JP2008521159A5 - - Google Patents

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JP2008521159A5
JP2008521159A5 JP2007543319A JP2007543319A JP2008521159A5 JP 2008521159 A5 JP2008521159 A5 JP 2008521159A5 JP 2007543319 A JP2007543319 A JP 2007543319A JP 2007543319 A JP2007543319 A JP 2007543319A JP 2008521159 A5 JP2008521159 A5 JP 2008521159A5
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address
test
memory
algorithm
buffer
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JP2008521159A (ja
JP4494474B2 (ja
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JP2007543319A 2004-11-18 2005-11-18 プログラマブル・メモリ・ビルト・イン・セルフ・テスト（ｍｂｉｓｔ）の方法及び装置 Expired - Lifetime JP4494474B2 (ja)

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US62939504P 2004-11-18 2004-11-18
US73349305P 2005-11-04 2005-11-04
PCT/US2005/042029 WO2006055862A2 (en) 2004-11-18 2005-11-18 Programmable memory built-in-self-test (mbist) method and apparatus

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JP2009185404A Division JP2009259398A (ja) 2004-11-18 2009-08-10 プログラマブル・メモリ・ビルト・イン・セルフ・テスト（ｍｂｉｓｔ）の方法及び装置

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JP2008521159A JP2008521159A (ja) 2008-06-19
JP2008521159A5 true JP2008521159A5 (https=) 2008-12-18
JP4494474B2 JP4494474B2 (ja) 2010-06-30

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JP2009185404A Pending JP2009259398A (ja) 2004-11-18 2009-08-10 プログラマブル・メモリ・ビルト・イン・セルフ・テスト（ｍｂｉｓｔ）の方法及び装置

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US (3) US7428680B2 (https=)
EP (1) EP1825479A4 (https=)
JP (2) JP4494474B2 (https=)
WO (1) WO2006055862A2 (https=)

Families Citing this family (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7533309B2 (en) * 2004-02-26 2009-05-12 Nilanjan Mukherjee Testing memories using algorithm selection
US7558948B2 (en) * 2004-09-20 2009-07-07 International Business Machines Corporation Method for providing zero overhead looping using carry chain masking
US7447965B2 (en) * 2005-05-03 2008-11-04 Agere Systems Inc. Offset test pattern apparatus and method
US7272756B2 (en) * 2005-05-03 2007-09-18 Agere Systems Inc. Exploitive test pattern apparatus and method
US20070033471A1 (en) * 2005-06-09 2007-02-08 Raguram Damodaran Hardware Configuration of pBIST
US7849441B2 (en) * 2005-06-27 2010-12-07 Ikoa Corporation Method for specifying stateful, transaction-oriented systems for flexible mapping to structurally configurable, in-memory processing semiconductor device
DE102006004168A1 (de) * 2005-08-04 2007-02-08 Robert Bosch Gmbh Überprüfung eines Adressdecoders
US7945823B2 (en) * 2006-03-02 2011-05-17 Netlogic Microsystems, Inc. Programmable address space built-in self test (BIST) device and method for fault detection
US20080016421A1 (en) * 2006-07-13 2008-01-17 International Business Machines Corporation Method and apparatus for providing programmable control of built-in self test
US20080195901A1 (en) * 2007-02-12 2008-08-14 Marvell Semiconductor Israel Ltd. Op-code based built-in-self-test
US7840865B2 (en) * 2007-03-23 2010-11-23 Mentor Graphics Corporation Built-in self-test of integrated circuits using selectable weighting of test patterns
JP4407722B2 (ja) * 2007-05-23 2010-02-03 ソニー株式会社 表示装置
US7805644B2 (en) * 2007-12-29 2010-09-28 Texas Instruments Incorporated Multiple pBIST controllers
JP4799580B2 (ja) * 2008-03-31 2011-10-26 株式会社東芝 半導体集積回路
US7882406B2 (en) * 2008-05-09 2011-02-01 Lsi Corporation Built in test controller with a downloadable testing program
US8156391B2 (en) * 2008-05-27 2012-04-10 Lsi Corporation Data controlling in the MBIST chain architecture
US8046643B2 (en) * 2008-06-09 2011-10-25 Lsi Corporation Transport subsystem for an MBIST chain architecture
US8170857B2 (en) * 2008-11-26 2012-05-01 International Business Machines Corporation In-situ design method and system for improved memory yield
US7906983B2 (en) * 2008-12-08 2011-03-15 Intuitive Research And Technology Programmable logic device having an embedded test logic with secure access control
US7908530B2 (en) * 2009-03-16 2011-03-15 Faraday Technology Corp. Memory module and on-line build-in self-test method thereof for enhancing memory system reliability
US20100257415A1 (en) * 2009-04-01 2010-10-07 Faraday Technology Corp. Instruction-based programmable memory built-in self test circuit and address generator thereof
US8065572B2 (en) * 2009-06-30 2011-11-22 Oracle America, Inc. At-speed scan testing of memory arrays
US8489943B2 (en) * 2009-12-15 2013-07-16 Stmicroelectronics International N.V. Protocol sequence generator
NL2004407C2 (en) * 2010-03-16 2011-09-20 Tu Delft Generic march element based memory built-in self test.
US8433976B1 (en) * 2010-04-27 2013-04-30 Altera Corporation Row column interleavers and deinterleavers with efficient memory usage
JP2012027734A (ja) * 2010-07-23 2012-02-09 Panasonic Corp メモリコントローラおよびメモリアクセスシステム
US8392772B2 (en) * 2010-09-16 2013-03-05 Texas Instruments Incorporated On-chip memory testing
US8468408B2 (en) 2010-09-16 2013-06-18 Advanced Micro Devices, Inc. Memory built-in self test (MBIST) circuitry configured to facilitate production of pre-stressed integrated circuits and methods
US8423846B2 (en) * 2010-09-16 2013-04-16 Advanced Micro Devices, Inc. Integrated circuit with memory built-in self test (MBIST) circuitry having enhanced features and methods
US8239818B1 (en) 2011-04-05 2012-08-07 International Business Machines Corporation Data structure for describing MBIST architecture
CN102737725A (zh) * 2011-04-13 2012-10-17 复旦大学 自动优化存储器性能的可编程内建自测系统和方法
US20130019130A1 (en) * 2011-07-15 2013-01-17 Synopsys Inc. Testing electronic memories based on fault and test algorithm periodicity
CN106229010B (zh) * 2011-09-27 2019-07-19 意法半导体研发(深圳)有限公司 故障诊断电路
US9910086B2 (en) 2012-01-17 2018-03-06 Allen Czamara Test IP-based A.T.E. instrument architecture
US8853847B2 (en) 2012-10-22 2014-10-07 International Business Machines Corporation Stacked chip module with integrated circuit chips having integratable and reconfigurable built-in self-maintenance blocks
US8872322B2 (en) 2012-10-22 2014-10-28 International Business Machines Corporation Stacked chip module with integrated circuit chips having integratable built-in self-maintenance blocks
US9194912B2 (en) 2012-11-29 2015-11-24 International Business Machines Corporation Circuits for self-reconfiguration or intrinsic functional changes of chips before vs. after stacking
US9436567B2 (en) * 2012-12-18 2016-09-06 Advanced Micro Devices, Inc. Memory bit MBIST architecture for parallel master and slave execution
US9773570B2 (en) 2013-03-06 2017-09-26 International Business Machines Corporation Built-in-self-test (BIST) test time reduction
US9251915B2 (en) * 2013-11-11 2016-02-02 Advantest Corporation Seamless fail analysis with memory efficient storage of fail lists
KR20150064452A (ko) * 2013-12-03 2015-06-11 에스케이하이닉스 주식회사 내장형 셀프 테스트 회로 및 이를 포함한 반도체 장치
US9548137B2 (en) 2013-12-26 2017-01-17 Intel Corporation Integrated circuit defect detection and repair
US9564245B2 (en) * 2013-12-26 2017-02-07 Intel Corporation Integrated circuit defect detection and repair
US9360523B2 (en) 2014-04-18 2016-06-07 Breker Verification Systems Display in a graphical format of test results generated using scenario models
US20160003900A1 (en) * 2014-07-04 2016-01-07 Texas Instruments Incorporated Self-test methods and systems for digital circuits
US9514842B2 (en) 2014-09-24 2016-12-06 Apple Inc. Memory testing system
US9836373B2 (en) * 2014-11-26 2017-12-05 Texas Instruments Incorporated On-chip field testing methods and apparatus
US9946620B2 (en) 2015-02-03 2018-04-17 Invecas, Inc. Memory built-in self test system
US10153055B2 (en) * 2015-03-26 2018-12-11 International Business Machines Corporation Arbitration for memory diagnostics
US11119893B2 (en) * 2015-09-22 2021-09-14 Advanced Micro Devices, Inc. Computing system with wireless debug code output
CN106409343B (zh) * 2016-08-31 2019-10-25 上海华力微电子有限公司 适用于各类周期性测试算法的存储器内建自测试电路
US10318433B2 (en) * 2016-12-20 2019-06-11 Texas Instruments Incorporated Streaming engine with multi dimensional circular addressing selectable at each dimension
CN110082672B (zh) * 2018-01-25 2020-09-11 大唐移动通信设备有限公司 一种芯片内逻辑模型的测试方法及装置
US10408876B2 (en) * 2018-01-29 2019-09-10 Oracle International Corporation Memory circuit march testing
US10593419B1 (en) * 2018-02-12 2020-03-17 Cadence Design Systems, Inc. Failing read count diagnostics for memory built-in self-test
US10685730B1 (en) 2018-03-20 2020-06-16 Seagate Technology Llc Circuit including efficient clocking for testing memory interface
US10665319B1 (en) * 2018-09-20 2020-05-26 Amazon Technologies, Inc. Memory device testing
US10818374B2 (en) * 2018-10-29 2020-10-27 Texas Instruments Incorporated Testing read-only memory using memory built-in self-test controller
US11101015B2 (en) 2018-12-17 2021-08-24 Micron Technology, Inc. Multi-dimensional usage space testing of memory components
US10910081B2 (en) * 2018-12-17 2021-02-02 Micron Technology, Inc. Management of test resources to perform reliability testing of memory components
CN111833959B (zh) * 2020-07-20 2022-08-02 北京百度网讯科技有限公司 存储器的测试的方法、装置、电子设备和计算机可读存储介质
CN112363875B (zh) * 2020-10-21 2023-04-07 海光信息技术股份有限公司 一种系统缺陷检测方法、设备、电子设备和存储介质
CN112951314B (zh) * 2021-02-01 2023-05-05 上海航天计算机技术研究所 一种基于tsc695处理器的可加载型通用ram自测试方法
US11847035B2 (en) * 2021-08-23 2023-12-19 International Business Machines Corporation Functional test of processor code modification operations
CN114048077A (zh) * 2021-10-31 2022-02-15 山东云海国创云计算装备产业创新中心有限公司 一种远端内存映射检测系统和服务器
US12555644B2 (en) 2021-11-17 2026-02-17 Google Llc Logical memory repair with a shared physical memory
TWI777889B (zh) * 2022-01-10 2022-09-11 芯測科技股份有限公司 用於產生記憶體自我測試演算法電路之方法
US12051476B2 (en) 2022-05-11 2024-07-30 Nxp Usa, Inc. Testing disruptive memories
US20240005000A1 (en) * 2022-06-30 2024-01-04 Seagate Technology Llc Detection of ransomware attack at object store
CN115346591B (zh) * 2022-09-22 2025-11-07 深圳国微福芯技术有限公司 存储器的测试方法及测试系统
CN116312714B (zh) * 2023-03-31 2026-04-03 深圳鲲云信息科技有限公司 测试只读存储器程序的方法、待测设计、测试设备和介质
KR102865048B1 (ko) 2023-06-28 2025-09-25 연세대학교 산학협력단 비선형 메모리 고장 분석 방법 및 메모리 테스트 장치

Family Cites Families (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS621031A (ja) * 1985-03-25 1987-01-07 Hitachi Ltd デ−タ処理装置
JPS63263535A (ja) * 1987-04-22 1988-10-31 Hitachi Ltd デ−タ処理システム
JP2860655B2 (ja) * 1988-08-31 1999-02-24 日本テキサス・インスツルメンツ株式会社 並列命令実行型プロセッサ
JP2968288B2 (ja) * 1989-11-07 1999-10-25 株式会社リコー 中央演算処理装置
JP2673602B2 (ja) * 1990-07-13 1997-11-05 ソニー・テクトロニクス株式会社 制御装置
US5173906A (en) 1990-08-31 1992-12-22 Dreibelbis Jeffrey H Built-in self test for integrated circuits
US5253349A (en) 1991-01-30 1993-10-12 International Business Machines Corporation Decreasing processing time for type 1 dyadic instructions
JPH04343132A (ja) * 1991-05-20 1992-11-30 Advantest Corp 中央演算処理装置
US5469443A (en) * 1993-10-01 1995-11-21 Hal Computer Systems, Inc. Method and apparatus for testing random access memory
US6070252A (en) 1994-09-30 2000-05-30 Intel Corporation Method and apparatus for interactive built-in-self-testing with user-programmable test patterns
US5661732A (en) * 1995-05-31 1997-08-26 International Business Machines Corporation Programmable ABIST microprocessor for testing arrays with two logical views
JP3368570B2 (ja) * 1995-07-26 2003-01-20 株式会社アドバンテスト 高速パターン発生方法及びこの方法を用いた高速パターン発生器
US20020071325A1 (en) * 1996-04-30 2002-06-13 Hii Kuong Hua Built-in self-test arrangement for integrated circuit memory devices
WO1998047152A1 (fr) * 1997-04-16 1998-10-22 Hitachi, Ltd. Circuit integre a semi-conducteur et procede pour tester la memoire
JP3723340B2 (ja) * 1997-06-26 2005-12-07 富士通株式会社 半導体記憶装置
US6347256B1 (en) * 1998-11-02 2002-02-12 Printcafe System, Inc. Manufacturing process modeling techniques
KR100308621B1 (ko) * 1998-11-19 2001-12-17 윤종용 반도체 메모리 장치를 위한 프로그램 가능한 내장 자기 테스트 시스템
US6415403B1 (en) 1999-01-29 2002-07-02 Global Unichip Corporation Programmable built in self test for embedded DRAM
US6553527B1 (en) * 1999-11-08 2003-04-22 International Business Machines Corporation Programmable array built-in self test method and controller with programmable expect generator
US6567942B1 (en) * 1999-11-08 2003-05-20 International Business Machines Corporation Method and apparatus to reduce the size of programmable array built-in self-test engines
JP2001148199A (ja) * 1999-11-19 2001-05-29 Mitsubishi Electric Corp 自己テスト回路内蔵半導体記憶装置
US6671837B1 (en) * 2000-06-06 2003-12-30 Intel Corporation Device and method to test on-chip memory in a production environment
US6874111B1 (en) 2000-07-26 2005-03-29 International Business Machines Corporation System initialization of microcode-based memory built-in self-test
US6651201B1 (en) * 2000-07-26 2003-11-18 International Business Machines Corporation Programmable memory built-in self-test combining microcode and finite state machine self-test
US6769081B1 (en) 2000-08-30 2004-07-27 Sun Microsystems, Inc. Reconfigurable built-in self-test engine for testing a reconfigurable memory
US7168005B2 (en) * 2000-09-14 2007-01-23 Cadence Design Systems, Inc. Programable multi-port memory BIST with compact microcode
US6671843B1 (en) * 2000-11-13 2003-12-30 Omar Kebichi Method for providing user definable algorithms in memory BIST
US6760872B2 (en) * 2001-03-19 2004-07-06 Cypress Semiconductor Corp. Configurable and memory architecture independent memory built-in self test
CA2345605A1 (en) 2001-04-30 2002-10-30 Robert A. Abbott Method of testing embedded memory array and embedded memory controller for use therewith
US6347056B1 (en) 2001-05-16 2002-02-12 Motorola, Inc. Recording of result information in a built-in self-test circuit and method therefor
JP2003029966A (ja) * 2001-07-17 2003-01-31 Hitachi Ltd データ処理装置
US6950974B1 (en) 2001-09-07 2005-09-27 Synopsys Inc. Efficient compression and application of deterministic patterns in a logic BIST architecture
EP1343173A1 (en) 2002-03-04 2003-09-10 iRoC Technologies Prgrammable test for memories
JP4228604B2 (ja) * 2002-06-26 2009-02-25 ソニー株式会社 パターン発生回路及び半導体装置並びに半導体装置の試験方法
EP1387255B1 (en) 2002-07-31 2020-04-08 Texas Instruments Incorporated Test and skip processor instruction having at least one register operand
EP1388788B1 (en) 2002-08-08 2006-11-22 STMicroelectronics S.r.l. Built-in self test circuit for integrated circuits
JP4205396B2 (ja) * 2002-10-30 2009-01-07 エルピーダメモリ株式会社 半導体集積回路装置
US7020820B2 (en) 2002-12-20 2006-03-28 Sun Microsystems, Inc. Instruction-based built-in self-test (BIST) of external memory
US7062694B2 (en) 2003-02-07 2006-06-13 Sun Microsystems, Inc. Concurrently programmable dynamic memory built-in self-test (BIST)
US6959256B2 (en) 2003-05-16 2005-10-25 Analog Devices, Inc. Universally accessible fully programmable memory built-in self-test (MBIST) system and method
US7444564B2 (en) 2003-11-19 2008-10-28 International Business Machines Corporation Automatic bit fail mapping for embedded memories with clock multipliers
US7325178B2 (en) 2003-12-05 2008-01-29 Texas Instruments Incorporated Programmable built in self test of memory
US7533309B2 (en) 2004-02-26 2009-05-12 Nilanjan Mukherjee Testing memories using algorithm selection
US7206979B1 (en) 2004-06-28 2007-04-17 Sun Microsystems, Inc. Method and apparatus for at-speed diagnostics of embedded memories
US7181659B2 (en) 2005-02-10 2007-02-20 International Business Machines Corporation Memory built-in self test engine apparatus and method with trigger on failure and multiple patterns per load capability

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