JP2002175696A5 - - Google Patents

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Publication number
JP2002175696A5
JP2002175696A5 JP2000371939A JP2000371939A JP2002175696A5 JP 2002175696 A5 JP2002175696 A5 JP 2002175696A5 JP 2000371939 A JP2000371939 A JP 2000371939A JP 2000371939 A JP2000371939 A JP 2000371939A JP 2002175696 A5 JP2002175696 A5 JP 2002175696A5
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JP
Japan
Prior art keywords
fuse
circuit
group
read
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000371939A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002175696A (ja
JP3954302B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2000371939A priority Critical patent/JP3954302B2/ja
Priority claimed from JP2000371939A external-priority patent/JP3954302B2/ja
Priority to US10/007,148 priority patent/US6577551B2/en
Publication of JP2002175696A publication Critical patent/JP2002175696A/ja
Publication of JP2002175696A5 publication Critical patent/JP2002175696A5/ja
Application granted granted Critical
Publication of JP3954302B2 publication Critical patent/JP3954302B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2000371939A 2000-12-06 2000-12-06 半導体集積回路 Expired - Fee Related JP3954302B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2000371939A JP3954302B2 (ja) 2000-12-06 2000-12-06 半導体集積回路
US10/007,148 US6577551B2 (en) 2000-12-06 2001-12-04 Semiconductor integrated circuit having a built-in data storage circuit for nonvolatile storage of control data

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000371939A JP3954302B2 (ja) 2000-12-06 2000-12-06 半導体集積回路

Publications (3)

Publication Number Publication Date
JP2002175696A JP2002175696A (ja) 2002-06-21
JP2002175696A5 true JP2002175696A5 (enExample) 2005-05-26
JP3954302B2 JP3954302B2 (ja) 2007-08-08

Family

ID=18841575

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000371939A Expired - Fee Related JP3954302B2 (ja) 2000-12-06 2000-12-06 半導体集積回路

Country Status (2)

Country Link
US (1) US6577551B2 (enExample)
JP (1) JP3954302B2 (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002269999A (ja) * 2001-03-13 2002-09-20 Toshiba Corp 半導体記憶装置
JP4790925B2 (ja) * 2001-03-30 2011-10-12 富士通セミコンダクター株式会社 アドレス発生回路
KR100420125B1 (ko) * 2002-02-02 2004-03-02 삼성전자주식회사 비휘발성 반도체 메모리 장치와 그것의 파워-업 독출 방법
DE10217710C1 (de) * 2002-04-20 2003-11-20 Infineon Technologies Ag Halbleiterschaltung mit Fuses und Ausleseverfahren für Fuses
US6667189B1 (en) * 2002-09-13 2003-12-23 Institute Of Microelectronics High performance silicon condenser microphone with perforated single crystal silicon backplate
JP4169592B2 (ja) * 2002-12-19 2008-10-22 株式会社ＮＳＣｏｒｅ Ｃｍｉｓ型半導体不揮発記憶回路
JP4138521B2 (ja) * 2003-02-13 2008-08-27 富士通株式会社 半導体装置
KR101106836B1 (ko) * 2003-11-12 2012-01-19 엔엑스피 비 브이 전자 회로 및 데이터 요소 프로세싱 방법
JP2006059969A (ja) * 2004-08-19 2006-03-02 Sony Corp 半導体装置
JP4880999B2 (ja) * 2005-12-28 2012-02-22 株式会社東芝 半導体集積回路およびその検査方法
JP5101044B2 (ja) * 2006-06-06 2012-12-19 日置電機株式会社 測定装置
JP5099674B2 (ja) * 2006-12-25 2012-12-19 三星電子株式会社 半導体集積回路
US7667506B2 (en) * 2007-03-29 2010-02-23 Mitutoyo Corporation Customizable power-on reset circuit based on critical circuit counterparts
JP2009099156A (ja) * 2007-10-12 2009-05-07 Elpida Memory Inc フューズラッチ回路及びフューズラッチ方法
JP4558033B2 (ja) * 2007-12-10 2010-10-06 株式会社東芝 不揮発性半導体記憶装置
KR100930411B1 (ko) * 2008-04-10 2009-12-08 주식회사 하이닉스반도체 퓨즈 정보 제어 장치, 이를 이용한 반도체 집적회로 및그의 퓨즈 정보 제어 방법
JP2011124683A (ja) * 2009-12-09 2011-06-23 Toshiba Corp 出力バッファ回路、入力バッファ回路、及び入出力バッファ回路
JP2011124689A (ja) * 2009-12-09 2011-06-23 Toshiba Corp バッファ回路
KR101901664B1 (ko) * 2012-04-02 2018-10-01 삼성전자주식회사 멀티 리딩 모드를 갖는 퓨즈 데이터 리딩 회로
JP2014078313A (ja) * 2013-12-26 2014-05-01 Ps4 Luxco S A R L 半導体装置
CN105139891B (zh) * 2015-09-11 2023-04-18 四川易冲科技有限公司 一种用于校准模拟集成电路的方法及装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5999463A (en) * 1997-07-21 1999-12-07 Samsung Electronics Co., Ltd. Redundancy fuse box and semiconductor device including column redundancy fuse box shared by a plurality of memory blocks
JP3730381B2 (ja) 1997-10-21 2006-01-05 株式会社東芝 半導体記憶装置
JPH11238394A (ja) * 1997-12-18 1999-08-31 Toshiba Corp 半導体記憶装置

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