JP2002148211A - Ｘ線検査装置 - Google Patents

Ｘ線検査装置

Info

Publication number
JP2002148211A
JP2002148211A JP2000338824A JP2000338824A JP2002148211A JP 2002148211 A JP2002148211 A JP 2002148211A JP 2000338824 A JP2000338824 A JP 2000338824A JP 2000338824 A JP2000338824 A JP 2000338824A JP 2002148211 A JP2002148211 A JP 2002148211A
Authority
JP
Japan
Prior art keywords
ray
inspection apparatus
detection level
line sensor
warning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2000338824A
Other languages
English (en)
Japanese (ja)
Inventor
Masahiro Shimada
征浩 嶌田
Takashi Kabumoto
隆司 株本
Hirokazu Sato
宏和 佐藤
Osamu Hirose
修 広瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ishida Co Ltd
Original Assignee
Ishida Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ishida Co Ltd filed Critical Ishida Co Ltd
Priority to JP2000338824A priority Critical patent/JP2002148211A/ja
Priority to GB0126303A priority patent/GB2374267B/en
Priority to KR1020010068111A priority patent/KR100830378B1/ko
Priority to CN 01143618 priority patent/CN1356539A/zh
Priority to CN2007101438969A priority patent/CN101105464B/zh
Publication of JP2002148211A publication Critical patent/JP2002148211A/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2000338824A 2000-11-07 2000-11-07 Ｘ線検査装置 Withdrawn JP2002148211A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2000338824A JP2002148211A (ja) 2000-11-07 2000-11-07 Ｘ線検査装置
GB0126303A GB2374267B (en) 2000-11-07 2001-11-01 X-ray inspection apparatus
KR1020010068111A KR100830378B1 (ko) 2000-11-07 2001-11-02 Ｘ선 검사 장치
CN 01143618 CN1356539A (zh) 2000-11-07 2001-11-07 X射线检查装置
CN2007101438969A CN101105464B (zh) 2000-11-07 2001-11-07 X射线检查装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000338824A JP2002148211A (ja) 2000-11-07 2000-11-07 Ｘ線検査装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2006134439A Division JP3987092B2 (ja) 2006-05-12 2006-05-12 Ｘ線検査装置

Publications (1)

Publication Number Publication Date
JP2002148211A true JP2002148211A (ja) 2002-05-22

Family

ID=18813977

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000338824A Withdrawn JP2002148211A (ja) 2000-11-07 2000-11-07 Ｘ線検査装置

Country Status (4)

Country Link
JP (1) JP2002148211A (zh)
KR (1) KR100830378B1 (zh)
CN (2) CN1356539A (zh)
GB (1) GB2374267B (zh)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002168806A (ja) * 2000-11-28 2002-06-14 Anritsu Corp Ｘ線異物検出装置
JP2005308600A (ja) * 2004-04-23 2005-11-04 Shimadzu Corp 放射線異物検査装置
JP2006071423A (ja) * 2004-09-01 2006-03-16 Ishida Co Ltd Ｘ線検査装置
JP2007240353A (ja) * 2006-03-09 2007-09-20 Nagoya Electric Works Co Ltd Ｘ線検出器診断装置およびｘ線検出器診断方法
JP2010085224A (ja) * 2008-09-30 2010-04-15 Anritsu Sanki System Co Ltd Ｘ線検査装置
JP2010127655A (ja) * 2008-11-25 2010-06-10 Panasonic Electric Works Co Ltd Ｘ線検査装置
JP2012021900A (ja) * 2010-07-15 2012-02-02 Hitachi Medical Corp Ｘ線画像診断装置
WO2012096266A1 (ja) * 2011-01-11 2012-07-19 株式会社東芝 Ｘ線診断装置
JP2013160569A (ja) * 2012-02-02 2013-08-19 Anritsu Sanki System Co Ltd Ｘ線検査装置
JP2018173372A (ja) * 2017-03-31 2018-11-08 松定プレシジョン株式会社 Ｘ線検査装置及びｘ線検査方法
JP2019015577A (ja) * 2017-07-05 2019-01-31 株式会社イシダ Ｘ線検査装置
JP2019113350A (ja) * 2017-12-21 2019-07-11 株式会社島津製作所 Ｘ線分析装置、及び、ｘ線検出器の交換時期判定方法
KR20190130097A (ko) * 2018-05-11 2019-11-21 테크밸리 주식회사 누설 선량의 모니터링 시스템

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006098195A (ja) * 2004-09-29 2006-04-13 Ishida Co Ltd Ｘ線検査装置
DE102006048608A1 (de) * 2006-10-13 2008-04-17 Siemens Ag Verfahren zur Kontrolle eines Leistungszustands eines Röntgenstrahlers und/oder eines Röntgendetektors und System zur Durchführung des Verfahrens
NL2015144B1 (nl) * 2015-07-10 2017-02-01 Amiris B V Inrichting en werkwijze voor het testen op micro-organismen in levensmiddelen die in verpakkingen gehouden zijn.
CN110165323A (zh) * 2019-05-29 2019-08-23 上海精测半导体技术有限公司 锂电池回收方法和设备
CA3147292A1 (en) * 2019-08-22 2021-02-25 John Bean Technologies Corporation X-ray unit technology modules and automated application training

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3955119A (en) * 1973-01-29 1976-05-04 Varian Associates Apparatus for predicting incipient failure of an X-ray generator tube
JPS52128190A (en) * 1976-04-21 1977-10-27 Nec Corp Inspection device for x ray fluoroscopic adhering layer
JPS62132106A (ja) * 1985-12-04 1987-06-15 Seiko Instr & Electronics Ltd 磁気シ−トの膜厚測定装置
JPS6456036A (en) * 1987-08-26 1989-03-02 Hitachi Medical Corp X-ray ct apparatus
US4918714A (en) * 1988-08-19 1990-04-17 Varian Associates, Inc. X-ray tube exposure monitor
US5736930A (en) * 1995-07-21 1998-04-07 Apple Computer, Inc. Apparatus and method for radiation source failure prediction
US5668850A (en) * 1996-05-23 1997-09-16 General Electric Company Systems and methods of determining x-ray tube life
US6212256B1 (en) * 1998-11-25 2001-04-03 Ge Medical Global Technology Company, Llc X-ray tube replacement management system

Cited By (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002168806A (ja) * 2000-11-28 2002-06-14 Anritsu Corp Ｘ線異物検出装置
JP4530523B2 (ja) * 2000-11-28 2010-08-25 アンリツ産機システム株式会社 Ｘ線異物検出装置
JP2005308600A (ja) * 2004-04-23 2005-11-04 Shimadzu Corp 放射線異物検査装置
JP4590915B2 (ja) * 2004-04-23 2010-12-01 株式会社島津製作所 放射線異物検査装置
JP2006071423A (ja) * 2004-09-01 2006-03-16 Ishida Co Ltd Ｘ線検査装置
JP4669250B2 (ja) * 2004-09-01 2011-04-13 株式会社イシダ Ｘ線検査装置
JP2007240353A (ja) * 2006-03-09 2007-09-20 Nagoya Electric Works Co Ltd Ｘ線検出器診断装置およびｘ線検出器診断方法
JP4728148B2 (ja) * 2006-03-09 2011-07-20 名古屋電機工業株式会社 Ｘ線検出器診断装置およびｘ線検出器診断方法
JP2010085224A (ja) * 2008-09-30 2010-04-15 Anritsu Sanki System Co Ltd Ｘ線検査装置
JP2010127655A (ja) * 2008-11-25 2010-06-10 Panasonic Electric Works Co Ltd Ｘ線検査装置
JP2012021900A (ja) * 2010-07-15 2012-02-02 Hitachi Medical Corp Ｘ線画像診断装置
WO2012096266A1 (ja) * 2011-01-11 2012-07-19 株式会社東芝 Ｘ線診断装置
JP2012159497A (ja) * 2011-01-11 2012-08-23 Toshiba Corp Ｘ線診断装置
US8905636B2 (en) 2011-01-11 2014-12-09 Kabushiki Kaisha Toshiba X-ray diagnostic apparatus
JP2013160569A (ja) * 2012-02-02 2013-08-19 Anritsu Sanki System Co Ltd Ｘ線検査装置
JP2018173372A (ja) * 2017-03-31 2018-11-08 松定プレシジョン株式会社 Ｘ線検査装置及びｘ線検査方法
JP2019015577A (ja) * 2017-07-05 2019-01-31 株式会社イシダ Ｘ線検査装置
JP7001252B2 (ja) 2017-07-05 2022-01-19 株式会社イシダ Ｘ線検査装置
JP2019113350A (ja) * 2017-12-21 2019-07-11 株式会社島津製作所 Ｘ線分析装置、及び、ｘ線検出器の交換時期判定方法
KR20190130097A (ko) * 2018-05-11 2019-11-21 테크밸리 주식회사 누설 선량의 모니터링 시스템
KR102176101B1 (ko) * 2018-05-11 2020-11-10 테크밸리 주식회사 누설 선량의 모니터링 시스템

Also Published As

Publication number Publication date
KR20020036705A (ko) 2002-05-16
GB0126303D0 (en) 2002-01-02
GB2374267B (en) 2004-06-16
CN1356539A (zh) 2002-07-03
CN101105464A (zh) 2008-01-16
CN101105464B (zh) 2011-08-24
GB2374267A (en) 2002-10-09
KR100830378B1 (ko) 2008-05-20

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Legal Events

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Effective date: 20071023

A761 Written withdrawal of application

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Effective date: 20100805