DE69706947D1 - Halbleiterspeicher - Google Patents

Halbleiterspeicher

Info

Publication number
DE69706947D1
DE69706947D1 DE69706947T DE69706947T DE69706947D1 DE 69706947 D1 DE69706947 D1 DE 69706947D1 DE 69706947 T DE69706947 T DE 69706947T DE 69706947 T DE69706947 T DE 69706947T DE 69706947 D1 DE69706947 D1 DE 69706947D1
Authority
DE
Germany
Prior art keywords
semiconductor memory
semiconductor
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69706947T
Other languages
English (en)
Other versions
DE69706947T2 (de
Inventor
Joji Nakane
Nobuyuki Moriwaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Publication of DE69706947D1 publication Critical patent/DE69706947D1/de
Application granted granted Critical
Publication of DE69706947T2 publication Critical patent/DE69706947T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B53/00—Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
DE69706947T 1996-04-19 1997-04-11 Halbleiterspeicher Expired - Lifetime DE69706947T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8098269A JPH09288891A (ja) 1996-04-19 1996-04-19 半導体メモリ装置
PCT/JP1997/001267 WO1997040500A1 (fr) 1996-04-19 1997-04-11 Memoire a semi-conducteur

Publications (2)

Publication Number Publication Date
DE69706947D1 true DE69706947D1 (de) 2001-10-31
DE69706947T2 DE69706947T2 (de) 2002-03-28

Family

ID=14215231

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69706947T Expired - Lifetime DE69706947T2 (de) 1996-04-19 1997-04-11 Halbleiterspeicher

Country Status (8)

Country Link
US (1) US6038160A (de)
EP (1) EP0847059B1 (de)
JP (1) JPH09288891A (de)
KR (1) KR100441837B1 (de)
CN (1) CN1119812C (de)
DE (1) DE69706947T2 (de)
TW (1) TW333704B (de)
WO (1) WO1997040500A1 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6256220B1 (en) 1997-09-15 2001-07-03 Celis Semiconductor Corporation Ferroelectric memory with shunted isolated nodes
US5959878A (en) * 1997-09-15 1999-09-28 Celis Semiconductor Corporation Ferroelectric memory cell with shunted ferroelectric capacitor and method of making same
JPH11273360A (ja) * 1998-03-17 1999-10-08 Toshiba Corp 強誘電体記憶装置
KR100335266B1 (ko) * 1998-06-30 2002-10-19 주식회사 하이닉스반도체 반도체메모리장치
KR100363102B1 (ko) * 1998-07-15 2003-02-19 주식회사 하이닉스반도체 강유전체 메모리
US6151241A (en) * 1999-05-19 2000-11-21 Symetrix Corporation Ferroelectric memory with disturb protection
KR100339428B1 (ko) * 1999-09-07 2002-05-31 박종섭 불휘발성 강유전체 메모리의 셀 블록 구조
JP3617615B2 (ja) * 1999-11-08 2005-02-09 シャープ株式会社 強誘電体記憶装置
US6566698B2 (en) * 2000-05-26 2003-05-20 Sony Corporation Ferroelectric-type nonvolatile semiconductor memory and operation method thereof
JP3866913B2 (ja) * 2000-11-21 2007-01-10 富士通株式会社 半導体装置
JP2003092364A (ja) * 2001-05-21 2003-03-28 Mitsubishi Electric Corp 半導体記憶装置
KR100762225B1 (ko) * 2001-06-30 2007-10-01 주식회사 하이닉스반도체 반도체 소자의 셀 플레이트 전압 안정화 회로
JP2003233984A (ja) * 2001-12-04 2003-08-22 Sanyo Electric Co Ltd メモリ装置
CN100419909C (zh) * 2002-03-15 2008-09-17 三洋电机株式会社 强感应体存储器及其动作方法和存储器装置
US6826099B2 (en) * 2002-11-20 2004-11-30 Infineon Technologies Ag 2T2C signal margin test mode using a defined charge and discharge of BL and /BL
JP4387407B2 (ja) * 2004-06-08 2009-12-16 富士通マイクロエレクトロニクス株式会社 半導体記憶装置の検査方法
JP2009271999A (ja) * 2008-05-07 2009-11-19 Toshiba Corp 抵抗変化メモリ装置
US10120674B2 (en) * 2015-06-02 2018-11-06 Texas Instruments Incorporated Ferroelectric memory expansion for firmware updates
EP3507805A4 (de) 2016-08-31 2020-06-03 Micron Technology, Inc. Vorrichtungen und verfahren mit ferroelektrischem speicher und zum betrieb von ferroelektrischem speicher
WO2018044487A1 (en) 2016-08-31 2018-03-08 Micron Technology, Inc. Apparatuses and methods including ferroelectric memory and for accessing ferroelectric memory
KR102227270B1 (ko) 2016-08-31 2021-03-15 마이크론 테크놀로지, 인크. 강유전 메모리 셀
KR102314663B1 (ko) 2016-08-31 2021-10-21 마이크론 테크놀로지, 인크. 2 트랜지스터-1 커패시터 메모리를 포함하고 이를 액세스하기 위한 장치 및 방법
US10867675B2 (en) 2017-07-13 2020-12-15 Micron Technology, Inc. Apparatuses and methods for memory including ferroelectric memory cells and dielectric memory cells
US10529410B2 (en) * 2017-12-18 2020-01-07 Micron Technology, Inc. Techniques for accessing an array of memory cells to reduce parasitic coupling

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4873664A (en) * 1987-02-12 1989-10-10 Ramtron Corporation Self restoring ferroelectric memory
US5329485A (en) * 1990-11-01 1994-07-12 Olympus Optical Co., Ltd. Memory device
JPH0660635A (ja) * 1992-08-06 1994-03-04 Olympus Optical Co Ltd 強誘電体メモリ装置
US5432731A (en) * 1993-03-08 1995-07-11 Motorola, Inc. Ferroelectric memory cell and method of sensing and writing the polarization state thereof
US5430671A (en) * 1993-04-09 1995-07-04 Matsushita Electric Industrial Co., Ltd. Semiconductor memory device
US5381364A (en) * 1993-06-24 1995-01-10 Ramtron International Corporation Ferroelectric-based RAM sensing scheme including bit-line capacitance isolation
US5406510A (en) * 1993-07-15 1995-04-11 Symetrix Corporation Non-volatile memory
JP3191550B2 (ja) * 1994-02-15 2001-07-23 松下電器産業株式会社 半導体メモリ装置
JP3191549B2 (ja) * 1994-02-15 2001-07-23 松下電器産業株式会社 半導体メモリ装置
US5572459A (en) * 1994-09-16 1996-11-05 Ramtron International Corporation Voltage reference for a ferroelectric 1T/1C based memory
US5598366A (en) * 1995-08-16 1997-01-28 Ramtron International Corporation Ferroelectric nonvolatile random access memory utilizing self-bootstrapping plate line segment drivers

Also Published As

Publication number Publication date
US6038160A (en) 2000-03-14
KR19990028224A (ko) 1999-04-15
EP0847059B1 (de) 2001-09-26
TW333704B (en) 1998-06-11
EP0847059A4 (de) 1998-11-18
CN1119812C (zh) 2003-08-27
EP0847059A2 (de) 1998-06-10
KR100441837B1 (ko) 2004-10-14
WO1997040500A1 (fr) 1997-10-30
DE69706947T2 (de) 2002-03-28
JPH09288891A (ja) 1997-11-04
CN1189234A (zh) 1998-07-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PANASONIC CORP., KADOMA, OSAKA, JP