|
JP5994274B2
(ja)
*
|
2012-02-14 |
2016-09-21 |
ソニー株式会社 |
半導体装置、半導体装置の製造方法、及び、電子機器
|
|
US8735219B2
(en)
*
|
2012-08-30 |
2014-05-27 |
Ziptronix, Inc. |
Heterogeneous annealing method and device
|
|
JP6313189B2
(ja)
*
|
2014-11-04 |
2018-04-18 |
東芝メモリ株式会社 |
半導体装置の製造方法
|
|
JP6335099B2
(ja)
*
|
2014-11-04 |
2018-05-30 |
東芝メモリ株式会社 |
半導体装置および半導体装置の製造方法
|
|
JP6465665B2
(ja)
*
|
2015-01-22 |
2019-02-06 |
日本放送協会 |
固体撮像素子およびその製造方法
|
|
JP6717290B2
(ja)
*
|
2015-03-03 |
2020-07-01 |
ソニー株式会社 |
半導体装置、および電子機器
|
|
JP2016174016A
(ja)
*
|
2015-03-16 |
2016-09-29 |
株式会社東芝 |
半導体装置および半導体装置の製造方法
|
|
JP2016181531A
(ja)
*
|
2015-03-23 |
2016-10-13 |
ソニー株式会社 |
半導体装置、および半導体装置の製造方法、固体撮像素子、撮像装置、並びに電子機器
|
|
JP2016219660A
(ja)
*
|
2015-05-22 |
2016-12-22 |
ソニー株式会社 |
半導体装置、製造方法、固体撮像素子、および電子機器
|
|
US10204893B2
(en)
|
2016-05-19 |
2019-02-12 |
Invensas Bonding Technologies, Inc. |
Stacked dies and methods for forming bonded structures
|
|
KR102505856B1
(ko)
|
2016-06-09 |
2023-03-03 |
삼성전자 주식회사 |
웨이퍼 대 웨이퍼 접합 구조체
|
|
JP6856983B2
(ja)
*
|
2016-06-30 |
2021-04-14 |
キヤノン株式会社 |
光電変換装置及びカメラ
|
|
US9666573B1
(en)
|
2016-10-26 |
2017-05-30 |
Micron Technology, Inc. |
Methods of forming integrated circuitry
|
|
TWI822659B
(zh)
*
|
2016-10-27 |
2023-11-21 |
美商艾德亞半導體科技有限責任公司 |
用於低溫接合的結構和方法
|
|
US10879212B2
(en)
|
2017-05-11 |
2020-12-29 |
Invensas Bonding Technologies, Inc. |
Processed stacked dies
|
|
US10103053B1
(en)
|
2017-07-14 |
2018-10-16 |
Micron Technology, Inc. |
Methods of forming integrated circuitry
|
|
JP2019054153A
(ja)
*
|
2017-09-15 |
2019-04-04 |
東芝メモリ株式会社 |
半導体装置の製造方法
|
|
US11031285B2
(en)
|
2017-10-06 |
2021-06-08 |
Invensas Bonding Technologies, Inc. |
Diffusion barrier collar for interconnects
|
|
US10818624B2
(en)
*
|
2017-10-24 |
2020-10-27 |
Taiwan Semiconductor Manufacturing Company Ltd. |
Semiconductor structure and method for manufacturing the same
|
|
US11152417B2
(en)
|
2017-11-21 |
2021-10-19 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
Anchor structures and methods for uniform wafer planarization and bonding
|
|
DE102018124337A1
(de)
*
|
2017-11-21 |
2019-05-23 |
Taiwan Semiconductor Manufacturing Co. Ltd. |
Ankerstrukturen und verfahren zur gleichmässigen waferplanarisierung und -bondung
|
|
JP2019140178A
(ja)
*
|
2018-02-07 |
2019-08-22 |
東芝メモリ株式会社 |
半導体装置
|
|
US11244916B2
(en)
*
|
2018-04-11 |
2022-02-08 |
Invensas Bonding Technologies, Inc. |
Low temperature bonded structures
|
|
US11276676B2
(en)
|
2018-05-15 |
2022-03-15 |
Invensas Bonding Technologies, Inc. |
Stacked devices and methods of fabrication
|
|
TWI888349B
(zh)
*
|
2018-06-05 |
2025-07-01 |
日商索尼半導體解決方案公司 |
固體攝像裝置、固體攝像裝置之製造方法及電子機器
|
|
WO2020010056A1
(en)
|
2018-07-03 |
2020-01-09 |
Invensas Bonding Technologies, Inc. |
Techniques for joining dissimilar materials in microelectronics
|
|
US11158606B2
(en)
|
2018-07-06 |
2021-10-26 |
Invensas Bonding Technologies, Inc. |
Molded direct bonded and interconnected stack
|
|
WO2020010265A1
(en)
|
2018-07-06 |
2020-01-09 |
Invensas Bonding Technologies, Inc. |
Microelectronic assemblies
|
|
US11011494B2
(en)
*
|
2018-08-31 |
2021-05-18 |
Invensas Bonding Technologies, Inc. |
Layer structures for making direct metal-to-metal bonds at low temperatures in microelectronics
|
|
JP6903612B2
(ja)
*
|
2018-09-06 |
2021-07-14 |
株式会社東芝 |
半導体装置
|
|
US11742374B2
(en)
|
2018-10-05 |
2023-08-29 |
Sony Semiconductor Solutions Corporation |
Semiconductor device, method of manufacturing semiconductor device, and imaging element
|
|
US11094573B2
(en)
*
|
2018-11-21 |
2021-08-17 |
Applied Materials, Inc. |
Method and apparatus for thin wafer carrier
|
|
CN113330557A
(zh)
|
2019-01-14 |
2021-08-31 |
伊文萨思粘合技术公司 |
键合结构
|
|
US11031374B2
(en)
*
|
2019-03-06 |
2021-06-08 |
Micron Technology, Inc. |
Methods of compensating for misalignment of bonded semiconductor wafers
|
|
US11296053B2
(en)
|
2019-06-26 |
2022-04-05 |
Invensas Bonding Technologies, Inc. |
Direct bonded stack structures for increased reliability and improved yield in microelectronics
|
|
US12080672B2
(en)
*
|
2019-09-26 |
2024-09-03 |
Adeia Semiconductor Bonding Technologies Inc. |
Direct gang bonding methods including directly bonding first element to second element to form bonded structure without adhesive
|
|
US11404307B2
(en)
*
|
2019-09-27 |
2022-08-02 |
Intel Corporation |
Interconnect structures and methods of fabrication
|
|
WO2021163823A1
(en)
|
2020-02-17 |
2021-08-26 |
Yangtze Memory Technologies Co., Ltd. |
Hybrid wafer bonding method and structure thereof
|
|
CN111463114B
(zh)
*
|
2020-04-17 |
2021-08-06 |
武汉新芯集成电路制造有限公司 |
半导体器件及其形成方法、芯片
|
|
US11631647B2
(en)
|
2020-06-30 |
2023-04-18 |
Adeia Semiconductor Bonding Technologies Inc. |
Integrated device packages with integrated device die and dummy element
|
|
JP7652560B2
(ja)
*
|
2020-12-16 |
2025-03-27 |
キオクシア株式会社 |
半導体記憶装置、半導体装置およびその製造方法
|
|
KR20230126736A
(ko)
|
2020-12-30 |
2023-08-30 |
아데이아 세미컨덕터 본딩 테크놀로지스 인코포레이티드 |
전도성 특징부를 갖는 구조 및 그 형성방법
|
|
KR102921309B1
(ko)
*
|
2021-06-22 |
2026-02-02 |
삼성전자주식회사 |
접합 강화 층을 갖는 반도체 소자 및 그 형성 방법
|
|
US11927814B2
(en)
|
2022-01-05 |
2024-03-12 |
Scidatek Inc. |
Semiconductor photodetector array sensor integrated with optical-waveguide-based devices
|
|
JP2023137581A
(ja)
*
|
2022-03-18 |
2023-09-29 |
キオクシア株式会社 |
半導体装置、半導体装置の製造方法
|
|
US20240071746A1
(en)
*
|
2022-08-26 |
2024-02-29 |
Tokyo Electron Limited |
Plasma surface treatment for wafer bonding methods
|
|
US20240387426A1
(en)
*
|
2023-05-18 |
2024-11-21 |
International Business Machines Corporation |
Electromigration resistant semiconductor structure
|