JP2010092589A - パイプラッチ回路を有するメモリ素子のデータ伝達方法 - Google Patents
パイプラッチ回路を有するメモリ素子のデータ伝達方法 Download PDFInfo
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- JP2010092589A JP2010092589A JP2010017713A JP2010017713A JP2010092589A JP 2010092589 A JP2010092589 A JP 2010092589A JP 2010017713 A JP2010017713 A JP 2010017713A JP 2010017713 A JP2010017713 A JP 2010017713A JP 2010092589 A JP2010092589 A JP 2010092589A
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/106—Data output latches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4093—Input/output [I/O] data interface arrangements, e.g. data buffers
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1039—Read-write modes for single port memories, i.e. having either a random port or a serial port using pipelining techniques, i.e. using latches between functional memory parts, e.g. row/column decoders, I/O buffers, sense amplifiers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1066—Output synchronization
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1072—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers for memories with random access ports synchronised on clock signal pulse trains, e.g. synchronous memories, self timed memories
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Databases & Information Systems (AREA)
- Dram (AREA)
Abstract
【解決手段】メモリセルの出力データを感知及び増幅し、グローバル入出力ラインに連結されたデータ入出力感知増幅器と、グローバル入出力ラインの一端に位置し、データを貯蔵するパイプラッチとを備えるメモリ素子において、
グローバル入出力ラインと複数のパイプラッチのうちの第1パイプラッチとを連結して、第1パイプラッチにデータを貯蔵するステップと、
グローバル入出力ラインがイネーブルされてから一定時間後に、前記連結を遮断するステップと、
グローバル入出力ラインがプリチャージされる信号に応答して、グローバル入出力ラインと複数のパイプラッチのうちの第2パイプラッチとを連結して、第2パイプラッチにデータを貯蔵するステップとを含む。
【選択図】図6
Description
上記グローバル入出力ラインと上記複数のパイプラッチのうちの第1パイプラッチとを連結して、上記第1パイプラッチにデータを貯蔵するステップと、
上記グローバル入出力ラインがイネーブルされてから一定時間後に、上記グローバル入出力ラインと上記第1パイプラッチとの連結を遮断するステップと、
上記グローバル入出力ラインがプリチャージされる信号に応答して、上記グローバル入出力ラインと上記複数のパイプラッチのうちの第2パイプラッチとを連結して、上記第2パイプラッチにデータを貯蔵するステップとを含んで成るメモリ素子のデータ伝達方法を提供する。
150 パイプラッチ制御信号発生部
530 パスゲート信号発生部
550 パイプラッチ選択信号発生部
Claims (2)
- メモリセルから出力されたデータを感知及び増幅し、グローバル入出力ラインに並列に連結された複数のデータ入出力感知増幅器と、上記グローバル入出力ラインの一端に位置し、上記データの伝達を受けて貯蔵する複数のパイプラッチとを備えるメモリ素子のデータ伝達方法であって、
上記グローバル入出力ラインと上記複数のパイプラッチのうちの第1パイプラッチとを連結して、上記第1パイプラッチにデータを貯蔵するステップと、
上記グローバル入出力ラインがイネーブルされてから一定時間後に、上記グローバル入出力ラインと上記第1パイプラッチとの連結を遮断するステップと、
上記グローバル入出力ラインがプリチャージされる信号に応答して、上記グローバル入出力ラインと上記複数のパイプラッチのうちの第2パイプラッチとを連結して、上記第2パイプラッチにデータを貯蔵するステップとを含んで成るメモリ素子のデータ伝達方法。 - 上記一定時間は、
上記データ入手力感知増幅器から出力されるデータの帯域幅が上記パイプラッチに十分に伝達され得る時間の間であることを特徴とする請求項1に記載のメモリ素子のデータ伝達方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1999-24823 | 1999-06-28 | ||
KR1019990024823A KR100341576B1 (ko) | 1999-06-28 | 1999-06-28 | 반도체메모리장치의 파이프데이터 입력 제어 방법 및 장치 |
Related Parent Applications (1)
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JP2000193821A Division JP4500969B2 (ja) | 1999-06-28 | 2000-06-28 | パイプラッチ回路を有するメモリ素子 |
Publications (2)
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JP2010092589A true JP2010092589A (ja) | 2010-04-22 |
JP5123336B2 JP5123336B2 (ja) | 2013-01-23 |
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JP2000193821A Expired - Fee Related JP4500969B2 (ja) | 1999-06-28 | 2000-06-28 | パイプラッチ回路を有するメモリ素子 |
JP2010017713A Expired - Fee Related JP5123336B2 (ja) | 1999-06-28 | 2010-01-29 | パイプラッチ回路を有するメモリ素子のデータ伝達方法 |
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JP2000193821A Expired - Fee Related JP4500969B2 (ja) | 1999-06-28 | 2000-06-28 | パイプラッチ回路を有するメモリ素子 |
Country Status (4)
Country | Link |
---|---|
US (1) | US6288947B1 (ja) |
JP (2) | JP4500969B2 (ja) |
KR (1) | KR100341576B1 (ja) |
TW (1) | TW453034B (ja) |
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KR100452328B1 (ko) * | 2002-07-31 | 2004-10-12 | 삼성전자주식회사 | 동기식 반도체 메모리 장치의 데이터 출력회로 |
KR100484249B1 (ko) * | 2002-08-07 | 2005-04-22 | 주식회사 하이닉스반도체 | 고속데이터 출력을 위한 동기식 메모리 장치의 파이프래치회로 및 그를 이용한 동기식 메모리 장치 |
US6886119B2 (en) * | 2002-09-04 | 2005-04-26 | Agere Systems Inc. | Method and apparatus for improved integrated circuit memory testing |
KR100496817B1 (ko) * | 2002-12-30 | 2005-06-23 | 주식회사 하이닉스반도체 | 데이터 정렬 시간을 최소화할 수 있는 반도체 기억 장치 |
KR100492907B1 (ko) | 2003-05-30 | 2005-06-02 | 주식회사 하이닉스반도체 | 글로벌 입출력 스킴을 변경한 메모리 소자 |
KR100613447B1 (ko) | 2004-10-07 | 2006-08-21 | 주식회사 하이닉스반도체 | 데이터 래치회로 및 이를 이용한 반도체 장치 |
US7515482B2 (en) * | 2005-09-29 | 2009-04-07 | Hynix Semiconductor Inc. | Pipe latch device of semiconductor memory device |
KR100670731B1 (ko) * | 2005-09-29 | 2007-01-17 | 주식회사 하이닉스반도체 | 반도체메모리소자 |
KR101047060B1 (ko) * | 2009-12-28 | 2011-07-06 | 주식회사 하이닉스반도체 | 데이터 출력 회로 |
KR20110088947A (ko) * | 2010-01-29 | 2011-08-04 | 주식회사 하이닉스반도체 | 반도체 메모리의 데이터 출력 회로 |
JP5710947B2 (ja) * | 2010-11-26 | 2015-04-30 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置およびその制御方法 |
US9763679B2 (en) | 2011-03-18 | 2017-09-19 | DePuy Synthes Products, Inc. | Combination driver/anti-rotation handle for shoulder arthroplasty |
US9820758B2 (en) | 2011-03-18 | 2017-11-21 | DePuy Synthes Products, Inc. | Combination reamer/drill bit for shoulder arthoplasty |
US8617176B2 (en) | 2011-08-24 | 2013-12-31 | Depuy Mitek, Llc | Cross pinning guide devices and methods |
KR20160041535A (ko) * | 2014-10-08 | 2016-04-18 | 에스케이하이닉스 주식회사 | 신호를 전송하는데 있어 피크 전류를 감소시키는 반도체 장치 및 시스템 |
KR102557324B1 (ko) * | 2016-02-15 | 2023-07-20 | 에스케이하이닉스 주식회사 | 메모리 장치 |
KR102508309B1 (ko) * | 2018-04-23 | 2023-03-10 | 에스케이하이닉스 주식회사 | 파이프 래치, 이를 이용하는 반도체 장치 및 반도체 시스템 |
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JP2001193821A (ja) * | 2000-01-07 | 2001-07-17 | Tochigi Fuji Ind Co Ltd | 電磁式クラッチ装置 |
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-
1999
- 1999-06-28 KR KR1019990024823A patent/KR100341576B1/ko not_active IP Right Cessation
-
2000
- 2000-06-27 TW TW089112622A patent/TW453034B/zh not_active IP Right Cessation
- 2000-06-27 US US09/604,687 patent/US6288947B1/en not_active Expired - Lifetime
- 2000-06-28 JP JP2000193821A patent/JP4500969B2/ja not_active Expired - Fee Related
-
2010
- 2010-01-29 JP JP2010017713A patent/JP5123336B2/ja not_active Expired - Fee Related
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JPH1055666A (ja) * | 1996-08-09 | 1998-02-24 | Nec Corp | クロック同期型半導体記憶装置 |
JPH10188556A (ja) * | 1996-12-20 | 1998-07-21 | Fujitsu Ltd | 半導体記憶装置 |
JP2001193821A (ja) * | 2000-01-07 | 2001-07-17 | Tochigi Fuji Ind Co Ltd | 電磁式クラッチ装置 |
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Publication number | Publication date |
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KR20010004203A (ko) | 2001-01-15 |
JP2001035154A (ja) | 2001-02-09 |
KR100341576B1 (ko) | 2002-06-22 |
TW453034B (en) | 2001-09-01 |
JP4500969B2 (ja) | 2010-07-14 |
JP5123336B2 (ja) | 2013-01-23 |
US6288947B1 (en) | 2001-09-11 |
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Free format text: JAPANESE INTERMEDIATE CODE: R250 |
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LAPS | Cancellation because of no payment of annual fees |