DE69719086D1 - Zeitverteilte entfernung von fehlerkorrekturcodes (ecc) zur korrektur von speicherfehlern - Google Patents

Zeitverteilte entfernung von fehlerkorrekturcodes (ecc) zur korrektur von speicherfehlern

Info

Publication number
DE69719086D1
DE69719086D1 DE69719086T DE69719086T DE69719086D1 DE 69719086 D1 DE69719086 D1 DE 69719086D1 DE 69719086 T DE69719086 T DE 69719086T DE 69719086 T DE69719086 T DE 69719086T DE 69719086 D1 DE69719086 D1 DE 69719086D1
Authority
DE
Germany
Prior art keywords
memory
ram
section
computer system
error
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69719086T
Other languages
English (en)
Other versions
DE69719086T2 (de
Inventor
R Hayek
Radhakrishnan Venkataraman
Jasmin Ajanovic
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of DE69719086D1 publication Critical patent/DE69719086D1/de
Application granted granted Critical
Publication of DE69719086T2 publication Critical patent/DE69719086T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • G06F11/106—Correcting systematically all correctable errors, i.e. scrubbing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52—Protection of memory contents; Detection of errors in memory contents
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • G06F11/1028—Adjacent errors, e.g. error in n-bit (n>1) wide storage units, i.e. package error
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • G06F11/1052—Bypassing or disabling error detection or correction
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0409—Online test

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Detection And Correction Of Errors (AREA)
DE69719086T 1996-12-31 1997-11-24 Zeitverteilte entfernung von fehlerkorrekturcodes (ecc) zur korrektur von speicherfehlern Expired - Lifetime DE69719086T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/777,252 US5978952A (en) 1996-12-31 1996-12-31 Time-distributed ECC scrubbing to correct memory errors
PCT/US1997/021904 WO1998029811A1 (en) 1996-12-31 1997-11-24 Time-distributed ecc scrubbing to correct memory errors

Publications (2)

Publication Number Publication Date
DE69719086D1 true DE69719086D1 (de) 2003-03-20
DE69719086T2 DE69719086T2 (de) 2003-09-25

Family

ID=25109720

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69719086T Expired - Lifetime DE69719086T2 (de) 1996-12-31 1997-11-24 Zeitverteilte entfernung von fehlerkorrekturcodes (ecc) zur korrektur von speicherfehlern

Country Status (5)

Country Link
US (1) US5978952A (de)
EP (1) EP0986783B1 (de)
AU (1) AU5512398A (de)
DE (1) DE69719086T2 (de)
WO (1) WO1998029811A1 (de)

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US6941493B2 (en) * 2002-02-27 2005-09-06 Sun Microsystems, Inc. Memory subsystem including an error detection mechanism for address and control signals
US20030163769A1 (en) * 2002-02-27 2003-08-28 Sun Microsystems, Inc. Memory module including an error detection mechanism for address and control signals
US6838331B2 (en) * 2002-04-09 2005-01-04 Micron Technology, Inc. Method and system for dynamically operating memory in a power-saving error correction mode
US6751143B2 (en) * 2002-04-11 2004-06-15 Micron Technology, Inc. Method and system for low power refresh of dynamic random access memories
US7171610B2 (en) * 2002-06-12 2007-01-30 International Business Machines Corporation Method, system, and article of manufacture for preventing data loss
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US6996766B2 (en) * 2002-06-28 2006-02-07 Sun Microsystems, Inc. Error detection/correction code which detects and corrects a first failing component and optionally a second failing component
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KR100543447B1 (ko) * 2003-04-03 2006-01-23 삼성전자주식회사 에러정정기능을 가진 플래쉬메모리장치
US7496822B2 (en) * 2003-05-15 2009-02-24 Texas Instruments Incorporated Apparatus and method for responding to data retention loss in a non-volatile memory unit using error checking and correction techniques
US7530008B2 (en) 2003-08-08 2009-05-05 Sun Microsystems, Inc. Scalable-chip-correct ECC scheme
US7188296B1 (en) 2003-10-30 2007-03-06 Sun Microsystems, Inc. ECC for component failures using Galois fields
US7328377B1 (en) 2004-01-27 2008-02-05 Altera Corporation Error correction for programmable logic integrated circuits
US7341765B2 (en) * 2004-01-27 2008-03-11 Battelle Energy Alliance, Llc Metallic coatings on silicon substrates, and methods of forming metallic coatings on silicon substrates
US7657186B2 (en) * 2004-03-05 2010-02-02 Finisar Corporation Consistency checking over internal information in an optical transceiver
CN100418074C (zh) * 2004-03-05 2008-09-10 菲尼萨公司 光学收发机中的分级和字节可配置存储器
US7278067B1 (en) * 2004-04-30 2007-10-02 Network Appliance, Inc. Method and an apparatus for aggressively detecting media errors on storage devices with negligible performance impact
US7543176B2 (en) * 2004-12-30 2009-06-02 Finisar Corporation Background consistency checking in an optical transceiver
EP1862909A4 (de) * 2005-03-24 2009-09-09 Fujitsu Ltd Speicheradressen-verwaltung durch firmware
US7350007B2 (en) * 2005-04-05 2008-03-25 Hewlett-Packard Development Company, L.P. Time-interval-based system and method to determine if a device error rate equals or exceeds a threshold error rate
US20060256615A1 (en) * 2005-05-10 2006-11-16 Larson Thane M Horizontal and vertical error correction coding (ECC) system and method
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US20070061669A1 (en) * 2005-08-30 2007-03-15 Major Karl L Method, device and system for detecting error correction defects
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JP4994112B2 (ja) * 2007-05-22 2012-08-08 ルネサスエレクトロニクス株式会社 半導体集積回路装置およびメモリ制御方法
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US9703630B2 (en) 2015-06-08 2017-07-11 International Business Machines Corporation Selective error coding
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US10956345B2 (en) * 2016-04-01 2021-03-23 Intel Corporation Enhanced directed system management interrupt mechanism
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Also Published As

Publication number Publication date
EP0986783A1 (de) 2000-03-22
US5978952A (en) 1999-11-02
EP0986783A4 (de) 2000-05-10
DE69719086T2 (de) 2003-09-25
WO1998029811A1 (en) 1998-07-09
AU5512398A (en) 1998-07-31
EP0986783B1 (de) 2003-02-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: HEYER, V., DIPL.-PHYS. DR.RER.NAT., PAT.-ANW., 806