DE69716233D1 - Halbleiterspeicheranordnung mit fehlerdetektion und -korrektur - Google Patents

Halbleiterspeicheranordnung mit fehlerdetektion und -korrektur

Info

Publication number
DE69716233D1
DE69716233D1 DE69716233T DE69716233T DE69716233D1 DE 69716233 D1 DE69716233 D1 DE 69716233D1 DE 69716233 T DE69716233 T DE 69716233T DE 69716233 T DE69716233 T DE 69716233T DE 69716233 D1 DE69716233 D1 DE 69716233D1
Authority
DE
Germany
Prior art keywords
block
semiconductor memory
pct
correction
error detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69716233T
Other languages
English (en)
Other versions
DE69716233T2 (de
Inventor
Shuichi Kikuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Device Ltd
Original Assignee
Tokyo Electron Device Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Device Ltd filed Critical Tokyo Electron Device Ltd
Application granted granted Critical
Publication of DE69716233D1 publication Critical patent/DE69716233D1/de
Publication of DE69716233T2 publication Critical patent/DE69716233T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/20—Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications
    • G11C29/765—Masking faults in memories by using spares or by reconfiguring using address translation or modifications in solid state disks
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/88—Monitoring involving counting
DE69716233T 1996-08-16 1997-08-08 Halbleiterspeicheranordnung mit fehlerdetektion und -korrektur Expired - Fee Related DE69716233T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP23468296 1996-08-16
PCT/JP1997/002779 WO1998008166A1 (en) 1996-08-16 1997-08-08 Semiconductor memory device having error detection and correction

Publications (2)

Publication Number Publication Date
DE69716233D1 true DE69716233D1 (de) 2002-11-14
DE69716233T2 DE69716233T2 (de) 2003-02-20

Family

ID=16974802

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69716233T Expired - Fee Related DE69716233T2 (de) 1996-08-16 1997-08-08 Halbleiterspeicheranordnung mit fehlerdetektion und -korrektur

Country Status (8)

Country Link
US (1) US6058047A (de)
EP (1) EP0862762B1 (de)
JP (1) JP2001501000A (de)
KR (1) KR100383404B1 (de)
AT (1) ATE225961T1 (de)
DE (1) DE69716233T2 (de)
TW (1) TW368659B (de)
WO (1) WO1998008166A1 (de)

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Also Published As

Publication number Publication date
WO1998008166A1 (en) 1998-02-26
EP0862762A1 (de) 1998-09-09
DE69716233T2 (de) 2003-02-20
US6058047A (en) 2000-05-02
TW368659B (en) 1999-09-01
JP2001501000A (ja) 2001-01-23
ATE225961T1 (de) 2002-10-15
KR20000064279A (ko) 2000-11-06
EP0862762B1 (de) 2002-10-09
KR100383404B1 (ko) 2003-07-16

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