | 2018-01-30 | 2020-04-07 | Micron Technology, Inc. | Logical operations using memory cells |
US11194477B2 (en) | 2018-01-31 | 2021-12-07 | Micron Technology, Inc. | Determination of a match between data values stored by three or more arrays |
US10437557B2 (en) * | 2018-01-31 | 2019-10-08 | Micron Technology, Inc. | Determination of a match between data values stored by several arrays |
US10725696B2 (en) | 2018-04-12 | 2020-07-28 | Micron Technology, Inc. | Command selection policy with read priority |
US10440341B1 (en) | 2018-06-07 | 2019-10-08 | Micron Technology, Inc. | Image processor formed in an array of memory cells |
US11568229B2 (en) * | 2018-07-11 | 2023-01-31 | Silicon Storage Technology, Inc. | Redundant memory access for rows or columns containing faulty memory cells in analog neural memory in deep learning artificial neural network |
KR102665410B1 (ko) * | 2018-07-30 | 2024-05-13 | 삼성전자주식회사 | 메모리 장치의 내부 프로세싱 동작 방법 |
JP6789576B2 (ja) * | 2018-08-02 | 2020-11-25 | 株式会社フローディア | 積和演算装置 |
US10769071B2 (en) | 2018-10-10 | 2020-09-08 | Micron Technology, Inc. | Coherent memory access |
US11175915B2 (en) | 2018-10-10 | 2021-11-16 | Micron Technology, Inc. | Vector registers implemented in memory |
US10483978B1 (en) | 2018-10-16 | 2019-11-19 | Micron Technology, Inc. | Memory device processing |
KR20200066953A (ko) | 2018-12-03 | 2020-06-11 | 삼성전자주식회사 | Pim을 채용하는 반도체 메모리 장치 및 그 동작 방법 |
US11184446B2 (en) | 2018-12-05 | 2021-11-23 | Micron Technology, Inc. | Methods and apparatus for incentivizing participation in fog networks |
US11403067B2 (en) | 2019-03-20 | 2022-08-02 | Micron Technology, Inc. | Memory array data structure for posit operations |
US12118056B2 (en) | 2019-05-03 | 2024-10-15 | Micron Technology, Inc. | Methods and apparatus for performing matrix transformations within a memory array |
WO2020247077A1 (en) * | 2019-06-04 | 2020-12-10 | Micron Technology, Inc. | Bit string accumulation in memory array periphery |
US10957393B2 (en) * | 2019-06-27 | 2021-03-23 | Micron Technology, Inc. | Apparatus and methods for performing concurrent access operations on different groupings of memory cells |
US10867655B1 (en) | 2019-07-08 | 2020-12-15 | Micron Technology, Inc. | Methods and apparatus for dynamically adjusting performance of partitioned memory |
US11360768B2 (en) | 2019-08-14 | 2022-06-14 | Micron Technolgy, Inc. | Bit string operations in memory |
US11934824B2 (en) * | 2019-09-05 | 2024-03-19 | Micron Technology, Inc. | Methods for performing processing-in-memory operations, and related memory devices and systems |
CN110633069B (zh) * | 2019-09-06 | 2022-09-16 | 安徽大学 | 一种基于静态随机存储器的乘法电路结构 |
CN112558917B (zh) * | 2019-09-10 | 2021-07-27 | 珠海博雅科技有限公司 | 存算一体电路和基于存算一体电路的数据运算方法 |
US11449577B2 (en) | 2019-11-20 | 2022-09-20 | Micron Technology, Inc. | Methods and apparatus for performing video processing matrix operations within a memory array |
US11853385B2 (en) | 2019-12-05 | 2023-12-26 | Micron Technology, Inc. | Methods and apparatus for performing diversity matrix operations within a memory array |
US11579843B2 (en) * | 2020-06-15 | 2023-02-14 | Micron Technology, Inc. | Bit string accumulation in multiple registers |
KR20210156985A (ko) | 2020-06-19 | 2021-12-28 | 삼성전자주식회사 | 일 함수 층들을 갖는 반도체 소자들 |
KR20210158607A (ko) | 2020-06-24 | 2021-12-31 | 삼성전자주식회사 | 캡핑층을 포함하는 반도체 소자 |
KR20210158615A (ko) | 2020-06-24 | 2021-12-31 | 삼성전자주식회사 | 게이트 라인을 포함하는 집적회로 소자 |
US11227641B1 (en) | 2020-07-21 | 2022-01-18 | Micron Technology, Inc. | Arithmetic operations in memory |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006127460A (ja) * | 2004-06-09 | 2006-05-18 | Renesas Technology Corp | 半導体装置、半導体信号処理装置、およびクロスバースイッチ |
JP2007206849A (ja) * | 2006-01-31 | 2007-08-16 | Renesas Technology Corp | 並列演算処理装置 |
Family Cites Families (296)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4380046A (en) | 1979-05-21 | 1983-04-12 | Nasa | Massively parallel processor computer |
JPS6032911B2 (ja) | 1979-07-26 | 1985-07-31 | 株式会社東芝 | 半導体記憶装置 |
US4435792A (en) | 1982-06-30 | 1984-03-06 | Sun Microsystems, Inc. | Raster memory manipulation apparatus |
US4727474A (en) | 1983-02-18 | 1988-02-23 | Loral Corporation | Staging memory for massively parallel processor |
EP0214718A3 (en) | 1985-07-22 | 1990-04-04 | Alliant Computer Systems Corporation | Digital computer |
US5201039A (en) | 1987-09-30 | 1993-04-06 | Mitsubishi Denki Kabushiki Kaisha | Multiple address-space data processor with addressable register and context switching |
JPH0831168B2 (ja) | 1987-11-06 | 1996-03-27 | 沖電気工業株式会社 | 窓口用自動取引装置 |
US4843264A (en) | 1987-11-25 | 1989-06-27 | Visic, Inc. | Dynamic sense amplifier for CMOS static RAM |
US5276643A (en) | 1988-08-11 | 1994-01-04 | Siemens Aktiengesellschaft | Integrated semiconductor circuit |
JPH0713858B2 (ja) | 1988-08-30 | 1995-02-15 | 三菱電機株式会社 | 半導体記憶装置 |
US5023838A (en) | 1988-12-02 | 1991-06-11 | Ncr Corporation | Random access memory device with integral logic capability |
US4958378A (en) | 1989-04-26 | 1990-09-18 | Sun Microsystems, Inc. | Method and apparatus for detecting changes in raster data |
US5253308A (en) | 1989-06-21 | 1993-10-12 | Amber Engineering, Inc. | Massively parallel digital image data processor using pixel-mapped input/output and relative indexed addressing |
DE69132495T2 (de) | 1990-03-16 | 2001-06-13 | Texas Instruments Inc., Dallas | Verteilter Verarbeitungsspeicher |
US5034636A (en) | 1990-06-04 | 1991-07-23 | Motorola, Inc. | Sense amplifier with an integral logic function |
US5210850A (en) | 1990-06-15 | 1993-05-11 | Compaq Computer Corporation | Memory address space determination using programmable limit registers with single-ended comparators |
JP3361825B2 (ja) | 1990-08-22 | 2003-01-07 | テキサス インスツルメンツ インコーポレイテツド | メモリ・アレイ・アーキテクチャ |
JPH06103599B2 (ja) | 1990-11-16 | 1994-12-14 | 三菱電機株式会社 | 半導体集積回路装置 |
US5325519A (en) | 1991-10-18 | 1994-06-28 | Texas Microsystems, Inc. | Fault tolerant computer with archival rollback capabilities |
FR2685973B1 (fr) | 1992-01-03 | 1994-02-25 | France Telecom | Point memoire pour memoire associative. |
KR950005095Y1 (ko) | 1992-03-18 | 1995-06-22 | 문정환 | 양방향성 그로벌 비트 라인을 갖는 dram |
KR940004434A (ko) | 1992-08-25 | 1994-03-15 | 윌리엄 이. 힐러 | 스마트 다이나믹 랜덤 억세스 메모리 및 그 처리방법 |
KR950004854B1 (ko) | 1992-10-08 | 1995-05-15 | 삼성전자 주식회사 | 반도체 메모리 장치 |
US5440482A (en) | 1993-03-25 | 1995-08-08 | Taligent, Inc. | Forward and reverse Boyer-Moore string searching of multilingual text having a defined collation order |
US5485373A (en) | 1993-03-25 | 1996-01-16 | Taligent, Inc. | Language-sensitive text searching system with modified Boyer-Moore process |
US5369622A (en) | 1993-04-20 | 1994-11-29 | Micron Semiconductor, Inc. | Memory with isolated digit lines |
US5754478A (en) | 1993-04-20 | 1998-05-19 | Micron Technology, Inc. | Fast, low power, write scheme for memory circuits using pulsed off isolation device |
JP2663838B2 (ja) | 1993-07-27 | 1997-10-15 | 日本電気株式会社 | 半導体集積回路装置 |
JP3252306B2 (ja) | 1993-08-10 | 2002-02-04 | 株式会社日立製作所 | 半導体不揮発性記憶装置 |
JP3904244B2 (ja) | 1993-09-17 | 2007-04-11 | 株式会社ルネサステクノロジ | シングル・チップ・データ処理装置 |
JP3251421B2 (ja) | 1994-04-11 | 2002-01-28 | 株式会社日立製作所 | 半導体集積回路 |
US5655113A (en) | 1994-07-05 | 1997-08-05 | Monolithic System Technology, Inc. | Resynchronization circuit for a memory system and method of operating same |
JPH0831168A (ja) | 1994-07-13 | 1996-02-02 | Hitachi Ltd | 半導体記憶装置 |
US5481500A (en) | 1994-07-22 | 1996-01-02 | International Business Machines Corporation | Precharged bit decoder and sense amplifier with integrated latch usable in pipelined memories |
US5615404A (en) | 1994-10-31 | 1997-03-25 | Intel Corporation | System having independently addressable bus interfaces coupled to serially connected multi-ported signal distributors generating and maintaining frame based polling schedule favoring isochronous peripherals |
US5638128A (en) | 1994-11-08 | 1997-06-10 | General Instrument Corporation Of Delaware | Pixel interpolation filters for video decompression processor |
US5724366A (en) | 1995-05-16 | 1998-03-03 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device |
KR0146530B1 (ko) | 1995-05-25 | 1998-09-15 | 김광호 | 단속제어회로를 구비한 반도체 메모리 장치와 제어방법 |
US7301541B2 (en) | 1995-08-16 | 2007-11-27 | Microunity Systems Engineering, Inc. | Programmable processor and method with wide operations |
JP2812262B2 (ja) | 1995-08-31 | 1998-10-22 | 日本電気株式会社 | 連想記憶装置 |
US6385634B1 (en) | 1995-08-31 | 2002-05-07 | Intel Corporation | Method for performing multiply-add operations on packed data |
JP2817836B2 (ja) | 1995-11-30 | 1998-10-30 | 日本電気株式会社 | 半導体メモリ装置 |
JP3356612B2 (ja) | 1996-02-29 | 2002-12-16 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 高速な輪郭スムージング方法及び装置 |
US6092186A (en) | 1996-05-07 | 2000-07-18 | Lucent Technologies Inc. | Apparatus and method for aborting un-needed instruction fetches in a digital microprocessor device |
US5915084A (en) | 1996-09-30 | 1999-06-22 | Advanced Micro Devices, Inc. | Scannable sense amplifier circuit |
US5991209A (en) | 1997-04-11 | 1999-11-23 | Raytheon Company | Split sense amplifier and staging buffer for wide memory architecture |
JP3592887B2 (ja) | 1997-04-30 | 2004-11-24 | 株式会社東芝 | 不揮発性半導体記憶装置 |
US6510098B1 (en) | 1997-05-28 | 2003-01-21 | Cirrus Logic, Inc. | Method and apparatus for transferring data in a dual port memory |
JPH1115773A (ja) | 1997-06-24 | 1999-01-22 | Matsushita Electron Corp | 半導体集積回路、コンピュータシステム、データ処理装置及びデータ処理方法 |
US5935263A (en) | 1997-07-01 | 1999-08-10 | Micron Technology, Inc. | Method and apparatus for memory array compressed data testing |
US6195734B1 (en) | 1997-07-02 | 2001-02-27 | Micron Technology, Inc. | System for implementing a graphic address remapping table as a virtual register file in system memory |
US6181698B1 (en) | 1997-07-09 | 2001-01-30 | Yoichi Hariguchi | Network routing table using content addressable memory |
US6025221A (en) | 1997-08-22 | 2000-02-15 | Micron Technology, Inc. | Processing methods of forming integrated circuitry memory devices, methods of forming DRAM arrays, and related semiconductor masks |
US5991785A (en) | 1997-11-13 | 1999-11-23 | Lucent Technologies Inc. | Determining an extremum value and its index in an array using a dual-accumulation processor |
US5867429A (en) | 1997-11-19 | 1999-02-02 | Sandisk Corporation | High density non-volatile flash memory without adverse effects of electric field coupling between adjacent floating gates |
US6163862A (en) * | 1997-12-01 | 2000-12-19 | International Business Machines Corporation | On-chip test circuit for evaluating an on-chip signal using an external test signal |
JP3488612B2 (ja) | 1997-12-11 | 2004-01-19 | 株式会社東芝 | センス増幅回路 |
US5986942A (en) | 1998-01-20 | 1999-11-16 | Nec Corporation | Semiconductor memory device |
JPH11260057A (ja) | 1998-03-13 | 1999-09-24 | Nec Corp | 半導体記憶装置 |
JPH11265995A (ja) | 1998-03-17 | 1999-09-28 | Mitsubishi Electric Corp | 半導体記憶装置 |
JPH11306751A (ja) | 1998-04-22 | 1999-11-05 | Toshiba Corp | 半導体記憶装置 |
US6005799A (en) | 1998-08-06 | 1999-12-21 | Silicon Aquarius | Methods and circuits for single-memory dynamic cell multivalue data storage |
US6141286A (en) | 1998-08-21 | 2000-10-31 | Micron Technology, Inc. | Embedded DRAM architecture with local data drivers and programmable number of data read and data write lines |
US7409694B2 (en) | 1998-09-09 | 2008-08-05 | Microsoft Corporation | Highly componentized system architecture with loadable virtual memory manager |
JP2000173269A (ja) | 1998-12-08 | 2000-06-23 | Mitsubishi Electric Corp | 半導体記憶装置 |
KR100381968B1 (ko) | 1998-12-30 | 2004-03-24 | 주식회사 하이닉스반도체 | 고속동작용디램 |
US6389507B1 (en) | 1999-01-15 | 2002-05-14 | Gigabus, Inc. | Memory device search system and method |
US5999435A (en) | 1999-01-15 | 1999-12-07 | Fast-Chip, Inc. | Content addressable memory device |
US6134164A (en) | 1999-04-22 | 2000-10-17 | International Business Machines Corp. | Sensing circuit for a memory cell array |
US6741104B2 (en) | 1999-05-26 | 2004-05-25 | Micron Technology, Inc. | DRAM sense amplifier for low voltages |
US6157578A (en) * | 1999-07-15 | 2000-12-05 | Stmicroelectronics, Inc. | Method and apparatus for accessing a memory device |
US6208544B1 (en) | 1999-09-09 | 2001-03-27 | Harris Corporation | Content addressable memory cell providing simultaneous read and compare capability |
US6578058B1 (en) | 1999-10-06 | 2003-06-10 | Agilent Technologies, Inc. | System and method for comparing values from target systems |
US7124221B1 (en) | 1999-10-19 | 2006-10-17 | Rambus Inc. | Low latency multi-level communication interface |
US6418498B1 (en) | 1999-12-30 | 2002-07-09 | Intel Corporation | Integrated system management memory for system management interrupt handler independent of BIOS and operating system |
JP4627103B2 (ja) | 2000-01-18 | 2011-02-09 | 富士通セミコンダクター株式会社 | 半導体記憶装置及びその制御方法 |
US6687175B1 (en) | 2000-02-04 | 2004-02-03 | Renesas Technology Corporation | Semiconductor device |
AU2001239907A1 (en) | 2000-02-29 | 2001-09-12 | Stephen J. Guerreri | Method and apparatus for building a memory image |
US7028170B2 (en) | 2000-03-08 | 2006-04-11 | Sun Microsystems, Inc. | Processing architecture having a compare capability |
JP3983969B2 (ja) | 2000-03-08 | 2007-09-26 | 株式会社東芝 | 不揮発性半導体記憶装置 |
US6678678B2 (en) | 2000-03-09 | 2004-01-13 | Braodcom Corporation | Method and apparatus for high speed table search |
JP3822412B2 (ja) | 2000-03-28 | 2006-09-20 | 株式会社東芝 | 半導体記憶装置 |
US6965648B1 (en) | 2000-05-04 | 2005-11-15 | Sun Microsystems, Inc. | Source synchronous link integrity validation |
AU2001270400A1 (en) | 2000-07-07 | 2002-01-21 | Mosaid Technologies Incorporated | A high speed dram architecture with uniform access latency |
US6466499B1 (en) | 2000-07-11 | 2002-10-15 | Micron Technology, Inc. | DRAM sense amplifier having pre-charged transistor body nodes |
AU2001285161A1 (en) | 2000-08-21 | 2002-03-04 | United States Postal Services | Delivery point validation system |
US6301164B1 (en) | 2000-08-25 | 2001-10-09 | Micron Technology, Inc. | Antifuse method to repair columns in a prefetched output memory architecture |
US6704828B1 (en) | 2000-08-31 | 2004-03-09 | Micron Technology, Inc. | System and method for implementing data pre-fetch having reduced data lines and/or higher data rates |
US6948056B1 (en) | 2000-09-28 | 2005-09-20 | Intel Corporation | Maintaining even and odd array pointers to extreme values by searching and comparing multiple elements concurrently where a pointer is adjusted after processing to account for a number of pipeline stages |
US6304477B1 (en) | 2001-01-31 | 2001-10-16 | Motorola, Inc. | Content addressable magnetic random access memory |
US6563754B1 (en) | 2001-02-08 | 2003-05-13 | Integrated Device Technology, Inc. | DRAM circuit with separate refresh memory |
US6650158B2 (en) | 2001-02-21 | 2003-11-18 | Ramtron International Corporation | Ferroelectric non-volatile logic elements |
US6807614B2 (en) | 2001-07-19 | 2004-10-19 | Shine C. Chung | Method and apparatus for using smart memories in computing |
US7546438B2 (en) | 2001-07-19 | 2009-06-09 | Chung Shine C | Algorithm mapping, specialized instructions and architecture features for smart memory computing |
US6449210B1 (en) * | 2001-08-02 | 2002-09-10 | Micron Technology, Inc. | Semiconductor memory array architecture |
ITRM20010531A1 (it) | 2001-08-31 | 2003-02-28 | Micron Technology Inc | Dispositivo rilevatore a bassa potenza e alta tensione per memorie ditipo flash. |
US7260672B2 (en) | 2001-09-07 | 2007-08-21 | Intel Corporation | Using data stored in a destructive-read memory |
US7062689B2 (en) | 2001-12-20 | 2006-06-13 | Arm Limited | Method and apparatus for memory self testing |
US20040073773A1 (en) | 2002-02-06 | 2004-04-15 | Victor Demjanenko | Vector processor architecture and methods performed therein |
US6707729B2 (en) | 2002-02-15 | 2004-03-16 | Micron Technology, Inc. | Physically alternating sense amplifier activation |
WO2003088033A1 (en) | 2002-04-09 | 2003-10-23 | University Of Rochester | Multiplier-based processor-in-memory architectures for image and graphics processing |
JP2003331598A (ja) | 2002-05-13 | 2003-11-21 | Mitsubishi Electric Corp | 半導体記憶装置 |
US7406494B2 (en) | 2002-05-14 | 2008-07-29 | Texas Instruments Incorporated | Method of generating a cycle-efficient bit-reverse index array for a wireless communication system |
JP2003346484A (ja) | 2002-05-23 | 2003-12-05 | Mitsubishi Electric Corp | 不揮発性半導体記憶装置 |
US6789099B2 (en) | 2002-06-10 | 2004-09-07 | International Business Machines Corporation | Sense-amp based adder with source follower evaluation tree |
JP3851856B2 (ja) * | 2002-09-06 | 2006-11-29 | 株式会社東芝 | 半導体記憶装置 |
US7054178B1 (en) | 2002-09-06 | 2006-05-30 | Etron Technology, Inc. | Datapath architecture for high area efficiency |
US6987693B2 (en) | 2002-09-24 | 2006-01-17 | Sandisk Corporation | Non-volatile memory and method with reduced neighboring field errors |
US7079407B1 (en) | 2002-10-18 | 2006-07-18 | Netlogic Microsystems, Inc. | Content addressable memory (CAM) device including match line sensing |
US6765834B2 (en) | 2002-11-19 | 2004-07-20 | Hewlett-Packard Development Company, L.P. | System and method for sensing memory cells of an array of memory cells |
US6731542B1 (en) | 2002-12-05 | 2004-05-04 | Advanced Micro Devices, Inc. | Circuit for accurate memory read operations |
KR100546307B1 (ko) | 2002-12-05 | 2006-01-26 | 삼성전자주식회사 | 글로벌 입출력라인을 프리차지 및/또는 이퀄라이징하기위한 프리차지 회로를 구비하는 반도체 장치 및프리차지 및/또는 이퀄라이즈하는 트랜지스터의 레이아웃 |
US6888372B1 (en) | 2002-12-20 | 2005-05-03 | Altera Corporation | Programmable logic device with soft multiplier |
US20050015557A1 (en) | 2002-12-27 | 2005-01-20 | Chih-Hung Wang | Nonvolatile memory unit with specific cache |
US7346903B2 (en) | 2003-02-04 | 2008-03-18 | Sun Microsystems, Inc. | Compiling and linking modules of a cycle-based logic design |
US6768679B1 (en) | 2003-02-10 | 2004-07-27 | Advanced Micro Devices, Inc. | Selection circuit for accurate memory read operations |
US6819612B1 (en) * | 2003-03-13 | 2004-11-16 | Advanced Micro Devices, Inc. | Apparatus and method for a sense amplifier circuit that samples and holds a reference voltage |
US6865122B2 (en) | 2003-04-11 | 2005-03-08 | Intel Corporation | Reclaiming blocks in a block-alterable memory |
US7574466B2 (en) | 2003-04-23 | 2009-08-11 | Micron Technology, Inc. | Method for finding global extrema of a set of shorts distributed across an array of parallel processing elements |
US7447720B2 (en) | 2003-04-23 | 2008-11-04 | Micron Technology, Inc. | Method for finding global extrema of a set of bytes distributed across an array of parallel processing elements |
US7454451B2 (en) | 2003-04-23 | 2008-11-18 | Micron Technology, Inc. | Method for finding local extrema of a set of values for a parallel processing element |
US9015390B2 (en) | 2003-04-25 | 2015-04-21 | Micron Technology, Inc. | Active memory data compression system and method |
DE10319271A1 (de) | 2003-04-29 | 2004-11-25 | Infineon Technologies Ag | Speicher-Schaltungsanordnung und Verfahren zur Herstellung |
US6828823B1 (en) * | 2003-05-16 | 2004-12-07 | Lattice Semiconductor Corporation | Non-volatile and reconfigurable programmable logic devices |
JP3898152B2 (ja) | 2003-05-27 | 2007-03-28 | ローム株式会社 | 演算機能付き記憶装置および演算記憶方法 |
WO2005024843A1 (en) | 2003-09-04 | 2005-03-17 | Koninklijke Philips Electronics N.V. | Integrated circuit and a method of cache remapping |
US6956770B2 (en) | 2003-09-17 | 2005-10-18 | Sandisk Corporation | Non-volatile memory and method with bit line compensation dependent on neighboring operating modes |
US7177183B2 (en) | 2003-09-30 | 2007-02-13 | Sandisk 3D Llc | Multiple twin cell non-volatile memory array and logic block structure and method therefor |
US7913125B2 (en) | 2003-11-04 | 2011-03-22 | Lsi Corporation | BISR mode to test the redundant elements and regular functional memory to avoid test escapes |
US6950771B1 (en) | 2003-12-09 | 2005-09-27 | Xilinx, Inc. | Correlation of electrical test data with physical defect data |
US7401281B2 (en) | 2004-01-29 | 2008-07-15 | International Business Machines Corporation | Remote BIST high speed test and redundancy calculation |
US7631236B2 (en) | 2004-01-29 | 2009-12-08 | International Business Machines Corporation | Hybrid built-in self test (BIST) architecture for embedded memory arrays and an associated method |
JP4819316B2 (ja) | 2004-02-23 | 2011-11-24 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US7088606B2 (en) | 2004-03-10 | 2006-08-08 | Altera Corporation | Dynamic RAM storage techniques |
US7020017B2 (en) | 2004-04-06 | 2006-03-28 | Sandisk Corporation | Variable programming of non-volatile memory |
US7120063B1 (en) | 2004-05-07 | 2006-10-10 | Spansion Llc | Flash memory cell and methods for programming and erasing |
US8522205B2 (en) | 2004-05-18 | 2013-08-27 | Oracle International Corporation | Packaging multiple groups of read-only files of an application's components into multiple shared libraries |
US7061817B2 (en) | 2004-06-30 | 2006-06-13 | Micron Technology, Inc. | Data path having grounded precharge operation and test compression capability |
US7116602B2 (en) | 2004-07-15 | 2006-10-03 | Micron Technology, Inc. | Method and system for controlling refresh to avoid memory cell data losses |
US7434024B2 (en) | 2004-08-30 | 2008-10-07 | Ati Technologies, Inc. | SIMD processor with register addressing, buffer stall and methods |
JP2006099232A (ja) | 2004-09-28 | 2006-04-13 | Renesas Technology Corp | 半導体信号処理装置 |
US20060069849A1 (en) | 2004-09-30 | 2006-03-30 | Rudelic John C | Methods and apparatus to update information in a memory |
US7685365B2 (en) | 2004-09-30 | 2010-03-23 | Intel Corporation | Transactional memory execution utilizing virtual memory |
US20060149804A1 (en) | 2004-11-30 | 2006-07-06 | International Business Machines Corporation | Multiply-sum dot product instruction with mask and splat |
US7230851B2 (en) | 2004-12-23 | 2007-06-12 | Sandisk Corporation | Reducing floating gate to floating gate coupling effect |
KR100684876B1 (ko) | 2005-01-03 | 2007-02-20 | 삼성전자주식회사 | 독출 시간을 단축시킬 수 있는 플래시 메모리 장치 및 방법 |
KR100673901B1 (ko) | 2005-01-28 | 2007-01-25 | 주식회사 하이닉스반도체 | 저전압용 반도체 메모리 장치 |
US7543119B2 (en) | 2005-02-10 | 2009-06-02 | Richard Edward Hessel | Vector processor |
US7624313B2 (en) | 2005-03-28 | 2009-11-24 | Hewlett-Packard Development Company, L.P. | TCAM BIST with redundancy |
US7187585B2 (en) | 2005-04-05 | 2007-03-06 | Sandisk Corporation | Read operation for non-volatile storage that includes compensation for coupling |
US7196928B2 (en) | 2005-04-05 | 2007-03-27 | Sandisk Corporation | Compensating for coupling during read operations of non-volatile memory |
US7193898B2 (en) | 2005-06-20 | 2007-03-20 | Sandisk Corporation | Compensation currents in non-volatile memory read operations |
JP4738112B2 (ja) | 2005-09-12 | 2011-08-03 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
KR100720644B1 (ko) | 2005-11-17 | 2007-05-21 | 삼성전자주식회사 | 메모리 장치 및 메모리 그 동작 방법 |
WO2007069295A1 (ja) | 2005-12-13 | 2007-06-21 | Spansion Llc | 半導体装置およびその制御方法 |
JP5129450B2 (ja) | 2006-01-16 | 2013-01-30 | ルネサスエレクトロニクス株式会社 | 情報処理装置 |
US8077533B2 (en) | 2006-01-23 | 2011-12-13 | Freescale Semiconductor, Inc. | Memory and method for sensing data in a memory using complementary sensing scheme |
US7400532B2 (en) | 2006-02-16 | 2008-07-15 | Micron Technology, Inc. | Programming method to reduce gate coupling interference for non-volatile memory |
KR100755370B1 (ko) | 2006-04-17 | 2007-09-04 | 삼성전자주식회사 | 반도체 메모리 장치 |
TW200828333A (en) | 2006-04-28 | 2008-07-01 | Samsung Electronics Co Ltd | Sense amplifier circuit and sense amplifier-based flip-flop having the same |
US7752417B2 (en) | 2006-06-05 | 2010-07-06 | Oracle America, Inc. | Dynamic selection of memory virtualization techniques |
US7372715B2 (en) | 2006-06-14 | 2008-05-13 | Micron Technology, Inc. | Architecture and method for NAND flash memory |
US8069377B2 (en) | 2006-06-26 | 2011-11-29 | Micron Technology, Inc. | Integrated circuit having memory array including ECC and column redundancy and method of operating the same |
US7724559B2 (en) | 2006-07-14 | 2010-05-25 | International Business Machines Corporation | Self-referenced match-line sense amplifier for content addressable memories |
US7443729B2 (en) | 2006-07-20 | 2008-10-28 | Sandisk Corporation | System that compensates for coupling based on sensing a neighbor using coupling |
US7885119B2 (en) | 2006-07-20 | 2011-02-08 | Sandisk Corporation | Compensating for coupling during programming |
US7692466B2 (en) | 2006-08-18 | 2010-04-06 | Ati Technologies Ulc | Sense amplifier based flip-flop |
US7805587B1 (en) | 2006-11-01 | 2010-09-28 | Nvidia Corporation | Memory addressing controlled by PTE fields |
US8151082B2 (en) | 2007-12-06 | 2012-04-03 | Fusion-Io, Inc. | Apparatus, system, and method for converting a storage request into an append data storage command |
US7471536B2 (en) | 2006-12-08 | 2008-12-30 | Texas Instruments Incorporated | Match mismatch emulation scheme for an addressed location in a CAM |
KR100819100B1 (ko) * | 2007-01-04 | 2008-04-03 | 삼성전자주식회사 | 반도체 메모리 장치에서의 데이터 라인 배치 구조 및 라인드라이빙 방법 |
US7460387B2 (en) | 2007-01-05 | 2008-12-02 | International Business Machines Corporation | eDRAM hierarchical differential sense amp |
US7603605B2 (en) | 2007-01-08 | 2009-10-13 | Arm Limited | Performance control of an integrated circuit |
US7743303B2 (en) | 2007-01-22 | 2010-06-22 | Micron Technology, Inc. | Defective memory block remapping method and system, and memory device and processor-based system using same |
KR100826497B1 (ko) | 2007-01-22 | 2008-05-02 | 삼성전자주식회사 | 전력 소모를 줄이기 위한 반도체 메모리 장치의 입출력센스 앰프 회로 |
JP4936914B2 (ja) * | 2007-01-23 | 2012-05-23 | 株式会社東芝 | 半導体記憶装置 |
US7937535B2 (en) | 2007-02-22 | 2011-05-03 | Arm Limited | Managing cache coherency in a data processing apparatus |
US7804718B2 (en) | 2007-03-07 | 2010-09-28 | Mosaid Technologies Incorporated | Partial block erase architecture for flash memory |
US7492640B2 (en) * | 2007-06-07 | 2009-02-17 | Sandisk Corporation | Sensing with bit-line lockout control in non-volatile memory |
JP2009009665A (ja) | 2007-06-29 | 2009-01-15 | Elpida Memory Inc | 半導体記憶装置 |
US7996749B2 (en) | 2007-07-03 | 2011-08-09 | Altera Corporation | Signal loss detector for high-speed serial interface of a programmable logic device |
US7489543B1 (en) | 2007-07-25 | 2009-02-10 | Micron Technology, Inc. | Programming multilevel cell memory arrays |
US7694195B2 (en) | 2007-08-14 | 2010-04-06 | Dell Products L.P. | System and method for using a memory mapping function to map memory defects |
US7869273B2 (en) * | 2007-09-04 | 2011-01-11 | Sandisk Corporation | Reducing the impact of interference during programming |
US7787319B2 (en) | 2007-09-06 | 2010-08-31 | Innovative Silicon Isi Sa | Sense amplifier circuitry for integrated circuit having memory cell array, and method of operating same |
US8042082B2 (en) | 2007-09-12 | 2011-10-18 | Neal Solomon | Three dimensional memory in a system on a chip |
US7965564B2 (en) | 2007-09-18 | 2011-06-21 | Zikbit Ltd. | Processor arrays made of standard memory cells |
US7663928B2 (en) | 2007-10-09 | 2010-02-16 | Ememory Technology Inc. | Sense amplifier circuit having current mirror architecture |
WO2009052525A1 (en) | 2007-10-19 | 2009-04-23 | Virident Systems, Inc. | Managing memory systems containing components with asymmetric characteristics |
US7924628B2 (en) * | 2007-11-14 | 2011-04-12 | Spansion Israel Ltd | Operation of a non-volatile memory array |
US7979667B2 (en) | 2007-12-10 | 2011-07-12 | Spansion Llc | Memory array search engine |
US7755960B2 (en) | 2007-12-17 | 2010-07-13 | Stmicroelectronics Sa | Memory including a performance test circuit |
US8495438B2 (en) | 2007-12-28 | 2013-07-23 | Texas Instruments Incorporated | Technique for memory imprint reliability improvement |
US7808854B2 (en) | 2008-02-19 | 2010-10-05 | Kabushiki Kaisha Toshiba | Systems and methods for data transfers between memory cells |
JP5194302B2 (ja) | 2008-02-20 | 2013-05-08 | ルネサスエレクトロニクス株式会社 | 半導体信号処理装置 |
US8332580B2 (en) | 2008-04-02 | 2012-12-11 | Zikbit Ltd. | System, method and apparatus for memory with embedded associative section for computations |
US20090254694A1 (en) | 2008-04-02 | 2009-10-08 | Zikbit Ltd. | Memory device with integrated parallel processing |
US7957206B2 (en) | 2008-04-04 | 2011-06-07 | Micron Technology, Inc. | Read circuitry for an integrated circuit having memory cells and/or a memory cell array, and method of operating same |
US8339824B2 (en) | 2008-07-02 | 2012-12-25 | Cooke Laurence H | Nearest neighbor serial content addressable memory |
US8555037B2 (en) | 2008-08-15 | 2013-10-08 | Apple Inc. | Processing vectors using wrapping minima and maxima instructions in the macroscalar architecture |
US8417921B2 (en) | 2008-08-15 | 2013-04-09 | Apple Inc. | Running-min and running-max instructions for processing vectors using a base value from a key element of an input vector |
US8259509B2 (en) | 2008-08-18 | 2012-09-04 | Elpida Memory, Inc. | Semiconductor memory device and method with auxiliary I/O line assist circuit and functionality |
ITRM20080543A1 (it) | 2008-10-09 | 2010-04-10 | Micron Technology Inc | Architettura e metodo per la programmazione di memorie. |
JP2010123210A (ja) * | 2008-11-20 | 2010-06-03 | Toshiba Corp | 半導体記憶装置 |
KR101596283B1 (ko) | 2008-12-19 | 2016-02-23 | 삼성전자 주식회사 | 개선된 로컬 입출력라인 프리차아지 스킴을 갖는 반도체 메모리 장치 |
US8027214B2 (en) | 2008-12-31 | 2011-09-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Asymmetric sense amplifier |
KR101622922B1 (ko) | 2009-03-06 | 2016-05-20 | 삼성전자 주식회사 | 개선된 로컬 입출력라인 프리차아지 스킴을 갖는 반도체 메모리 장치 |
US8484276B2 (en) | 2009-03-18 | 2013-07-09 | International Business Machines Corporation | Processing array data on SIMD multi-core processor architectures |
KR20100134235A (ko) | 2009-06-15 | 2010-12-23 | 삼성전자주식회사 | 반도체 메모리 장치 |
US7898864B2 (en) | 2009-06-24 | 2011-03-01 | Sandisk Corporation | Read operation for memory with compensation for coupling based on write-erase cycles |
US8412985B1 (en) | 2009-06-30 | 2013-04-02 | Micron Technology, Inc. | Hardwired remapped memory |
US8412987B2 (en) | 2009-06-30 | 2013-04-02 | Micron Technology, Inc. | Non-volatile memory to store memory remap information |
US8238173B2 (en) | 2009-07-16 | 2012-08-07 | Zikbit Ltd | Using storage cells to perform computation |
US9076527B2 (en) | 2009-07-16 | 2015-07-07 | Mikamonu Group Ltd. | Charge sharing in a TCAM array |
JP4951041B2 (ja) | 2009-08-06 | 2012-06-13 | 株式会社東芝 | 半導体記憶装置 |
US20120135225A1 (en) | 2009-08-18 | 2012-05-31 | Andre Colas | Multi-layer Transdermal Patch |
US8059438B2 (en) | 2009-08-28 | 2011-11-15 | International Business Machines Corporation | Content addressable memory array programmed to perform logic operations |
US8077532B2 (en) | 2009-09-02 | 2011-12-13 | Micron Technology, Inc. | Small unit internal verify read in a memory device |
US8482975B2 (en) | 2009-09-14 | 2013-07-09 | Micron Technology, Inc. | Memory kink checking |
US8495465B1 (en) | 2009-10-15 | 2013-07-23 | Apple Inc. | Error correction coding over multiple memory pages |
US20120246380A1 (en) | 2009-10-21 | 2012-09-27 | Avidan Akerib | Neighborhood operations for parallel processing |
US9477636B2 (en) * | 2009-10-21 | 2016-10-25 | Micron Technology, Inc. | Memory having internal processors and data communication methods in memory |
US8650232B2 (en) | 2009-10-26 | 2014-02-11 | Via Technologies, Inc. | System and method for determination of a horizontal minimum of digital values |
KR101634340B1 (ko) | 2009-11-03 | 2016-06-28 | 삼성전자주식회사 | 반도체 메모리 장치의 프로그램 방법 |
US8583896B2 (en) | 2009-11-13 | 2013-11-12 | Nec Laboratories America, Inc. | Massively parallel processing core with plural chains of processing elements and respective smart memory storing select data received from each chain |
KR20110054773A (ko) | 2009-11-18 | 2011-05-25 | 삼성전자주식회사 | 비트라인 디스털번스를 개선하는 반도체 메모리 장치 |
US8089815B2 (en) | 2009-11-24 | 2012-01-03 | Sandisk Technologies Inc. | Programming memory with bit line floating to reduce channel-to-floating gate coupling |
US8605015B2 (en) | 2009-12-23 | 2013-12-10 | Syndiant, Inc. | Spatial light modulator with masking-comparators |
JP2011146102A (ja) | 2010-01-15 | 2011-07-28 | Elpida Memory Inc | 半導体装置及びデータ処理システム |
CN102141905B (zh) * | 2010-01-29 | 2015-02-25 | 上海芯豪微电子有限公司 | 一种处理器体系结构 |
US8164942B2 (en) | 2010-02-01 | 2012-04-24 | International Business Machines Corporation | High performance eDRAM sense amplifier |
US8533245B1 (en) | 2010-03-03 | 2013-09-10 | Altera Corporation | Multipliers with a reduced number of memory blocks |
US10242720B2 (en) | 2010-03-25 | 2019-03-26 | Qualcomm Incorporated | Dual sensing current latched sense amplifier |
US9317536B2 (en) | 2010-04-27 | 2016-04-19 | Cornell University | System and methods for mapping and searching objects in multidimensional space |
KR101119371B1 (ko) * | 2010-04-29 | 2012-03-06 | 주식회사 하이닉스반도체 | 반도체 메모리 장치 및 이의 동작 방법 |
US8559232B2 (en) | 2010-05-03 | 2013-10-15 | Aplus Flash Technology, Inc. | DRAM-like NVM memory array and sense amplifier design for high temperature and high endurance operation |
US8351278B2 (en) | 2010-06-23 | 2013-01-08 | International Business Machines Corporation | Jam latch for latching memory array output data |
KR101143471B1 (ko) | 2010-07-02 | 2012-05-11 | 에스케이하이닉스 주식회사 | 센스앰프 및 이를 포함하는 반도체 장치 |
US20120017039A1 (en) | 2010-07-16 | 2012-01-19 | Plx Technology, Inc. | Caching using virtual memory |
US8462532B1 (en) | 2010-08-31 | 2013-06-11 | Netlogic Microsystems, Inc. | Fast quaternary content addressable memory cell |
US8347154B2 (en) | 2010-09-21 | 2013-01-01 | International Business Machines Corporation | Use of hashing function to distinguish random and repeat errors in a memory system |
US8904115B2 (en) | 2010-09-28 | 2014-12-02 | Texas Instruments Incorporated | Cache with multiple access pipelines |
US8850137B2 (en) | 2010-10-11 | 2014-09-30 | Cisco Technology, Inc. | Memory subsystem for counter-based and other applications |
US8332367B2 (en) | 2010-10-20 | 2012-12-11 | International Business Machines Corporation | Parallel data redundancy removal |
KR101148352B1 (ko) | 2010-11-02 | 2012-05-21 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 및 그의 동작 방법 |
JP5528987B2 (ja) | 2010-11-11 | 2014-06-25 | ピーエスフォー ルクスコ エスエイアールエル | 半導体装置 |
US8553481B2 (en) | 2010-11-29 | 2013-10-08 | Apple Inc. | Sense amplifier latch with integrated test data multiplexer |
WO2012104674A1 (en) | 2011-01-31 | 2012-08-09 | Freescale Semiconductor, Inc. | Integrated circuit device and method for determining an index of an extreme value within an array of values |
KR20120088973A (ko) | 2011-02-01 | 2012-08-09 | 삼성전자주식회사 | 로컬 센스앰프 회로 및 이를 포함하는 반도체 메모리 장치 |
JP2012174016A (ja) | 2011-02-22 | 2012-09-10 | Renesas Electronics Corp | データ処理装置およびそのデータ処理方法 |
JP5259765B2 (ja) | 2011-03-29 | 2013-08-07 | 株式会社東芝 | 不揮発性半導体メモリ |
US8725730B2 (en) | 2011-05-23 | 2014-05-13 | Hewlett-Packard Development Company, L.P. | Responding to a query in a data processing system |
US8706958B2 (en) | 2011-09-01 | 2014-04-22 | Thomas Hein | Data mask encoding in data bit inversion scheme |
US9001587B2 (en) * | 2011-09-16 | 2015-04-07 | Samsung Electronics Co., Ltd. | Flash memory and reading method of flash memory |
KR101878902B1 (ko) * | 2011-10-04 | 2018-07-17 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 및 그의 구동 방법 |
US20140247673A1 (en) | 2011-10-28 | 2014-09-04 | Naveen Muralimanohar | Row shifting shiftable memory |
US8891297B2 (en) | 2011-11-01 | 2014-11-18 | Micron Technology, Inc. | Memory cell sensing |
KR101298191B1 (ko) * | 2011-11-04 | 2013-08-20 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치, 이를 위한 연속 프로그램 제어 회로 및 프로그램 방법 |
KR101321481B1 (ko) | 2011-11-04 | 2013-10-28 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 및 이를 위한 테스트 회로 |
US9830158B2 (en) | 2011-11-04 | 2017-11-28 | Nvidia Corporation | Speculative execution and rollback |
KR20130052971A (ko) | 2011-11-14 | 2013-05-23 | 삼성전자주식회사 | 비휘발성 메모리 장치의 동작 방법 |
GB2511957B (en) | 2011-11-22 | 2015-02-11 | Mips Tech Inc | Processor with kernel mode access to user space virtual addresses |
CN103959237B (zh) | 2011-11-30 | 2016-09-28 | 英特尔公司 | 用于提供向量横向比较功能的指令和逻辑 |
CN104011657B (zh) | 2011-12-22 | 2016-10-12 | 英特尔公司 | 用于向量计算和累计的装置和方法 |
KR20130072869A (ko) | 2011-12-22 | 2013-07-02 | 에스케이하이닉스 주식회사 | 프리차지 회로 및 비휘발성 메모리 장치 |
US20130286705A1 (en) | 2012-04-26 | 2013-10-31 | David B. Grover | Low power content addressable memory hitline precharge and sensing circuit |
US8938603B2 (en) | 2012-05-31 | 2015-01-20 | Samsung Electronics Co., Ltd. | Cache system optimized for cache miss detection |
US20130332707A1 (en) | 2012-06-07 | 2013-12-12 | Intel Corporation | Speed up big-number multiplication using single instruction multiple data (simd) architectures |
KR102062301B1 (ko) | 2013-01-03 | 2020-01-03 | 삼성전자주식회사 | 메모리 장치의 페이지 복사 방법 및 메모리 시스템의 페이지 관리 방법 |
US9846644B2 (en) | 2013-01-14 | 2017-12-19 | Hewlett Packard Enterprise Development Lp | Nonvolatile memory array logic |
US20140215185A1 (en) | 2013-01-29 | 2014-07-31 | Atmel Norway | Fetching instructions of a loop routine |
US9158667B2 (en) * | 2013-03-04 | 2015-10-13 | Micron Technology, Inc. | Apparatuses and methods for performing logical operations using sensing circuitry |
US9171153B2 (en) | 2013-05-17 | 2015-10-27 | Hewlett-Packard Development Company, L.P. | Bloom filter with memory element |
US8964496B2 (en) * | 2013-07-26 | 2015-02-24 | Micron Technology, Inc. | Apparatuses and methods for performing compare operations using sensing circuitry |
US8971124B1 (en) * | 2013-08-08 | 2015-03-03 | Micron Technology, Inc. | Apparatuses and methods for performing logical operations using sensing circuitry |
US9430191B2 (en) | 2013-11-08 | 2016-08-30 | Micron Technology, Inc. | Division operations for memory |
CN106462501B (zh) | 2014-05-08 | 2019-07-09 | 美光科技公司 | 基于混合存储器立方体系统互连目录的高速缓冲存储器一致性方法 |
CN106415522B (zh) | 2014-05-08 | 2020-07-21 | 美光科技公司 | 存储器内轻量一致性 |
US9711206B2 (en) * | 2014-06-05 | 2017-07-18 | Micron Technology, Inc. | Performing logical operations using sensing circuitry |
US9704540B2 (en) * | 2014-06-05 | 2017-07-11 | Micron Technology, Inc. | Apparatuses and methods for parity determination using sensing circuitry |
US9449674B2 (en) * | 2014-06-05 | 2016-09-20 | Micron Technology, Inc. | Performing logical operations using sensing circuitry |
US9747961B2 (en) * | 2014-09-03 | 2017-08-29 | Micron Technology, Inc. | Division operations in memory |
CN107408404B (zh) * | 2015-02-06 | 2021-02-12 | 美光科技公司 | 用于存储器装置的设备及方法以作为程序指令的存储 |
US9892767B2 (en) * | 2016-02-12 | 2018-02-13 | Micron Technology, Inc. | Data gathering in memory |
US9697876B1 (en) * | 2016-03-01 | 2017-07-04 | Micron Technology, Inc. | Vertical bit vector shift in memory |
US10262721B2 (en) * | 2016-03-10 | 2019-04-16 | Micron Technology, Inc. | Apparatuses and methods for cache invalidate |
US9659605B1 (en) * | 2016-04-20 | 2017-05-23 | Micron Technology, Inc. | Apparatuses and methods for performing corner turn operations using sensing circuitry |
US9659610B1 (en) * | 2016-05-18 | 2017-05-23 | Micron Technology, Inc. | Apparatuses and methods for shifting data |
KR102548591B1 (ko) * | 2016-05-30 | 2023-06-29 | 삼성전자주식회사 | 반도체 메모리 장치 및 그것의 동작 방법 |
US9767864B1 (en) * | 2016-07-21 | 2017-09-19 | Micron Technology, Inc. | Apparatuses and methods for storing a data value in a sensing circuitry element |
US9805772B1 (en) * | 2016-10-20 | 2017-10-31 | Micron Technology, Inc. | Apparatuses and methods to selectively perform logical operations |
US10268389B2 (en) * | 2017-02-22 | 2019-04-23 | Micron Technology, Inc. | Apparatuses and methods for in-memory operations |
US10236038B2 (en) * | 2017-05-15 | 2019-03-19 | Micron Technology, Inc. | Bank to bank data transfer |
US10262701B2 (en) * | 2017-06-07 | 2019-04-16 | Micron Technology, Inc. | Data transfer between subarrays in memory |
US10416927B2 (en) * | 2017-08-31 | 2019-09-17 | Micron Technology, Inc. | Processing in memory |
US10747909B2 (en) * | 2018-09-25 | 2020-08-18 | Northrop Grumman Systems Corporation | System architecture to mitigate memory imprinting |
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006127460A (ja) * | 2004-06-09 | 2006-05-18 | Renesas Technology Corp | 半導体装置、半導体信号処理装置、およびクロスバースイッチ |
JP2007206849A (ja) * | 2006-01-31 | 2007-08-16 | Renesas Technology Corp | 並列演算処理装置 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6147461B1 (ja) * | 2017-01-31 | 2017-06-14 | ゼンテルジャパン株式会社 | 半導体記憶装置 |
WO2018142478A1 (ja) * | 2017-01-31 | 2018-08-09 | ゼンテルジャパン株式会社 | 半導体記憶装置 |
US11200945B2 (en) | 2017-01-31 | 2021-12-14 | Zentel Japan Corporation | Semiconductor memory device |
JP2019164870A (ja) * | 2018-03-20 | 2019-09-26 | 株式会社東芝 | 磁気デバイス |
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