JP2013546164A - Pedot/pssおよび安定剤を含む改善された電気的パラメータを持つ層組成物 - Google Patents
Pedot/pssおよび安定剤を含む改善された電気的パラメータを持つ層組成物 Download PDFInfo
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- JP2013546164A JP2013546164A JP2013530622A JP2013530622A JP2013546164A JP 2013546164 A JP2013546164 A JP 2013546164A JP 2013530622 A JP2013530622 A JP 2013530622A JP 2013530622 A JP2013530622 A JP 2013530622A JP 2013546164 A JP2013546164 A JP 2013546164A
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- stabilizer
- layer
- conductive polymer
- polymer
- dispersion
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- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
- 125000001037 p-tolyl group Chemical group [H]C1=C([H])C(=C([H])C([H])=C1*)C([H])([H])[H] 0.000 description 1
- 239000005022 packaging material Substances 0.000 description 1
- 125000003538 pentan-3-yl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])[H] 0.000 description 1
- VLTRZXGMWDSKGL-UHFFFAOYSA-M perchlorate Inorganic materials [O-]Cl(=O)(=O)=O VLTRZXGMWDSKGL-UHFFFAOYSA-M 0.000 description 1
- JGTNAGYHADQMCM-UHFFFAOYSA-N perfluorobutanesulfonic acid Chemical compound OS(=O)(=O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F JGTNAGYHADQMCM-UHFFFAOYSA-N 0.000 description 1
- YFSUTJLHUFNCNZ-UHFFFAOYSA-N perfluorooctane-1-sulfonic acid Chemical compound OS(=O)(=O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F YFSUTJLHUFNCNZ-UHFFFAOYSA-N 0.000 description 1
- SNGREZUHAYWORS-UHFFFAOYSA-N perfluorooctanoic acid Chemical compound OC(=O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F SNGREZUHAYWORS-UHFFFAOYSA-N 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 150000003018 phosphorus compounds Chemical class 0.000 description 1
- 229920002492 poly(sulfone) Polymers 0.000 description 1
- 229920001197 polyacetylene Polymers 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 229920001444 polymaleic acid Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- KCXFHTAICRTXLI-UHFFFAOYSA-N propane-1-sulfonic acid Chemical compound CCCS(O)(=O)=O KCXFHTAICRTXLI-UHFFFAOYSA-N 0.000 description 1
- 239000003586 protic polar solvent Substances 0.000 description 1
- 229940079877 pyrogallol Drugs 0.000 description 1
- 150000004040 pyrrolidinones Chemical class 0.000 description 1
- 229960001285 quercetin Drugs 0.000 description 1
- 235000005875 quercetin Nutrition 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229960004889 salicylic acid Drugs 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 125000003548 sec-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000004984 smart glass Substances 0.000 description 1
- CHQMHPLRPQMAMX-UHFFFAOYSA-L sodium persulfate Substances [Na+].[Na+].[O-]S(=O)(=O)OOS([O-])(=O)=O CHQMHPLRPQMAMX-UHFFFAOYSA-L 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000011343 solid material Substances 0.000 description 1
- 239000000600 sorbitol Substances 0.000 description 1
- 150000003440 styrenes Chemical class 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000005720 sucrose Substances 0.000 description 1
- 150000003871 sulfonates Chemical group 0.000 description 1
- 125000001174 sulfone group Chemical group 0.000 description 1
- 150000003460 sulfonic acids Chemical class 0.000 description 1
- 125000003375 sulfoxide group Chemical group 0.000 description 1
- 150000003462 sulfoxides Chemical class 0.000 description 1
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 125000001973 tert-pentyl group Chemical group [H]C([H])([H])C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- DGQOCLATAPFASR-UHFFFAOYSA-N tetrahydroxy-1,4-benzoquinone Chemical compound OC1=C(O)C(=O)C(O)=C(O)C1=O DGQOCLATAPFASR-UHFFFAOYSA-N 0.000 description 1
- 125000000101 thioether group Chemical group 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 125000003944 tolyl group Chemical group 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 1
- ITMCEJHCFYSIIV-UHFFFAOYSA-N triflic acid Chemical compound OS(=O)(=O)C(F)(F)F ITMCEJHCFYSIIV-UHFFFAOYSA-N 0.000 description 1
- 150000005170 trihydroxybenzoic acids Chemical class 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- NLVXSWCKKBEXTG-UHFFFAOYSA-N vinylsulfonic acid Chemical class OS(=O)(=O)C=C NLVXSWCKKBEXTG-UHFFFAOYSA-N 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
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Abstract
【選択図】図2
Description
a)基板表面を持つ基板を準備する工程と、
b)この基板表面のうちの少なくとも一部の上に、導電性ポリマーを含むポリマー層を形成する工程と、
c)安定剤および液相を含む液体安定剤相を、工程b)から得たポリマー層に付与する工程であって、この安定剤相は、この安定剤相に基づいて、0.2重量%未満の、上記導電性ポリマーを含有する、工程と
を含み、当該安定剤は、少なくとも2つ、好ましくは少なくとも3つ、さらに好ましくは少なくとも4つ、さらにより好ましくは少なくとも6つのOH基を有する芳香族化合物である、製造方法によってなされる。
Aは、置換されていてもよいC1−C5−アルキレンラジカルを表し、
Rは、直鎖状もしくは分枝状の、置換されていてもよいC1−C18−アルキルラジカル、置換されていてもよいC5−C12−シクロアルキルラジカル、置換されていてもよいC6−C14−アリールラジカル、置換されていてもよいC7−C18−アラルキルラジカル、置換されていてもよいC1−C4−ヒドロキシアルキルラジカルまたはヒドロキシルラジカルを表し、
xは0〜8の整数を表し、
複数のラジカルRがAに結合されている場合、これらは同一であってもよいし異なっていてもよい)。
を含む。
S1)基板表面を持つ基板と、
S2)この基板表面に重なるポリマー層であって、導電性ポリマーを含むポリマー層と、
S3)このポリマー層に重なる安定剤層であって、少なくとも2つのOH基を持つ芳香族化合物である安定剤を含む、安定剤層と
を含む層組成物によってなされる。
粒径の決定:
分散液の平均粒径は、超遠心によって決定した。測定方法および正確な手順は、W.ScholtanおよびH.LangeによってKolloid − Z. u. Z. Polymere 250、782−796(1972)に記載されている。この記載と異なるところは、測定前にポリマー分散液を純水で希釈して測定吸光度を1としたことである。
分散液でコーティングしたポリエステルフィルムの上に、導電性の銀電極対(Leitsilber 200、Demetron)を、刷毛を使用して、中央の2つの異なる場所に塗布した。この電極対は、幅およそ2mm、長さ20mmおよび対間隔20mmを有していた。電極を取り付けた後、このフィルムを、空気中、室温で1時間乾燥した。この後、このフィルムを、導電性の銀電極の2つの端部の各々で、これらと垂直に切断した。これにより、2つの電極が互いに向かい合っている正方形の測定範囲を形成した。市販のオーム計(例えばGossen Metrawatt GmbH製のMetra Hit 12 S)を用いて表面抵抗を測定した。示された抵抗値はΩ/squareで表示した表面抵抗に相当した。2回の個々の測定値の平均を測定値として記載した。
分散液の一部分を、スピンコーター(Chemat Technology KW−4A)を用いて顕微鏡スライドガラス(26mm×26mm×1mm)上にスピンコーティングした。この試料を120℃で10分間乾燥した。このあと、この顕微鏡スライドの2つの向かい合った端を導電性の銀でコーティングした。この導電性の銀が乾燥した後、この2つの銀の細片を接触させ、Keithley 199マルチメーターを使用して表面抵抗(R□)を測定した。層の厚さを、Tencor Alpha Step 500表面形状測定装置を用いて決定した。表面抵抗および層の厚さdから、次式に従って比電気伝導率σを求めた:σ=1/(R□×d)。
分散液の粘度は、100Hzのせん断速度および20℃で、レオメーター(DG43ダブルギャップシリンダーシステムを具えるHaake 型式RotoVisco 1)を用いて求めた。
固形分含量を決定するために、5gの分散液を100℃で14時間乾燥し、重量差によって固形分含量を求めた。
キャパシタンス(マイクロファラドで表示)およびDF(%表示)は、LCRメーター(Agilent 4284A)を用いて、20℃において120Hzで測定した。
ESR(ミリオームで表示)は、LCRメーター(Agilent 4284A)を用いて、20℃において100Hzで測定した。
本願明細書中に特段の記載がない限り、平均は算術平均である。
868gの脱イオン水、330gの、平均分子量が70000であり固形分含量が3.8重量%であるポリスチレンスルホン酸水溶液を、撹拌機および内部温度計を具える2Lの3つ口フラスコの中に最初に導入した。反応温度を20〜25℃に保った。5.1gの3,4−エチレンジオキシチオフェンを、撹拌しながら加えた。この溶液を30分間撹拌した。このあと、0.03gの硫酸鉄(III)および9.5gの過硫酸ナトリウムを加え、この溶液をさらに24時間撹拌した。
100gの実施例1から得た分散液および4gのジメチルスルホキシド(DMSO)をガラスのビーカーの中で撹拌機を用いて激しく撹拌した。
実施例1から得たポリ(3,4−エチレンジオキシチオフェン)/ポリスチレンスルホン酸分散液を、高圧ホモジナイザーを用いて、1,500barの圧力下で5回均質化した。その後、この分散液を、ロータリー・エバポレーターで2.5%の固形分含量まで濃縮し、次いでさらに、高圧ホモジナイザーを用いて、1,500barの圧力下でさらに5回均質化した。
44gの実施例3から得た分散液、52gの蒸留水および4gのジメチルスルホキシド(DMSO)を、ガラスのビーカーの中で撹拌機を用いて激しく撹拌した。
100gの実施例3から得た分散液および10gのエチレングリコールをガラスのビーカーの中で撹拌機を用いて激しく撹拌し、その後、アンモニア水を用いて3のpHに調整した。
0.5重量%、1重量%および2重量%のタンニン(Aldrich − CAS番号1401−55−4)を、いずれの場合も10gの実施例4から得た分散液に、ガラスのビーカーの中で激しく撹拌しながら加えた。これらの分散液の粘度および実施例4から得た分散液の粘度を求めた(保存前の粘度)。このあと、すべての4つの分散液を、40℃で21日間、密閉したガラスのビーカーの中で保存し、そのあと、これらの分散液の粘度を再度求めた(保存後の粘度)。これらの粘度は、表1に示されている。
サイズが15×20cm2のポリエステルフィルムの小片に、螺旋棒(Erichson K HAND COATER 620 K棒の6番)を用いて、実施例2から得た分散液の一部分をナイフコーティングした。このコーティングを空気循環乾燥機の中で、130℃で20分間乾燥した。次いでこのコーティングしたポリエステルフィルムを、各々、安定剤の溶液に1分間浸漬し、そのあと、空気循環乾燥機の中で、130℃で20分間乾燥した。使用した安定剤溶液(すべてAldrich)は、表2に示されている。これらの安定剤溶液は、激しく撹拌しながら、安定剤を対応する溶媒に加えることにより、調製した。これらのコーティングの表面抵抗を、保存の前、および空気中、150℃で192時間行った保存の後で求めた。保存前の表面抵抗および保存後の表面抵抗の上昇、すなわち保存前の表面抵抗に対する保存後の表面抵抗の比、は表2に示されている。
実施例6と同様にして分散液からコーティングを製造し、測定したが、安定剤溶液への浸漬は行わなかった。結果を表2に示す。
0.1gのタンニン(Aldrich − CAS番号1401−55−4)を、激しく撹拌しながら、10gの実施例2から得た分散液に加えた。このようにして得られるこの分散液から、実施例6と同様にしてコーティングを製造し、測定したが、安定剤溶液への含浸は行わなかった。結果を表2に示す。
0.5gの3,4−エチレンジオキシチオフェン(3.5mmol)、4.5gのトシル酸鉄(III)(7.9mmol)および6.75gのブタノール(91mmol)からなる溶液を調製し、この溶液の一部分を、スピンコーターを用いて、2枚の顕微鏡スライドガラスの上へと、2,000rpmで5秒間スピンコーティングした。この試料を130℃で15分間乾燥し、次いで水で15分間洗浄した。乾燥後、この顕微鏡スライドの2つの向かい合った端を導電性の銀でコーティングした。この導電性の銀が乾燥した後、この2つの銀の細片を接触させた。次いで、このコーティングした顕微鏡スライドを、各々、5重量%タンニン水溶液に1分間浸漬し、その後、130℃で15分間乾燥した。
実施例7と同様にしてコーティングを製造し、測定したが、タンニン溶液への含浸は行わなかった。結果を表3に示す。
0.5gの3,4−エチレンジオキシチオフェン(3.5mmol)、4.5gのトシル酸鉄(III)(7.9mmol)、6.75gのブタノール(91mmol)および0.05gのタンニン(Aldrich)からなる溶液を調製した。この溶液の中に直ちに沈殿が生じ、それゆえ、これはコーティングの製造には好適ではなかった。
8.1. 酸化された電極体の製造:
170mm×5mmの寸法を持つ多孔性アルミニウム箔(アノード箔)を、アジピン酸アンモニウムの9%水溶液の中で92Vの形成電圧を用いて酸化した。このアノード箔および200mm×5mmの寸法を持つ多孔性アルミニウム箔(カソード箔)に、それぞれ接続ワイヤを設け、次いで、2つのセルロースセパレーター紙と一緒に巻きとり、接着テープを用いて固定した。5個のこれらの酸化された電極体を製造した。この酸化された電極体のセパレーター紙を300℃のオーブンの中で炭化させた。
8.1から得た酸化された電極体を、実施例5から得た分散液に15分間浸漬した。このあと、120℃で20分間、150℃で20分間、最後に260℃で3分間、乾燥を実施した。次いでこれらのコンデンサを、5重量%のタンニン(Aldrich)を含有する水溶液に15分間含浸した。このあと、120℃で20分間、および150℃で20分間、乾燥を実施した。
実施例8のようにしてコンデンサを製造し、測定したが、固体電解質の製造の間、タンニン溶液への含浸は実施しなかった。
2 電極材料
3 誘電体
4 アノード体の電極表面
5 固体電解質
6 コンデンサ体
7 安定剤
8 細孔
9 層組成物
10 導電性の層
11 基板
12 基板表面
13 ポリマー層
14 導電性ポリマー
15 安定剤層
Claims (21)
- 導電層(11)を持つ層組成物(10)の製造方法であって、
a)基板表面(13)を持つ基板(12)を準備する工程と、
b)前記基板表面(13)のうちの少なくとも一部の上に、導電性ポリマー(15)を含むポリマー層(14)を形成する工程と、
c)安定剤および液相を含む液体安定剤相を、工程b)から得たポリマー層(14)に付与する工程であって、前記安定剤相は、前記安定剤相に基づいて、0.2重量%未満の、前記導電性ポリマーを含む、工程と
を含み、前記安定剤は、少なくとも2つのOH基を持つ芳香族化合物である、製造方法。 - 工程c)での前記安定剤相の付与の後に、前記液相は、さらなる工程d)において少なくとも部分的に除去される、請求項1に記載の製造方法。
- 前記安定剤は、ヒドロキシベンゼン、ヒドロキシナフタレン、没食子酸エステルおよびタンニンならびにこれらの誘導体からなる群から選択される化合物である、請求項1または請求項2に記載の製造方法。
- 前記基板(12)は、電極材料(2)の電極体(1)を含み、誘電体(3)は、この電極材料(2)の表面(4)を少なくとも部分的に覆う、請求項1から請求項3のいずれか1項に記載の製造方法。
- 工程c)における前記液相は、水もしくはアルコールまたはそれらの混合物を含む、請求項1から請求項4のいずれか1項に記載の製造方法。
- 工程c)における前記安定剤相は、前記安定剤相に基づいて、0.1〜50重量%の範囲の濃度の前記安定剤を含む、請求項1から請求項5のいずれか1項に記載の製造方法。
- 前記導電性ポリマーは、少なくとも1つのポリチオフェン、ポリピロールもしくはポリアニリンもしくはそれらの誘導体のうちの1つ、またはこれらのうちの少なくとも2つの混合物を含む、請求項1から請求項6のいずれか1項に記載の製造方法。
- 前記導電性ポリマーは、一般式(I)、一般式(II)もしくは一般式(III)またはこれらのうちの少なくとも2つの組み合わせからなる群から選択される繰り返し単位を持つ少なくとも1つのポリチオフェン
Aは、置換されていてもよいC1−C5−アルキレンラジカルを表し、
Rは、直鎖状もしくは分枝状の、置換されていてもよいC1−C18−アルキルラジカル、置換されていてもよいC5−C12−シクロアルキルラジカル、置換されていてもよいC6−C14−アリールラジカル、置換されていてもよいC7−C18−アラルキルラジカル、置換されていてもよいC1−C4−ヒドロキシアルキルラジカルまたはヒドロキシルラジカルを表し、
xは0〜8の整数を表し、
複数のラジカルRがAに結合されている場合、これらは同一であってもよいし異なっていてもよい)
を含む、請求項1から請求項7のいずれか1項に記載の製造方法。 - 前記導電性ポリマーはポリ(3,4−エチレンジオキシチオフェン)である、請求項1から請求項8のいずれか1項に記載の製造方法。
- 前記導電性ポリマーは、少なくとも1つの高分子アニオンをさらに含む、請求項1から請求項9のいずれか1項に記載の製造方法。
- 前記高分子アニオンはポリスチレンスルホン酸である、請求項10に記載の製造方法。
- 工程b)におけるポリマー層(13)の形成は、導電性ポリマーの粒子および分散剤を含む分散液の付与およびこの分散剤の少なくとも部分的な除去によって実施される、請求項1から請求項11のいずれか1項に記載の製造方法。
- 工程b)における前記分散液の前記粒子は70nm以下のサイズ(d50)を有する、請求項12に記載の製造方法。
- 工程b)における導電性ポリマーの粒子を含む前記分散液は、前記分散剤として有機溶媒、水または有機溶媒と水との混合物を含む、請求項12または請求項13に記載の製造方法。
- 前記電極材料はバルブ金属またはNbOである、請求項4から請求項14のいずれか1項に記載の製造方法。
- 請求項1から請求項15のいずれか1項に記載の製造方法によって得ることができる層組成物(10)。
- 層組成物(10)であって、
S1)基板表面(12)を持つ基板(11)と、
S2)前記基板表面(12)に重なるポリマー層(13)であって、導電性ポリマー(14)を含む、ポリマー層(13)と、
S3)ポリマー層(14)に重なる安定剤層(15)であって、少なくとも2つのOH基を持つ芳香族化合物である安定剤(7)を含む、安定剤層(15)と
を含む、層組成物(10)。 - 前記層組成物(10)はコンデンサである、請求項16または請求項17に記載の層組成物。
- 導電手段または帯電防止手段としての、請求項16または請求項17に記載の層組成物の使用。
- 電子部品における請求項16から請求項18のいずれか1項に記載の層組成物(10)の使用。
- コンデンサにおける請求項16から請求項18のいずれか1項に記載の層組成物(10)の使用。
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- 2011-09-30 KR KR1020137011194A patent/KR101786157B1/ko active IP Right Grant
- 2011-09-30 EP EP18206281.0A patent/EP3470464A1/en active Pending
- 2011-09-30 JP JP2013530622A patent/JP6021114B2/ja active Active
- 2011-09-30 US US13/877,000 patent/US10109427B2/en active Active
- 2011-09-30 WO PCT/EP2011/004881 patent/WO2012041507A1/en active Application Filing
- 2011-09-30 EP EP11784934.9A patent/EP2622018B1/en active Active
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20160028628A (ko) * | 2014-09-03 | 2016-03-14 | 주식회사 한국엔티켐 | 전도성 고분자 용액 및 이의 경화 도막 |
KR20160028630A (ko) * | 2014-09-03 | 2016-03-14 | 주식회사 한국엔티켐 | 전도성 고분자 용액 및 이의 경화 도막 |
KR102270821B1 (ko) * | 2014-09-03 | 2021-07-01 | 주식회사 한국엔티켐 | 전도성 고분자 용액 및 이의 경화 도막 |
KR102270820B1 (ko) * | 2014-09-03 | 2021-07-06 | 주식회사 한국엔티켐 | 전도성 고분자 용액 및 이의 경화 도막 |
JP2023521677A (ja) * | 2020-04-02 | 2023-05-25 | ヘレウス ドイチェラント ゲーエムベーハー ウント カンパニー カーゲー | 高信頼性用途のためのポリマーコンデンサの製造プロセス |
JP7400123B2 (ja) | 2020-04-02 | 2023-12-18 | ヘレウス ドイチェラント ゲーエムベーハー ウント カンパニー カーゲー | 高信頼性用途のためのポリマーコンデンサの製造プロセス |
Also Published As
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US10109427B2 (en) | 2018-10-23 |
DE102010047086A1 (de) | 2012-04-05 |
JP6021114B2 (ja) | 2016-11-02 |
KR20130113464A (ko) | 2013-10-15 |
TW201229159A (en) | 2012-07-16 |
US11600449B2 (en) | 2023-03-07 |
KR101786157B1 (ko) | 2017-10-17 |
EP3470464A1 (en) | 2019-04-17 |
US20180374649A1 (en) | 2018-12-27 |
US20130295389A1 (en) | 2013-11-07 |
CN103154132B (zh) | 2015-06-10 |
CN103154132A (zh) | 2013-06-12 |
WO2012041507A1 (en) | 2012-04-05 |
EP2622018B1 (en) | 2019-01-02 |
TWI534218B (zh) | 2016-05-21 |
EP2622018A1 (en) | 2013-08-07 |
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