JP2011173747A - 誘電体セラミックおよび積層セラミックコンデンサ - Google Patents
誘電体セラミックおよび積層セラミックコンデンサ Download PDFInfo
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Abstract
【解決手段】積層セラミックコンデンサ1の誘電体セラミック層2を構成する誘電体セラミックとして、100(Ba1−xCax)mTiO3+aMgO+bVO5/2+cReO3/2+dMnO+eSiO2(Reは、Y、La、Sm、Eu、Gd、Tb、Dy、Ho、Er、TmおよびYbの中から選ばれる少なくとも1種。)で表わされ、x、a、b、c、d、e、およびmは、それぞれ、0.05≦x≦0.15、0.01≦a≦0.1、0.05≦b≦0.5、1.0≦c≦5.0、0.1≦d≦1.0、0.5≦e≦2.5、および0.990≦m≦1.030の各条件を満たすものを用いる。
【選択図】図1
Description
0.05≦x≦0.15、
0.01≦a≦0.1、および
0.05≦b≦0.5
の各条件を満たすことを特徴としている。
0.05≦x≦0.15、
0.01≦a≦0.1、
0.05≦b≦0.5、
1.0≦c≦5.0、
0.1≦d≦1.0、
0.5≦e≦2.5、および
0.990≦m≦1.030
の各条件を満たすことを特徴としている。
0.05≦x≦0.15、
0.01≦a≦0.1、および
0.05≦b≦0.5
の各条件を満たす、誘電体セラミックから構成される。
0.05≦x≦0.15、
0.01≦a≦0.1、
0.05≦b≦0.5、
1.0≦c≦5.0、
0.1≦d≦1.0、
0.5≦e≦2.5、および
0.990≦m≦1.030
の各条件を満たす、誘電体セラミックから構成される。
まず、主成分である(Ba1−xCax)mTiO3の出発原料として、高純度のBaCO3、CaCO3およびTiO2の各粉末を準備し、これらを表1ないし表3に示すCa含有量、すなわち「Ca変性量:x」および「(Ba,Ca)/Ti比:m」となるように調合した。
次に、上記誘電体原料粉末に、ポリビニルブチラール系バインダ、可塑剤および有機溶剤としてのエタノールを加え、これらをボールミルにより湿式混合し、セラミックスラリーを作製した。
次に、各試料に係る積層セラミックコンデンサについて、以下のような評価を行なった。
高温負荷信頼性試験として、170℃の温度下にて24Vの直流電圧(20kV/mmの電界強度)を印加しながら、絶縁抵抗の経時変化を測定し、各試料の絶縁抵抗値が105Ω以下になった時点を故障とし、ワイブルプロットにより、平均故障時間(MTTF)と故障時間のばらつき(形状パラメータ:m値)とを求めた。
各試料の静電容量を測定し、比誘電率を算出した。測定は、自動ブリッジ式測定器を用い、25℃の温度において1Vrms、1kHzの交流電圧を印加して行なった。得られた静電容量値と内部電極面積および誘電体セラミック層の厚さとから比誘電率εrを算出した。
各試料の静電容量の温度変化率を測定した。測定は、−55℃から+125℃の範囲内で、温度を変化させながら静電容量を測定し、25℃での静電容量値(C25)を基準として、変化の絶対値が最大となった静電容量値(CTC)についての変化率(ΔCTC)を、ΔCTC=((CTC−C25)/C25)の式により算出した。
各試料の絶縁抵抗を測定し、比抵抗(logρ)を算出した。測定は、絶縁抵抗計を用い、25℃の温度において10Vの直流電圧を120秒間印加して絶縁抵抗を測定し、得られた絶縁抵抗値と内部電極面積および誘電体セラミック層の厚さとから比抵抗(logρ)[Ω・m]を算出した。
0.05≦x≦0.15、
0.01≦a≦0.1、
0.05≦b≦0.5、
1.0≦c≦5.0、
0.1≦d≦1.0、
0.5≦e≦2.5、および
0.990≦m≦1.030
の各条件を満たす、この発明のより好ましい範囲にある試料である。
2 誘電体セラミック層
3,4 内部電極
5 コンデンサ本体
6,7 外部電極
Claims (3)
- 組成式:100(Ba1−xCax)TiO3+aMgO+bVO5/2で表わされ、前記x、a、およびbは、それぞれ、
0.05≦x≦0.15、
0.01≦a≦0.1、および
0.05≦b≦0.5
の各条件を満たす、誘電体セラミック。 - 組成式:100(Ba1−xCax)mTiO3+aMgO+bVO5/2+cReO3/2+dMnO+eSiO2で表わされ、
前記Reは、Y、La、Sm、Eu、Gd、Tb、Dy、Ho、Er、TmおよびYbの中から選ばれる少なくとも1種の金属元素であり、
前記x、a、b、c、d、e、およびmは、それぞれ、
0.05≦x≦0.15、
0.01≦a≦0.1、
0.05≦b≦0.5、
1.0≦c≦5.0、
0.1≦d≦1.0、
0.5≦e≦2.5、および
0.990≦m≦1.030
の各条件を満たす、誘電体セラミック。 - 積層された複数の誘電体セラミック層、および前記誘電体セラミック層間の特定の界面に沿って形成された複数の内部電極をもって構成される、コンデンサ本体と、
前記コンデンサ本体の外表面上の互いに異なる位置に形成され、かつ前記内部電極の特定のものに電気的に接続される、複数の外部電極と
を備え、
前記誘電体セラミック層は、請求項1または2に記載の誘電体セラミックからなる、
積層セラミックコンデンサ。
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TW100104329A TWI413630B (zh) | 2010-02-24 | 2011-02-09 | 介電體陶瓷及積層陶瓷電容器 |
KR1020110011785A KR101380132B1 (ko) | 2010-02-24 | 2011-02-10 | 유전체 세라믹 및 적층 세라믹 콘덴서 |
CN2011100381620A CN102190487B (zh) | 2010-02-24 | 2011-02-12 | 电介质陶瓷及层叠陶瓷电容器 |
US13/026,699 US20110205686A1 (en) | 2010-02-24 | 2011-02-14 | Dielectric ceramic and laminated ceramic capacitor |
KR1020130025629A KR20130040993A (ko) | 2010-02-24 | 2013-03-11 | 유전체 세라믹 및 적층 세라믹 콘덴서 |
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JP2016001723A (ja) * | 2014-05-22 | 2016-01-07 | 株式会社村田製作所 | 積層セラミックコンデンサ |
US9633793B2 (en) * | 2014-09-09 | 2017-04-25 | Murata Manufacturing Co., Ltd. | Multilayer ceramic capacitor |
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KR20130040993A (ko) | 2013-04-24 |
JP5370212B2 (ja) | 2013-12-18 |
US9406440B2 (en) | 2016-08-02 |
TW201202169A (en) | 2012-01-16 |
US20110205686A1 (en) | 2011-08-25 |
KR20110097630A (ko) | 2011-08-31 |
CN102190487A (zh) | 2011-09-21 |
CN102190487B (zh) | 2013-07-10 |
KR101380132B1 (ko) | 2014-04-04 |
US20140268489A1 (en) | 2014-09-18 |
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