DE69719086D1 - Zeitverteilte entfernung von fehlerkorrekturcodes (ecc) zur korrektur von speicherfehlern - Google Patents
Zeitverteilte entfernung von fehlerkorrekturcodes (ecc) zur korrektur von speicherfehlernInfo
- Publication number
- DE69719086D1 DE69719086D1 DE69719086T DE69719086T DE69719086D1 DE 69719086 D1 DE69719086 D1 DE 69719086D1 DE 69719086 T DE69719086 T DE 69719086T DE 69719086 T DE69719086 T DE 69719086T DE 69719086 D1 DE69719086 D1 DE 69719086D1
- Authority
- DE
- Germany
- Prior art keywords
- memory
- ram
- section
- computer system
- error
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
- G06F11/106—Correcting systematically all correctable errors, i.e. scrubbing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/52—Protection of memory contents; Detection of errors in memory contents
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
- G06F11/1028—Adjacent errors, e.g. error in n-bit (n>1) wide storage units, i.e. package error
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
- G06F11/1052—Bypassing or disabling error detection or correction
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0409—Online test
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Detection And Correction Of Errors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/777,252 US5978952A (en) | 1996-12-31 | 1996-12-31 | Time-distributed ECC scrubbing to correct memory errors |
PCT/US1997/021904 WO1998029811A1 (en) | 1996-12-31 | 1997-11-24 | Time-distributed ecc scrubbing to correct memory errors |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69719086D1 true DE69719086D1 (de) | 2003-03-20 |
DE69719086T2 DE69719086T2 (de) | 2003-09-25 |
Family
ID=25109720
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69719086T Expired - Lifetime DE69719086T2 (de) | 1996-12-31 | 1997-11-24 | Zeitverteilte entfernung von fehlerkorrekturcodes (ecc) zur korrektur von speicherfehlern |
Country Status (5)
Country | Link |
---|---|
US (1) | US5978952A (de) |
EP (1) | EP0986783B1 (de) |
AU (1) | AU5512398A (de) |
DE (1) | DE69719086T2 (de) |
WO (1) | WO1998029811A1 (de) |
Families Citing this family (63)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050036363A1 (en) * | 1996-05-24 | 2005-02-17 | Jeng-Jye Shau | High performance embedded semiconductor memory devices with multiple dimension first-level bit-lines |
US5748547A (en) * | 1996-05-24 | 1998-05-05 | Shau; Jeng-Jye | High performance semiconductor memory devices having multiple dimension bit lines |
US6119248A (en) * | 1998-01-26 | 2000-09-12 | Dell Usa L.P. | Operating system notification of correctable error in computer information |
US6219742B1 (en) * | 1998-04-29 | 2001-04-17 | Compaq Computer Corporation | Method and apparatus for artificially generating general purpose events in an ACPI environment |
US6463563B1 (en) | 1999-11-30 | 2002-10-08 | International Business Machines Corporation | Single symbol correction double symbol detection code employing a modular H-matrix |
US6510528B1 (en) * | 1999-12-14 | 2003-01-21 | International Business Machines Corporation | Method for improving personal computer reliability for systems that use certain power saving schemes |
US6832340B2 (en) * | 2000-01-26 | 2004-12-14 | Hewlett-Packard Development Company, L.P. | Real-time hardware memory scrubbing |
US6662333B1 (en) * | 2000-02-04 | 2003-12-09 | Hewlett-Packard Development Company, L.P. | Shared error correction for memory design |
US6701480B1 (en) * | 2000-03-08 | 2004-03-02 | Rockwell Automation Technologies, Inc. | System and method for providing error check and correction in memory systems |
US6675317B2 (en) * | 2000-12-14 | 2004-01-06 | International Business Machines Corporation | Method and system for determining erase procedures run on a hard drive |
US6449203B1 (en) * | 2001-03-08 | 2002-09-10 | Micron Technology, Inc. | Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMs |
US6792567B2 (en) * | 2001-04-30 | 2004-09-14 | Stmicroelectronics, Inc. | System and method for correcting soft errors in random access memory devices |
US6571317B2 (en) * | 2001-05-01 | 2003-05-27 | Broadcom Corporation | Replacement data error detector |
US6976204B1 (en) | 2001-06-15 | 2005-12-13 | Advanced Micro Devices, Inc. | Circuit and method for correcting erroneous data in memory for pipelined reads |
DE10128996B4 (de) | 2001-06-15 | 2019-06-13 | Robert Bosch Gmbh | Verfahren und Vorrichtung zur Überwachung von Speicherzellen eines flüchtigen Datenspeichers |
US6851070B1 (en) * | 2001-08-13 | 2005-02-01 | Network Appliance, Inc. | System and method for managing time-limited long-running operations in a data storage system |
JP4856848B2 (ja) | 2001-10-11 | 2012-01-18 | アルテラ コーポレイション | プログラマブルロジックリソース上のエラー検出 |
US6751159B2 (en) * | 2001-10-26 | 2004-06-15 | Micron Technology, Inc. | Memory device operable in either a high-power, full-page size mode or a low-power, reduced-page size mode |
US6848063B2 (en) | 2001-11-20 | 2005-01-25 | Hewlett-Packard Development Company, L.P. | System and method for scrubbing errors in very large memories |
US6934903B1 (en) | 2001-12-17 | 2005-08-23 | Advanced Micro Devices, Inc. | Using microcode to correct ECC errors in a processor |
US6718444B1 (en) | 2001-12-20 | 2004-04-06 | Advanced Micro Devices, Inc. | Read-modify-write for partial writes in a memory controller |
US20030163769A1 (en) * | 2002-02-27 | 2003-08-28 | Sun Microsystems, Inc. | Memory module including an error detection mechanism for address and control signals |
US6941493B2 (en) * | 2002-02-27 | 2005-09-06 | Sun Microsystems, Inc. | Memory subsystem including an error detection mechanism for address and control signals |
US6838331B2 (en) * | 2002-04-09 | 2005-01-04 | Micron Technology, Inc. | Method and system for dynamically operating memory in a power-saving error correction mode |
US6751143B2 (en) * | 2002-04-11 | 2004-06-15 | Micron Technology, Inc. | Method and system for low power refresh of dynamic random access memories |
US7171610B2 (en) * | 2002-06-12 | 2007-01-30 | International Business Machines Corporation | Method, system, and article of manufacture for preventing data loss |
US6973613B2 (en) * | 2002-06-28 | 2005-12-06 | Sun Microsystems, Inc. | Error detection/correction code which detects and corrects component failure and which provides single bit error correction subsequent to component failure |
US6976194B2 (en) * | 2002-06-28 | 2005-12-13 | Sun Microsystems, Inc. | Memory/Transmission medium failure handling controller and method |
US6996766B2 (en) * | 2002-06-28 | 2006-02-07 | Sun Microsystems, Inc. | Error detection/correction code which detects and corrects a first failing component and optionally a second failing component |
US20040039873A1 (en) * | 2002-08-21 | 2004-02-26 | Hou-Yuan Lin | Management system for access control modes of a DRAM module socket |
US6996686B2 (en) * | 2002-12-23 | 2006-02-07 | Sun Microsystems, Inc. | Memory subsystem including memory modules having multiple banks |
US7779285B2 (en) * | 2003-02-18 | 2010-08-17 | Oracle America, Inc. | Memory system including independent isolated power for each memory module |
EP1460765A1 (de) * | 2003-03-19 | 2004-09-22 | STMicroelectronics S.r.l. | Fehlerkorrekturmethode für als Symbolsequenz codierte digitale Daten |
KR100543447B1 (ko) * | 2003-04-03 | 2006-01-23 | 삼성전자주식회사 | 에러정정기능을 가진 플래쉬메모리장치 |
US7496822B2 (en) * | 2003-05-15 | 2009-02-24 | Texas Instruments Incorporated | Apparatus and method for responding to data retention loss in a non-volatile memory unit using error checking and correction techniques |
US7530008B2 (en) | 2003-08-08 | 2009-05-05 | Sun Microsystems, Inc. | Scalable-chip-correct ECC scheme |
US7188296B1 (en) | 2003-10-30 | 2007-03-06 | Sun Microsystems, Inc. | ECC for component failures using Galois fields |
US7341765B2 (en) * | 2004-01-27 | 2008-03-11 | Battelle Energy Alliance, Llc | Metallic coatings on silicon substrates, and methods of forming metallic coatings on silicon substrates |
US7328377B1 (en) | 2004-01-27 | 2008-02-05 | Altera Corporation | Error correction for programmable logic integrated circuits |
US7657186B2 (en) * | 2004-03-05 | 2010-02-02 | Finisar Corporation | Consistency checking over internal information in an optical transceiver |
CN100418074C (zh) * | 2004-03-05 | 2008-09-10 | 菲尼萨公司 | 光学收发机中的分级和字节可配置存储器 |
US7278067B1 (en) * | 2004-04-30 | 2007-10-02 | Network Appliance, Inc. | Method and an apparatus for aggressively detecting media errors on storage devices with negligible performance impact |
US7543176B2 (en) * | 2004-12-30 | 2009-06-02 | Finisar Corporation | Background consistency checking in an optical transceiver |
CN100549986C (zh) * | 2005-03-24 | 2009-10-14 | 富士通株式会社 | 信息处理装置 |
US7350007B2 (en) * | 2005-04-05 | 2008-03-25 | Hewlett-Packard Development Company, L.P. | Time-interval-based system and method to determine if a device error rate equals or exceeds a threshold error rate |
US20060256615A1 (en) * | 2005-05-10 | 2006-11-16 | Larson Thane M | Horizontal and vertical error correction coding (ECC) system and method |
US7698591B2 (en) * | 2005-08-26 | 2010-04-13 | International Business Machines Corporation | Method and apparatus for ensuring data integrity in redundant mass storage systems |
US20070061669A1 (en) * | 2005-08-30 | 2007-03-15 | Major Karl L | Method, device and system for detecting error correction defects |
US20070168754A1 (en) * | 2005-12-19 | 2007-07-19 | Xiv Ltd. | Method and apparatus for ensuring writing integrity in mass storage systems |
US20080183916A1 (en) * | 2007-01-30 | 2008-07-31 | Mark David Bellows | Using Extreme Data Rate Memory Commands to Scrub and Refresh Double Data Rate Memory |
US8042022B2 (en) * | 2007-03-08 | 2011-10-18 | Micron Technology, Inc. | Method, system, and apparatus for distributed decoding during prolonged refresh |
JP4994112B2 (ja) * | 2007-05-22 | 2012-08-08 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置およびメモリ制御方法 |
US8046524B2 (en) * | 2007-08-08 | 2011-10-25 | Sandisk Technologies Inc. | Managing processing delays in an isochronous system |
US20100106904A1 (en) * | 2008-10-23 | 2010-04-29 | Dell Products L.P. | Shadow raid cache memory |
US8589726B2 (en) | 2011-09-01 | 2013-11-19 | Infinidat Ltd. | System and method for uncovering data errors |
US9183078B1 (en) * | 2012-04-10 | 2015-11-10 | Marvell International Ltd. | Providing error checking and correcting (ECC) capability for memory |
WO2015147829A1 (en) * | 2014-03-27 | 2015-10-01 | Siemens Aktiengesellschaft | System and method of run-time continuous memory check for embedded systems |
US9600189B2 (en) | 2014-06-11 | 2017-03-21 | International Business Machines Corporation | Bank-level fault management in a memory system |
US9703630B2 (en) | 2015-06-08 | 2017-07-11 | International Business Machines Corporation | Selective error coding |
US10628248B2 (en) | 2016-03-15 | 2020-04-21 | International Business Machines Corporation | Autonomous dram scrub and error counting |
US10956345B2 (en) * | 2016-04-01 | 2021-03-23 | Intel Corporation | Enhanced directed system management interrupt mechanism |
KR20180060084A (ko) | 2016-11-28 | 2018-06-07 | 삼성전자주식회사 | 반도체 메모리 장치의 스크러빙 컨트롤러, 반도체 메모리 장치 및 반도체 메모리 장치의 동작 방법 |
US11288120B2 (en) | 2020-03-13 | 2022-03-29 | Marvell Asia Pte Ltd. | Circuit and method for soft-error protection in operation of ECC and register |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4535455A (en) * | 1983-03-11 | 1985-08-13 | At&T Bell Laboratories | Correction and monitoring of transient errors in a memory system |
US5263032A (en) * | 1991-06-27 | 1993-11-16 | Digital Equipment Corporation | Computer system operation with corrected read data function |
US5367689A (en) * | 1992-10-02 | 1994-11-22 | Compaq Computer Corporation | Apparatus for strictly ordered input/output operations for interrupt system integrity |
US5490155A (en) * | 1992-10-02 | 1996-02-06 | Compaq Computer Corp. | Error correction system for n bits using error correcting code designed for fewer than n bits |
US5717903A (en) * | 1995-05-15 | 1998-02-10 | Compaq Computer Corporation | Method and appartus for emulating a peripheral device to allow device driver development before availability of the peripheral device |
-
1996
- 1996-12-31 US US08/777,252 patent/US5978952A/en not_active Expired - Lifetime
-
1997
- 1997-11-24 EP EP97951493A patent/EP0986783B1/de not_active Expired - Lifetime
- 1997-11-24 AU AU55123/98A patent/AU5512398A/en not_active Abandoned
- 1997-11-24 DE DE69719086T patent/DE69719086T2/de not_active Expired - Lifetime
- 1997-11-24 WO PCT/US1997/021904 patent/WO1998029811A1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
EP0986783B1 (de) | 2003-02-12 |
US5978952A (en) | 1999-11-02 |
DE69719086T2 (de) | 2003-09-25 |
WO1998029811A1 (en) | 1998-07-09 |
AU5512398A (en) | 1998-07-31 |
EP0986783A1 (de) | 2000-03-22 |
EP0986783A4 (de) | 2000-05-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: HEYER, V., DIPL.-PHYS. DR.RER.NAT., PAT.-ANW., 806 |