HK1087195A1 - Run-off path to collect liquid for an immersion lithography apparatus - Google Patents

Run-off path to collect liquid for an immersion lithography apparatus

Info

Publication number
HK1087195A1
HK1087195A1 HK06107409.4A HK06107409A HK1087195A1 HK 1087195 A1 HK1087195 A1 HK 1087195A1 HK 06107409 A HK06107409 A HK 06107409A HK 1087195 A1 HK1087195 A1 HK 1087195A1
Authority
HK
Hong Kong
Prior art keywords
run
path
lithography apparatus
immersion lithography
collect liquid
Prior art date
Application number
HK06107409.4A
Other languages
English (en)
Chinese (zh)
Inventor
諾瓦克.托馬斯.
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Publication of HK1087195A1 publication Critical patent/HK1087195A1/xx

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70341Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7095Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
HK06107409.4A 2003-04-10 2006-06-30 Run-off path to collect liquid for an immersion lithography apparatus HK1087195A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US46211403P 2003-04-10 2003-04-10
PCT/US2004/009993 WO2004093160A2 (fr) 2003-04-10 2004-04-01 Trajet de ruissellement permettant de recueillir un liquide dans un appareil de lithographie a immersion

Publications (1)

Publication Number Publication Date
HK1087195A1 true HK1087195A1 (en) 2006-10-06

Family

ID=33299911

Family Applications (3)

Application Number Title Priority Date Filing Date
HK06107409.4A HK1087195A1 (en) 2003-04-10 2006-06-30 Run-off path to collect liquid for an immersion lithography apparatus
HK16101898.3A HK1214000A1 (zh) 2003-04-10 2016-02-19 用於浸沒式光刻裝置的收集液體的溢流路徑
HK18114938.6A HK1255862A1 (zh) 2003-04-10 2018-11-22 用於沉浸光刻裝置的收集液體的溢出通道

Family Applications After (2)

Application Number Title Priority Date Filing Date
HK16101898.3A HK1214000A1 (zh) 2003-04-10 2016-02-19 用於浸沒式光刻裝置的收集液體的溢流路徑
HK18114938.6A HK1255862A1 (zh) 2003-04-10 2018-11-22 用於沉浸光刻裝置的收集液體的溢出通道

Country Status (7)

Country Link
US (4) US7397532B2 (fr)
EP (3) EP1611482B1 (fr)
JP (1) JP4488005B2 (fr)
KR (1) KR101129213B1 (fr)
CN (1) CN1771463A (fr)
HK (3) HK1087195A1 (fr)
WO (1) WO2004093160A2 (fr)

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US20120268726A1 (en) 2012-10-25
US7397532B2 (en) 2008-07-08
US20080239261A1 (en) 2008-10-02
EP1611482A4 (fr) 2008-10-15
US8243253B2 (en) 2012-08-14
WO2004093160A3 (fr) 2005-02-24
CN1771463A (zh) 2006-05-10
HK1255862A1 (zh) 2019-08-30
EP1611482B1 (fr) 2015-06-03
EP1611482A2 (fr) 2006-01-04
EP3352010A1 (fr) 2018-07-25
US9007561B2 (en) 2015-04-14
KR101129213B1 (ko) 2012-03-27
JP4488005B2 (ja) 2010-06-23

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Effective date: 20200401